KR970023857A - 알루미늄 배선부를 갖는 반도체 장치 및 그 제조방법 - Google Patents
알루미늄 배선부를 갖는 반도체 장치 및 그 제조방법 Download PDFInfo
- Publication number
- KR970023857A KR970023857A KR1019960046188A KR19960046188A KR970023857A KR 970023857 A KR970023857 A KR 970023857A KR 1019960046188 A KR1019960046188 A KR 1019960046188A KR 19960046188 A KR19960046188 A KR 19960046188A KR 970023857 A KR970023857 A KR 970023857A
- Authority
- KR
- South Korea
- Prior art keywords
- film
- aluminum
- titanium
- semiconductor device
- manufacturing
- Prior art date
Links
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 title claims abstract description 20
- 229910052782 aluminium Inorganic materials 0.000 title claims abstract description 20
- 239000004065 semiconductor Substances 0.000 title claims abstract description 19
- 238000004519 manufacturing process Methods 0.000 title claims abstract 7
- UQZIWOQVLUASCR-UHFFFAOYSA-N alumane;titanium Chemical compound [AlH3].[Ti] UQZIWOQVLUASCR-UHFFFAOYSA-N 0.000 claims abstract 14
- 229910000838 Al alloy Inorganic materials 0.000 claims abstract 6
- 239000000758 substrate Substances 0.000 claims abstract 6
- 239000004020 conductor Substances 0.000 claims abstract 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims 8
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims 8
- 229910052719 titanium Inorganic materials 0.000 claims 8
- 239000010936 titanium Substances 0.000 claims 8
- 239000010410 layer Substances 0.000 claims 5
- 239000002356 single layer Substances 0.000 claims 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 1
- 238000005275 alloying Methods 0.000 claims 1
- 229910052799 carbon Inorganic materials 0.000 claims 1
- 238000013508 migration Methods 0.000 abstract 1
- 230000005012 migration Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76853—Barrier, adhesion or liner layers characterized by particular after-treatment steps
- H01L21/76855—After-treatment introducing at least one additional element into the layer
- H01L21/76858—After-treatment introducing at least one additional element into the layer by diffusing alloying elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/32051—Deposition of metallic or metal-silicide layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76843—Barrier, adhesion or liner layers formed in openings in a dielectric
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76843—Barrier, adhesion or liner layers formed in openings in a dielectric
- H01L21/76846—Layer combinations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76853—Barrier, adhesion or liner layers characterized by particular after-treatment steps
- H01L21/76855—After-treatment introducing at least one additional element into the layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53209—Conductive materials based on metals, e.g. alloys, metal silicides
- H01L23/53214—Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being aluminium
- H01L23/53223—Additional layers associated with aluminium layers, e.g. adhesion, barrier, cladding layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/45—Ohmic electrodes
- H01L29/456—Ohmic electrodes on silicon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/0212—Auxiliary members for bonding areas, e.g. spacers
- H01L2224/02122—Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body
- H01L2224/02163—Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body on the bonding area
- H01L2224/02165—Reinforcing structures
- H01L2224/02166—Collar structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05556—Shape in side view
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Recrystallisation Techniques (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
알루미늄 배선을 (111) 방향 티탄 알루미늄막과 (111) 방향 알루미늄막 내지는 (111) 방향 티탄 알루미늄막과 (111) 방향 알루미늄 합금막의 2층 구조로 함으로써, 일렉트로 마이그레이션(electro migration) 내성이 높은 고 (111) 방향의 알루미늄 배선을 갖는 신뢰성이 높은 반도체 장치 및 제조 방법을 제공한다.
반도체 기판상에 절연막을 통하여 (111) 방향을 가지는 티탄 알루미늄막과, 이 티탄 알루미늄막상에 에피택셜 성장(epitaxial growth)시킨 (111) 방향을 가지는 알루미늄막, 또는 알루미늄 합금막으로 이루어지는 도체층을 형성한 알루미늄 배선부를 갖는 반도체 장치를 제공한다. 이러한 구조로 함으로써, 알쿠미늄배선의 일렉트로 마이그레이션 내성을 향상시킬 수 있어서, 신뢰성이 높은 반도체 장치의 배선 구조를 실현할 수 있다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
도1은 본 발명의 제1실시 형태로 예시한 반도체 장치의 알루미늄 배선 구조의 일례를 도시하는 모식도.
