KR930018704A - 리드-온-칩 반도체 장치 - Google Patents

리드-온-칩 반도체 장치 Download PDF

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KR930018704A
KR930018704A KR1019930000791A KR930000791A KR930018704A KR 930018704 A KR930018704 A KR 930018704A KR 1019930000791 A KR1019930000791 A KR 1019930000791A KR 930000791 A KR930000791 A KR 930000791A KR 930018704 A KR930018704 A KR 930018704A
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chip
lead
working surface
leads
bond pads
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KR1019930000791A
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KR100276781B1 (ko
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지. 비글러 챨스
제이. 카스토 제임스
비. 맥샤인 마이클
디. 아프샤 데이비드
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빈센트 비. 인그라시아
모토로라 인코포레이티드
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • HELECTRICITY
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    • HELECTRICITY
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    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49503Lead-frames or other flat leads characterised by the die pad
    • H01L23/4951Chip-on-leads or leads-on-chip techniques, i.e. inner lead fingers being used as die pad
    • HELECTRICITY
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    • H01L23/50Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
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    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
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    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
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    • H01L2224/481Disposition
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    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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    • H01L2924/181Encapsulation
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y10S228/00Metal fusion bonding
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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  • Condensed Matter Physics & Semiconductors (AREA)
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  • Wire Bonding (AREA)
  • Lead Frames For Integrated Circuits (AREA)
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Abstract

본 발명의 반도체 장치(10)는 리-온-칩(LOC)형태를 갖는다. 상기 장치의 리드(24)는 전도성 와이어(30)에 의해 주변 본드패드(14)에 전기적으로 연결된 중심부(36)를 갖는다.
리드의 안쪽부분(38)은 접착력을 개선하고 와이어 보닝중에 리드를 안정시키는 내부 클램핑 영역(41)을 제공하기 위해 중심부로부터 중심선(A-A)을 향해 연장된다. 한 실시예에서, 리드 프레임의 타이 바아(22)는 반도체 칩(12)을 가로질러 전원을 분배시키는데 사용된다. 또한 상기 리드 프레임은 칩(12)과 절연 테이프(18)를 리드 프레임에 각각 배열시키기 위해 칩 얼라인먼트 형상부(50)와 테이프 얼라인먼트 형상부(52)를 포함할 수 있다.

Description

리드-온-칩 반도체 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 한 실시예에 따른 반도체 장치의 평면도.
제2도는 제1도 영역(34)의 분해도.
제3도는 본 발명의 다른 실시예에 따른 반도체 장치의 평면도.

Claims (4)

