GB8921087D0 - A method of testing an integrated circuit and one or more associated masks - Google Patents

A method of testing an integrated circuit and one or more associated masks

Info

Publication number
GB8921087D0
GB8921087D0 GB898921087A GB8921087A GB8921087D0 GB 8921087 D0 GB8921087 D0 GB 8921087D0 GB 898921087 A GB898921087 A GB 898921087A GB 8921087 A GB8921087 A GB 8921087A GB 8921087 D0 GB8921087 D0 GB 8921087D0
Authority
GB
United Kingdom
Prior art keywords
testing
integrated circuit
associated masks
masks
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB898921087A
Other versions
GB2223128A (en
GB2223128B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB888822248A external-priority patent/GB8822248D0/en
Application filed by Individual filed Critical Individual
Publication of GB8921087D0 publication Critical patent/GB8921087D0/en
Publication of GB2223128A publication Critical patent/GB2223128A/en
Application granted granted Critical
Publication of GB2223128B publication Critical patent/GB2223128B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
GB8921087A 1988-09-22 1989-09-18 A method of testing an integrated circuit and one or more associated masks Expired - Lifetime GB2223128B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB888822248A GB8822248D0 (en) 1988-09-22 1988-09-22 Method of testing integrated circuit & one/more associated masks
GB898912907A GB8912907D0 (en) 1988-09-22 1989-06-05 Specific continuity and propagation testing of integrated circuits and masks

Publications (3)

Publication Number Publication Date
GB8921087D0 true GB8921087D0 (en) 1989-11-01
GB2223128A GB2223128A (en) 1990-03-28
GB2223128B GB2223128B (en) 1991-11-06

Family

ID=26294424

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8921087A Expired - Lifetime GB2223128B (en) 1988-09-22 1989-09-18 A method of testing an integrated circuit and one or more associated masks

Country Status (1)

Country Link
GB (1) GB2223128B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010023187A1 (en) * 2010-06-09 2011-12-15 Dtg International Gmbh Apparatus and method for inspecting printed circuit boards

Also Published As

Publication number Publication date
GB2223128A (en) 1990-03-28
GB2223128B (en) 1991-11-06

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19930918