Claims (7)
- 반도체 기판상에 절연막을 통하여 적어도 (111) 방향을 가지는 티탄 알루미늄막과, 이 티탄 알루미늄막상에 에피택셜 성장한 (111) 방향을 가지는 알루미늄막, 또는 알루미늄 합금막으로 이루어지는 도체층을 형성한 것을 특징으로 하는 알루미늄 배선부를 갖는 반도체 장치.
- 제1항에 있어서, 절연막과 티탄 알루미늄막 사이에 티탄막을 설치한 것을 특징으로 하는 알루미늄 배선부를 갖는 반도체 장치.
- 제1항에 있어서, 절연막과 티탄 알루미늄막 사이에 질화 티탄막으로 이루어지는 단층막 또는 질화 티탄막과 티탄막으로 이루어지는 2층막을 설치한 것을 특징으로 하는 알루미늄 배선부를 갖는 반도체 장치.
- 제2항에 있어서, 절연막과 티탄 알루미늄막 사이에 질화 티탄막으로 이루어지는 단층막 또는 질화 티탄막과 티탄막으로 이루어지는 2층막을 설치한 것을 특징으로 하는 알루미늄 배선부를 갖는 반도체 장치.
- 알루미늄 배선부를 갖는 반도체 장치의 제조 방법에 있어서, 반도체 기판상에 절연막을 형성하는 공정과, 상기 절연막상에 직접 또는 티탄막을 통하여 (111) 방향을 가지는 티탄 알루미늄막을 형성하는 공정과, 상기 티탄 알루미늄막상에 (111) 방향을 가지는 알루미늄막, 또는 알루미늄 합금막을 에피택셜 성장시키는 공정을 적어도 포함하는 것을 특징으로 하는 알루미늄 배선부를 갖는 반도체 장치의 제조 방법.
- 알루미늄 배선부를 갖는 반도체 장치의 제조 방법에 있어서, 반도체 기판상에 절연막을 형성하는 공정과, 상기 절연막상에 티탄막을 형성하는 공정과, 상기 티탄막상에 기판온도 260℃이상으로 알루미늄막을 형성함으로써 상기 티탄막과 알루미늄막을 합금화 반응시켜 (111) 방향을 가지는 티탄 알루미늄막을 형성하는 공정과, 상기 티탄 알루미늄막상에 (111) 방향을 가지는 알루미늄막 또는 알루미늄 합금을 에피택셜 성장시키는 공정을 적어도 포함하는 것을 특징으로 하는 알루미늄 배선부를 갖는 반도체 장치의 제조 방법.
- 알루미늄 배선부를 갖는 반도체 장치의 제조 방법에 있어서, 반도체 기판상에 절연막을 형성하는 공정과 상기 절연막상에 질화 티탄막 또는 질화 티탄막과 티탄막으로 이루어지는 2층막을 형성하는 공정과, 상기 질화 티탄막 또는 질화 티탄막과 티탄막으로 이루어지는 2층막상에 (111) 방향을 가지는 티탄 알루미늄막을 형성하는 공정과 상기 티탄 알루미늄막상에 (111) 방향을 가지는 알루미늄막 또는 알루미늄 합금막을 에피택셜 성장시키는 공정을 적어도 포함하는 것을 특징으로 하는 알루미늄 배선부를 갖는 반도체 장치의 제조 방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7268172A JPH09115829A (ja) | 1995-10-17 | 1995-10-17 | アルミニウム配線部を有する半導体装置およびその製造方法 |
JP95-268172 | 1995-10-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR970023857A true KR970023857A (ko) | 1997-05-30 |
Family
ID=17454920
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960046188A KR970023857A (ko) | 1995-10-17 | 1996-10-16 | 알루미늄 배선부를 갖는 반도체 장치 및 그 제조방법 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5869901A (ko) |
JP (1) | JPH09115829A (ko) |
KR (1) | KR970023857A (ko) |
DE (1) | DE19642740A1 (ko) |
GB (1) | GB2306774B (ko) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6087259A (en) * | 1996-06-24 | 2000-07-11 | Hyundai Electronics Industries Co., Ltd. | Method for forming bit lines of semiconductor devices |
JP3677135B2 (ja) * | 1997-01-09 | 2005-07-27 | 株式会社東芝 | 半導体集積回路とその製造方法 |
KR100244251B1 (ko) * | 1997-06-19 | 2000-02-01 | 김영환 | 반도체 소자의 커패시터 제조 방법 |
KR100269302B1 (ko) * | 1997-07-23 | 2000-10-16 | 윤종용 | 반도체장치의금속배선및그형성방법 |
JP3381767B2 (ja) * | 1997-09-22 | 2003-03-04 | 東京エレクトロン株式会社 | 成膜方法および半導体装置の製造方法 |
US6365514B1 (en) * | 1997-12-23 | 2002-04-02 | Intel Corporation | Two chamber metal reflow process |
KR100316030B1 (ko) * | 1997-12-30 | 2002-02-19 | 박종섭 | 반도체장치의알루미늄배선형성방법 |
JPH11243204A (ja) * | 1998-02-25 | 1999-09-07 | Matsushita Electric Ind Co Ltd | アクティブマトリックス基板及びその液晶表示装置 |
KR100287179B1 (ko) * | 1998-09-04 | 2001-04-16 | 윤종용 | 비트라인를포함하는반도체장치및그제조방법 |
US6495442B1 (en) * | 2000-10-18 | 2002-12-17 | Magic Corporation | Post passivation interconnection schemes on top of the IC chips |
