AU2003242859A1 - Scanning probe microscope - Google Patents

Scanning probe microscope

Info

Publication number
AU2003242859A1
AU2003242859A1 AU2003242859A AU2003242859A AU2003242859A1 AU 2003242859 A1 AU2003242859 A1 AU 2003242859A1 AU 2003242859 A AU2003242859 A AU 2003242859A AU 2003242859 A AU2003242859 A AU 2003242859A AU 2003242859 A1 AU2003242859 A1 AU 2003242859A1
Authority
AU
Australia
Prior art keywords
scanning probe
probe microscope
microscope
scanning
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003242859A
Other languages
English (en)
Inventor
Jamie Kayne Hobbs
Andrew David Laver Humphris
Mervyn John Miles
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Bristol
Original Assignee
University of Bristol
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0215581A external-priority patent/GB0215581D0/en
Priority claimed from GB0310344A external-priority patent/GB0310344D0/en
Application filed by University of Bristol filed Critical University of Bristol
Publication of AU2003242859A1 publication Critical patent/AU2003242859A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode
    • G01Q60/34—Tapping mode
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Power Engineering (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
AU2003242859A 2002-07-04 2003-07-04 Scanning probe microscope Abandoned AU2003242859A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB0215581A GB0215581D0 (en) 2002-07-04 2002-07-04 Scanning probe microscope
GB0215581.0 2002-07-04
GB0310344.7 2003-05-06
GB0310344A GB0310344D0 (en) 2003-05-06 2003-05-06 Scanning probe microscope
PCT/GB2003/002903 WO2004005844A2 (en) 2002-07-04 2003-07-04 Scanning probe microscope

Publications (1)

Publication Number Publication Date
AU2003242859A1 true AU2003242859A1 (en) 2004-01-23

Family

ID=30117097

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003242859A Abandoned AU2003242859A1 (en) 2002-07-04 2003-07-04 Scanning probe microscope

Country Status (9)

Country Link
US (1) US7473887B2 (enExample)
EP (1) EP1540270A2 (enExample)
JP (2) JP2005531781A (enExample)
KR (1) KR100961571B1 (enExample)
CN (1) CN1304867C (enExample)
AU (1) AU2003242859A1 (enExample)
CA (1) CA2491404C (enExample)
RU (1) RU2334214C2 (enExample)
WO (1) WO2004005844A2 (enExample)

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RU2462726C2 (ru) * 2010-10-11 2012-09-27 Государственное Научное Учреждение "Институт Тепло- И Массообмена Имени А.В. Лыкова Национальной Академии Наук Беларуси" Способ сканирования на сканирующем зондовом микроскопе и формирования изображения поверхности
CA2825038A1 (en) 2011-01-31 2012-08-09 Infinitesima Limited Adaptive mode scanning probe microscope
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RU2461839C1 (ru) * 2011-03-16 2012-09-20 Государственное образовательное учреждение высшего профессионального образования "Саратовский государственный университет им. Н.Г. Чернышевского" Сканирующий зондовый микроскоп
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EP2932277B1 (en) * 2012-12-12 2024-04-03 Universität Basel Method and device for controlling a scanning probe microscope
CN103197103A (zh) * 2013-03-20 2013-07-10 河南科技大学 纳米尺度静电场的构筑方法和装置
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CN104020317B (zh) * 2014-06-12 2017-05-17 合肥工业大学 双端音叉扫描探针测头系统及其测量方法
KR101607606B1 (ko) * 2015-08-17 2016-03-31 한국표준과학연구원 원자간력 현미경의 측정 방법
CN105467160B (zh) * 2016-01-18 2018-11-30 江南大学 一种射频探针原子力显微镜系统
CN105527463A (zh) * 2016-03-01 2016-04-27 江南大学 一种射频原子力显微镜扫描探针及其制备方法
JP6696570B2 (ja) * 2016-06-02 2020-05-20 株式会社島津製作所 走査型プローブ顕微鏡
JP6885585B2 (ja) * 2017-03-28 2021-06-16 株式会社日立ハイテクサイエンス 走査型プローブ顕微鏡、及びその走査方法
CN107192854B (zh) * 2017-04-18 2020-12-04 天津大学 原子力显微镜的z扫描器和探针装置及探针装置安装器
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KR102840619B1 (ko) * 2018-05-25 2025-07-31 몰레큘라 비스타 인크. 샘플에 대한 광 유도력을 개선하기 위해 센서 분자를 사용하는 스캐닝 프로브 현미경
CN109115258B (zh) * 2018-06-21 2020-10-23 迈克医疗电子有限公司 一种检测装置的校准方法、装置和终端设备
CN108844450B (zh) * 2018-08-30 2020-07-28 江苏静远建设工程有限公司 一种木塑板材表面平整度检测装置
CN109238116B (zh) * 2018-08-30 2020-04-21 南丰县致诚科技有限公司 一种复合板材表面平整度检测装置
CN108981549B (zh) * 2018-08-30 2020-04-10 常州市冠信装饰新材料科技有限公司 一种装饰板材表面平整度检测装置
CN109238115B (zh) * 2018-08-30 2020-02-14 宁夏宏源建科检测有限公司 一种建筑板材表面平整度检测装置
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CN111983260B (zh) * 2020-08-19 2023-04-07 国家纳米科学中心 一种原子力显微镜探针振幅的校准方法
CN113848349B (zh) * 2021-09-09 2025-01-14 国仪量子技术(合肥)股份有限公司 探针自动进针装置及探针自动进针方法
KR102642140B1 (ko) 2021-11-16 2024-02-28 국립안동대학교 산학협력단 원자 현미경
CN114184547B (zh) * 2021-11-29 2024-05-14 重庆川仪自动化股份有限公司 一种基于双闭环的扫描光栅微镜机械摆角的控制方法
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Also Published As

Publication number Publication date
RU2334214C2 (ru) 2008-09-20
KR20050043885A (ko) 2005-05-11
US7473887B2 (en) 2009-01-06
JP2005531781A (ja) 2005-10-20
CA2491404C (en) 2014-09-09
WO2004005844A2 (en) 2004-01-15
CN1304867C (zh) 2007-03-14
WO2004005844A3 (en) 2005-03-24
EP1540270A2 (en) 2005-06-15
KR100961571B1 (ko) 2010-06-04
CA2491404A1 (en) 2004-01-15
CN1672011A (zh) 2005-09-21
JP2010210636A (ja) 2010-09-24
RU2005102703A (ru) 2005-08-20
US20040051542A1 (en) 2004-03-18

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