  1. 리드-온-칩 반도체 장치(10 또는 70)에 있어서, 칩의 두 대향면을 교차하는 중심선(A-A)을 갖는 작용면과 주변을 모두 구비한 반도체 칩(12)과, 주변을 따라 칩의 작용면상에 형성된 다수의 본드 패드(14) 및, 다수의 본드 패드가 삽입되고 칩의 작용면에 놓인 부분을 갖는 다수의 리드를 포함하며, 상기 각각의 리드는, 전도성 와이어(30)에 의해 다수의 본드패드중의 하나에 전기적으로 연결된 중앙부(36)와, 상기 리드의 중심부분으로부터 칩의 작용면의 중심선을 향해 연장된 안쪽부분(38) 및, 칩으로부터 이격되어 리드의 중심부분에서 연장된 바깥부분(42)을 포함하는 것을 특징으로 하는 리드-온-칩 반도체 장치.
  2. 리드-온-칩 반도체 장치(10 또는 70)에 있어서, 작용면과 4개의 측면 및 4개의 모퉁이를 갖는 반도체 칩(12)과, 칩의 작용면상에 형성된 다수의 본드패드(14) 및, 칩의 작용면상에 놓이고 다수의 본드패드에 전기적으로 연결된 부분을 갖는 다수의 리드(24)를 구비하며, 상기 다수의 리드중 적어도 두개의 리드는 칩의 한쪽면이나 모퉁이에 배열된 돌출부(50)를 갖는 것을 특징으로 하는 리드-온-칩 반도체 장치.
  3. 리드-온-칩 반도체 장치(10 또는 70)제조 방법에 있어서, 작용면, 중심(A-A), 주변부 및 상기 주변부를 따라 칩의 작용면상 형성된 다수의 본드패드(14)를 가지는 반도체 칩(12)을 제공하는 단계와, 각각 안쪽부분(38)을 갖는 다수의 리드(24)를 구비한 리드 프레임(16)을 제공하는 단계와, 다수의 리드의 안쪽 부분들이 작용면상에 놓이고 칩의 중심선을 향해 연장되도록 칩을 리드 프레임에 접착하는 단계와, 클램핑 기구를 갖는 와이어 본딩 장치에 부착된 칩을 구비한 리드프레임을 위치시키는 단계와, 상기 리드의 실질적인 이동을 억제하도록 상기 클램핑 공구를 갖는 칩의 작용면에 대해 다수의 리드의 안쪽 부분을 클램핑하는 단계 및, 다수의 본드패드중 하나에 다수 리드의 각각의 클램프 되지 않은 부분을 와이어 본딩하는 단계를 포함하는 것을 특징으로 하는 리드-온-칩 반도체 장치.
  4. ※ 참고사항 : 최초출원 내용에 의하여 공개되는 것임.
KR1019930000791A 1992-02-03 1993-01-21 리드-온-칩 반도체장치 및 그 제조방법 KR100276781B1 (ko)

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US82987092A 1992-02-03 1992-02-03
US829,870 1992-02-03

