JPS5552967A - Pattern signal generator - Google Patents
Pattern signal generatorInfo
- Publication number
- JPS5552967A JPS5552967A JP12652378A JP12652378A JPS5552967A JP S5552967 A JPS5552967 A JP S5552967A JP 12652378 A JP12652378 A JP 12652378A JP 12652378 A JP12652378 A JP 12652378A JP S5552967 A JPS5552967 A JP S5552967A
- Authority
- JP
- Japan
- Prior art keywords
- address
- pattern
- memory
- signal
- dut
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To eliminate occurrence of idle time when switching regular and irregular patterns to each other by applying a patttern having both regular and irregular pattern signals being mixed within to a check element.
CONSTITUTION: The pattern generator 13 of a main pattern generator 9 applies a regular pattern signal through data multiplexers 22aW22c to a tested element DUT by a command from an instruction memory 10. The start address stack 19 of an auxiliary pattern generator 9', on the other hand, applies, when reading an irregular pattern production command from the memory 10, a start address to an address counter 18 to output an irregular pattern signal from an auxiliary memory 17 to the multiplexers 22aW22c. When a flip-flop FF16 is set by an operation start signal 37 to produce a signal 38, the output from the memory 17 is applied to the DUT. When the address from a stop address stack 20 becomes coincident to the address of the counter 18 in a comparator 21, the flip-flop FF16 is reset to thereby allow the output of a generator 13 to be applied to the DUT.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12652378A JPS5552967A (en) | 1978-10-13 | 1978-10-13 | Pattern signal generator |
| US06/026,246 US4293950A (en) | 1978-04-03 | 1979-04-02 | Test pattern generating apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12652378A JPS5552967A (en) | 1978-10-13 | 1978-10-13 | Pattern signal generator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5552967A true JPS5552967A (en) | 1980-04-17 |
Family
ID=14937305
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12652378A Pending JPS5552967A (en) | 1978-04-03 | 1978-10-13 | Pattern signal generator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5552967A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57116269A (en) * | 1981-01-12 | 1982-07-20 | Toshiba Corp | Lsi test pattern generating part |
| JPS58774A (en) * | 1981-06-25 | 1983-01-05 | Toshiba Corp | High speed pattern generator |
| JPS58108475A (en) * | 1981-10-19 | 1983-06-28 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | Method and device for indexing test vector |
| JPS59132376A (en) * | 1983-01-18 | 1984-07-30 | Hitachi Ltd | Test pattern reading control system |
| JPS61176464U (en) * | 1985-04-24 | 1986-11-04 | ||
| JPS63145975A (en) * | 1986-12-09 | 1988-06-18 | Ando Electric Co Ltd | Logic circuit tester |
| JPH026765A (en) * | 1988-01-06 | 1990-01-10 | Teledyne Inc | Automatic circuit tester control system |
-
1978
- 1978-10-13 JP JP12652378A patent/JPS5552967A/en active Pending
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57116269A (en) * | 1981-01-12 | 1982-07-20 | Toshiba Corp | Lsi test pattern generating part |
| JPH0530225B2 (en) * | 1981-01-12 | 1993-05-07 | Tokyo Shibaura Electric Co | |
| JPS58774A (en) * | 1981-06-25 | 1983-01-05 | Toshiba Corp | High speed pattern generator |
| JPH0311435B2 (en) * | 1981-06-25 | 1991-02-15 | Tokyo Shibaura Electric Co | |
| JPS58108475A (en) * | 1981-10-19 | 1983-06-28 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | Method and device for indexing test vector |
| JPH0416752B2 (en) * | 1981-10-19 | 1992-03-25 | Fueachairudo Kamera Endo Insutsurumento Corp | |
| JPS59132376A (en) * | 1983-01-18 | 1984-07-30 | Hitachi Ltd | Test pattern reading control system |
| JPH0575985B2 (en) * | 1983-01-18 | 1993-10-21 | Hitachi Ltd | |
| JPS61176464U (en) * | 1985-04-24 | 1986-11-04 | ||
| JPS63145975A (en) * | 1986-12-09 | 1988-06-18 | Ando Electric Co Ltd | Logic circuit tester |
| JPH026765A (en) * | 1988-01-06 | 1990-01-10 | Teledyne Inc | Automatic circuit tester control system |
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