WO2003006407A1 - Procédé de production de composé d'éther - Google Patents
Procédé de production de composé d'éther Download PDFInfo
- Publication number
- WO2003006407A1 WO2003006407A1 PCT/JP2002/007117 JP0207117W WO03006407A1 WO 2003006407 A1 WO2003006407 A1 WO 2003006407A1 JP 0207117 W JP0207117 W JP 0207117W WO 03006407 A1 WO03006407 A1 WO 03006407A1
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- compound
- general formula
- acid
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Classifications
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C41/00—Preparation of ethers; Preparation of compounds having groups, groups or groups
- C07C41/48—Preparation of compounds having groups
- C07C41/50—Preparation of compounds having groups by reactions producing groups
- C07C41/54—Preparation of compounds having groups by reactions producing groups by addition of compounds to unsaturated carbon-to-carbon bonds
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C67/00—Preparation of carboxylic acid esters
- C07C67/04—Preparation of carboxylic acid esters by reacting carboxylic acids or symmetrical anhydrides onto unsaturated carbon-to-carbon bonds
Definitions
- the present invention relates to a method for producing an ether compound which is useful for applications such as a chemically amplified resist composition, a synthetic intermediate for pharmaceuticals, and a paint, and a protecting agent for a hydroxyl group which provides a protected hydroxyl group.
- Alkyl vinyl ether-derived esters and esters are easily removed from groups derived from alkyl vinyl ether by heat or an acid catalyst. Useful for body, paint, etc. For example, it is known to use hemiacetal esters and acetal derived from alkyl vinyl ether in a chemically amplified resist composition.
- Amyl ester and acyl ester derived from alkyl vinyl ether are usually produced by reacting an alkyl vinyl ether with a compound having a carboxyl group in the presence of an acid catalyst or the like.
- an acid catalyst or the like For example, when ethyl vinyl ether or the like is reacted with a compound having a carboxyl group, there is a problem that by-products such as a polymer such as ethyl vinyl ether are generated.
- the polymer when a polymer containing a carboxyl group that has been esterified using ethyl vinyl ester is used in a chemically amplified resist composition, the polymer may be spin-coated on a silicon wafer.
- a study was made on the reaction of linear alkyl vinyl ethers with compounds having a carboxyl group in the presence of various acids. We are studying the synthesis of miase ester.
- An object of the present invention is to provide a method for producing an ether compound which is useful in applications such as a chemically amplified resist composition, an intermediate for the synthesis of pharmaceuticals, and a coating material, with little side reaction and in a high yield, and having excellent thermal stability.
- An object of the present invention is to provide a hydroxyl group protecting agent or the like which provides a protected hydroxyl group. The present invention provides the following [1] to [9].
- RR 2 and R 3 are the same or different and represent a substituted or unsubstituted alkyl, a substituted or unsubstituted aryl or a substituted or unsubstituted aralkyl, or R 1 and R 2 are adjacent Reacting with an alkenyl ether represented by the formula:
- a compound having a carboxyl group is represented by the general formula (I)
- a compound having a hydroxyl group is represented by the general formula (I)
- the alkenyl ether represented by the general formula (I) may be referred to as a compound (I).
- a compound having a group represented by the general formula (II) may be referred to as a compound (II).
- RR 2 and R 3 are as defined above, and R 4 is a hydrogen atom or Or a lower alkyl).
- alkenyl ether represented by the general formula (I) may be referred to as a compound (I)
- ether compound having a group represented by the general formula (II) may be referred to as a compound (II).
- alkyl represents, for example, linear or branched alkyl having 1 to 18 carbon atoms, and specifically, methyl, ethyl, propyl, isopropyl, butyl, isobutyl , Sec-butyl, tert-butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, dodecyl, octyl decyl and the like.
- alkyl having 1 to 6 carbon atoms is preferable, and furthermore, Alkyl having 1 to 3 carbon atoms is more preferred.
- Lower alkyl represents, for example, straight-chain or branched alkyl having 1 to 6 carbon atoms, and specifically, methyl, ethyl, propyl, isopropyl, butyl, isoptyl, sec-butyl, tert-butyl, pentyl, Hexyl and the like.
