CN1898744A - 低电压工作动态随机访问存储器电路 - Google Patents

低电压工作动态随机访问存储器电路 Download PDF

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Publication number
CN1898744A
CN1898744A CNA2004800266531A CN200480026653A CN1898744A CN 1898744 A CN1898744 A CN 1898744A CN A2004800266531 A CNA2004800266531 A CN A2004800266531A CN 200480026653 A CN200480026653 A CN 200480026653A CN 1898744 A CN1898744 A CN 1898744A
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CN
China
Prior art keywords
transistor
voltage
drain electrode
signal
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2004800266531A
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English (en)
Chinese (zh)
Inventor
邱源城
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZMOS Technology Inc
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ZMOS Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ZMOS Technology Inc filed Critical ZMOS Technology Inc
Publication of CN1898744A publication Critical patent/CN1898744A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408—Address circuits
    • G11C11/4085—Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4094—Bit-line management or control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/02—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding parasitic signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/065—Differential amplifiers of latching type
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/08—Control thereof
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/005—Transfer gates, i.e. gates coupling the sense amplifier output to data lines, I/O lines or global bit lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22—Control and timing of internal memory operations
    • G11C2207/2227—Standby or low power modes

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Vehicle Body Suspensions (AREA)
  • Logic Circuits (AREA)
CNA2004800266531A 2003-09-05 2004-09-03 低电压工作动态随机访问存储器电路 Pending CN1898744A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US50066203P 2003-09-05 2003-09-05
US60/500,662 2003-09-05

Publications (1)

Publication Number Publication Date
CN1898744A true CN1898744A (zh) 2007-01-17

Family

ID=34272981

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2004800266531A Pending CN1898744A (zh) 2003-09-05 2004-09-03 低电压工作动态随机访问存储器电路

Country Status (9)

Country Link
US (3) US7082048B2 (enExample)
EP (1) EP1661137B1 (enExample)
JP (1) JP2007504594A (enExample)
KR (1) KR20060119934A (enExample)
CN (1) CN1898744A (enExample)
AT (1) ATE439672T1 (enExample)
CA (1) CA2537632A1 (enExample)
DE (1) DE602004022561D1 (enExample)
WO (1) WO2005024834A2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103077739A (zh) * 2012-12-31 2013-05-01 清华大学 一种冗余结构动态随机访问存储单元
CN103531229A (zh) * 2013-10-18 2014-01-22 上海工程技术大学 一种静态随机存储器
CN115620767A (zh) * 2021-07-12 2023-01-17 长鑫存储技术有限公司 存储器的检测方法和存储器的检测装置

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US7287171B1 (en) 2004-03-08 2007-10-23 Altera Corporation Systems and methods for reducing static and total power consumption in programmable logic device architectures
TW200721163A (en) * 2005-09-23 2007-06-01 Zmos Technology Inc Low power memory control circuits and methods
US7755964B2 (en) * 2006-10-25 2010-07-13 Qualcomm Incorporated Memory device with configurable delay tracking
KR100897282B1 (ko) * 2007-11-07 2009-05-14 주식회사 하이닉스반도체 리시버 회로
KR101096225B1 (ko) * 2008-08-21 2011-12-22 주식회사 하이닉스반도체 반도체 메모리 장치 및 그 구동방법
JP2012190522A (ja) 2011-03-14 2012-10-04 Elpida Memory Inc 半導体装置
TWI457575B (zh) * 2012-04-06 2014-10-21 Ind Tech Res Inst 具有自我測試的像素陣列模組及其自我測試方法
US8896344B1 (en) 2013-01-04 2014-11-25 Altera Corporation Heterogeneous programmable device and configuration software adapted therefor
KR20170013488A (ko) * 2015-07-27 2017-02-07 에스케이하이닉스 주식회사 반도체장치 및 반도체시스템
US10656995B2 (en) 2018-10-03 2020-05-19 Micron Technology, Inc. Copy-back operations in a memory device
KR102615012B1 (ko) 2018-11-12 2023-12-19 삼성전자주식회사 메모리 장치 및 그것의 동작 방법
CN114400999A (zh) 2020-12-21 2022-04-26 台湾积体电路制造股份有限公司 电路及其操作方法

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KR100568544B1 (ko) * 2004-09-20 2006-04-07 삼성전자주식회사 계층적 비트 라인 구조를 가지는 반도체 메모리 장치 및반도체 메모리 장치의 동작 방법

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103077739A (zh) * 2012-12-31 2013-05-01 清华大学 一种冗余结构动态随机访问存储单元
CN103531229A (zh) * 2013-10-18 2014-01-22 上海工程技术大学 一种静态随机存储器
CN115620767A (zh) * 2021-07-12 2023-01-17 长鑫存储技术有限公司 存储器的检测方法和存储器的检测装置

Also Published As

Publication number Publication date
EP1661137A4 (en) 2007-05-30
US20060227593A1 (en) 2006-10-12
US7082048B2 (en) 2006-07-25
WO2005024834A2 (en) 2005-03-17
US7839701B2 (en) 2010-11-23
DE602004022561D1 (de) 2009-09-24
US7324390B2 (en) 2008-01-29
US20050083769A1 (en) 2005-04-21
US20080008018A1 (en) 2008-01-10
EP1661137A2 (en) 2006-05-31
EP1661137B1 (en) 2009-08-12
CA2537632A1 (en) 2005-03-17
WO2005024834A3 (en) 2005-12-15
JP2007504594A (ja) 2007-03-01
KR20060119934A (ko) 2006-11-24
ATE439672T1 (de) 2009-08-15

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