HK1127162A1 - Packaging of semiconductor devices for increased reliability - Google Patents
Packaging of semiconductor devices for increased reliabilityInfo
- Publication number
- HK1127162A1 HK1127162A1 HK09106262.9A HK09106262A HK1127162A1 HK 1127162 A1 HK1127162 A1 HK 1127162A1 HK 09106262 A HK09106262 A HK 09106262A HK 1127162 A1 HK1127162 A1 HK 1127162A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- integrated circuit
- radiation
- packaging
- semiconductor devices
- circuit die
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
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- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
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- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
- H01L23/3677—Wire-like or pin-like cooling fins or heat sinks
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- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
- H01L23/556—Protection against radiation, e.g. light or electromagnetic waves against alpha rays
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- H01L25/105—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
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- H01L2224/32153—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being arranged next to each other, e.g. on a common substrate
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- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49128—Assembling formed circuit to base
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- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
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- Y10T29/49139—Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture
- Y10T29/4914—Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture with deforming of lead or terminal
- Y10T29/49142—Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture with deforming of lead or terminal including metal fusion
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49144—Assembling to base an electrical component, e.g., capacitor, etc. by metal fusion
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- Y10T29/49117—Conductor or circuit manufacturing
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- Y10T29/49147—Assembling terminal to base
- Y10T29/49149—Assembling terminal to base by metal fusion bonding
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/621,844 US7191516B2 (en) | 2003-07-16 | 2003-07-16 | Method for shielding integrated circuit devices |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1127162A1 true HK1127162A1 (en) | 2009-09-18 |
Family
ID=34063073
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK09106262.9A HK1127162A1 (en) | 2003-07-16 | 2009-07-13 | Packaging of semiconductor devices for increased reliability |
Country Status (7)
Country | Link |
---|---|
US (3) | US7191516B2 (de) |
EP (1) | EP1647173A4 (de) |
JP (1) | JP4795948B2 (de) |
KR (1) | KR101059918B1 (de) |
CN (2) | CN101345238B (de) |
HK (1) | HK1127162A1 (de) |
WO (1) | WO2005010937A2 (de) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070164424A1 (en) * | 2003-04-02 | 2007-07-19 | Nancy Dean | Thermal interconnect and interface systems, methods of production and uses thereof |
KR20060025155A (ko) * | 2003-06-06 | 2006-03-20 | 허니웰 인터내셔날 인코포레이티드 | 열적 상호접속 시스템, 그 제조 방법 및 사용법 |
US7191516B2 (en) * | 2003-07-16 | 2007-03-20 | Maxwell Technologies, Inc. | Method for shielding integrated circuit devices |
US8154881B2 (en) * | 2006-11-13 | 2012-04-10 | Telecommunication Systems, Inc. | Radiation-shielded semiconductor assembly |
EP2112471A1 (de) * | 2008-04-22 | 2009-10-28 | Microcomponents AG | Montagevorrichtung für elektronisches Bauteil |
CN101572260B (zh) * | 2008-04-30 | 2011-04-20 | 南亚科技股份有限公司 | 多芯片堆叠封装体 |
US7741567B2 (en) * | 2008-05-19 | 2010-06-22 | Texas Instruments Incorporated | Integrated circuit package having integrated faraday shield |
US7835207B2 (en) | 2008-10-07 | 2010-11-16 | Micron Technology, Inc. | Stacked device remapping and repair |
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-
2003
- 2003-07-16 US US10/621,844 patent/US7191516B2/en not_active Expired - Fee Related
-
2004
- 2004-07-12 WO PCT/US2004/022344 patent/WO2005010937A2/en active Search and Examination
- 2004-07-12 EP EP04778051.5A patent/EP1647173A4/de not_active Withdrawn
- 2004-07-12 CN CN2008102102998A patent/CN101345238B/zh not_active Expired - Fee Related
- 2004-07-12 CN CN200480020214XA patent/CN1823561B/zh not_active Expired - Fee Related
- 2004-07-12 KR KR1020067000831A patent/KR101059918B1/ko not_active IP Right Cessation
- 2004-07-12 JP JP2006520255A patent/JP4795948B2/ja not_active Expired - Fee Related
-
2006
- 2006-11-13 US US11/559,140 patent/US7696610B2/en not_active Expired - Lifetime
-
2009
- 2009-07-13 HK HK09106262.9A patent/HK1127162A1/xx not_active IP Right Cessation
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2010
- 2010-03-08 US US12/719,123 patent/US8018739B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20060113632A (ko) | 2006-11-02 |
CN1823561A (zh) | 2006-08-23 |
CN101345238B (zh) | 2010-12-15 |
WO2005010937A3 (en) | 2005-05-26 |
US8018739B2 (en) | 2011-09-13 |
US20100155912A1 (en) | 2010-06-24 |
EP1647173A2 (de) | 2006-04-19 |
KR101059918B1 (ko) | 2011-08-29 |
EP1647173A4 (de) | 2017-12-27 |
US20080251895A1 (en) | 2008-10-16 |
US7696610B2 (en) | 2010-04-13 |
CN101345238A (zh) | 2009-01-14 |
US20050011656A1 (en) | 2005-01-20 |
CN1823561B (zh) | 2011-09-07 |
US7191516B2 (en) | 2007-03-20 |
WO2005010937A2 (en) | 2005-02-03 |
JP2007531981A (ja) | 2007-11-08 |
JP4795948B2 (ja) | 2011-10-19 |
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PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20140712 |