JP2964983B2 - 三次元メモリモジュール及びそれを用いた半導体装置 - Google Patents
三次元メモリモジュール及びそれを用いた半導体装置Info
- Publication number
- JP2964983B2 JP2964983B2 JP9083182A JP8318297A JP2964983B2 JP 2964983 B2 JP2964983 B2 JP 2964983B2 JP 9083182 A JP9083182 A JP 9083182A JP 8318297 A JP8318297 A JP 8318297A JP 2964983 B2 JP2964983 B2 JP 2964983B2
- Authority
- JP
- Japan
- Prior art keywords
- chip
- carrier
- semiconductor device
- memory module
- dimensional memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000015654 memory Effects 0.000 title claims description 46
- 239000004065 semiconductor Substances 0.000 title claims description 44
- 239000000969 carrier Substances 0.000 claims description 2
- 239000011347 resin Substances 0.000 description 14
- 229920005989 resin Polymers 0.000 description 14
- 238000007789 sealing Methods 0.000 description 14
- 238000000034 method Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 4
- 241000981595 Zoysia japonica Species 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 239000013256 coordination polymer Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
-
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0652—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00 the devices being arranged next and on each other, i.e. mixed assemblies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/023—Stackable modules
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06513—Bump or bump-like direct electrical connections between devices, e.g. flip-chip connection, solder bumps
-
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06517—Bump or bump-like direct electrical connections from device to substrate
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/0652—Bump or bump-like direct electrical connections from substrate to substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06541—Conductive via connections through the device, e.g. vertical interconnects, through silicon via [TSV]
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- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06555—Geometry of the stack, e.g. form of the devices, geometry to facilitate stacking
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- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
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- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
- H01L2924/1533—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
- H01L2924/15331—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a ball array, e.g. BGA
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Description
ール及びそれを用いた半導体装置に関し、特にチップセ
レクト用の半導体素子を含む三次元メモリモジュール及
びそれを用いた半導体装置に関するものである。
リモジュールは、特開平5−121713号公報に示さ
れており、図9にその概略構成を示す様に、第一の最上
層には、増幅型光素子がマトリックス状に配されたCM
Dからなる光センサ層41、第二層にはADコンバータ
層42、第三層には演算処理層43が積層された構造と
なっている。光センサ層41の各素子のゲート電位を光
の入射により蓄積された正孔蓄積電位に保つことで、正
孔蓄積量(データ)を破壊することなく信号読出しが可
