KR950012614A - 플라즈마 처리장치 - Google Patents

플라즈마 처리장치 Download PDF

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KR950012614A
KR950012614A KR1019940025300A KR19940025300A KR950012614A KR 950012614 A KR950012614 A KR 950012614A KR 1019940025300 A KR1019940025300 A KR 1019940025300A KR 19940025300 A KR19940025300 A KR 19940025300A KR 950012614 A KR950012614 A KR 950012614A
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gas
plasma processing
processing apparatus
coil
target object
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KR1019940025300A
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KR100264445B1 (ko
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노부오 이시이
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이노우에 아키라
도오교오 에레구토론 가부시끼가이샤
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Priority claimed from JP27313893A external-priority patent/JP3173691B2/ja
Priority claimed from JP27314093A external-priority patent/JP3173693B2/ja
Priority claimed from JP27313993A external-priority patent/JP3173692B2/ja
Priority claimed from JP28421193A external-priority patent/JP3276023B2/ja
Priority claimed from JP28420793A external-priority patent/JP3193815B2/ja
Application filed by 이노우에 아키라, 도오교오 에레구토론 가부시끼가이샤 filed Critical 이노우에 아키라
Publication of KR950012614A publication Critical patent/KR950012614A/ko
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32623—Mechanical discharge control means
    • H01J37/32642—Focus rings
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S156/00—Adhesive bonding and miscellaneous chemical manufacture
    • Y10S156/915—Differential etching apparatus including focus ring surrounding a wafer for plasma apparatus

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
  • Plasma Technology (AREA)

Abstract

플라즈마 처리 장치가 웨이퍼를 지지하기 위하여 그 내부에 지지대가 배치된 챔버를 포함하다. 평판형의 코일로 된 안테나가 웨이퍼 쪽으로 향하기 위하여 챔버의 절연벽의 외면에 장착된다. 고주파 전류가 코일에 공급되고, 그로 인해 코일과 웨이퍼 사이의 챔버 내에서 플라즈마를 생성한다. 웨이퍼를 둘러싸기 위하여 포커스 링이 지지대 상에 배치되고, 그것은 상기 웨이퍼의 표면을 지나는 코일을 향하여 돌출하며, 상기 돌출부와 코일 사이에서 생성되는 플라즈마를 웨이퍼의 표면과 거의 평행한 방법으로 향하게 하기 위하여 전기 절연체 또는 고저항체로 형성된 돌출부를 가진다.

Description

플라즈마 처리장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 제1의 실시예에 관한 플라즈마 처리 장치의 전체 구성을 나타내는 단면도이다.
제2도는 본 발명의 실시예의 전체 구성의 개략을 나타내는 개략 사시도이다.

Claims (17)

