JPS5694453A - Test signal generating device - Google Patents
Test signal generating deviceInfo
- Publication number
- JPS5694453A JPS5694453A JP17068379A JP17068379A JPS5694453A JP S5694453 A JPS5694453 A JP S5694453A JP 17068379 A JP17068379 A JP 17068379A JP 17068379 A JP17068379 A JP 17068379A JP S5694453 A JPS5694453 A JP S5694453A
- Authority
- JP
- Japan
- Prior art keywords
- bit pattern
- control device
- read
- test signal
- generating device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To test an I/O control device under the state most similar to the connection to the actual I/O device, by constituting a test generating device by the control circuit which accesses the ROM or the RAM.
CONSTITUTION: Test signal generating device 2 which tests I/O control device 1 is connected to I/O control device 1, and this generating device is provided with bit pattern storage ROM5 to store the bit pattern for test signal and ROM address counter 6 to designate the read address of ROM5. Further, clock generating circuit 7 which generates clocks to read the bit pattern and control circuit 4 which controls the read of the bit pattern are provided. Then, the bit pattern read from ROM5 is applied to I/O control device 1 in serial through interface circuit 3, and thus, I/O control device 1 is tested under the nearest state to connection to the actual I/O device.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17068379A JPS5694453A (en) | 1979-12-27 | 1979-12-27 | Test signal generating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17068379A JPS5694453A (en) | 1979-12-27 | 1979-12-27 | Test signal generating device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5694453A true JPS5694453A (en) | 1981-07-30 |
Family
ID=15909450
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17068379A Pending JPS5694453A (en) | 1979-12-27 | 1979-12-27 | Test signal generating device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5694453A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60246454A (en) * | 1984-05-21 | 1985-12-06 | Fujitsu Ltd | Testing system of input/output device |
JPS63138659U (en) * | 1987-02-28 | 1988-09-13 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5253638A (en) * | 1975-10-28 | 1977-04-30 | Mitsubishi Electric Corp | Mimic equipment of input/output unit |
-
1979
- 1979-12-27 JP JP17068379A patent/JPS5694453A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5253638A (en) * | 1975-10-28 | 1977-04-30 | Mitsubishi Electric Corp | Mimic equipment of input/output unit |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60246454A (en) * | 1984-05-21 | 1985-12-06 | Fujitsu Ltd | Testing system of input/output device |
JPS63138659U (en) * | 1987-02-28 | 1988-09-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5585265A (en) | Function test evaluation device for integrated circuit | |
JPS5585264A (en) | Function test evaluation device for integrated circuit | |
JPS5694453A (en) | Test signal generating device | |
JPS52155518A (en) | Electronic musical instrument | |
JPS53121429A (en) | Duplex memory unit | |
JPS5293361A (en) | Automatic tester | |
JPS55108996A (en) | Memory test system | |
JPS5674666A (en) | Voltage level generator | |
JPS54946A (en) | Operation speed test circuit for logic element or logic circuit | |
JPS5223372A (en) | Mintur measuring instrument | |
JPS5367086A (en) | Logic sequence system | |
JPS55124076A (en) | Self-checking method of testing apparatus | |
JPS5332010A (en) | Waveform memory for electronic musical instrument | |
JPS5436151A (en) | Test unit for micro computer system | |
JPS533715A (en) | Test signal generator | |
JPS5210767A (en) | Clock tester | |
JPS56140439A (en) | Pattern generator | |
JPS5698796A (en) | High-speed memory test system | |
JPS5384651A (en) | Automatic test control system | |
JPS5299734A (en) | Testing unit of integrated circuit | |
JPS53106190A (en) | Device tester | |
JPS5431236A (en) | State information recorcing system | |
JPS545632A (en) | Test method for memory unit | |
JPS6473267A (en) | Test data generation system for lsi | |
JPS53108746A (en) | Terminal test system |