JPS5564699A - Semiconductor integrated-circuit memory - Google Patents

Semiconductor integrated-circuit memory

Info

Publication number
JPS5564699A
JPS5564699A JP13852178A JP13852178A JPS5564699A JP S5564699 A JPS5564699 A JP S5564699A JP 13852178 A JP13852178 A JP 13852178A JP 13852178 A JP13852178 A JP 13852178A JP S5564699 A JPS5564699 A JP S5564699A
Authority
JP
Japan
Prior art keywords
logic
tests
ram
test
write
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13852178A
Other languages
Japanese (ja)
Inventor
Kazuaki Mayumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP13852178A priority Critical patent/JPS5564699A/en
Publication of JPS5564699A publication Critical patent/JPS5564699A/en
Pending legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE: To make it possible to self-diagnose write and read pattern tests by forming a logic circuit unit for RAM logic operation tests on the same semiconductor chip.
CONSTITUTION: On the same semiconductor chip RAM part 3 and logic circuit units such a test logic part 7, multiplexers 2 and 6, etc., used for logic operation tests of RAM part 3 are formed when test assignement signal (d) of level L is inputted to test terminal 8, logic part 7, for example, is driven and clock signal (e) inputted from terminal 9 operates logic part 7 to generate word patterns for read and write tests of RAM, thereby executing pattern tests of memory part 3 via output signals (a) and (c). When dissidence is detected between write and read patterns, test result signal (f) of a chip defect can be obtained via terminal 10.
COPYRIGHT: (C)1980,JPO&Japio
JP13852178A 1978-11-09 1978-11-09 Semiconductor integrated-circuit memory Pending JPS5564699A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13852178A JPS5564699A (en) 1978-11-09 1978-11-09 Semiconductor integrated-circuit memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13852178A JPS5564699A (en) 1978-11-09 1978-11-09 Semiconductor integrated-circuit memory

Publications (1)

Publication Number Publication Date
JPS5564699A true JPS5564699A (en) 1980-05-15

Family

ID=15224079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13852178A Pending JPS5564699A (en) 1978-11-09 1978-11-09 Semiconductor integrated-circuit memory

Country Status (1)

Country Link
JP (1) JPS5564699A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS603082A (en) * 1983-06-18 1985-01-09 Dainippon Printing Co Ltd Ic card
JPS61296600A (en) * 1985-06-24 1986-12-27 Nec Ic Microcomput Syst Ltd Storage device
JPS6238600A (en) * 1985-08-14 1987-02-19 Fujitsu Ltd Semiconductor memory device
JPS6243897A (en) * 1985-08-20 1987-02-25 Nec Corp Semiconductor memory
JPS62293598A (en) * 1986-06-12 1987-12-21 Toshiba Corp Semiconductor storage device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS603082A (en) * 1983-06-18 1985-01-09 Dainippon Printing Co Ltd Ic card
JPH053634B2 (en) * 1983-06-18 1993-01-18 Dainippon Printing Co Ltd
JPS61296600A (en) * 1985-06-24 1986-12-27 Nec Ic Microcomput Syst Ltd Storage device
JPS6238600A (en) * 1985-08-14 1987-02-19 Fujitsu Ltd Semiconductor memory device
JPS6243897A (en) * 1985-08-20 1987-02-25 Nec Corp Semiconductor memory
JPS62293598A (en) * 1986-06-12 1987-12-21 Toshiba Corp Semiconductor storage device
JPH0468719B2 (en) * 1986-06-12 1992-11-04 Tokyo Shibaura Electric Co

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