PL272015A2 - Method of testing digital integrated circuits - Google Patents

Method of testing digital integrated circuits

Info

Publication number
PL272015A2
PL272015A2 PL27201588A PL27201588A PL272015A2 PL 272015 A2 PL272015 A2 PL 272015A2 PL 27201588 A PL27201588 A PL 27201588A PL 27201588 A PL27201588 A PL 27201588A PL 272015 A2 PL272015 A2 PL 272015A2
Authority
PL
Poland
Prior art keywords
integrated circuits
digital integrated
testing digital
testing
circuits
Prior art date
Application number
PL27201588A
Inventor
Marek Wojtalewicz
Barbara Wojtalewicz
Original Assignee
Marek Wojtalewicz
Barbara Wojtalewicz
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marek Wojtalewicz, Barbara Wojtalewicz filed Critical Marek Wojtalewicz
Priority to PL27201588A priority Critical patent/PL272015A2/en
Publication of PL272015A2 publication Critical patent/PL272015A2/en

Links

PL27201588A 1988-04-22 1988-04-22 Method of testing digital integrated circuits PL272015A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL27201588A PL272015A2 (en) 1988-04-22 1988-04-22 Method of testing digital integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL27201588A PL272015A2 (en) 1988-04-22 1988-04-22 Method of testing digital integrated circuits

Publications (1)

Publication Number Publication Date
PL272015A2 true PL272015A2 (en) 1989-02-20

Family

ID=20041782

Family Applications (1)

Application Number Title Priority Date Filing Date
PL27201588A PL272015A2 (en) 1988-04-22 1988-04-22 Method of testing digital integrated circuits

Country Status (1)

Country Link
PL (1) PL272015A2 (en)

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