- Examples of the cycloalkyl formed by R 1 and R 2 taken together with the adjacent carbon atom include a cycloalkyl having 3 to 8 carbon atoms. Specific examples thereof include cyclopropyl, cyclobutyl, cyclobutyl, cyclopentyl, and cycloalkyl. Hexyl, cycloheptyl, cyclooctyl and the like.
- aryl examples include phenyl, naphthyl and the like.
- aralkyl examples include aralkyl having 7 to 15 carbon atoms, and specific examples include benzyl, phenethyl, naphthylmethyl, naphthylethyl, and the like.o
- alkyl substituent examples include alkoxy, alkanoyl, cyano, nitro, halogen, alkoxycarbonyl and the like.
- alkyl moiety of alkoxy and alkoxycarbonyl include the same as those exemplified for the aforementioned alkyl.
- alkanoyl examples include straight-chain or branched alkanols having 1 to 7 carbon atoms, and specific examples include formyl, acetyl, propionyl, butyryl, isobutyryl, valeryl, isovaleryl, vivaloyl, hexanoyl, Heptanoyl and the like.
- halogen examples include fluorine, chlorine, bromine, and iodine atoms.
- substituent of aryl and aralkyl examples include alkyl, alkoxy, alkanol, cyano, nitro, halogen, alkoxycarbonyl and the like.
- alkyl, alkoxy, alkanoyl, halogen and alkoxycarbonyl are the same as described above.
- examples of the compound having a hydroxyl group include alcohols, phenols, and compounds having a carboxyl group. Among them, compounds having a carboxyl group are preferable.
- RR 2 and R 3 are preferably both alkyl.
- the compound (I) include, for example, 1-methoxy-2-methylpropene, 1-ethoxy-12-methylpropene, 1-propoxy-12-methylpropene, 1-isopropoxy-2-methylpropene, 1- Butoxy 2-methylpropene, 1-isobutoxy-12-propene, 1- (tert-butoxy) -12-methylpropene, 1-pentyloxy-2-methylpropene, 1-isopentyloxy-12-methylpropene, 11 Neopentyloxy 1-methylpropene, 1- (tert-pentyloxy) 1-2-methylpropene, 1-hexyloxy-2-methylpropene, 1-isohexyloxy1-2-methylpropene, 1- (2- 2-methylpropene, 1-heptyloxy 2-methylpropene, 1-octyl 2-methylpropene, 1-nonyloxy-2-methylpropene, 1-denoyloxy-2-methylpropene, 1-dodecanyloxy-2-methylprobene, 1-year
- the compound (I) one type, or two or more types are used.
- the compound having a carboxyl group may be a saturated or unsaturated compound, for example, formic acid, acetic acid, propionic acid, propiolic acid, butyric acid, isobutyric acid, hexanoic acid, heptanoic acid, octylic acid, nonanoic acid, isononanoic acid
- Monocarboxylic acids such as, decanoic acid, dodecanoic acid, stearic acid, benzoic acid, cinnamic acid, 2-naphthoic acid, nicotinic acid, isonicotinic acid, aminic acid fatty acid, tall oil fatty acid, soybean oil fatty acid, and dehydrated castor oil fatty acid , Succinic acid, glutaric acid, adipic acid, azelaic acid, sebacic acid, dodecandic acid, compounds having a decamethylene dicarboxyl group, fumaric acid, maleic acid, trimellitic acid,
- Hydroxycarboxylic acids such as acid, lactic acid, citric acid, hydroxybivalic acid, 12-hydroxystearic acid and malic acid, and carboxyl groups such as acrylic acid, methacrylic acid, itaconic acid, mesaconic acid, maleic acid and fumaric acid
- a high molecular weight compound such as a carboxyl group-containing polyester resin, an alkyd resin or an epoxy resin using the above-mentioned polyunsaturated monomer or polycarboxylic acid as a raw material; Carboxyl group-containing vinyl copolymers obtained by copolymerizing a saturated monomer with another type of unsaturated monomer; and carboxyl group-containing,? -Unsaturated monomers or carboxyl group-containing monomers.
- Vinyl copolymers are preferably used.
- alcohols include methanol, ethanol, propanol, isopropyl alcohol, n-butanol, isobutanol, sec-butyl alcohol, Pen alcohol, hexanol, heptanol, octanol, nonanol, decanol, monoalcohol such as benzyl alcohol, ethylene glycol, 1,3-propylene glycol, 1,2-propylene glycol, 1,4 —Butanediol, 1,3-butanediol, 1,5-pentanediol, 3-methyl-1,5-pentanediol, 1,6-hexanediol, 1,8-octanediol, 2,4— Jethyl-1,5-pentenediol, 2-butyl-2-ethyl-1,3-propanediol, 2,2-getyl-1,3-propanedio
- phenols examples include phenol, resorcinol, hydroquinone, pyrocatechol, bisphenol A, dihydroxydiphenylmethane (bisphenol F), bisphenol S, tetrabromobisphenol A, 1,3-bis (4-hydroxyphenyl).
- cyclohexane 4, 4, over dihydroxy one 3, 3 5 one dimethyl diphenylmethane, 4, 4, one dihydroxy pen Zoff enone, tris (4-hydroxyphenyl) methane, bis (4-hydroxyphenyl) ether , Novolak phenol, novolak cresol, bis (3,5-dimethyl-4-hydroxyphenyl) sulfone, bis (4-hydroxyphenyl) sulfone, low molecular weight phenolic compounds such as hydroxystyrene, and phenol novolak Resin, Crezo Examples include a phenolic novolak resin, a cresol nopolak resin, or another copolymerizable compound of hydroxystyrene, such as a phenolic novolak resin, a phenol novolak resin, or a copolymer obtained by copolymerizing hydroxystyrene with another copolymerizable vinyl monomer.
- a copolymer copolymerized with a vinyl monomer is
- the equivalent ratio (molar ratio) of the compound having a hydroxyl group to the compound (I) is preferably 1: 0.9 to 1: 2, and more preferably 1: 0.9 to 0.9.
- the ratio is preferably 1: 1.5, and more preferably 1: 1 to: L: 1.2.
- the reaction temperature is preferably from 0 to 150 ° C, more preferably from 0 to 100 ° C, and even more preferably from 0 to 50 ° C.
- the acid catalyst is not particularly limited, and examples thereof include inorganic acids such as hydrochloric acid, sulfuric acid, nitric acid, and phosphoric acid, and organic acids such as p-toluenesulfonic acid. Among them, P-toluenesulfonic acid is preferable. .
- One or more acid catalysts are used.
- the amount of the acid catalyst to be added is not particularly limited, but is preferably 0.0001 to 0.5 equivalent (molar ratio) with respect to the starting compound having a hydroxyl group, and is preferably 0.0001 to 0.5 equivalent. More preferably, it is 1 equivalent (molar ratio). In the production method of the present invention, even if any acid catalyst is used, the desired product can be produced in high yield with few side reactions.
- an organic solvent may be used.
- the organic solvent include hydrocarbon solvents such as hexane, toluene, and xylene; ether solvents such as dioxane and tetrahydrofuran; and ketone solvents such as acetone, methyl ethyl ketone, and methyl isobutyl ketone. , One, or two or more are used.
- the group derived from compound (I) in compound (II) can be prepared by heat treatment or treatment with an acid.
- an organic solvent may be used, and examples of the organic solvent include the same as described above.
- the acid used includes sulfuric acid, hydrochloric acid, p-toluenesulfonic acid and the like, and among them, p-toluenesulfonic acid is preferable.
- the acid is preferably used in an amount of 0.01 to 50 equivalents (molar ratio) to the compound (II).
- the temperature of the acid treatment is preferably from 80 to 160 ° C. In the case of acid treatment, water may be added.
- the temperature of the acid treatment when water is added is preferably 20 to 80 ° C.
- a group derived from compound (I) in compound (II) can be eliminated from compound (II) by using a photoacid generator in place of the acid and using the acid generated by light irradiation.
- a photoacid generator is used, the photoacid generator can be used in the same manner as when compound (II) described later is used for a chemically amplified resist composition].
- the concept of the protection method of the present invention also includes a form in which a group derived from the compound (I) is introduced into all of the plurality of hydroxyl groups as described above, and a part of the group is eliminated. As described above, the introduction of a group derived from compound (I) into a compound having a hydroxyl group and the elimination from compound (II) can be easily performed.
- (II) can be used as a component of a chemically amplified resist composition, etc.
- the amplification type resist composition contains the compound (II) and the photoacid generator.
- the present invention is not limited to this.
- the compound (II) may be a polymer having a group represented by the general formula (II) (hereinafter, also referred to as a base polymer). More preferably, a vinyl polymer having a group represented by the general formula (II) is preferable. Above all, a Bier polymer having a structural unit represented by the general formula (III) [hereinafter referred to as polymer (III) is more preferable, and a vinyl copolymer having a structural unit represented by the general formula (III) is more preferable. In the polymer (III), those in which R 4 is a hydrogen atom or methyl are preferred.
- the weight average molecular weight of the base polymer is preferably from 100 ° to 100,000, more preferably from 1,000 to 50,000.
- the pace polymer is produced, for example, by polymerizing the corresponding vinyl monomer in a known manner (Japanese Patent Application Laid-Open No. 9-59324, Japanese Patent Application Laid-Open No. 7-62190) or according to these methods. be able to.
- the chemically amplified resist composition of the present invention preferably comprises an organic solvent (e.g., a hydrocarbon solvent such as hexane, toluene, or xylene, an ether solvent such as dioxane or tetrahydrofuran), acetone, methyl ethyl ketone, or methyl. It is dissolved or dispersed in a ketone-based solvent such as isobutyl ketone or the like, or an ester such as ethyl acetate or propylene glycol monomethyl ether acetate, etc.), and applied onto a wafer.
- the organic solvent is preferably used in an amount of 0.5 to 100 times (by weight) the compound (II).
- a heating step (prebake step) is usually performed to evaporate the organic solvent on the wafer.
- the heating temperature in the prebake step is preferably 80 to 130 ° C.
- Compound (II) has excellent heat resistance and hardly decomposes at the above-mentioned heating temperature.
- the wafer from which the organic solvent has been evaporated is irradiated with an excimer laser (eg, a KrF excimer laser) from an exposure apparatus. At the irradiated portion, acid is generated due to decomposition of the photoacid generator. Occurs and the hydroxyl groups are regenerated. Sa In addition, during development, the compound in which the xyl group at the opening is regenerated is washed away by the alkaline solution, and a positive resist is obtained.
- an excimer laser eg, a KrF excimer laser
- the photoacid generator there can be used hondium salt compounds, sulfone compounds, sulfonic ester compounds, diazosulfone compounds, disulfonylmethane compounds, sulfonimide compounds, nitrobenzyl compounds, naphthoquinonediazide compounds, and the like.
- hondium salt compound examples include bis (4-tert-butylphenyl) hydrogentrifluoromethanesulfonate, bis (4-tert-butylphenyl) hydrogennononafluorobutanesulfonate, and bis (4-butylmethane).
- tert-Butylphenyl done-2-1-trifluoromethylbenzenesulfonate, bis (4-tert-butylphenyl) done-10-1 camphorsulfonate, bis (4-tert-butylbutyl) done-1p— Toluene sulfonate, diphenyl trifluoromethanesulfonate, diphenyl dimethyl nonafluorobutane sulfonate, diphenyl dimethyl sulfonate 2-trifluoromethylbenzene benzene sulfonate, diphenyl dimethyl sulfonate 1 10—Camphorsulfonate, diphene P-toluenesulfonate, triphenylsulfonium trifluoromethanesulfonate, triphenylsulfonium nonafluorobutane sulfonate, triphenylsulfonium-12-trifluoromethylpentene
- sulfone compound examples include, for example, ketosulfone and sulfonylsulfone, and their diazo compounds.
- sulfonic acid ester compound examples include benzoin tosylate, pyrogallol tristrifluorosulfonate, pyrogallol methanesulfonate triester, nitrobenzyl-1,9,10-jetoxyanthracene-12-sulfonate, and thiomethylol Benzoisocyanate, sodium methylol benzoin octane sulfonate, sodium methyl benzoin trifluoromethanesulfonate, sodium methyl benzopentyl decyl sulfonate and the like.
- sulfonimide compound examples include N— (trifluoromethylsulfonyloxy) succinimide, N— (trifluoromethylsulfonyloxy) phthalimide, and N— (trifluoromethylsulfonyloxy) diphene.
- the compounding amount of the photoacid generator is preferably 0.01 to 50 parts by weight, more preferably 0.1 to 3 parts by weight, more preferably 0.1 to 3 parts by weight per 100 parts by weight of compound (II). More preferably, it is 5 to 25 parts by weight.
- the chemically amplified resist composition of the present invention has excellent stability in the pre-baking step and long-term storage stability, and has good lithographic properties. 3 ⁇ 4 ⁇
- the conversion of the raw materials and the selectivity to the target product in the Examples and Comparative Examples were determined by gas chromatography analysis.
- GC-14A manufactured by Shimadzu Corporation was used, and Hewlett-Packard INNOWAX (length: 30 m, diameter: 0.25 mm) was used as a column.
- Both the injection temperature and the detector temperature of the sample were 200 ° C, and the analysis was performed by raising the column temperature from 50 ° C to 200 ° C at 10 ° C / min.
- the quantification after one gas chromatography analysis was performed by the absolute calibration method.
- the acid value was measured according to JIS K0070.
- the number average molecular weight (Mn) and the molecular weight distribution (Mw / Mn: weight average molecular weight / number average molecular weight) of the polymers in the following Examples were measured by gel permeation chromatography under the following conditions.
- Example 7 Synthesis of polymer
- the precipitated polymer was dissolved in acetone, and the same operation was repeated three times.
- the obtained polymer was dried under reduced pressure for 1 mm to obtain a white solid polymer.
- 20 g of the obtained solid polymer was dissolved in 80 g of propylene glycol monomethyl ether acetate, and 1% by weight of diphenylodonium trifluoromethanesulfonate (DPI-OTf) was added as a photoacid generator to form a chemically amplified resist.
- DPI-OTf diphenylodonium trifluoromethanesulfonate
- a propylene glycol monomethyl ether acetate solution of the composition was obtained.
- the number average molecular weight in terms of styrene of the polymer in the chemically amplified resist composition was 10,200.
- Exposure Low-pressure mercury lamp (254 nm) manufactured by Toshiba Corporation
- a method for producing an ether compound which is useful for a chemically amplified resist composition, a synthetic intermediate of a pharmaceutical product, a paint, etc., with a low side reaction and a high yield, and a hydroxyl having excellent thermal stability It is possible to provide a hydroxyl group protecting agent or the like that provides a protected group.
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020037012121A KR100894244B1 (ko) | 2001-07-13 | 2002-07-12 | 에테르 화합물의 제조법 |
US10/482,111 US7015363B2 (en) | 2001-07-13 | 2002-07-12 | Process for producing ether compound |
JP2003512181A JP4048171B2 (ja) | 2001-07-13 | 2002-07-12 | エーテル化合物の製造法 |
EP02746017A EP1415968A4 (en) | 2001-07-13 | 2002-07-12 | METHOD FOR PRODUCING AN ETHER CONNECTION |
US11/289,706 US7358030B2 (en) | 2001-07-13 | 2005-11-30 | Process for producing ether compound |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2001-213246 | 2001-07-13 | ||
JP2001213246 | 2001-07-13 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
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US10482111 A-371-Of-International | 2002-07-12 | ||
