JPS55163697A - Memory device - Google Patents

Memory device

Info

Publication number
JPS55163697A
JPS55163697A JP7046979A JP7046979A JPS55163697A JP S55163697 A JPS55163697 A JP S55163697A JP 7046979 A JP7046979 A JP 7046979A JP 7046979 A JP7046979 A JP 7046979A JP S55163697 A JPS55163697 A JP S55163697A
Authority
JP
Japan
Prior art keywords
read
program
write
cell
memory device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7046979A
Other languages
Japanese (ja)
Inventor
Akira Fusaoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP7046979A priority Critical patent/JPS55163697A/en
Publication of JPS55163697A publication Critical patent/JPS55163697A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To realize the test for the frequency of reference of each order such as the data or the program of each address by adding the count value memory cell to record the reference frequency to the memory device, thus performing the evaluation for the debug and the system of the program.
CONSTITUTION: The read/write is carried out for the information of each cell 2 in accordance with the state of read/write control signal 5. Signal 5 is applied also to each count value memory cell 7 with every read/write, and the contents of cell 7 is stored in counting circuit 8. Circuit 8 carries out the prescribed action based on control signal 10. As a result, the debug and the like can be done for the program while giving the test to the reference frequency of each address.
COPYRIGHT: (C)1980,JPO&Japio
JP7046979A 1979-06-05 1979-06-05 Memory device Pending JPS55163697A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7046979A JPS55163697A (en) 1979-06-05 1979-06-05 Memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7046979A JPS55163697A (en) 1979-06-05 1979-06-05 Memory device

Publications (1)

Publication Number Publication Date
JPS55163697A true JPS55163697A (en) 1980-12-19

Family

ID=13432403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7046979A Pending JPS55163697A (en) 1979-06-05 1979-06-05 Memory device

Country Status (1)

Country Link
JP (1) JPS55163697A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5819962A (en) * 1981-07-29 1983-02-05 Yokogawa Hokushin Electric Corp Microprocessor analyzer
JPS61286940A (en) * 1985-06-13 1986-12-17 テクトロニツクス・インコ−ポレイテツド Event counter
JPS62150443A (en) * 1985-12-24 1987-07-04 Nec Corp Program debugging device
JPS62216047A (en) * 1986-03-10 1987-09-22 Fujitsu Ltd Deciding system for regression preventing test case
JPH03235138A (en) * 1990-02-13 1991-10-21 Agency Of Ind Science & Technol Memory access frequency measuring device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5819962A (en) * 1981-07-29 1983-02-05 Yokogawa Hokushin Electric Corp Microprocessor analyzer
JPS6365982B2 (en) * 1981-07-29 1988-12-19 Yokogawa Electric Corp
JPS61286940A (en) * 1985-06-13 1986-12-17 テクトロニツクス・インコ−ポレイテツド Event counter
JPS62150443A (en) * 1985-12-24 1987-07-04 Nec Corp Program debugging device
JPS62216047A (en) * 1986-03-10 1987-09-22 Fujitsu Ltd Deciding system for regression preventing test case
JPH03235138A (en) * 1990-02-13 1991-10-21 Agency Of Ind Science & Technol Memory access frequency measuring device

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