CN104716196A - 薄膜晶体管及其制作方法、阵列基板及显示装置 - Google Patents

薄膜晶体管及其制作方法、阵列基板及显示装置 Download PDF

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CN104716196A
CN104716196A CN201510121068.XA CN201510121068A CN104716196A CN 104716196 A CN104716196 A CN 104716196A CN 201510121068 A CN201510121068 A CN 201510121068A CN 104716196 A CN104716196 A CN 104716196A
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active layer
electrode
film transistor
insulating barrier
drain electrode
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CN104716196B (zh
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张立
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BOE Technology Group Co Ltd
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Priority to KR1020167031863A priority patent/KR101863217B1/ko
Priority to US14/914,228 priority patent/US9882063B2/en
Priority to PCT/CN2015/086443 priority patent/WO2016145769A1/zh
Priority to JP2016567745A priority patent/JP6521534B2/ja
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Abstract

本发明涉及半导体器件制备技术领域,公开了一种薄膜晶体管及其制作方法、阵列基板及显示装置。所述薄膜晶体管的源电极和漏电极位于有源层上,整个有源层位于同一平面内,克服了现有技术中有源层由于爬坡困难导致的易断线问题,而且有源层的厚度均匀,不会出现击穿短路现象,提高了薄膜晶体管的良率。并设置源电极和漏电极为非同层结构,能够灵活调节源电极和漏电极的距离,更易实现窄沟道,提高薄膜晶体管的性能。

Description

薄膜晶体管及其制作方法、阵列基板及显示装置
技术领域
本发明涉及半导体器件制备技术领域,特别是涉及一种薄膜晶体管及其制作方法、阵列基板及显示装置。
背景技术
结合图1和图2所示,在共面薄膜晶体管(Thin Film Transistor,简称TFT)中,源电极3、漏电极4和栅电极1均设置在有源层2的同一侧上。根据栅电极1相对有源层2的位置,共面TFT其分为顶栅型共面TFT(结合图1所示)和底栅型共面TFT(结合图2所示)。
