TW571416B - Semiconductor device and method of fabricating the same - Google Patents
Semiconductor device and method of fabricating the same Download PDFInfo
- Publication number
- TW571416B TW571416B TW91137702A TW91137702A TW571416B TW 571416 B TW571416 B TW 571416B TW 91137702 A TW91137702 A TW 91137702A TW 91137702 A TW91137702 A TW 91137702A TW 571416 B TW571416 B TW 571416B
- Authority
- TW
- Taiwan
- Prior art keywords
- semiconductor device
- semiconductor
- metal wiring
- electrode
- connection terminal
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/019—Manufacture or treatment using temporary auxiliary substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01221—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition
- H10W72/01225—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in solid form, e.g. by using a powder or by stud bumping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/015—Manufacture or treatment of bond wires
- H10W72/01551—Changing the shapes of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07502—Connecting or disconnecting of bond wires using an auxiliary member
- H10W72/07504—Connecting or disconnecting of bond wires using an auxiliary member the auxiliary member being temporary, e.g. a sacrificial coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07502—Connecting or disconnecting of bond wires using an auxiliary member
- H10W72/07504—Connecting or disconnecting of bond wires using an auxiliary member the auxiliary member being temporary, e.g. a sacrificial coating
- H10W72/07507—Connecting or disconnecting of bond wires using an auxiliary member the auxiliary member being temporary, e.g. a sacrificial coating the auxiliary member being a temporary substrate, e.g. a removable substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07521—Aligning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07531—Techniques
- H10W72/07532—Compression bonding, e.g. thermocompression bonding
- H10W72/07533—Ultrasonic bonding, e.g. thermosonic bonding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07541—Controlling the environment, e.g. atmosphere composition or temperature
- H10W72/07553—Controlling the environment, e.g. atmosphere composition or temperature changes in shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
- H10W72/242—Dispositions, e.g. layouts relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5445—Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5524—Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/581—Auxiliary members, e.g. flow barriers
- H10W72/583—Reinforcing structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/801—Interconnections on sidewalls of containers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/932—Plan-view shape, i.e. in top view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9413—Dispositions of bond pads on encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/944—Dispositions of multiple bond pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/131—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed
- H10W74/142—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations exposing the passive side of the semiconductor body
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/288—Configurations of stacked chips characterised by arrangements for thermal management of the stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/722—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001299756 | 2001-09-28 | ||