US6965165B2 (en) | 1998-12-21 | 2005-11-15 | Mou-Shiung Lin | Top layers of metal for high performance IC's |
US6383915B1 (en) * | 1999-02-03 | 2002-05-07 | Applied Materials, Inc. | Tailoring of a wetting/barrier layer to reduce electromigration in an aluminum interconnect |
JP3437801B2 (ja) * | 1999-07-28 | 2003-08-18 | 沖電気工業株式会社 | 半導体装置のための配線構造および配線形成方法 |
US6833623B2 (en) * | 1999-08-11 | 2004-12-21 | Micron Technology, Inc. | Enhanced barrier liner formation for via |
US6331460B1 (en) | 1999-11-17 | 2001-12-18 | Agere Systems Guardian Corp. | Method of fabricating a mom capacitor having a metal silicide barrier |
US6335557B1 (en) * | 1999-11-17 | 2002-01-01 | Agere Systems Guardian Corp. | Metal silicide as a barrier for MOM capacitors in CMOS technologies |
KR100367406B1 (ko) | 2000-08-31 | 2003-01-10 | 주식회사 하이닉스반도체 | 고집적 반도체 소자의 게이트 형성방법 |
US6787833B1 (en) * | 2000-08-31 | 2004-09-07 | Micron Technology, Inc. | Integrated circuit having a barrier structure |
JP4752108B2 (ja) | 2000-12-08 | 2011-08-17 | ソニー株式会社 | 半導体装置およびその製造方法 |
DE602004028129D1 (de) * | 2003-08-11 | 2010-08-26 | Honeywell Int Inc | Target/trägerplatte-konstruktionen und herstellungsverfahren dafür |
JP2006344635A (ja) * | 2005-06-07 | 2006-12-21 | Matsushita Electric Ind Co Ltd | 評価用半導体装置 |
US20080006098A1 (en) * | 2006-07-07 | 2008-01-10 | Infineon Technologies | Sensor device and a method for its manufacturing |
KR100840642B1 (ko) * | 2006-12-05 | 2008-06-24 | 동부일렉트로닉스 주식회사 | 반도체 소자의 가드링 및 그 형성방법 |
US9698019B2 (en) | 2014-03-14 | 2017-07-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | N-work function metal with crystal structure |
US10453923B2 (en) * | 2016-03-16 | 2019-10-22 | Fuji Electric Co., Ltd. | Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device |
JP6772495B2 (ja) * | 2016-03-16 | 2020-10-21 | 富士電機株式会社 | 炭化珪素半導体装置および炭化珪素半導体装置の製造方法 |
JP6783688B2 (ja) * | 2017-03-14 | 2020-11-11 | エイブリック株式会社 | 半導体装置および半導体装置の製造方法 |
US10354871B2 (en) * | 2017-09-11 | 2019-07-16 | General Electric Company | Sputtering system and method for forming a metal layer on a semiconductor device |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4017890A (en) * | 1975-10-24 | 1977-04-12 | International Business Machines Corporation | Intermetallic compound layer in thin films for improved electromigration resistance |
US4438450A (en) * | 1979-11-30 | 1984-03-20 | Bell Telephone Laboratories, Incorporated | Solid state device with conductors having chain-shaped grain structure |
JPH0687464B2 (ja) * | 1986-12-17 | 1994-11-02 | 日本電装株式会社 | アルミニウム合金配線装置およびその製造方法 |
US5071714A (en) * | 1989-04-17 | 1991-12-10 | International Business Machines Corporation | Multilayered intermetallic connection for semiconductor devices |
JP2680468B2 (ja) * | 1989-07-01 | 1997-11-19 | 株式会社東芝 | 半導体装置および半導体装置の製造方法 |
