JPS53108243A - Measurement system for memory access time - Google Patents

Measurement system for memory access time

Info

Publication number
JPS53108243A
JPS53108243A JP2339977A JP2339977A JPS53108243A JP S53108243 A JPS53108243 A JP S53108243A JP 2339977 A JP2339977 A JP 2339977A JP 2339977 A JP2339977 A JP 2339977A JP S53108243 A JPS53108243 A JP S53108243A
Authority
JP
Japan
Prior art keywords
access time
memory access
measurement system
memory
data sent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2339977A
Other languages
Japanese (ja)
Inventor
Haruo Takagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP2339977A priority Critical patent/JPS53108243A/en
Publication of JPS53108243A publication Critical patent/JPS53108243A/en
Pending legal-status Critical Current

Links

Landscapes

  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE: To secure the measurement of the memory access time, by reading the data sent from each address of the memory to be measured in the programed access time to compare it with the data sent from the master memory.
COPYRIGHT: (C)1978,JPO&Japio
JP2339977A 1977-03-03 1977-03-03 Measurement system for memory access time Pending JPS53108243A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2339977A JPS53108243A (en) 1977-03-03 1977-03-03 Measurement system for memory access time

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2339977A JPS53108243A (en) 1977-03-03 1977-03-03 Measurement system for memory access time

Publications (1)

Publication Number Publication Date
JPS53108243A true JPS53108243A (en) 1978-09-20

Family

ID=12109422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2339977A Pending JPS53108243A (en) 1977-03-03 1977-03-03 Measurement system for memory access time

Country Status (1)

Country Link
JP (1) JPS53108243A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992009083A1 (en) * 1990-11-20 1992-05-29 Oki Electric Industry Co., Ltd. Synchronous semiconductor memory
JPH0519024A (en) * 1991-07-12 1993-01-26 Nec Corp Method for testing integrated circuit
JP2001356153A (en) * 2000-06-14 2001-12-26 Advantest Corp Semiconductor device testing method and semiconductor device testing device
JP2016051454A (en) * 2014-09-02 2016-04-11 株式会社東芝 Processor and wait time measurement method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992009083A1 (en) * 1990-11-20 1992-05-29 Oki Electric Industry Co., Ltd. Synchronous semiconductor memory
US5311483A (en) * 1990-11-20 1994-05-10 Oki Electric Industry Co., Ltd. Synchronous type semiconductor memory
JPH0519024A (en) * 1991-07-12 1993-01-26 Nec Corp Method for testing integrated circuit
JP2001356153A (en) * 2000-06-14 2001-12-26 Advantest Corp Semiconductor device testing method and semiconductor device testing device
JP4495308B2 (en) * 2000-06-14 2010-07-07 株式会社アドバンテスト Semiconductor device testing method and semiconductor device testing equipment
JP2016051454A (en) * 2014-09-02 2016-04-11 株式会社東芝 Processor and wait time measurement method

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