KR20220084204A - 반도체 장치 - Google Patents
반도체 장치 Download PDFInfo
- Publication number
- KR20220084204A KR20220084204A KR1020227019745A KR20227019745A KR20220084204A KR 20220084204 A KR20220084204 A KR 20220084204A KR 1020227019745 A KR1020227019745 A KR 1020227019745A KR 20227019745 A KR20227019745 A KR 20227019745A KR 20220084204 A KR20220084204 A KR 20220084204A
- Authority
- KR
- South Korea
- Prior art keywords
- film
- oxide semiconductor
- insulating film
- semiconductor film
- oxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H01L29/7869—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/134309—Electrodes characterised by their geometrical arrangement
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
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- H01L29/78648—
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- H01L29/78696—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
- H10D30/6733—Multi-gate TFTs
- H10D30/6734—Multi-gate TFTs having gate electrodes arranged on both top and bottom sides of the channel, e.g. dual-gate TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6757—Thin-film transistors [TFT] characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/421—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
- H10D86/423—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/431—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having different compositions, shapes, layouts or thicknesses of gate insulators in different TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/441—Interconnections, e.g. scanning lines
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Optics & Photonics (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Engineering & Computer Science (AREA)
- Geometry (AREA)
- Thin Film Transistor (AREA)
- Electroluminescent Light Sources (AREA)
- Electrodes Of Semiconductors (AREA)
- Formation Of Insulating Films (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Bipolar Transistors (AREA)
- Noodles (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2013-103708 | 2013-05-16 | ||
| JP2013103708 | 2013-05-16 | ||
| KR1020217036098A KR102409894B1 (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
| PCT/JP2014/062900 WO2014185480A1 (en) | 2013-05-16 | 2014-05-08 | Semiconductor device |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020217036098A Division KR102409894B1 (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20220084204A true KR20220084204A (ko) | 2022-06-21 |
Family
ID=51895521
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020217011523A Active KR102325150B1 (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
| KR1020157035443A Active KR102244511B1 (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
| KR1020217036098A Active KR102409894B1 (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
| KR1020227019745A Ceased KR20220084204A (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
Family Applications Before (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020217011523A Active KR102325150B1 (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
| KR1020157035443A Active KR102244511B1 (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
| KR1020217036098A Active KR102409894B1 (ko) | 2013-05-16 | 2014-05-08 | 반도체 장치 |
Country Status (5)
| Country | Link |
|---|---|
| US (4) | US9508861B2 (enExample) |
| JP (6) | JP6320840B2 (enExample) |
| KR (4) | KR102325150B1 (enExample) |
| TW (5) | TWI627751B (enExample) |
| WO (1) | WO2014185480A1 (enExample) |