| JP2002103684A JP4014912B2 (ja) | 2001-09-28 | 2002-04-05 | 半導体装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200305264A TW200305264A (en) | 2003-10-16 |
| TW571416B true TW571416B (en) | 2004-01-11 |
Family
ID=26623238
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW91137702A TW571416B (en) | 2001-09-28 | 2002-12-27 | Semiconductor device and method of fabricating the same |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US20030062631A1 (enExample) |
| JP (1) | JP4014912B2 (enExample) |
| TW (1) | TW571416B (enExample) |
Families Citing this family (48)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100536898B1 (ko) * | 2003-09-04 | 2005-12-16 | 삼성전자주식회사 | 반도체 소자의 와이어 본딩 방법 |
| US7425759B1 (en) * | 2003-11-20 | 2008-09-16 | Bridge Semiconductor Corporation | Semiconductor chip assembly with bumped terminal and filler |
| JP3864952B2 (ja) * | 2003-12-01 | 2007-01-10 | セイコーエプソン株式会社 | 振動子デバイス及びそれを備えた電子機器並びに振動子デバイスの製造方法 |
| US7205178B2 (en) * | 2004-03-24 | 2007-04-17 | Freescale Semiconductor, Inc. | Land grid array packaged device and method of forming same |
| CN101060848B (zh) * | 2004-12-30 | 2011-06-22 | 索利吉尼克斯公司 | 用二丙酸倍氯米松和泼尼松治疗移植物抗宿主病和白血病 |
| US7371676B2 (en) | 2005-04-08 | 2008-05-13 | Micron Technology, Inc. | Method for fabricating semiconductor components with through wire interconnects |
| US7393770B2 (en) * | 2005-05-19 | 2008-07-01 | Micron Technology, Inc. | Backside method for fabricating semiconductor components with conductive interconnects |
| US7768113B2 (en) * | 2005-05-26 | 2010-08-03 | Volkan Ozguz | Stackable tier structure comprising prefabricated high density feedthrough |
| US7919844B2 (en) * | 2005-05-26 | 2011-04-05 | Aprolase Development Co., Llc | Tier structure with tier frame having a feedthrough structure |
| WO2007004986A1 (en) * | 2005-07-06 | 2007-01-11 | Infineon Technologies Ag | An integrated circuit package and a method for manufacturing an integrated circuit package |
| SG130061A1 (en) | 2005-08-24 | 2007-03-20 | Micron Technology Inc | Microelectronic devices and microelectronic support devices, and associated assemblies and methods |
| US7307348B2 (en) | 2005-12-07 | 2007-12-11 | Micron Technology, Inc. | Semiconductor components having through wire interconnects (TWI) |
| US20070216033A1 (en) * | 2006-03-20 | 2007-09-20 | Corisis David J | Carrierless chip package for integrated circuit devices, and methods of making same |
| US7659612B2 (en) | 2006-04-24 | 2010-02-09 | Micron Technology, Inc. | Semiconductor components having encapsulated through wire interconnects (TWI) |
| TWI314774B (en) * | 2006-07-11 | 2009-09-11 | Siliconware Precision Industries Co Ltd | Semiconductor package and fabrication method thereof |
| KR100761468B1 (ko) | 2006-07-13 | 2007-09-27 | 삼성전자주식회사 | 반도체 장치 및 그 형성 방법 |
| US7969022B1 (en) * | 2007-03-21 | 2011-06-28 | Marvell International Ltd. | Die-to-die wire-bonding |
| JP2008306128A (ja) * | 2007-06-11 | 2008-12-18 | Shinko Electric Ind Co Ltd | 半導体装置およびその製造方法 |
| JP5273956B2 (ja) * | 2007-07-02 | 2013-08-28 | スパンション エルエルシー | 半導体装置の製造方法 |
| US20090154111A1 (en) * | 2007-12-17 | 2009-06-18 | Lynch Thomas W | Reticulated heat dissipation |
| US20090165996A1 (en) * | 2007-12-26 | 2009-07-02 | Lynch Thomas W | Reticulated heat dissipation with coolant |