能であり、選択回路の付加により、アレイ中の所望の素
子から信号を読出すランダムアクセスが可能な増幅型光
素子を用いた全モノリシックIC構造の三次元集積回路
装置である。
の一回路ブロックの例を示しており、20は受光部、2
1,22は垂直及び水平走査回路、23は電圧発生回
路、32はバッファ回路、33はADC(アナログディ
ジタル変換器)、34はバッファレジスタ、35はCP
U、36はメモリ、37はI/Oバッファ、38はタイ
ミングコントローラ、39はアドレスデコーダ、40は
シャッタコントローラを夫々示している。
特に本発明とは関連性を有していないので、ここでは説
明を省略する(上記特開平5−121713号公報参照
のこと)。
入り三次元メモリモジュールは、全モノリシックIC構
造となっているため、所望のメモリ容量を持つメモリモ
ジュールを構成する場合は、モノリシックICの設計か
らスタートしなければならない。また、現状の最先端メ
モリIC以上のメモリ容量が必要となった場合には、モ
ノリシックICの新プロセスを開発する必要がある。し
かし、モノリシックICの開発及びモノリシックICの
新プロセス技術開発には、高度な技術,長期の開発期間
と莫大なリソースが必要であり、容易には開発できな
い。
期間を必要とすることなく、容易に短期間で低コストの
チップセレクタ入りの三次元メモリモジュール及びそれ
を用いた半導体装置を提供することである。
パターンが形成されたキャリヤ及びこのキャリヤに第1
バンプにより接続された半導体チップを有する複数の半
導体装置ユニット同士を第2バンプによってスタック接
続して構成し、前記半導体装置ユニットの各キャリヤ毎
にこのキャリヤに前記第1バンプにより接続されたチッ
プセレクト用半導体素子を搭載してなり、前記チップセ
レクト用半導体素子は、前記キャリヤに設けられたキャ
ビティ内に搭載されていることを特徴とする三次元メモ
リモジュールが得られる。
体チップの複数個と、これ等複数個の半導体チップのセ
レクトをなすチップセレクト用半導体素子とを搭載して
なることを特徴とする。
メモリモジュールを用いて構成された三次元構造の半導
体装置が得られる。
産可能なメモリチップとチップセレクタ用チップとをフ
リップチップ接続法を用いて搭載して、単品の半導体装
置ユニットを形成する。更にこの単品の半導体装置ユニ
ットをバンプによって多段接続する。この方法によっ
て、次世代のチップセレクタ入り三次元メモリモジュー
ルが、所望のメモリ容量を短期間に、しかも低コストで
実現できる。尚、キャリアへのチップセレクタチップの
搭載方法は、一キャリアに一チップ、多段接続単位に一
チップ、あるいは一キャリアにマルチのメモリチップが
搭載された構造の場合は、一チップ等の構成方法等をと
ることができる。
を参照して説明する。
示す平面図、断面図及び側面図である。キャリヤ1にチ
ップセレクタチップ3とメモリチップ4をバンプ6によ
り接続する。そして、封止樹脂5によって樹脂封止して
単品の半導体装置を製造する。キャリヤ1には、単品の
半導体装置ユニットを多段接続するためのスタックパッ
ド2が形成されている。
である。図1(c)は図1(a)の単品の半導体装置ユ
ニットを4段スタックした場合の左側面図であり、マザ
ーボード8に実装した状態を示す。この場合は、各キャ
リヤにメモリ一個とチップセレクタチップが一個搭載の
構成例である。この構成の場合は、汎用性が非常に高く
なる。
タックしたチップセレクタ入り三次元メモリモジュール
9をSIMM(Single in line Memory Module)モジュー
ル10に搭載した構成を示している。尚、チップセレク
タ入り三次元メモリモジュール9をSIMMモジュール
10に両面搭載しても何等差し支えない。
示す平面図、断面図及び側面図である。チップセレクタ
チップ専用キャリヤ11にチップセレクタチップ3をバ
ンプ6により接続する。そして、封止樹脂5によって樹
脂封止してチップセレクタ専用の単品の半導体装置ユニ
ットを製造する。チップセレクタチップ専用キャリヤ1
1には、単品の半導体装置を多段接続するためのスタッ
クパッド2が形成されている。
図である。図2(c)は図2(a)のチップセレクタ専
用単品の半導体装置ユニットと参考例1で説明した単品
の半導体装置ユニットからチップセレクタチップを除い
たメモリチップのみが搭載された半導体装置を4段スタ
ックした場合の左側面図であり、マザーボード8に実装
した状態を示す。この場合は、スタック構成毎にチップ
セレクタチップ3が一個となった構成例である。この構
成の場合は、効率が非常に高くなる。
タックしたチップセレクタ入り三次元メモリモジュール
9をSIMMモジュール10に搭載した構成を示してい
る。尚、チップセレクタ入り三次元メモリモジュール9
をSIMMモジュール10に両面搭載しても何等差し支
えない。
示す平面図と側面図である。マルチチップキャリア12
にはチップセレクタチップ3とメモリチップ4を4個バ
ンプ6により接続する。そして、封止樹脂5によって樹
脂封止して単品の半導体装置ユニットを製造する。マル
チチップキャリヤ12には、単品の半導体装置を多段接
続するためのスタックパッド2が形成されている。
を4段スタックした場合の側面図であり、マザーボード
8に実装した状態を示す。この場合は、各キャリヤにメ
モリ4個とチップセレクタチップ一個を搭載した構成例
である。この構成の場合は、メモリ容量を非常に大きく
できることと汎用性が非常に高くなる。
る。図3(a)に示したマルチチップ型キャリヤのメモ
リチップ4とチップセレクタチップの最適配置例を示し
たものであり、配線長が一番短くなる。そのため高速動
作への対応が実現可能となる。
示す平面図とC−C´の断面図である。キャリヤ1にキ
ャビティ13を設け、キャビティ13内にチップセレク
タチップ3へバンプにより搭載し、封止樹脂5によって
樹脂封止する。この時、封止樹脂5はキャリヤ1に上面
から出ない構造となっている。次にメモリチップ4を同
様にしてバンプによってキャリヤ1に搭載する。その
後、封止樹脂5によって樹脂封止する。
密度な集積度の高い半導体装置を実現することができ
る。本構造の場合、必要に応じキャビティ13の数量は
多くても何等差し支えない。
示す平面図とD−D´の断面図である。マルチチップキ
ャリヤ12にキャビティ13を設け、キャビティ13内
にチップセレクタチップ3をバンプにより搭載し、封止
樹脂5によって樹脂封止する。この時、封止樹脂5はマ
ルチチップキャリア12の上面から出ない構造となって