薄膜晶体管液晶显示器(Thin Film Transistor Liquid Crystal Display,简称TFT-LCD)具有体积小、功耗低、无辐射、制造成本相对较低等特点,在当前的平板显示器市场占据了主导地位。当共面TFT用于TFT-LCD中时,对于顶栅型共面TFT,如图1所示,像素电极5通过贯穿钝化层102和栅绝缘层101的过孔与漏电极4电性接触,由于过孔的深度过大,导致爬坡困难,像素电极5容易断线,出现电性接触不良。而如果以跳接的形式实现像素电极5与漏电极4的电性连接时,会增加Mask数量,提高生产成本。而对于底栅型共面TFT,如图2所示,有源层2搭接在源电极3和漏电极4上,形成源电极3和漏电极4的刻蚀工艺导致源漏金属的侧面粗糙,由于有源层2的厚度很薄,当其搭接在源电极3和漏电极4上时,源电极3和漏电极4的侧面粗糙和爬坡问题,导致有源层2容易断线,而且厚度不均匀,在加电过程中容易击穿短路。
发明内容
本发明提供一种薄膜晶体管及其制作方法,用以解决共面薄膜晶体管及其应用存在的上述技术问题。
本发明还通过一种阵列基板及显示装置,通过采用上述的薄膜晶体管,用以提高器件的良率。
为解决上述技术问题,本发明实施例中提供一种薄膜晶体管,包括:
有源层,整个所述有源层位于同一平面内;
位于有源层上、与所述有源层接触设置的源电极;
位于源电极上的第一绝缘层,所述第一绝缘层包括第一过孔;
位于所述第一绝缘层上的漏电极,所述漏电极通过第一过孔与有源层接触。
本发明实施例中还提供一种薄膜晶体管的制作方法,包括:
形成有源层,整个所述有源层位于同一平面内;
在所述有源层上形成与所述有源层接触设置的源电极;
在所述源电极上形成第一绝缘层,并在所述第一绝缘层中形成第一过孔;
在所述第一绝缘层上形成漏电极,所述漏电极通过第一过孔与有源层接触。
同时,本发明实施例中还提供一种阵列基板,包括:
如上所述的薄膜晶体管;
覆盖薄膜晶体管的漏电极的第二绝缘层;
位于所述第二绝缘层上的像素电极,所述第二绝缘层中具有第三过孔,所述像素电极通过所述第三过孔与薄膜晶体管的漏电极电性接触。
本发明实施例中还提供一种显示装置,包括如上所述的阵列基板。
本发明的上述技术方案的有益效果如下:
上述技术方案中,通过设置薄膜晶体管的源电极和漏电极位于有源层上,保证有源层位于同一平面内,克服了现有技术中有源层由于爬坡困难导致的易断线问题,而且有源层的厚度均匀,不会出现击穿短路现象,提高了薄膜晶体管的良率。并设置源电极和漏电极为非同层结构,能够灵活调节源电极和漏电极的距离,更易实现窄沟道,提高薄膜晶体管的性能。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动性的前提下,还可以根据这些附图获得其他的附图。
图1表示现有技术中顶栅型共面薄膜晶体管阵列基板的结构示意图;
图2表示现有技术中底栅型共面薄膜晶体管阵列基板的结构示意图;
图3表示本发明实施例中共面薄膜晶体管阵列基板的结构示意图;
图4-图9表示本发明实施例中共面薄膜晶体管阵列基板的制作过程示意图。
具体实施方式
本发明提供一种薄膜晶体管,其源电极和漏电极位于有源层上,整个有源层位于同一平面内,从而有源层不存在爬坡困难导致的易断线问题,而且有源层的厚度均匀,在工作过程中不易出现击穿短路现象,提高了薄膜晶体管的良率。并设置源电极和漏电极为非同层结构,能够灵活调节源电极和漏电极的距离,更易实现窄沟道,提高薄膜晶体管的性能。
对于液晶显示器件,阵列基板上与薄膜晶体管的漏电极电性接触的电极为透明的像素电极,材料可以为铟锡氧化物(ITO)或铟锌氧化物(IZO)。对于有机发光二极管(OLED)显示器件,阵列基板上与驱动薄膜晶体管的漏电极电性接触的底电极为OLED的阴极或阳极,其可以为透明导电材料,也可以为不透明导电材料(如:Cu、Al),并且,通常底电极又称作像素电极(本发明均称其为像素电极)。
下面将结合附图和实施例,对本发明的具体实施方式作进一步详细描述。以下实施例用于说明本发明,但不用来限制本发明的范围。