| JP5343359B2 (ja) * | 2008-01-09 | 2013-11-13 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法 |
| US8138024B2 (en) * | 2008-02-26 | 2012-03-20 | Stats Chippac Ltd. | Package system for shielding semiconductor dies from electromagnetic interference |
| US8189344B2 (en) | 2008-06-09 | 2012-05-29 | Stats Chippac Ltd. | Integrated circuit package system for stackable devices |
| US7851893B2 (en) * | 2008-06-10 | 2010-12-14 | Stats Chippac, Ltd. | Semiconductor device and method of connecting a shielding layer to ground through conductive vias |
| US8183677B2 (en) * | 2008-11-26 | 2012-05-22 | Infineon Technologies Ag | Device including a semiconductor chip |
| US8168458B2 (en) * | 2008-12-08 | 2012-05-01 | Stats Chippac, Ltd. | Semiconductor device and method of forming bond wires and stud bumps in recessed region of peripheral area around the device for electrical interconnection to other devices |
| JP2010141066A (ja) * | 2008-12-11 | 2010-06-24 | Rohm Co Ltd | 半導体装置 |
| JP5112275B2 (ja) * | 2008-12-16 | 2013-01-09 | 新光電気工業株式会社 | 半導体装置及び半導体装置の製造方法 |
| JP5588150B2 (ja) | 2009-02-06 | 2014-09-10 | セイコーインスツル株式会社 | 樹脂封止型半導体装置 |
| US8357563B2 (en) * | 2010-08-10 | 2013-01-22 | Spansion Llc | Stitch bump stacking design for overall package size reduction for multiple stack |
| US8304900B2 (en) | 2010-08-11 | 2012-11-06 | Stats Chippac Ltd. | Integrated circuit packaging system with stacked lead and method of manufacture thereof |
| JP6246507B2 (ja) * | 2012-11-05 | 2017-12-13 | 新光電気工業株式会社 | プローブカード及びその製造方法 |
| JP5763696B2 (ja) * | 2013-03-04 | 2015-08-12 | スパンション エルエルシー | 半導体装置およびその製造方法 |
| JP6092729B2 (ja) | 2013-07-19 | 2017-03-08 | 新光電気工業株式会社 | プローブカード及びその製造方法 |
| JP6208486B2 (ja) | 2013-07-19 | 2017-10-04 | 新光電気工業株式会社 | プローブカード及びその製造方法 |
| JP6219227B2 (ja) * | 2014-05-12 | 2017-10-25 | 東京エレクトロン株式会社 | ヒータ給電機構及びステージの温度制御方法 |
| JP6219229B2 (ja) * | 2014-05-19 | 2017-10-25 | 東京エレクトロン株式会社 | ヒータ給電機構 |
| CN106486443A (zh) * | 2015-08-27 | 2017-03-08 | 冠研(上海)专利技术有限公司 | 简易半导体芯片封装结构及其封装方法 |
| CN106486429A (zh) * | 2015-08-27 | 2017-03-08 | 冠研(上海)专利技术有限公司 | 半导体芯片封装结构及其封装方法 |
| CN105514074B (zh) * | 2015-12-01 | 2018-07-03 | 上海伊诺尔信息技术有限公司 | 智能卡芯片封装结构及其制造方法 |
| IT201700073501A1 (it) * | 2017-06-30 | 2018-12-30 | St Microelectronics Srl | Prodotto a semiconduttore e corrispondente procedimento |
| US10453820B2 (en) * | 2018-02-07 | 2019-10-22 | Micron Technology, Inc. | Semiconductor assemblies using edge stacking and methods of manufacturing the same |
| FR3104317A1 (fr) * | 2019-12-04 | 2021-06-11 | Stmicroelectronics (Tours) Sas | Procédé de fabrication de puces électroniques |
| US11955396B2 (en) * | 2020-11-27 | 2024-04-09 | Yibu Semiconductor Co., Ltd. | Semiconductor packaging method, semiconductor assembly and electronic device comprising semiconductor assembly |
| US12159850B2 (en) | 2020-12-25 | 2024-12-03 | Yibu Semiconductor Co., Ltd. | Semiconductor packaging method, semiconductor assembly and electronic device comprising semiconductor assembly |
| US12154884B2 (en) | 2021-02-01 | 2024-11-26 | Yibu Semiconductor Co., Ltd. | Semiconductor packaging method, semiconductor assembly and electronic device comprising semiconductor assembly |
| US12500203B2 (en) | 2021-02-22 | 2025-12-16 | Yibu Semiconductor Co., Ltd. | Semiconductor packaging method, semiconductor assembly and electronic device comprising semiconductor assembly |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60117696A (ja) * | 1983-11-30 | 1985-06-25 | 沖電気工業株式会社 | Epromの実装構造 |