Families Citing this family (58)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9853053B2 (en) | 2012-09-10 | 2017-12-26 | 3B Technologies, Inc. | Three dimension integrated circuits employing thin film transistors |
| US9754971B2 (en) | 2013-05-18 | 2017-09-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP2015195327A (ja) | 2013-06-05 | 2015-11-05 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| US9293480B2 (en) | 2013-07-10 | 2016-03-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and display device including the semiconductor device |
| US9461126B2 (en) | 2013-09-13 | 2016-10-04 | Semiconductor Energy Laboratory Co., Ltd. | Transistor, clocked inverter circuit, sequential circuit, and semiconductor device including sequential circuit |
| US9882014B2 (en) | 2013-11-29 | 2018-01-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| TWI666770B (zh) | 2013-12-19 | 2019-07-21 | 日商半導體能源研究所股份有限公司 | 半導體裝置 |
| US9379192B2 (en) | 2013-12-20 | 2016-06-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US9472678B2 (en) | 2013-12-27 | 2016-10-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| KR102166898B1 (ko) * | 2014-01-10 | 2020-10-19 | 삼성디스플레이 주식회사 | 박막 트랜지스터 표시판 및 그 제조 방법 |
| WO2015114476A1 (en) | 2014-01-28 | 2015-08-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US9780226B2 (en) | 2014-04-25 | 2017-10-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| TWI646658B (zh) | 2014-05-30 | 2019-01-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置 |
| US9722090B2 (en) | 2014-06-23 | 2017-08-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including first gate oxide semiconductor film, and second gate |
| US9461179B2 (en) | 2014-07-11 | 2016-10-04 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor device (TFT) comprising stacked oxide semiconductor layers and having a surrounded channel structure |
| US9705004B2 (en) | 2014-08-01 | 2017-07-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| WO2016099580A2 (en) | 2014-12-23 | 2016-06-23 | Lupino James John | Three dimensional integrated circuits employing thin film transistors |
| TW201638363A (zh) * | 2015-02-18 | 2016-11-01 | Idemitsu Kosan Co | 積層體及積層體之製造方法 |
| US10186618B2 (en) * | 2015-03-18 | 2019-01-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| TWI695513B (zh) * | 2015-03-27 | 2020-06-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置及電子裝置 |
| CN104952879B (zh) * | 2015-05-05 | 2018-01-30 | 深圳市华星光电技术有限公司 | 采用coa技术的双栅极tft基板结构 |
| CN104821339B (zh) * | 2015-05-11 | 2018-01-30 | 京东方科技集团股份有限公司 | Tft及制作方法、阵列基板及制作驱动方法、显示装置 |
| TWI595650B (zh) * | 2015-05-21 | 2017-08-11 | 蘇烱光 | 適應性雙閘極金氧半場效電晶體 |
| CN106298883B (zh) * | 2015-06-04 | 2020-09-15 | 昆山工研院新型平板显示技术中心有限公司 | 一种薄膜晶体管及其制备方法 |
| JP6698649B2 (ja) * | 2015-06-18 | 2020-05-27 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2017050537A (ja) | 2015-08-31 | 2017-03-09 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| KR20250135902A (ko) | 2015-11-20 | 2025-09-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 이 반도체 장치의 제작 방법, 또는 이 반도체 장치를 가지는 표시 장치 |
| WO2017098369A1 (en) * | 2015-12-11 | 2017-06-15 | Semiconductor Energy Laboratory Co., Ltd. | Oxide semiconductor film, semiconductor device, and display device |
| US20170168333A1 (en) * | 2015-12-11 | 2017-06-15 | Semiconductor Energy Laboratory Co., Ltd. | Display device and separation method |
| US10714633B2 (en) * | 2015-12-15 | 2020-07-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and display device |
| JP6802701B2 (ja) | 2015-12-18 | 2020-12-16 | 株式会社半導体エネルギー研究所 | 表示装置、モジュール及び電子機器 |