US11/289,706 Division US7358030B2 (en) | 2001-07-13 | 2005-11-30 | Process for producing ether compound |
Publications (1)
Publication Number | Publication Date |
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WO2003006407A1 true WO2003006407A1 (fr) | 2003-01-23 |
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PCT/JP2002/007117 WO2003006407A1 (fr) | 2001-07-13 | 2002-07-12 | Procédé de production de composé d'éther |
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US (2) | US7015363B2 (ja) |
EP (1) | EP1415968A4 (ja) |
JP (1) | JP4048171B2 (ja) |
KR (1) | KR100894244B1 (ja) |
WO (1) | WO2003006407A1 (ja) |
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EP1378795A1 (en) | 2002-07-04 | 2004-01-07 | Shin-Etsu Chemical Co., Ltd. | Resist composition and patterning process |
WO2004019131A1 (ja) * | 2002-08-20 | 2004-03-04 | Kyowa Hakko Chemical Co., Ltd. | 可視光感光性組成物 |
JP2005255742A (ja) * | 2004-03-10 | 2005-09-22 | Jsr Corp | (メタ)アクリル酸系重合体および感放射線性樹脂組成物 |
WO2006009258A1 (ja) | 2004-07-22 | 2006-01-26 | Kansai Paint Co., Ltd. | 近赤外線活性型ポジ型樹脂組成物 |
WO2006035926A1 (ja) * | 2004-09-30 | 2006-04-06 | Kyowa Hakko Chemical Co., Ltd. | ポジ型液晶素子用フォトレジスト組成物 |
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WO2007069585A1 (ja) * | 2005-12-13 | 2007-06-21 | Kansai Paint Co., Ltd. | 回路基板用ポジ型レジスト組成物、回路基板用ポジ型ドライフィルム、及び、それを用いた回路基板の製造方法 |
JP2007163772A (ja) * | 2005-12-13 | 2007-06-28 | Kansai Paint Co Ltd | 回路基板用ポジ型レジスト組成物、回路基板用ポジ型ドライフィルム、及び、それを用いた回路基板の製造方法 |
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WO2003006407A1 (fr) * | 2001-07-13 | 2003-01-23 | Kyowa Yuka Co., Ltd. | Procédé de production de composé d'éther |
US20060160247A1 (en) * | 2005-01-17 | 2006-07-20 | Hiroshi Koyama | Unsaturated carboxylic acid hemicacetal ester, polymeric compound and photoresist resin composition |
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TW528932B (en) * | 1997-01-24 | 2003-04-21 | Shinetsu Chemical Co | Polymers and chemically amplified positive resist compositions |
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- 2002-07-12 EP EP02746017A patent/EP1415968A4/en not_active Withdrawn
- 2002-07-12 US US10/482,111 patent/US7015363B2/en not_active Expired - Fee Related
- 2002-07-12 JP JP2003512181A patent/JP4048171B2/ja not_active Expired - Lifetime
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2005
- 2005-11-30 US US11/289,706 patent/US7358030B2/en not_active Expired - Fee Related
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JP2000298344A (ja) * | 1999-04-13 | 2000-10-24 | Taiyo Ink Mfg Ltd | ポジ型感光性樹脂組成物 |
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EP1378795A1 (en) | 2002-07-04 | 2004-01-07 | Shin-Etsu Chemical Co., Ltd. | Resist composition and patterning process |
WO2004019131A1 (ja) * | 2002-08-20 | 2004-03-04 | Kyowa Hakko Chemical Co., Ltd. | 可視光感光性組成物 |
US7294448B2 (en) | 2002-08-20 | 2007-11-13 | Kyowa Hakko Kogyo Co., Ltd. | Composition sensitive to visible light |
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WO2013141376A1 (ja) * | 2012-03-23 | 2013-09-26 | 富士フイルム株式会社 | 保護剤、該保護剤により保護された化合物の製造方法、該保護剤により保護された樹脂、該保護剤により保護された樹脂を含有する感光性樹脂組成物、パターン形成材料、感光性膜、硬化レリーフパターン、その製造方法、及び半導体装置 |
Also Published As
Publication number | Publication date |
---|---|
US7358030B2 (en) | 2008-04-15 |
KR20040015067A (ko) | 2004-02-18 |
EP1415968A1 (en) | 2004-05-06 |
JP4048171B2 (ja) | 2008-02-13 |
JPWO2003006407A1 (ja) | 2004-10-28 |
US7015363B2 (en) | 2006-03-21 |
US20040181097A1 (en) | 2004-09-16 |
EP1415968A4 (en) | 2004-12-08 |
KR100894244B1 (ko) | 2009-04-20 |
US20060074262A1 (en) | 2006-04-06 |
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