| WO1989001873A1 (en) * | 1987-08-26 | 1989-03-09 | Matsushita Electric Industrial Co., Ltd. | Integrated circuit device and method of producing the same |
| US6072239A (en) * | 1995-11-08 | 2000-06-06 | Fujitsu Limited | Device having resin package with projections |
| JP3007833B2 (ja) | 1995-12-12 | 2000-02-07 | 富士通株式会社 | 半導体装置及びその製造方法及びリードフレーム及びその製造方法 |
| JP3207738B2 (ja) * | 1996-01-15 | 2001-09-10 | 株式会社東芝 | 樹脂封止型半導体装置及びその製造方法 |
| JP3500015B2 (ja) | 1996-09-25 | 2004-02-23 | 三洋電機株式会社 | 半導体装置及びその製造方法 |
| JPH11312749A (ja) * | 1998-02-25 | 1999-11-09 | Fujitsu Ltd | 半導体装置及びその製造方法及びリードフレームの製造方法 |
| US6451624B1 (en) * | 1998-06-05 | 2002-09-17 | Micron Technology, Inc. | Stackable semiconductor package having conductive layer and insulating layers and method of fabrication |
| JP3397725B2 (ja) * | 1999-07-07 | 2003-04-21 | 沖電気工業株式会社 | 半導体装置、その製造方法及び半導体素子実装用テープの製造方法 |
| US6247229B1 (en) * | 1999-08-25 | 2001-06-19 | Ankor Technology, Inc. | Method of forming an integrated circuit device package using a plastic tape as a base |
| JP2002158312A (ja) * | 2000-11-17 | 2002-05-31 | Oki Electric Ind Co Ltd | 3次元実装用半導体パッケージ、その製造方法、および半導体装置 |
| JP3798620B2 (ja) * | 2000-12-04 | 2006-07-19 | 富士通株式会社 | 半導体装置の製造方法 |
| US6696320B2 (en) * | 2001-09-30 | 2004-02-24 | Intel Corporation | Low profile stacked multi-chip package and method of forming same |
-
2002
- 2002-04-05 JP JP2002103684A patent/JP4014912B2/ja not_active Expired - Fee Related
- 2002-09-24 US US10/252,504 patent/US20030062631A1/en not_active Abandoned
- 2002-12-27 TW TW91137702A patent/TW571416B/zh active
-
2005
- 2005-06-13 US US11/150,296 patent/US7148576B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| TW200305264A (en) | 2003-10-16 |
| US20050224949A1 (en) | 2005-10-13 |
| US7148576B2 (en) | 2006-12-12 |
| JP2003174120A (ja) | 2003-06-20 |
| JP4014912B2 (ja) | 2007-11-28 |
| US20030062631A1 (en) | 2003-04-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW571416B (en) | Semiconductor device and method of fabricating the same | |
| TWI772672B (zh) | 晶片封裝方法及晶片結構 | |
| JP5529371B2 (ja) | 半導体装置及びその製造方法 | |
| CN101290930B (zh) | 包含半导体芯片叠层的半导体器件及其制造方法 | |
| CN112117258A (zh) | 一种芯片封装结构及其封装方法 | |
| JPH1056128A (ja) | 半導体パッケージ用基板およびその製造方法とその基板 を利用した積層型半導体パッケージ | |
| JP2002222889A (ja) | 半導体装置及びその製造方法 | |
| JP2004221399A (ja) | リードフレーム、その製造方法、それを用いた半導体装置およびその製造方法 | |
| KR100594716B1 (ko) | 공동부를 구비한 캡 웨이퍼, 이를 이용한 반도체 칩, 및그 제조방법 | |
| CN101477980A (zh) | 具有减小尺寸的堆叠晶片水平封装 | |
| US12424501B2 (en) | Semiconductor package including a chip-substrate composite semiconductor device | |
| CN114171404A (zh) | 扇出式堆叠芯片的封装方法及封装结构 | |
| CN114171405A (zh) | 扇出式堆叠芯片的封装方法及封装结构 | |
| CN114171402A (zh) | 扇出式堆叠芯片的封装方法及封装结构 | |
| CN114171401A (zh) | 扇出式堆叠芯片的封装方法及封装结构 | |
| CN114203690A (zh) | 扇出式堆叠芯片的封装方法及封装结构 | |
| CN100423250C (zh) | 双层引线封装结构及其制造方法 | |
| CN114171406A (zh) | 扇出式堆叠芯片的封装方法及封装结构 | |
| JP4140012B2 (ja) | チップ状電子部品、その製造方法及び実装構造 | |
| CN120933163B (zh) | 桥连封装方法和封装结构 | |
| TWI399839B (zh) | 內置於半導體封裝構造之中介連接器 | |
| TWI401787B (zh) | 封裝基板之製法 | |
| KR20030080187A (ko) | 반도체장치 | |
| CN116779461A (zh) | 扇出型芯片封装方法及封装结构 | |
| TWI377661B (en) | Substrate for package on package and method for manufacturing the same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent |