JPS5472924A - Semiconductor memory inspection equipment - Google Patents
Semiconductor memory inspection equipmentInfo
- Publication number
- JPS5472924A JPS5472924A JP13999477A JP13999477A JPS5472924A JP S5472924 A JPS5472924 A JP S5472924A JP 13999477 A JP13999477 A JP 13999477A JP 13999477 A JP13999477 A JP 13999477A JP S5472924 A JPS5472924 A JP S5472924A
- Authority
- JP
- Japan
- Prior art keywords
- memory
- memories
- write data
- commodity
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
PURPOSE: To improve the precision of inspection iterms by a simple constitution, by attaining parallel access to an inspected commodity and reference one with the same function for the formation of an expected value and by forming write data by a memory stored with special write data.
CONSTITUTION: In addition to inspected-commodity memory 3 and reference- commodity memory 3' with the same function as memory 3, test-pattern memory 2 stored with testing write data is provided. In order to supply address information AD and memory-operation control signal R/W from address generating circuit 1 to both memories 3 and 3' according to a fixed program, and to obtain write data from memory to memories 3 and 3', address information AD is supplied to memory 2 and output Di of memory 2 is to both memories 3 and 3'. Then, memories 3 and 3' are operated under the same conditions, and outputs of memories 3 and 3' are compared by comparing-coincidence circuit 4, so that decising signal (DO/NGO) will be outputted depending upon the result of the comparison.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13999477A JPS5472924A (en) | 1977-11-24 | 1977-11-24 | Semiconductor memory inspection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13999477A JPS5472924A (en) | 1977-11-24 | 1977-11-24 | Semiconductor memory inspection equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5472924A true JPS5472924A (en) | 1979-06-11 |
Family
ID=15258452
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13999477A Pending JPS5472924A (en) | 1977-11-24 | 1977-11-24 | Semiconductor memory inspection equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5472924A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5870174A (en) * | 1981-09-29 | 1983-04-26 | Fujitsu Ltd | Test system for semiconductor ic memory |
JPS61147356A (en) * | 1984-12-20 | 1986-07-05 | Toshiba Corp | Testing device for memory module |
KR100896585B1 (en) * | 2000-09-28 | 2009-05-21 | 베리지 (싱가포르) 피티이. 엘티디. | Memory tester has memory sets configurable for use as error catch ram, tag ram's, buffer memories and stimulus log ram |
-
1977
- 1977-11-24 JP JP13999477A patent/JPS5472924A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5870174A (en) * | 1981-09-29 | 1983-04-26 | Fujitsu Ltd | Test system for semiconductor ic memory |
JPS61147356A (en) * | 1984-12-20 | 1986-07-05 | Toshiba Corp | Testing device for memory module |
KR100896585B1 (en) * | 2000-09-28 | 2009-05-21 | 베리지 (싱가포르) 피티이. 엘티디. | Memory tester has memory sets configurable for use as error catch ram, tag ram's, buffer memories and stimulus log ram |
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