结合图3和图8所示,本发明实施例中提供一种薄膜晶体管,其整个有源层2位于同一平面内。所述薄膜晶体管的源电极3和漏电极4位于有源层2上,并与有源层2接触设置。源电极3和漏电极4之间设置有第一绝缘层130。漏电极4设置在第一绝缘层130上,通过第一绝缘层130中的第一过孔6与有源层2接触。
上述技术方案中,有源层2位于同一平面内,不会出现爬坡困难导致的易断线问题,而且其厚度均匀,在工作过程中不易击穿短路,克服了现有技术中底栅型共面薄膜晶体管存在的技术问题。同时,源电极3和漏电极4为非同层结构,更易实现窄沟道,提高薄膜晶体管的性能。
结合图3-图8所示,本发明实施例中薄膜晶体管的制作方法包括:
形成有源层2,整个所述有源层2位于同一平面内;
在有源层2上形成与有源层2接触设置的源电极3;
在源电极3上形成第一绝缘层130,并在第一绝缘层130中形成第一过孔6;
在第一绝缘层130上形成漏电极4,漏电极4通过第一过孔6与有源层2接触。
其中,源电极3可以位于薄膜晶体管的有源层2所在的区域内,且整个源电极3与有源层2接触设置,如图3所示。则在实际制作工艺中,可以通过一次构图工艺中同时形成源电极3和有源层2,以简化制作工艺。结合图4-图7所示,形成源电极3和有源层2的构图工艺具体包括:
形成有源层薄膜110;
在有源层薄膜110上形成源金属层120,如图4所示;
在源金属层120上涂覆光刻胶,对光刻胶进行曝光、显影,形成光刻胶完全保留区域200、光刻胶半保留区域201和光刻胶不保留区域202,光刻胶完全保留区域200对应薄膜晶体管的源电极所在的区域,光刻胶半保留区域201对应薄膜晶体管的有源层不与源电极位置对应的区域,光刻胶不保留区域202对应其他区域,如图5所示;
刻蚀掉光刻胶不保留区域202的源金属层和有源层薄膜,形成有源层2的图案,如图6所示;
去除光刻胶半保留区域201的光刻胶;
刻蚀掉光刻胶半保留区域201的源金属层;
剥离剩余的光刻胶,形成薄膜晶体管的有源层2和源电极3,如图7所示。
上述步骤通过一次构图工艺同时形成薄膜晶体管的有源层2和源电极3,其中,源电极3与漏电极4为非同层结构,两者由不同膜层形成。
相对于现有技术中的顶栅型共面结构,通过一次构图工艺同时形成薄膜晶体管的有源层2和源电极3,可以有效减小源电极3的宽度,在薄膜晶体管的投影宽度一定的情况下,能够适当增加漏电极4的宽度(对比图1和图3),则可以设计栅电极和阵列基板的像素电极5为同层结构,并保证栅电极和像素电极5之间的距离足够远,使两者之间形成的耦合电容足够小,不会影响器件的性能。此时,漏电极4与像素电极5之间可以仅设置一层第二绝缘层140,则像素电极5通过第二绝缘层140中的过孔与漏电极4电性接触时,过孔深度较小,不易出现断线的问题,提高了器件的良率。
本发明实施例中,顶栅型共面薄膜晶体管的栅电极包括位于第二绝缘层140上的第一部分10,第一部分10具有对应源电极3和漏电极4之间区域的部分。优选地,栅电极的第一部分10与阵列基板的像素电极5为同层结构,由同一膜层形成,具体的:
在第二绝缘层140上形成导电层,对所述导电层进行构图工艺,形成栅电极的第一部分10和像素电极5,栅电极的第一部分10具有对应源电极3和漏电极4之间区域的部分。
则,薄膜晶体管的制作方法还包括:
形成覆盖漏电极4的第二绝缘层140;
形成栅电极,所述栅电极包括位于第二绝缘层140上的第一部分10,第一部分10具有对应源电极3和漏电极4之间区域的部分,结合图3所示。
其中,栅电极的第一部分10与阵列基板的像素电极5为同层结构,由同一导电层形成。像素电极5通过第二绝缘层140中的第三过孔8与漏电极4电性接触,结合图3和图9所示。由于像素电极5和漏电极4之间只有一层第二绝缘层140,第三过孔8的深度较小,像素电极5不会出现爬坡困难导致的易断线问题,提高了器件的良率。
