KR100668096B1 - 반도체 레이저장치 - Google Patents

반도체 레이저장치 Download PDF

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Publication number
KR100668096B1
KR100668096B1 KR1020040020390A KR20040020390A KR100668096B1 KR 100668096 B1 KR100668096 B1 KR 100668096B1 KR 1020040020390 A KR1020040020390 A KR 1020040020390A KR 20040020390 A KR20040020390 A KR 20040020390A KR 100668096 B1 KR100668096 B1 KR 100668096B1
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South Korea
Prior art keywords
film
dielectric film
reflectance
refractive index
film thickness
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Expired - Lifetime
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KR1020040020390A
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English (en)
Korean (ko)
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KR20040084838A (ko
Inventor
마쓰오카히로마스
쿠니츠구야스히로
니시구치하루미
야기테쓰야
나카가와야스유키
호리에준이치
Original Assignee
미쓰비시덴키 가부시키가이샤
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Publication of KR20040084838A publication Critical patent/KR20040084838A/ko
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/028Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/028Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
    • H01S5/0287Facet reflectivity

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)
KR1020040020390A 2003-03-27 2004-03-25 반도체 레이저장치 Expired - Lifetime KR100668096B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2003-00088905 2003-03-27
JP2003088905A JP4097552B2 (ja) 2003-03-27 2003-03-27 半導体レーザ装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020060086769A Division KR100709281B1 (ko) 2003-03-27 2006-09-08 반도체 레이저장치

Publications (2)

Publication Number Publication Date
KR20040084838A KR20040084838A (ko) 2004-10-06
KR100668096B1 true KR100668096B1 (ko) 2007-01-15

Family

ID=32985224

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020040020390A Expired - Lifetime KR100668096B1 (ko) 2003-03-27 2004-03-25 반도체 레이저장치
KR1020060086769A Expired - Lifetime KR100709281B1 (ko) 2003-03-27 2006-09-08 반도체 레이저장치

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020060086769A Expired - Lifetime KR100709281B1 (ko) 2003-03-27 2006-09-08 반도체 레이저장치

Country Status (6)

Country Link
US (1) US7106775B2 (enExample)
JP (1) JP4097552B2 (enExample)
KR (2) KR100668096B1 (enExample)
CN (2) CN100411262C (enExample)
DE (1) DE102004013109B4 (enExample)
TW (1) TWI239703B (enExample)

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JPH0839698A (ja) * 1994-07-27 1996-02-13 Mitsui Petrochem Ind Ltd 散水用チューブの継手
JP2003243764A (ja) * 2002-02-19 2003-08-29 Matsushita Electric Ind Co Ltd 半導体レーザおよびその製造方法
JP2004327581A (ja) * 2003-04-23 2004-11-18 Mitsubishi Electric Corp 半導体レーザ装置
JP2004327678A (ja) * 2003-04-24 2004-11-18 Sony Corp 多波長半導体レーザ及びその製造方法
JP4286683B2 (ja) * 2004-02-27 2009-07-01 ローム株式会社 半導体レーザ
JP2006128475A (ja) * 2004-10-29 2006-05-18 Mitsubishi Electric Corp 半導体レーザ
JP2006351966A (ja) * 2005-06-17 2006-12-28 Sony Corp 多波長半導体レーザ素子
JP4923489B2 (ja) 2005-09-05 2012-04-25 三菱電機株式会社 半導体レーザ装置
KR100853241B1 (ko) * 2005-12-16 2008-08-20 샤프 가부시키가이샤 질화물 반도체 발광소자 및 질화물 반도체 레이저 소자의제조방법
JP5191650B2 (ja) * 2005-12-16 2013-05-08 シャープ株式会社 窒化物半導体発光素子および窒化物半導体発光素子の製造方法
JP5004597B2 (ja) * 2006-03-06 2012-08-22 シャープ株式会社 窒化物半導体発光素子および窒化物半導体発光素子の製造方法
JP5430826B2 (ja) * 2006-03-08 2014-03-05 シャープ株式会社 窒化物半導体レーザ素子
JP2007280975A (ja) * 2006-03-13 2007-10-25 Mitsubishi Electric Corp 半導体レーザ
JP4444304B2 (ja) * 2006-04-24 2010-03-31 シャープ株式会社 窒化物半導体発光素子および窒化物半導体発光素子の製造方法
JP4294699B2 (ja) 2007-02-26 2009-07-15 三菱電機株式会社 半導体レーザ装置
JP5162926B2 (ja) 2007-03-07 2013-03-13 三菱電機株式会社 半導体レーザ装置の製造方法
JP4946524B2 (ja) 2007-03-08 2012-06-06 三菱電機株式会社 半導体レーザ装置
JP2009170801A (ja) * 2008-01-18 2009-07-30 Mitsubishi Electric Corp 半導体レーザ
JP5443356B2 (ja) * 2008-07-10 2014-03-19 株式会社東芝 半導体レーザ装置
JP2010219436A (ja) * 2009-03-18 2010-09-30 Sony Corp 多波長半導体レーザおよび光学記録再生装置
DE102015116335B4 (de) 2015-09-28 2024-10-24 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Halbleiterlaser
CN106207753B (zh) * 2016-09-06 2019-09-03 青岛海信宽带多媒体技术有限公司 半导体激光芯片及其制造方法、半导体激光装置
DE102017112610A1 (de) * 2017-06-08 2018-12-13 Osram Opto Semiconductors Gmbh Kantenemittierender Halbleiterlaser und Betriebsverfahren für einen solchen Halbleiterlaser
CN111193184A (zh) * 2019-12-30 2020-05-22 腾景科技股份有限公司 一种镀在半导体激光器腔面用于选模的超窄带超薄反射膜
WO2021187081A1 (ja) * 2020-03-17 2021-09-23 パナソニック株式会社 半導体レーザ素子
KR102397558B1 (ko) * 2020-10-29 2022-05-17 주식회사 오이솔루션 Dfb 반도체 레이저
CN116918197A (zh) * 2021-03-05 2023-10-20 株式会社堀场制作所 半导体激光装置
CN113402275B (zh) * 2021-08-12 2022-09-02 齐鲁工业大学 一种多层bmn介质薄膜材料及其制备方法
US12424819B2 (en) * 2022-05-26 2025-09-23 Arima Lasers Corp. Edge-emitting semiconductor laser with high thermal conductivity and low reflection front mirror surface

