HK1127162A1 - Packaging of semiconductor devices for increased reliability - Google Patents

Packaging of semiconductor devices for increased reliability

Info

Publication number
HK1127162A1
HK1127162A1 HK09106262.9A HK09106262A HK1127162A1 HK 1127162 A1 HK1127162 A1 HK 1127162A1 HK 09106262 A HK09106262 A HK 09106262A HK 1127162 A1 HK1127162 A1 HK 1127162A1
Authority
HK
Hong Kong
Prior art keywords
integrated circuit
radiation
packaging
semiconductor devices
circuit die
Prior art date
Application number
HK09106262.9A
Other languages
English (en)
Inventor
Patterson Janet
Original Assignee
Maxwell Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maxwell Technologies Inc filed Critical Maxwell Technologies Inc
Publication of HK1127162A1 publication Critical patent/HK1127162A1/xx

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
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    • H01ELECTRIC ELEMENTS
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/552Protection against radiation, e.g. light or electromagnetic waves
    • HELECTRICITY
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • HELECTRICITY
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    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367Cooling facilitated by shape of device
    • H01L23/3677Wire-like or pin-like cooling fins or heat sinks
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    • H01L23/556Protection against radiation, e.g. light or electromagnetic waves against alpha rays
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields
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    • Y10T29/49128Assembling formed circuit to base
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y10T29/4913Assembling to base an electrical component, e.g., capacitor, etc.
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y10T29/4913Assembling to base an electrical component, e.g., capacitor, etc.
    • Y10T29/49139Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture
    • Y10T29/4914Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture with deforming of lead or terminal
    • Y10T29/49142Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture with deforming of lead or terminal including metal fusion
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y10T29/4913Assembling to base an electrical component, e.g., capacitor, etc.
    • Y10T29/49144Assembling to base an electrical component, e.g., capacitor, etc. by metal fusion
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y10T29/49147Assembling terminal to base
    • Y10T29/49149Assembling terminal to base by metal fusion bonding

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
HK09106262.9A 2003-07-16 2009-07-13 Packaging of semiconductor devices for increased reliability HK1127162A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/621,844 US7191516B2 (en) 2003-07-16 2003-07-16 Method for shielding integrated circuit devices

Publications (1)

Publication Number Publication Date
HK1127162A1 true HK1127162A1 (en) 2009-09-18

Family

ID=34063073

Family Applications (1)

Application Number Title Priority Date Filing Date
HK09106262.9A HK1127162A1 (en) 2003-07-16 2009-07-13 Packaging of semiconductor devices for increased reliability

Country Status (7)

Country Link
US (3) US7191516B2 (de)
EP (1) EP1647173A4 (de)
JP (1) JP4795948B2 (de)
KR (1) KR101059918B1 (de)
CN (2) CN101345238B (de)
HK (1) HK1127162A1 (de)
WO (1) WO2005010937A2 (de)

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US20070164424A1 (en) * 2003-04-02 2007-07-19 Nancy Dean Thermal interconnect and interface systems, methods of production and uses thereof
KR20060025155A (ko) * 2003-06-06 2006-03-20 허니웰 인터내셔날 인코포레이티드 열적 상호접속 시스템, 그 제조 방법 및 사용법
US7191516B2 (en) * 2003-07-16 2007-03-20 Maxwell Technologies, Inc. Method for shielding integrated circuit devices
US8154881B2 (en) * 2006-11-13 2012-04-10 Telecommunication Systems, Inc. Radiation-shielded semiconductor assembly
EP2112471A1 (de) * 2008-04-22 2009-10-28 Microcomponents AG Montagevorrichtung für elektronisches Bauteil
CN101572260B (zh) * 2008-04-30 2011-04-20 南亚科技股份有限公司 多芯片堆叠封装体
US7741567B2 (en) * 2008-05-19 2010-06-22 Texas Instruments Incorporated Integrated circuit package having integrated faraday shield
US7835207B2 (en) 2008-10-07 2010-11-16 Micron Technology, Inc. Stacked device remapping and repair
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US8018739B2 (en) 2011-09-13
US20100155912A1 (en) 2010-06-24
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US7696610B2 (en) 2010-04-13
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CN1823561B (zh) 2011-09-07
US7191516B2 (en) 2007-03-20
WO2005010937A2 (en) 2005-02-03
JP2007531981A (ja) 2007-11-08
JP4795948B2 (ja) 2011-10-19

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