进一步地,设置栅电极还包括第二部分11,与栅电极的第一部分10电性连接,其材料为栅金属,可以在不改变传输信号的配线结构的前提下,仍然通过栅线(由栅金属层形成,与栅电极的第二部分11为同层结构)向栅电极传输开启或关闭薄膜晶体管的信号,不会增加制作工艺,便于实现。其中,栅电极的第二部分11可以与漏电极4为同层结构,由同一栅金属层形成。并且,第二绝缘层140覆盖栅电极的第二部分11和漏电极4。
作为一个优选的实施方式,阵列基板为顶栅型共面薄膜晶体管阵列基板,薄膜晶体管的栅电极包括第一部分10和第二部分11。第一部分10具有对应源电极3和漏电极4之间区域的部分,并与阵列基板的像素电极5为同层结构。第二部分11的材料为栅金属,与漏电极4为同层结构,源电极3由源金属层形成。栅电极的第一部分10与第二部分11之间设置有第二绝缘层140,并通过第二绝缘层140中的第二过孔7电性接触。相应地,阵列基板的制作方法包括:
形成薄膜晶体管的有源层2和源电极3,源电极3与有源层2电性接触;
形成栅金属层,对所述栅金属层进行构图工艺,形成栅电极的第二部分11和漏电极4;
形成覆盖漏电极4的第二绝缘层140;
在第二绝缘层140上形成导电层,对所述导电层进行构图工艺,形成栅电极的第一部分10和阵列基板的像素电极5,所述栅电极的第一部分10具有对应源电极3和漏电极4之间区域的部分,并通过第二绝缘层140中的第二过孔7与第二部分11电性接触,像素电极5通过第二绝缘层140中的第三过孔8与漏电极4电性接触。
上述步骤中,优选地,薄膜晶体管的有源层2和源电极3通过一次构图工艺形成,以简化制作工艺。当然,也可以通过两次构图工艺,分别形成有源层2和源电极3。
对于顶栅型共面薄膜晶体管,当栅电极包括材料为栅金属并与漏电极4为同层结构的第二部分11时,优选地,设置第二部分11位于源电极3远离漏电极4的一侧,如图3所示,以减小第二部分11与源电极3、漏电极4之间形成的耦合电容,提高器件的显示品质。
结合图3所示,本发明实施例中的薄膜晶体管具体包括:
有源层2,整个所述有源层2位于同一平面内;
设置在有源层2上的源电极3,位于有源层2所在的区域内,且整个源电极2与有源层2接触设置;
设置在源电极3上的第一绝缘层130,第一绝缘层130中具有第一过孔;
设置在第一绝缘层130上的栅电极的第二部分11和漏电极4,漏电极4通过所述第一过孔与有源层2接触设置,栅电极的第二部分11和漏电极4为同层结构,材料为栅金属,第二部分11位于源电极3远离漏电极4的一侧;
设置在漏电极4上的第二绝缘层140,第二绝缘层140中具有第二过孔7和第三过孔8;
设置在第二绝缘层140上的栅电极的第一部分10,通过所述第二过孔7与第二部分11电性接触。
本发明实施例中的阵列基板具体包括:
上述的薄膜晶体管;
覆盖薄膜晶体管的漏电极4的第二绝缘层140;
像素电极5,设置在第二绝缘层140上,与栅电极的第一部分10为同层结构,通过第二绝缘层140中的第三过孔与漏电极4电性接触。
结合图3-图9所示,本发明实施例中薄膜晶体管的制作方法具体包括:
步骤S1、提供一衬底基板100,如:玻璃基板、石英基板、有机树脂基板等透明基板,并在衬底基板100上形成有源层2和源电极3。
其中,有源层2的材料可以为硅半导体,也可以为金属氧化物半导体。源电极3的材料为Cu,Al,Ag,Mo,Cr,Nd,Ni,Mn,Ti,Ta,W等金属以及这些金属的合金,源电极3可以为单层结构或者多层结构,多层结构比如Cu\Mo,Ti\Cu\Ti,Mo\Al\Mo等。
具体的:
在衬底基板100上依次形成有源层薄膜110和源金属层120;
在源金属层120上涂覆光刻胶,对光刻胶进行曝光、显影,形成光刻胶完全保留区域200、光刻胶半保留区域201和光刻胶不保留区域202,光刻胶完全保留区域200对应薄膜晶体管的源电极所在的区域,光刻胶半保留区域201对应薄膜晶体管的有源层不与源电极位置对应的区域,光刻胶不保留区域202对应其他区域,如图5所示;
刻蚀掉光刻胶不保留区域202的源金属层和有源层薄膜,形成有源层的图案2,如图6所示;
去除光刻胶半保留区域201的光刻胶;
刻蚀掉光刻胶半保留区域201的源金属层;
剥离剩余的光刻胶,形成薄膜晶体管的有源层2和源电极3,如图7所示。
步骤S2、在完成步骤S1的衬底基板100上形成第一绝缘层130,对第一绝缘层130进行构图工艺形成第一过孔6,露出有源层2,如图8所示。
第一绝缘层130可以是SiNx,SiOx或Si(ON)x。
步骤S3、在完成步骤S2的衬底基板100上形成栅金属层(图中未示出),对所述栅金属层进行构图工艺,形成栅电极的第二部分11、漏电极4和栅线,其中,栅电极的第二部分11与栅线电性连接,漏电极4通过第一过孔6与有源层2电性接触,结合图8和图9所示;
其中,栅金属层可以是Cu,Al,Ag,Mo,Cr,Nd,Ni,Mn,Ti,Ta,W等金属以及这些金属的合金,栅金属层可以为单层结构或者多层结构,多层结构比如Cu\Mo,Ti\Cu\Ti,Mo\Al\Mo等。
步骤S4、在完成步骤S3的衬底基板100上形成第二绝缘层140,对第二绝缘层140进行构图工艺形成第二过孔7和第三过孔8,如图9所示。
第二绝缘层140可以是SiNx,SiOx或Si(ON)x。
步骤S5、在完成步骤S4的衬底基板100上形成导电层,对所述导电层进行构图工艺,形成栅电极的第一部分10,栅电极的第一部分10具有对应源电极3和漏电极4之间区域的部分,通过第二过孔7与第二部分11电性接触,结合图3和图9所示。
至此完成薄膜晶体管的制作。
本发明实施例中阵列基板的制作方法具体包括:
通过上述步骤S1-S5形成薄膜晶体管,并在步骤S5中形成栅电极的第一部分10的同时,形成阵列基板的像素电极5,像素电极5通过第三过孔8与漏电极4电性接触,结合图3和图9所示。
其中,形成栅电极的第一部分10和像素电极5的步骤具体为:
在完成步骤S4的衬底基板100上形成导电层,对所述导电层进行构图工艺,形成栅电极的第一部分10和像素电极5。
本发明实施例中还提供一种显示装置,包括如上所述的阵列基板,用以提高显示器件的良率和显示品质。
所述显示装置可以为液晶显示装置,也可以为有机发光二极管显示装置。具体的,所述显示装置可以为:液晶面板、电子纸、OLED面板、手机、平板电脑、电视机、显示器、笔记本电脑、数码相框、导航仪等任何具有显示功能的产品或部件。
本发明的技术方案,通过设置薄膜晶体管的源电极和漏电极位于有源层上,保证有源层位于同一平面内,克服了现有技术中有源层由于爬坡困难导致的易断线问题,而且有源层的厚度均匀,不会出现击穿短路现象,提高了薄膜晶体管的良率。并设置源电极和漏电极为非同层结构,能够灵活调节源电极和漏电极的距离,更易实现窄沟道,提高薄膜晶体管的性能。
以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本发明技术原理的前提下,还可以做出若干改进和替换,这些改进和替换也应视为本发明的保护范围。

Claims (15)

1.一种薄膜晶体管,其特征在于,包括:
有源层,整个所述有源层位于同一平面内;
位于有源层上、与所述有源层接触设置的源电极;
位于源电极上的第一绝缘层,所述第一绝缘层包括第一过孔;