| US10083991B2 (en) | 2015-12-28 | 2018-09-25 | Semiconductor Energy Laboratory Co., Ltd. | Display device, display module, and electronic device |
| US9954003B2 (en) * | 2016-02-17 | 2018-04-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
| US20170301699A1 (en) * | 2016-04-13 | 2017-10-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and display device including the semiconductor device |
| CN105932032A (zh) * | 2016-06-16 | 2016-09-07 | 深圳市华星光电技术有限公司 | 一种阵列基板及其制备方法 |
| TW201804613A (zh) * | 2016-07-26 | 2018-02-01 | 聯華電子股份有限公司 | 氧化物半導體裝置 |
| US10475869B2 (en) | 2016-08-23 | 2019-11-12 | Semiconductor Energy Laboratory Co., Ltd. | Display device including display element and transistor |
| KR102512925B1 (ko) * | 2016-11-23 | 2023-03-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치, 표시 모듈, 및 전자 기기 |
| JP6844845B2 (ja) | 2017-05-31 | 2021-03-17 | 三国電子有限会社 | 表示装置 |
| US11257959B2 (en) * | 2017-12-06 | 2022-02-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the semiconductor device |
| KR102550633B1 (ko) * | 2018-05-04 | 2023-07-04 | 삼성디스플레이 주식회사 | 박막 트랜지스터 기판 및 그 제조방법 |
| CN108767016B (zh) * | 2018-05-21 | 2021-09-21 | 京东方科技集团股份有限公司 | 一种薄膜晶体管及其制作方法、阵列基板、显示装置 |
| JP7190729B2 (ja) | 2018-08-31 | 2022-12-16 | 三国電子有限会社 | キャリア注入量制御電極を有する有機エレクトロルミネセンス素子 |
| US20200083386A1 (en) * | 2018-09-11 | 2020-03-12 | Sharp Kabushiki Kaisha | Thin-film transistor substrate, liquid crystal display device, and organic electroluminescent display device |
| JP7246681B2 (ja) | 2018-09-26 | 2023-03-28 | 三国電子有限会社 | トランジスタ及びトランジスタの製造方法、並びにトランジスタを含む表示装置 |
| CN109449157A (zh) * | 2019-01-28 | 2019-03-08 | 南京中电熊猫平板显示科技有限公司 | 静电防护电路及制造方法、静电防护模块及液晶显示装置 |
| JP7190740B2 (ja) | 2019-02-22 | 2022-12-16 | 三国電子有限会社 | エレクトロルミネセンス素子を有する表示装置 |
| CN109920800A (zh) * | 2019-02-28 | 2019-06-21 | 武汉华星光电半导体显示技术有限公司 | 一种显示装置及其制作方法 |
| CN112186004A (zh) | 2019-07-04 | 2021-01-05 | 乐金显示有限公司 | 显示设备 |
| KR20210004795A (ko) * | 2019-07-04 | 2021-01-13 | 엘지디스플레이 주식회사 | 디스플레이 장치 |
| US20210193049A1 (en) * | 2019-12-23 | 2021-06-24 | Apple Inc. | Electronic Display with In-Pixel Compensation and Oxide Drive Transistors |
| JP7444436B2 (ja) | 2020-02-05 | 2024-03-06 | 三国電子有限会社 | 液晶表示装置 |
| US11444025B2 (en) * | 2020-06-18 | 2022-09-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Transistor and fabrication method thereof |
| JP7520690B2 (ja) * | 2020-10-26 | 2024-07-23 | 株式会社ジャパンディスプレイ | 表示装置 |
| JP7437359B2 (ja) * | 2021-08-30 | 2024-02-22 | シャープディスプレイテクノロジー株式会社 | アクティブマトリクス基板およびその製造方法 |
| TWI792545B (zh) * | 2021-09-09 | 2023-02-11 | 力晶積成電子製造股份有限公司 | 基於氧化物半導體的鐵電記憶體 |
| TWI813217B (zh) * | 2021-12-09 | 2023-08-21 | 友達光電股份有限公司 | 半導體裝置及其製造方法 |
| TWI853289B (zh) * | 2022-08-16 | 2024-08-21 | 友達光電股份有限公司 | 半導體裝置及其製造方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006165528A (ja) | 2004-11-10 | 2006-06-22 | Canon Inc | 画像表示装置 |
| JP2011124360A (ja) | 2009-12-10 | 2011-06-23 | Fujifilm Corp | 薄膜トランジスタおよびその製造方法、並びにその薄膜トランジスタを備えた装置 |
| JP2011138934A (ja) | 2009-12-28 | 2011-07-14 | Sony Corp | 薄膜トランジスタ、表示装置および電子機器 |
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| JPH0244260B2 (ja) | 1987-02-24 | 1990-10-03 | Kagaku Gijutsucho Mukizaishitsu Kenkyushocho | Ingazn5o8deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho |
| JPH0244258B2 (ja) | 1987-02-24 | 1990-10-03 | Kagaku Gijutsucho Mukizaishitsu Kenkyushocho | Ingazn3o6deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho |
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| JP7324826B2 (ja) | 半導体装置 | |
| KR102696003B1 (ko) | 반도체 장치 | |
| JP7329575B2 (ja) | 半導体装置 |
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