TWI260076B - Semiconductor package device and method of formation and testing - Google Patents
Semiconductor package device and method of formation and testing Download PDFInfo
- Publication number
- TWI260076B TWI260076B TW091132762A TW91132762A TWI260076B TW I260076 B TWI260076 B TW I260076B TW 091132762 A TW091132762 A TW 091132762A TW 91132762 A TW91132762 A TW 91132762A TW I260076 B TWI260076 B TW I260076B
- Authority
- TW
- Taiwan
- Prior art keywords
- integrated circuit
- pads
- circuit
- depositing
- package substrate
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/019—Manufacture or treatment using temporary auxiliary substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/114—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations
- H10W74/117—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations the substrate having spherical bumps for external connection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07502—Connecting or disconnecting of bond wires using an auxiliary member
- H10W72/07504—Connecting or disconnecting of bond wires using an auxiliary member the auxiliary member being temporary, e.g. a sacrificial coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/853—On the same surface
- H10W72/865—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
- H10W74/142—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations exposing the passive side of the semiconductor body
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/22—Configurations of stacked chips the stacked chips being on both top and bottom sides of a package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/284—Configurations of stacked chips characterised by structural arrangements for measuring or testing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/291—Configurations of stacked chips characterised by containers, encapsulations, or other housings for the stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/752—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Wire Bonding (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/008,800 US6916682B2 (en) | 2001-11-08 | 2001-11-08 | Semiconductor package device for use with multiple integrated circuits in a stacked configuration and method of formation and testing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200300283A TW200300283A (en) | 2003-05-16 |
| TWI260076B true TWI260076B (en) | 2006-08-11 |
Family
ID=21733752
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW091132762A TWI260076B (en) | 2001-11-08 | 2002-11-07 | Semiconductor package device and method of formation and testing |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6916682B2 (https=) |
| EP (1) | EP1481421A2 (https=) |
| JP (1) | JP2005535103A (https=) |
| KR (1) | KR100926002B1 (https=) |
| CN (1) | CN100477141C (https=) |
| AU (1) | AU2002337875A1 (https=) |
| TW (1) | TWI260076B (https=) |
| WO (1) | WO2003041158A2 (https=) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SG108245A1 (en) | 2001-03-30 | 2005-01-28 | Micron Technology Inc | Ball grid array interposer, packages and methods |
| JP2003243604A (ja) * | 2002-02-13 | 2003-08-29 | Sony Corp | 電子部品及び電子部品の製造方法 |
| US6906415B2 (en) * | 2002-06-27 | 2005-06-14 | Micron Technology, Inc. | Semiconductor device assemblies and packages including multiple semiconductor devices and methods |
| US7573136B2 (en) * | 2002-06-27 | 2009-08-11 | Micron Technology, Inc. | Semiconductor device assemblies and packages including multiple semiconductor device components |
| US6964881B2 (en) * | 2002-08-27 | 2005-11-15 | Micron Technology, Inc. | Multi-chip wafer level system packages and methods of forming same |
| US7071545B1 (en) * | 2002-12-20 | 2006-07-04 | Asat Ltd. | Shielded integrated circuit package |