位于所述第一绝缘层上的漏电极,所述漏电极通过第一过孔与有源层接触。
2.根据权利要求1所述的薄膜晶体管,其特征在于,还包括:
覆盖漏电极的第二绝缘层;
栅电极,包括位于所述第二绝缘层上的第一部分,所述第一部分具有对应源电极和漏电极之间区域的部分。
3.根据权利要求2所述的薄膜晶体管,其特征在于,所述栅电极还包括第二部分,与栅电极的第一部分电性连接;
所述漏电极与所述栅电极的第二部分为同层结构,所述第二绝缘层覆盖所述栅电极的第二部分和漏电极。
4.根据权利要求3所述的薄膜晶体管,其特征在于,所述栅电极的第二部分位于源电极远离漏电极的一侧。
5.根据权利要求3所述的薄膜晶体管,其特征在于,所述第二绝缘层包括第二过孔,所述栅电极的第一部分通过所述第二过孔与栅电极的第二部分电性接触。
6.根据权利要求3所述的薄膜晶体管,其特征在于,所述栅电极的第二部分和漏电极的材料为栅金属。
7.根据权利要求2所述的薄膜晶体管,其特征在于,所述栅电极的第一部分为透明导电材料。
8.根据权利要求1-7任一项所述的薄膜晶体管,其特征在于,所述源电极位于薄膜晶体管的有源层所在的区域内,且整个源电极与所述有源层接触设置。
9.一种薄膜晶体管的制作方法,其特征在于,包括:
形成有源层,整个所述有源层位于同一平面内;
在所述有源层上形成与所述有源层接触设置的源电极;
在所述源电极上形成第一绝缘层,并在所述第一绝缘层中形成第一过孔;
在所述第一绝缘层上形成漏电极,所述漏电极通过第一过孔与有源层接触。
10.根据权利要求9所述的制作方法,其特征在于,还包括:
形成覆盖漏电极的第二绝缘层;
形成栅电极,所述栅电极包括位于所述第二绝缘层上的第一部分,所述第一部分具有对应源电极和漏电极之间区域的部分。
11.根据权利要求10所述的制作方法,其特征在于,所述制作方法还包括:
在所述第二绝缘层中形成第二过孔;
形成栅电极和漏电极的步骤包括:
在所述第一绝缘层上形成栅金属层,对所述栅金属层进行构图工艺,形成栅电极的第二部分和漏电极,所述漏电极通过第一绝缘层中的第一过孔与有源层接触;
在所述第二绝缘层上形成导电层,对所述导电层进行构图工艺,形成栅电极的第一部分,所述栅电极的第一部分具有对应源电极和漏电极之间区域的部分,并通过第二绝缘层中的第二过孔与栅电极的第二部分电性接触。
12.根据权利要求9-11任一项所述的制作方法,其特征在于,形成有源层和源电极的步骤包括:
形成有源层薄膜;
在所述有源层薄膜上形成源金属层;
在所述源金属层上涂覆光刻胶,对光刻胶进行曝光、显影,形成光刻胶完全保留区域、光刻胶半保留区域和光刻胶不保留区域,所述光刻胶完全保留区域对应薄膜晶体管的源电极所在的区域,所述光刻胶半保留区域对应薄膜晶体管的有源层不与源电极位置对应的区域,所述光刻胶不保留区域对应其他区域;
刻蚀掉光刻胶不保留区域的源金属层和有源层薄膜,形成有源层的图案;
去除光刻胶半保留区域的光刻胶;
刻蚀掉光刻胶半保留区域的源金属层;
剥离剩余的光刻胶,形成薄膜晶体管的有源层和源电极。
13.一种阵列基板,其特征在于,包括:
权利要求1-8任一项所述的薄膜晶体管;
覆盖薄膜晶体管的漏电极的第二绝缘层;
位于所述第二绝缘层上的像素电极,所述第二绝缘层中具有第三过孔,所述像素电极通过所述第三过孔与薄膜晶体管的漏电极电性接触。
14.根据权利要求13所述的阵列基板,其特征在于,还包括:
栅电极,包括位于所述第二绝缘层上的第一部分,所述第一部分具有对应源电极和漏电极之间区域的部分,所述栅电极的第一部分与像素电极为同层结构。
15.一种显示装置,其特征在于,包括权利要求13或14所述的阵列基板。
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