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DE (2) DE69332191T2 (ko)
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Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR950005269B1 (ko) * 1992-07-29 1995-05-22 삼성전자주식회사 반도체 패키지 구조 및 제조방법
JPH07130788A (ja) * 1993-09-09 1995-05-19 Mitsubishi Electric Corp 半導体集積回路装置
JP2735509B2 (ja) * 1994-08-29 1998-04-02 アナログ デバイセス インコーポレーテッド 改善された熱放散を備えたicパッケージ
JP2908255B2 (ja) * 1994-10-07 1999-06-21 日本電気株式会社 半導体装置
JPH08306853A (ja) * 1995-05-09 1996-11-22 Fujitsu Ltd 半導体装置及びその製造方法及びリードフレームの製造方法
TW315491B (en) * 1995-07-31 1997-09-11 Micron Technology Inc Apparatus for applying adhesive tape for semiconductor packages
US6281044B1 (en) 1995-07-31 2001-08-28 Micron Technology, Inc. Method and system for fabricating semiconductor components
JP3304720B2 (ja) * 1995-10-31 2002-07-22 日立電線株式会社 リードフレームへの接着剤塗布方法
US5796159A (en) * 1995-11-30 1998-08-18 Analog Devices, Inc. Thermally efficient integrated circuit package
US5843809A (en) * 1996-01-24 1998-12-01 Lsi Logic Corporation Lead frames for trench drams
JP3488570B2 (ja) * 1996-03-29 2004-01-19 ローム株式会社 Led発光装置およびこれを用いた面発光照明装置
US5733800A (en) * 1996-05-21 1998-03-31 Micron Technology, Inc. Underfill coating for LOC package
US6384333B1 (en) 1996-05-21 2002-05-07 Micron Technology, Inc. Underfill coating for LOC package
TW335545B (en) * 1996-06-12 1998-07-01 Hitachi Cable Lead frame, method of making the same and semiconductor device using the same
US6020748A (en) * 1996-07-03 2000-02-01 Vanguard International Semiconductor Corporation Method and apparatus for conducting failure analysis on IC chip package
DE19629767C2 (de) * 1996-07-23 2003-11-27 Infineon Technologies Ag Anschlußrahmen für Halbleiter-Chips und Halbeiter-Modul
US5736432A (en) * 1996-09-20 1998-04-07 National Semiconductor Corporation Lead frame with lead finger locking feature and method for making same
JPH10242360A (ja) * 1997-02-25 1998-09-11 Oki Electric Ind Co Ltd 半導体装置
KR100227120B1 (ko) * 1997-02-28 1999-10-15 윤종용 엘오씨(loc)리드와 표준형 리드가 복합된 구조를 갖는 반도체 칩 패키지
JP3638750B2 (ja) * 1997-03-25 2005-04-13 株式会社ルネサステクノロジ 半導体装置
US6008996A (en) * 1997-04-07 1999-12-28 Micron Technology, Inc. Interdigitated leads-over-chip lead frame, device, and method for supporting an integrated circuit die
US6271582B1 (en) * 1997-04-07 2001-08-07 Micron Technology, Inc. Interdigitated leads-over-chip lead frame, device, and method for supporting an integrated circuit die
JP2891233B2 (ja) * 1997-04-11 1999-05-17 日本電気株式会社 半導体装置
DE19715739A1 (de) * 1997-04-16 1998-10-22 Mci Computer Gmbh Halbleiter-Bauelement
US6144089A (en) * 1997-11-26 2000-11-07 Micron Technology, Inc. Inner-digitized bond fingers on bus bars of semiconductor device package
US6268643B1 (en) * 1997-12-22 2001-07-31 Texas Instruments Incorporated Lead frame device for delivering electrical power to a semiconductor die
US6509632B1 (en) * 1998-01-30 2003-01-21 Micron Technology, Inc. Method of fabricating a redundant pinout configuration for signal enhancement in an IC package
US6335225B1 (en) 1998-02-20 2002-01-01 Micron Technology, Inc. High density direct connect LOC assembly
US6114756A (en) * 1998-04-01 2000-09-05 Micron Technology, Inc. Interdigitated capacitor design for integrated circuit leadframes
US6117797A (en) 1998-09-03 2000-09-12 Micron Technology, Inc. Attachment method for heat sinks and devices involving removal of misplaced encapsulant
US6977214B2 (en) * 1998-12-11 2005-12-20 Micron Technology, Inc. Die paddle clamping method for wire bond enhancement
DE19900464A1 (de) * 1999-01-08 2000-04-20 Siemens Ag Bauelement und Verfahren zur Herstellung eines Bauelementes
DE10158770B4 (de) * 2001-11-29 2006-08-03 Infineon Technologies Ag Leiterrahmen und Bauelement mit einem Leiterrahmen
US7005729B2 (en) * 2002-04-24 2006-02-28 Intel Corporation Device packaging using tape automated bonding (TAB) strip bonded to strip carrier frame
JP4387654B2 (ja) * 2002-10-10 2009-12-16 パナソニック株式会社 半導体装置およびその製造方法
US7012324B2 (en) * 2003-09-12 2006-03-14 Freescale Semiconductor, Inc. Lead frame with flag support structure
DE102004020172A1 (de) * 2004-04-24 2005-11-24 Robert Bosch Gmbh Monolithischer Regler für die Generatoreinheit eines Kraftfahrzeugs
US7466013B2 (en) * 2005-12-15 2008-12-16 Etron Technology, Inc. Semiconductor die structure featuring a triple pad organization
KR100900229B1 (ko) 2006-12-01 2009-06-02 주식회사 하이닉스반도체 Fbga 패키지
US7829997B2 (en) * 2007-04-04 2010-11-09 Freescale Semiconductor, Inc. Interconnect for chip level power distribution
CN101675518B (zh) * 2007-05-10 2012-12-05 飞思卡尔半导体公司 芯片上功率引线球栅阵列封装
US8791582B2 (en) 2010-07-28 2014-07-29 Freescale Semiconductor, Inc. Integrated circuit package with voltage distributor
KR101796116B1 (ko) 2010-10-20 2017-11-10 삼성전자 주식회사 반도체 장치, 이를 포함하는 메모리 모듈, 메모리 시스템 및 그 동작방법
US8957510B2 (en) 2013-07-03 2015-02-17 Freescale Semiconductor, Inc. Using an integrated circuit die configuration for package height reduction

