GB201005252D0 - - Google Patents
Info
- Publication number
- GB201005252D0 GB201005252D0 GB201005252A GB201005252A GB201005252D0 GB 201005252 D0 GB201005252 D0 GB 201005252D0 GB 201005252 A GB201005252 A GB 201005252A GB 201005252 A GB201005252 A GB 201005252A GB 201005252 D0 GB201005252 D0 GB 201005252D0
- Authority
- GB
- United Kingdom
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB201005252A GB201005252D0 (enExample) | 2010-03-29 | 2010-03-29 | |
| US13/636,216 US9052340B2 (en) | 2010-03-29 | 2011-03-29 | Probe assembly for a scanning probe microscope |
| PCT/GB2011/050646 WO2011121348A1 (en) | 2010-03-29 | 2011-03-29 | Probe assembly for a scanning probe microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB201005252A GB201005252D0 (enExample) | 2010-03-29 | 2010-03-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB201005252D0 true GB201005252D0 (enExample) | 2010-05-12 |
Family
ID=42228521
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB201005252A Ceased GB201005252D0 (enExample) | 2010-03-29 | 2010-03-29 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US9052340B2 (enExample) |
| GB (1) | GB201005252D0 (enExample) |
| WO (1) | WO2011121348A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015017765A2 (en) * | 2013-08-01 | 2015-02-05 | Hysitron, Inc. | Instrument changing assembly and methods for the same |
| CN107923928B (zh) * | 2015-05-19 | 2020-07-17 | 南洋理工大学 | 检查样品表面的装置和方法 |
| US9568495B2 (en) * | 2015-05-20 | 2017-02-14 | AIST-NT, Inc. | Systems and methods for non-destructive surface chemical analysis of samples |
| DE102015210159B4 (de) | 2015-06-02 | 2018-09-20 | Carl Zeiss Smt Gmbh | Sondensystem und Verfahren zum Aufnehmen einer Sonde eines Rastersondenmikroskops |
| JP7048964B2 (ja) * | 2018-03-26 | 2022-04-06 | 株式会社日立ハイテクサイエンス | 走査型プローブ顕微鏡及びその走査方法 |
| DE102022202657A1 (de) | 2022-03-17 | 2023-09-21 | Carl Zeiss Smt Gmbh | Wechseln von Sonden für Rastersondenmikroskope |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0487003B1 (en) * | 1990-11-20 | 1997-07-09 | Canon Kabushiki Kaisha | Slope detection method, and information detection/writing apparatus using the method |
| US5157256A (en) | 1991-08-08 | 1992-10-20 | Burleigh Instruments Inc. | System for exchanging samples and electrode tip units in a surface probe microscope |
| JP3126527B2 (ja) | 1992-12-22 | 2001-01-22 | キヤノン株式会社 | 情報処理装置 |
| US5418771A (en) * | 1993-02-25 | 1995-05-23 | Canon Kabushiki Kaisha | Information processing apparatus provided with surface aligning mechanism between probe head substrate and recording medium substrate |
| US5705814A (en) | 1995-08-30 | 1998-01-06 | Digital Instruments, Inc. | Scanning probe microscope having automatic probe exchange and alignment |
| US6028305A (en) | 1998-03-25 | 2000-02-22 | Board Of Trustees Of The Leland Stanford Jr. University | Dual cantilever scanning probe microscope |
| US6196061B1 (en) * | 1998-11-05 | 2001-03-06 | Nanodevices, Inc. | AFM with referenced or differential height measurement |
| US6545492B1 (en) | 1999-09-20 | 2003-04-08 | Europaisches Laboratorium Fur Molekularbiologie (Embl) | Multiple local probe measuring device and method |
| JP3785018B2 (ja) | 2000-03-13 | 2006-06-14 | エスアイアイ・ナノテクノロジー株式会社 | マイクロプローブおよびそれを用いた走査型プローブ装置 |
| KR100829659B1 (ko) | 2001-02-06 | 2008-05-16 | 더 유니버시티 오브 브리스톨 | 근접장 주사 광학 현미경 |
| JP4570363B2 (ja) * | 2001-10-02 | 2010-10-27 | ノースウエスタン ユニヴァーシティ | タンパク質およびペプチドのナノアレイ |
| US7268348B2 (en) | 2002-01-22 | 2007-09-11 | International Business Machines Corporation | Scanning probe for data storage and microscopy |
| US7473887B2 (en) | 2002-07-04 | 2009-01-06 | University Of Bristol Of Senate House | Resonant scanning probe microscope |
| JP2006125984A (ja) | 2004-10-28 | 2006-05-18 | Japan Science & Technology Agency | デイジー型カンチレバーホイールを有する計測装置 |
| US8261662B1 (en) * | 2004-11-08 | 2012-09-11 | Nanolnk, Inc. | Active pen nanolithography |
| GB0621560D0 (en) | 2006-10-31 | 2006-12-06 | Infinitesima Ltd | Probe assembly for a scanning probe microscope |
| US7597717B1 (en) | 2007-06-25 | 2009-10-06 | The United States Of America As Represented By The Secretary Of The Navy | Rotatable multi-cantilever scanning probe microscopy head |
-
2010
- 2010-03-29 GB GB201005252A patent/GB201005252D0/en not_active Ceased
-
2011
- 2011-03-29 US US13/636,216 patent/US9052340B2/en active Active
- 2011-03-29 WO PCT/GB2011/050646 patent/WO2011121348A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US20130014296A1 (en) | 2013-01-10 |
| US9052340B2 (en) | 2015-06-09 |
| WO2011121348A1 (en) | 2011-10-06 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AT | Applications terminated before publication under section 16(1) |