  1. 가스 유입 포트 및 가스 배출 포트를 가지는 챔버와; 상기 챔버내에 배치된 피처리 면을 가지는 피처리체를 지지하는 지지 수단과; 상기 지지 수단에 의해 지지되는 피처리체의 피처리면에 대하여 소정의 간격을 두고 설치된 평면상의 코일과; 상기 코일에 고주파 전류를 공급하며, 상기 코일과 지지 수단 사이의 챔버 내에 플라즈마를 발생시키는 고주파 전원 수단과; 피처리체를 둘러싸도록 상기 지지수단에 설치된 피처리체의 피처리면에 의하여 상기 코일 방향으로 돌출하며, 전기 절연체 또는 고저항체로서 형성된 돌출부를 가지며, 상기 돌출부와 코일과의 사이에서 발생하는 플라즈마를 피처리면과 거의 평행한 방향으로 지향하는 수단을 포함하여 구성되는 플라즈마 처리장치.
  2. 제1항에 있어서, 사익 돌출부는 피처리체 측에 위치한 한 끝단과, 피처리체로부터 떨어진 측에 위치한 다른 한 끝단부를 가지며, 다른 한 끝단부는 한 쪽 끝단부 보다 코일 방향으로 돌출하여 있는, 플라즈마 처리장치.
  3. 제2항에 있어서, 상기 지향 수단은, 전기 절연체 또는 고저항체로서 형성된 고리 모양의 플라즈마 포커스 링을 가지는, 플라즈마 처리장치.
  4. 제3항에 있어서, 상기 포커스 링은 피처리체에 가까와짐에 따라 상기 코일로부터 멀어지도록 경사진 돌출면을 가지는, 플라즈마 처리장치.
  5. 제3항에 있어서, 상기 포커스 링은 피처리체에 가까와짐에 따라 상기 코일로부터 멀어지도록 스탭와이즈된 돌출면을 가지는, 플라즈마 처리장치.
  6. 제1항에 있어서, 상기 지향 수단은, 전기 절연체 또는 고저항체로서 형성된 외환상부재와, 이 외환상부재와 피처리체와의 사이에 배치된, 도체로서 형성된 내환상부재를 가지는, 플라즈마 처리장치.
  7. 제6항에 있어서, 상기 외환상부재는 상기 내환상부재 보다 상기 코일 방향으로 돌출하여 있는, 플라즈마 처리장치.
  8. 제6항에 있어서, 상기 외환상부재는 상기 내환상부재 보다 상기 코일 방향으로 돌출하여 있는, 플라즈마 처리장치
  9. 제1항에 있어서, 상기 지지 수단의 온도를 조절하는 수단과; 상기 온도 조절 수단으로부터의 열을 피처리체에 전달시키는 열전달용 가스를 상기 지지 수단과 피처리체 사이에 공급하는 가스 공급수단과; 이 공급시킨 가스의 압력을 검출하고, 압력에 대응한 신호를 내보내는 압력 검출 수단과; 이 압력 검출 수단으로부터 발생된 신호에 따라 상기 가스 공급 수단의 가스 공급량을 조절하며, 이 가스에 의하여 피처리체로의 열전달을 제어하는 수단을 더욱 포함하여 구성되는, 플라즈마 처리장치.
  10. 제9항에 있어서, 상기 제어 수단은, 피처리체의 처리중에는 피처리체의 온도가 일정하게 되도록 가스 공급량을 제어하는, 플라즈마 처리장치.
  11. 제9항에 있어서, 상기 지지 수단의 온도를 검출하고, 이 온도에 대응한 신호를 내보내는 온도 검출 수단을 더욱 포함하며, 여기서 상기 제어 수단은 이 온도 검출 수단으로부터의 신호와, 상기 압력 검출수단으로부터의 신호에 다라 상기 가스 공급 수단의 가스 공급량을 조절하는, 플라즈마 처리장치.
  12. 제1항에 있어서, 상기 지지 수단이, 피처리체를 정전적으로 흡착하여 지지하며, 반응성 이온에 대하여 내구성이 높은 재료로서 형성된 바깥 층과, 이 바깥 층에 설치된 전극을 가지는 정전 척를 포함하며 구성되는, 플라즈마 처리장치.
  13. 제12항에 있어서, 상기 정전척의 바깥 층은 세라믹, 석영 또는 절연성 고분자로 형성되는, 플라즈마 처리장치.
  14. 제1항에 있어서, 상기 지지 수단은 하우징의 대향 전극을 가지며, 이 전극에는 1 내지 3MHz의 주파수의 바이어스용 고주파 에너지가 인가되는, 플라즈마 처리장치.
  15. 제1항에 있어서, 상기 지지 수단은, 피처리체의 처리 중에는 -50 내지 -150℃로 냉각되어 있는, 플라즈마 처리장치.
  16. 제1항에 있어서, 상기 챔버에는 가스 유입 포트를 통하여, CH4가스와 CF4가스, 그리고 이들 가스에 유량비로서 10%미만의 02가스 또는 50%미만의 Ar가스로 된 혼합 가스, 또는 NF3가스와, CH4가스, 02가스 또는 Ar가스로 된 혼합 가스가 공급되어 피처리체가 에칭 처리되는, 플라즈마 처리장치.
  17. 제16항에 있어서, 에칭 처리 중, 상기 챔버의 내면은 50 내지 100℃로 가열되어 있는, 플라즈마 처리장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019940025300A 1993-10-04 1994-10-04 플라즈마처리장치 KR100264445B1 (ko)

Applications Claiming Priority (10)

Application Number Priority Date Filing Date Title
JP27313893A JP3173691B2 (ja) 1993-10-04 1993-10-04 プラズマ処理装置
JP93-273139 1993-10-04
JP27314093A JP3173693B2 (ja) 1993-10-04 1993-10-04 プラズマ処理装置及びその方法
JP27313993A JP3173692B2 (ja) 1993-10-04 1993-10-04 プラズマ処理方法
JP93-273140 1993-10-04
JP93-273138 1993-10-04
JP93-284211 1993-10-20
JP28421193A JP3276023B2 (ja) 1993-10-20 1993-10-20 プラズマ処理装置の制御方法
JP28420793A JP3193815B2 (ja) 1993-10-20 1993-10-20 プラズマ処理装置およびその制御方法
JP93-284207 1993-10-20

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KR950012614A true KR950012614A (ko) 1995-05-16
KR100264445B1 KR100264445B1 (ko) 2000-11-01

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KR (1) KR100264445B1 (ko)

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