| JP3867796B2 (ja) * | 2003-10-09 | 2007-01-10 | セイコーエプソン株式会社 | 半導体装置及びその製造方法、回路基板並びに電子機器 |
| JP4556023B2 (ja) * | 2004-04-22 | 2010-10-06 | 独立行政法人産業技術総合研究所 | システムインパッケージ試験検査装置および試験検査方法 |
| TWI270953B (en) * | 2005-08-17 | 2007-01-11 | Advanced Semiconductor Eng | Substrate and testing method thereof |
| KR100690246B1 (ko) * | 2006-01-10 | 2007-03-12 | 삼성전자주식회사 | 플립 칩 시스템 인 패키지 제조 방법 |
| US8410594B2 (en) * | 2006-01-11 | 2013-04-02 | Stats Chippac Ltd. | Inter-stacking module system |
| US20080251901A1 (en) * | 2006-01-24 | 2008-10-16 | Zigmund Ramirez Camacho | Stacked integrated circuit package system |
| DE102006017059B4 (de) * | 2006-04-11 | 2008-04-17 | Infineon Technologies Ag | Halbleiter-Bauelement-System, sowie Verfahren zum Modifizieren eines Halbleiterbauelements |
| JP3942190B1 (ja) * | 2006-04-25 | 2007-07-11 | 国立大学法人九州工業大学 | 両面電極構造の半導体装置及びその製造方法 |
| KR100782774B1 (ko) * | 2006-05-25 | 2007-12-05 | 삼성전기주식회사 | Sip 모듈 |
| JP4930699B2 (ja) * | 2006-12-06 | 2012-05-16 | 凸版印刷株式会社 | 半導体装置 |
| US7973310B2 (en) * | 2008-07-11 | 2011-07-05 | Chipmos Technologies Inc. | Semiconductor package structure and method for manufacturing the same |
| SG10201505279RA (en) | 2008-07-18 | 2015-10-29 | Utac Headquarters Pte Ltd | Packaging structural member |
| US8742603B2 (en) * | 2010-05-20 | 2014-06-03 | Qualcomm Incorporated | Process for improving package warpage and connection reliability through use of a backside mold configuration (BSMC) |
| US8664540B2 (en) * | 2011-05-27 | 2014-03-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interposer testing using dummy connections |
| US9472533B2 (en) * | 2013-11-20 | 2016-10-18 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of forming wire bondable fan-out EWLB package |
| DE112015007224B4 (de) * | 2015-12-23 | 2022-06-30 | Intel Corporation | Umgekehrt montiertes Gull-Wing Elektronikgehäuse |
| US9721881B1 (en) | 2016-04-29 | 2017-08-01 | Nxp Usa, Inc. | Apparatus and methods for multi-die packaging |
| US20180190776A1 (en) * | 2016-12-30 | 2018-07-05 | Sireesha Gogineni | Semiconductor chip package with cavity |
| KR102886060B1 (ko) * | 2022-11-22 | 2025-11-12 | 앱솔릭스 인코포레이티드 | 패키징 기판 및 이를 포함하는 반도체 패키지 |
Family Cites Families (49)
| Publication number | Priority date | Publication date | Assignee | Title |
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| FR2439478A1 (fr) * | 1978-10-19 | 1980-05-16 | Cii Honeywell Bull | Boitier plat pour dispositifs a circuits integres |
| US4729061A (en) * | 1985-04-29 | 1988-03-01 | Advanced Micro Devices, Inc. | Chip on board package for integrated circuit devices using printed circuit boards and means for conveying the heat to the opposite side of the package from the chip mounting side to permit the heat to dissipate therefrom |
| JPH0821672B2 (ja) | 1987-07-04 | 1996-03-04 | 株式会社堀場製作所 | イオン濃度測定用シート型電極の製造方法 |
| JP2585006B2 (ja) * | 1987-07-22 | 1997-02-26 | 東レ・ダウコーニング・シリコーン株式会社 | 樹脂封止型半導体装置およびその製造方法 |
| US5219795A (en) * | 1989-02-07 | 1993-06-15 | Fujitsu Limited | Dual in-line packaging and method of producing the same |
| US5200362A (en) * | 1989-09-06 | 1993-04-06 | Motorola, Inc. | Method of attaching conductive traces to an encapsulated semiconductor die using a removable transfer film |
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| US5383269A (en) * | 1991-09-03 | 1995-01-24 | Microelectronics And Computer Technology Corporation | Method of making three dimensional integrated circuit interconnect module |
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| US5291062A (en) * | 1993-03-01 | 1994-03-01 | Motorola, Inc. | Area array semiconductor device having a lid with functional contacts |
