GB2223128B - A method of testing an integrated circuit and one or more associated masks - Google Patents

A method of testing an integrated circuit and one or more associated masks

Info

Publication number
GB2223128B
GB2223128B GB8921087A GB8921087A GB2223128B GB 2223128 B GB2223128 B GB 2223128B GB 8921087 A GB8921087 A GB 8921087A GB 8921087 A GB8921087 A GB 8921087A GB 2223128 B GB2223128 B GB 2223128B
Authority
GB
United Kingdom
Prior art keywords
testing
integrated circuit
associated masks
masks
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB8921087A
Other versions
GB2223128A (en
GB8921087D0 (en
Inventor
Robert Howard Jones
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB888822248A external-priority patent/GB8822248D0/en
Application filed by Individual filed Critical Individual
Publication of GB8921087D0 publication Critical patent/GB8921087D0/en
Publication of GB2223128A publication Critical patent/GB2223128A/en
Application granted granted Critical
Publication of GB2223128B publication Critical patent/GB2223128B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
GB8921087A 1988-09-22 1989-09-18 A method of testing an integrated circuit and one or more associated masks Expired - Lifetime GB2223128B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB888822248A GB8822248D0 (en) 1988-09-22 1988-09-22 Method of testing integrated circuit & one/more associated masks
GB898912907A GB8912907D0 (en) 1988-09-22 1989-06-05 Specific continuity and propagation testing of integrated circuits and masks

Publications (3)

Publication Number Publication Date
GB8921087D0 GB8921087D0 (en) 1989-11-01
GB2223128A GB2223128A (en) 1990-03-28
GB2223128B true GB2223128B (en) 1991-11-06

Family

ID=26294424

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8921087A Expired - Lifetime GB2223128B (en) 1988-09-22 1989-09-18 A method of testing an integrated circuit and one or more associated masks

Country Status (1)

Country Link
GB (1) GB2223128B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010023187A1 (en) * 2010-06-09 2011-12-15 Dtg International Gmbh Apparatus and method for inspecting printed circuit boards

Also Published As

Publication number Publication date
GB2223128A (en) 1990-03-28
GB8921087D0 (en) 1989-11-01

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19930918