JP2598335B2 (ja) * | 1990-08-28 | 1997-04-09 | 三菱電機株式会社 | 半導体集積回路装置の配線接続構造およびその製造方法 |
JP2937613B2 (ja) * | 1991-07-16 | 1999-08-23 | 日本電気株式会社 | 薄膜配線およびその製造方法 |
US5242860A (en) * | 1991-07-24 | 1993-09-07 | Applied Materials, Inc. | Method for the formation of tin barrier layer with preferential (111) crystallographic orientation |
JPH05235416A (ja) * | 1992-02-21 | 1993-09-10 | Murata Mfg Co Ltd | 強誘電体薄膜素子 |
JPH06268083A (ja) * | 1993-03-11 | 1994-09-22 | Sony Corp | 半導体装置の配線 |
JP3422055B2 (ja) * | 1993-11-08 | 2003-06-30 | 株式会社デンソー | 半導体装置の電極配線 |
US5523259A (en) * | 1994-12-05 | 1996-06-04 | At&T Corp. | Method of forming metal layers formed as a composite of sub-layers using Ti texture control layer |
US5641992A (en) * | 1995-08-10 | 1997-06-24 | Siemens Components, Inc. | Metal interconnect structure for an integrated circuit with improved electromigration reliability |
US5747879A (en) * | 1995-09-29 | 1998-05-05 | Intel Corporation | Interface between titanium and aluminum-alloy in metal stack for integrated circuit |
-
1995
- 1995-10-17 JP JP7268172A patent/JPH09115829A/ja active Pending
-
1996
- 1996-10-14 GB GB9621415A patent/GB2306774B/en not_active Expired - Fee Related
- 1996-10-15 US US08/730,598 patent/US5869901A/en not_active Expired - Fee Related
- 1996-10-16 KR KR1019960046188A patent/KR970023857A/ko active IP Right Grant
- 1996-10-16 DE DE19642740A patent/DE19642740A1/de not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
GB9621415D0 (en) | 1996-12-04 |
DE19642740A1 (de) | 1997-04-24 |
GB2306774B (en) | 1997-12-17 |
US5869901A (en) | 1999-02-09 |
GB2306774A (en) | 1997-05-07 |
JPH09115829A (ja) | 1997-05-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR970023857A (ko) | 알루미늄 배선부를 갖는 반도체 장치 및 그 제조방법 | |
KR890001178A (ko) | 초전도재의 배선을 가지는 반도체장치 | |
KR910005383A (ko) | 반도체장치 및 그 제조방법 | |
KR970018759A (ko) | 반도체 발광소자 및 그 제조방법 | |
KR970008573A (ko) | 반도체 장치의 접속구조 및 그 제조방법 | |
KR870002645A (ko) | 반도체장치의 제조방법 | |
KR920017250A (ko) | 반도체기판 및 그 제조방법 | |
KR870003561A (ko) | 반도체장치 | |
KR840002162A (ko) | 반도체 장치(半導體裝置) | |
KR870004503A (ko) | 반도체 장치 및 그 제조방법 | |
KR900017110A (ko) | 반도체장치의 제조방법 | |
KR880014665A (ko) | 반도체장치 및 그 제조방법 | |
WO2003049191A3 (de) | Bicmos-struktur, verfahren zu ihrer herstellung und bipolartransistor für eine bicmos-struktur | |
KR890016626A (ko) | 반도체장치 | |
KR930022523A (ko) | 반도체장치 | |
KR940016597A (ko) | 절연체 위에 단결정 반도체 제조방법 | |
KR900002408A (ko) | 반도체장치의 제조방법 | |
JPS6459937A (en) | Semiconductor device | |
KR900007107A (ko) | 반도체 소자 | |
KR870007567A (ko) | 반도체장치의 제조방법 | |
JPS5780741A (en) | Active matrix substrate | |
KR960005797A (ko) | 반도체소자 배선 형성방법 | |
KR910010625A (ko) | 반도체 장치의 제조방법 | |
KR920013629A (ko) | 반도체장치 | |
JPS5934653A (ja) | 半導体装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
NORF | Unpaid initial registration fee |