JPS5476037A - Pla logic circuit - Google Patents

Pla logic circuit

Info

Publication number
JPS5476037A
JPS5476037A JP14411577A JP14411577A JPS5476037A JP S5476037 A JPS5476037 A JP S5476037A JP 14411577 A JP14411577 A JP 14411577A JP 14411577 A JP14411577 A JP 14411577A JP S5476037 A JPS5476037 A JP S5476037A
Authority
JP
Japan
Prior art keywords
scan
sequence
test data
path
operation part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14411577A
Other languages
Japanese (ja)
Inventor
Etsuo Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP14411577A priority Critical patent/JPS5476037A/en
Publication of JPS5476037A publication Critical patent/JPS5476037A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To secure the direct writing or reading and thus to facilitate the test by constituting the circuit with the scan-in path to supply the plural-bit test data to the feedback register in sequence and the scan-out path to deliver the test data in sequence.
CONSTITUTION: The circuit is constituted with the following units: logical operation part 13 and 14 which perform the logical operation for the data; feedback register 18 which supplies the output to the input of the logical operation part with the output of the operation part used as the input in order to form a feedback group; scan-in path 110 which supplies the test data of plural bits to register 18 in sequence; and scan-out path 111 which delivers the test data in sequence. With such constitution, the direct writing or reading can be facilitated with an easy testing ensured.
COPYRIGHT: (C)1979,JPO&Japio
JP14411577A 1977-11-30 1977-11-30 Pla logic circuit Pending JPS5476037A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14411577A JPS5476037A (en) 1977-11-30 1977-11-30 Pla logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14411577A JPS5476037A (en) 1977-11-30 1977-11-30 Pla logic circuit

Publications (1)

Publication Number Publication Date
JPS5476037A true JPS5476037A (en) 1979-06-18

Family

ID=15354527

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14411577A Pending JPS5476037A (en) 1977-11-30 1977-11-30 Pla logic circuit

Country Status (1)

Country Link
JP (1) JPS5476037A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56145370A (en) * 1980-03-25 1981-11-12 Chiyou Lsi Gijutsu Kenkyu Kumiai Logic circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56145370A (en) * 1980-03-25 1981-11-12 Chiyou Lsi Gijutsu Kenkyu Kumiai Logic circuit

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