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3685137A (en) * 1971-05-13 1972-08-22 Rca Corp Method for manufacturing wire bonded integrated circuit devices
US4583676A (en) * 1982-05-03 1986-04-22 Motorola, Inc. Method of wire bonding a semiconductor die and apparatus therefor
US4595945A (en) * 1983-10-21 1986-06-17 At&T Bell Laboratories Plastic package with lead frame crossunder
US4612564A (en) * 1984-06-04 1986-09-16 At&T Bell Laboratories Plastic integrated circuit package
US4600138A (en) * 1984-07-25 1986-07-15 Hughes Aircraft Company Bonding tool and clamp assembly and wire handling method
JPH06105721B2 (ja) * 1985-03-25 1994-12-21 日立超エル・エス・アイエンジニアリング株式会社 半導体装置
US4862245A (en) * 1985-04-18 1989-08-29 International Business Machines Corporation Package semiconductor chip
US4796078A (en) * 1987-06-15 1989-01-03 International Business Machines Corporation Peripheral/area wire bonding technique
US4821945A (en) * 1987-07-01 1989-04-18 International Business Machines Single lead automatic clamping and bonding system
US4987474A (en) * 1987-09-18 1991-01-22 Hitachi, Ltd. Semiconductor device and method of manufacturing the same
JP2706077B2 (ja) * 1988-02-12 1998-01-28 株式会社日立製作所 樹脂封止型半導体装置及びその製造方法
US4937656A (en) * 1988-04-22 1990-06-26 Mitsubishi Denki Kabushiki Kaisha Semiconductor device
JPH02137250A (ja) * 1988-11-17 1990-05-25 Mitsubishi Electric Corp 半導体装置の製造方法及び半導体装置
US4916519A (en) * 1989-05-30 1990-04-10 International Business Machines Corporation Semiconductor package
SG49886A1 (en) * 1989-06-30 1998-06-15 Texas Instruments Inc Balanced capacitance lead frame for integrated circuits
JPH088330B2 (ja) * 1989-07-19 1996-01-29 日本電気株式会社 Loc型リードフレームを備えた半導体集積回路装置
US4965654A (en) * 1989-10-30 1990-10-23 International Business Machines Corporation Semiconductor package with ground plane
JPH04348045A (ja) * 1990-05-20 1992-12-03 Hitachi Ltd 半導体装置及びその製造方法
US5035034A (en) * 1990-07-16 1991-07-30 Motorola, Inc. Hold-down clamp with mult-fingered interchangeable insert for wire bonding semiconductor lead frames
DE4030771B4 (de) * 1990-09-28 2005-09-08 Infineon Technologies Ag Halbleiterbauelement mit einem in einem Kunststoffgehäuse eingebetteten Halbleiterchip
JPH04181749A (ja) * 1990-11-16 1992-06-29 Sumitomo Metal Mining Co Ltd 2層tab製造用フォトマスク
KR940002771Y1 (ko) * 1991-05-14 1994-04-23 금성일렉트론 주식회사 리드 프레임의 인너리드 클램프장치

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US5455200A (en) 1995-10-03
EP0843356B1 (en) 2002-08-07
EP0843356A3 (en) 1998-10-28
EP0554742A2 (en) 1993-08-11
JP3161128B2 (ja) 2001-04-25
DE69332191D1 (de) 2002-09-12
EP0843356A2 (en) 1998-05-20
KR100276781B1 (ko) 2001-01-15
DE69332191T2 (de) 2002-12-12
DE69321266T2 (de) 1999-04-29
EP0554742A3 (en) 1993-09-08
EP0554742B1 (en) 1998-09-30
JPH05275606A (ja) 1993-10-22
US5381036A (en) 1995-01-10
DE69321266D1 (de) 1998-11-05

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