| US5679978A (en) | 1993-12-06 | 1997-10-21 | Fujitsu Limited | Semiconductor device having resin gate hole through substrate for resin encapsulation |
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| US5747874A (en) * | 1994-09-20 | 1998-05-05 | Fujitsu Limited | Semiconductor device, base member for semiconductor device and semiconductor device unit |
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| JP2725637B2 (ja) * | 1995-05-31 | 1998-03-11 | 日本電気株式会社 | 電子回路装置およびその製造方法 |
| WO1996041378A1 (en) | 1995-06-07 | 1996-12-19 | The Panda Project | Semiconductor die carrier having double-sided die attach plate |
| JPH0917919A (ja) | 1995-06-29 | 1997-01-17 | Fujitsu Ltd | 半導体装置 |
| US5798564A (en) * | 1995-12-21 | 1998-08-25 | Texas Instruments Incorporated | Multiple chip module apparatus having dual sided substrate |
| US5843808A (en) | 1996-01-11 | 1998-12-01 | Asat, Limited | Structure and method for automated assembly of a tab grid array package |
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| JP2000208698A (ja) * | 1999-01-18 | 2000-07-28 | Toshiba Corp | 半導体装置 |
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| US6329713B1 (en) * | 1998-10-21 | 2001-12-11 | International Business Machines Corporation | Integrated circuit chip carrier assembly comprising a stiffener attached to a dielectric substrate |
| JP3512657B2 (ja) | 1998-12-22 | 2004-03-31 | シャープ株式会社 | 半導体装置 |
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| JP3576030B2 (ja) * | 1999-03-26 | 2004-10-13 | 沖電気工業株式会社 | 半導体装置及びその製造方法 |
| US6117704A (en) * | 1999-03-31 | 2000-09-12 | Irvine Sensors Corporation | Stackable layers containing encapsulated chips |
| JP3575001B2 (ja) * | 1999-05-07 | 2004-10-06 | アムコー テクノロジー コリア インコーポレーティド | 半導体パッケージ及びその製造方法 |
| JP2001077301A (ja) * | 1999-08-24 | 2001-03-23 | Amkor Technology Korea Inc | 半導体パッケージ及びその製造方法 |
| JP3418759B2 (ja) * | 1999-08-24 | 2003-06-23 | アムコー テクノロジー コリア インコーポレーティド | 半導体パッケージ |
| JP2001077293A (ja) * | 1999-09-02 | 2001-03-23 | Nec Corp | 半導体装置 |
| JP2001094045A (ja) * | 1999-09-22 | 2001-04-06 | Seiko Epson Corp | 半導体装置 |
| JP3485507B2 (ja) * | 1999-10-25 | 2004-01-13 | 沖電気工業株式会社 | 半導体装置 |
| US6344687B1 (en) * | 1999-12-22 | 2002-02-05 | Chih-Kung Huang | Dual-chip packaging |
| SG100635A1 (en) * | 2001-03-09 | 2003-12-26 | Micron Technology Inc | Die support structure |
| SG108245A1 (en) * | 2001-03-30 | 2005-01-28 | Micron Technology Inc | Ball grid array interposer, packages and methods |
| US6787916B2 (en) * | 2001-09-13 | 2004-09-07 | Tru-Si Technologies, Inc. | Structures having a substrate with a cavity and having an integrated circuit bonded to a contact pad located in the cavity |
-
2001
- 2001-11-08 US US10/008,800 patent/US6916682B2/en not_active Expired - Lifetime
-
2002
- 2002-10-16 CN CNB028245296A patent/CN100477141C/zh not_active Expired - Fee Related
- 2002-10-16 WO PCT/US2002/033083 patent/WO2003041158A2/en not_active Ceased
- 2002-10-16 KR KR1020047006983A patent/KR100926002B1/ko not_active Expired - Fee Related
- 2002-10-16 EP EP02773779A patent/EP1481421A2/en not_active Withdrawn
- 2002-10-16 AU AU2002337875A patent/AU2002337875A1/en not_active Abandoned
- 2002-10-16 JP JP2003543094A patent/JP2005535103A/ja active Pending
- 2002-11-07 TW TW091132762A patent/TWI260076B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR100926002B1 (ko) | 2009-11-09 |
| CN1602548A (zh) | 2005-03-30 |
| EP1481421A2 (en) | 2004-12-01 |
| US20030085463A1 (en) | 2003-05-08 |
| TW200300283A (en) | 2003-05-16 |
| KR20050037430A (ko) | 2005-04-21 |
| AU2002337875A1 (en) | 2003-05-19 |
| JP2005535103A (ja) | 2005-11-17 |
| CN100477141C (zh) | 2009-04-08 |
| US6916682B2 (en) | 2005-07-12 |
| WO2003041158A2 (en) | 2003-05-15 |
| WO2003041158A3 (en) | 2003-10-23 |
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