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4975922A (en) * 1988-06-27 1990-12-04 Sharp Kabushiki Kaisha Multi-layered dielectric film

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DE3728305A1 (de) * 1987-08-25 1989-03-09 Standard Elektrik Lorenz Ag Halbleiterlaser mit konstanter differentieller quantenausbeute oder konstanter optischer ausgangsleistung
US4925259A (en) * 1988-10-20 1990-05-15 The United States Of America As Represented By The United States Department Of Energy Multilayer optical dielectric coating
JP3080312B2 (ja) 1989-10-31 2000-08-28 ソニー株式会社 半導体レーザの製造方法
JPH0418784A (ja) 1990-02-13 1992-01-22 Fuji Electric Co Ltd 半導体レーザ素子の保護膜
JP3014208B2 (ja) * 1992-02-27 2000-02-28 三菱電機株式会社 半導体光素子
JP3399049B2 (ja) 1992-10-27 2003-04-21 松下電器産業株式会社 半導体レーザ装置
JPH06138303A (ja) * 1992-10-28 1994-05-20 Olympus Optical Co Ltd プラスチック製光学部品の反射防止膜
JP3863577B2 (ja) * 1994-11-14 2006-12-27 三洋電機株式会社 半導体レーザ
JP3470476B2 (ja) * 1995-11-02 2003-11-25 ソニー株式会社 半導体発光素子
JP3538515B2 (ja) 1997-03-04 2004-06-14 シャープ株式会社 半導体レーザ素子
US6020992A (en) * 1997-06-16 2000-02-01 Laser Power Corporation Low absorption coatings for infrared laser optical elements
US6094730A (en) * 1997-10-27 2000-07-25 Hewlett-Packard Company Hardware-assisted firmware tracing method and apparatus
JP4613374B2 (ja) 1999-09-07 2011-01-19 ソニー株式会社 半導体レーザ
JP2001257413A (ja) * 2000-03-14 2001-09-21 Toshiba Electronic Engineering Corp 半導体レーザ装置及びその製造方法
JP4033644B2 (ja) 2000-07-18 2008-01-16 日亜化学工業株式会社 窒化ガリウム系発光素子
JP2002094173A (ja) * 2000-09-14 2002-03-29 Mitsubishi Electric Corp 半導体レーザ装置
JP2002223030A (ja) 2001-01-24 2002-08-09 Toshiba Corp 半導体レーザ装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4975922A (en) * 1988-06-27 1990-12-04 Sharp Kabushiki Kaisha Multi-layered dielectric film

Also Published As

Publication number Publication date
KR20060102321A (ko) 2006-09-27
CN1543026A (zh) 2004-11-03
CN1819378A (zh) 2006-08-16
KR100709281B1 (ko) 2007-04-19
US20040190576A1 (en) 2004-09-30
DE102004013109A1 (de) 2004-11-11
DE102004013109B4 (de) 2010-02-04
CN100411262C (zh) 2008-08-13
US7106775B2 (en) 2006-09-12
TW200423505A (en) 2004-11-01
TWI239703B (en) 2005-09-11
CN1303732C (zh) 2007-03-07
KR20040084838A (ko) 2004-10-06
JP2004296903A (ja) 2004-10-21
JP4097552B2 (ja) 2008-06-11

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