いる。次にメモリチップ4を同様にしてバンプによって
マルチチップキャリヤ12に4個搭載する。その後、封
止樹脂5によって樹脂封止する。
密度な集積度の高い半導体装置を実現することができ
る。本構造の場合、必要に応じキャビティ13の数量と
チップセレクタチップ3の数量及びメモリチップの数量
は多くても何等差し支えない。
タ入の三次元メモリモジュールの等価回路例を示す。
本電気株式会社製のRAMモジュールを使用し、チップ
セレクタチップ3としても同じく日本電気株式会社製の
モジュールを使用している。尚、当該RAMモジュール
4のピン接続に関して図8にその詳細を示している。
リチップとチップセレクタ用のチップとをフリップチッ
プ接続法を用いて搭載して、単品の半導体装置ユニット
を形成し、更に、この単品の半導体装置ユニットをバン
プによって多段接続する構造をとることによって、次世
代のチップセレクタ入り三次元メモリモジュールを、所
望のメモリ容量を短時間に、しかも低コストで実現する
ことができる。
の搭載方法を、一キャリヤに一チップ、多段接続単位に
一チップ、あるいは、一キャリヤにマルチのメモリチッ
プが搭載された構造の場合は、一チップ等の構成方法等
がある。そのため、所望のメモリ容量、実装密度、小型
軽量化等に対して自由に選択対応ができる。
メモリモジュールの実現は、従来技術で必要であった高
度な技術、長期の開発期間と莫大なリソース等は必要と
しない。その結果、モノリシックICの次世代メモリ容
量を短期間に低コストで容易に、しかもチップセレクタ
入りの三次元メモリモジュールとして実現できる。
図,断面図,側面図である。
図,断面図,側面図である。
図と側面図である。
図と断面図である。
図と断面図である。
元メモリモジュールの等価回路例である。
細を示す図である。
ジュールの構成例である。
モジュールの等価的ブロック例である。
Claims (3)
- 【請求項1】回路パターンが形成されたキャリヤ及びこ
のキャリヤに第1バンプにより接続された半導体チップ
を有する複数の半導体装置ユニット同士を第2バンプに
よってスタック接続して構成し、前記半導体装置ユニッ
トの各キャリヤ毎にこのキャリヤに前記第1バンプによ
り接続されたチップセレクト用半導体素子を搭載してな
り、前記チップセレクト用半導体素子は、前記キャリヤ
に設けられたキャビティ内に搭載されていることを特徴
とする三次元メモリモジュール。 - 【請求項2】前記キャリヤの各々は、前記半導体チップ
の複数個と、これ等複数個の半導体チップのセレクトを
なすチップセレクト用半導体素子とを搭載してなること
を特徴とする請求項1記載の三次元メモリモジュール。 - 【請求項3】請求項1または2のいずれか記載の三次元
メモリモジュールを用いて構成された三次元構造の半導
体装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9083182A JP2964983B2 (ja) | 1997-04-02 | 1997-04-02 | 三次元メモリモジュール及びそれを用いた半導体装置 |
US09/033,674 US5973392A (en) | 1997-04-02 | 1998-03-03 | Stacked carrier three-dimensional memory module and semiconductor device using the same |
TW087103161A TW420869B (en) | 1997-04-02 | 1998-03-04 | 3D memory module and the semiconductor device using the same |
KR19980009986A KR100293775B1 (ko) | 1997-04-02 | 1998-03-23 | 3차원 메모리모듈 및 이를 이용한 반도체장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9083182A JP2964983B2 (ja) | 1997-04-02 | 1997-04-02 | 三次元メモリモジュール及びそれを用いた半導体装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11100286A Division JPH11317494A (ja) | 1999-04-07 | 1999-04-07 | 三次元メモリモジュ―ル及びそれを用いた半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH10284683A JPH10284683A (ja) | 1998-10-23 |
JP2964983B2 true JP2964983B2 (ja) | 1999-10-18 |
Family
ID=13795176
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9083182A Expired - Lifetime JP2964983B2 (ja) | 1997-04-02 | 1997-04-02 | 三次元メモリモジュール及びそれを用いた半導体装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5973392A (ja) |
JP (1) | JP2964983B2 (ja) |
KR (1) | KR100293775B1 (ja) |
TW (1) | TW420869B (ja) |
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-
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- 1998-03-23 KR KR19980009986A patent/KR100293775B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR19980080562A (ko) | 1998-11-25 |
KR100293775B1 (ko) | 2001-07-12 |
US5973392A (en) | 1999-10-26 |
JPH10284683A (ja) | 1998-10-23 |
TW420869B (en) | 2001-02-01 |
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