JPS5578524A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5578524A JPS5578524A JP15288778A JP15288778A JPS5578524A JP S5578524 A JPS5578524 A JP S5578524A JP 15288778 A JP15288778 A JP 15288778A JP 15288778 A JP15288778 A JP 15288778A JP S5578524 A JPS5578524 A JP S5578524A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- silicon
- gas
- silicon carbide
- reactive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 3
- 229910052710 silicon Inorganic materials 0.000 abstract 3
- 239000010703 silicon Substances 0.000 abstract 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 abstract 3
- 229910010271 silicon carbide Inorganic materials 0.000 abstract 3
- 239000011248 coating agent Substances 0.000 abstract 2
- 238000000576 coating method Methods 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 2
- 239000012808 vapor phase Substances 0.000 abstract 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 abstract 1
- 229910052799 carbon Inorganic materials 0.000 abstract 1
- 230000006837 decompression Effects 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 abstract 1
- 230000001939 inductive effect Effects 0.000 abstract 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Photovoltaic Devices (AREA)
- Led Devices (AREA)
- Light Receiving Elements (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15288778A JPS5578524A (en) | 1978-12-10 | 1978-12-10 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15288778A JPS5578524A (en) | 1978-12-10 | 1978-12-10 | Manufacture of semiconductor device |
Related Child Applications (8)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5560881A Division JPS56153727A (en) | 1981-04-15 | 1981-04-15 | Manufacture of semiconductor device |
| JP5560681A Division JPS56169320A (en) | 1981-04-15 | 1981-04-15 | Silicon carbide semiconductor |
| JP5560781A Division JPS56169321A (en) | 1981-04-15 | 1981-04-15 | Silicon carbide semiconductor |
| JP57126047A Division JPS5825227A (ja) | 1982-07-19 | 1982-07-19 | 半導体装置作製方法 |
| JP57126046A Division JPS5825226A (ja) | 1982-07-19 | 1982-07-19 | プラズマ気相反応装置 |
| JP58048504A Division JPS5967625A (ja) | 1983-03-23 | 1983-03-23 | 半導体 |
| JP62065997A Division JPS6366922A (ja) | 1987-03-20 | 1987-03-20 | 半導体装置作製方法 |
| JP62065998A Division JPS6366923A (ja) | 1987-03-20 | 1987-03-20 | 連続式半導体被膜形成装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5578524A true JPS5578524A (en) | 1980-06-13 |
| JPS6237527B2 JPS6237527B2 (enrdf_load_stackoverflow) | 1987-08-13 |
Family
ID=15550286
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15288778A Granted JPS5578524A (en) | 1978-12-10 | 1978-12-10 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5578524A (enrdf_load_stackoverflow) |
Cited By (52)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56169320A (en) * | 1981-04-15 | 1981-12-26 | Shunpei Yamazaki | Silicon carbide semiconductor |
| JPS5742331A (en) * | 1980-08-26 | 1982-03-09 | Canon Inc | Manufacture for deposited film |
| JPS5743413A (en) * | 1980-05-19 | 1982-03-11 | Energy Conversion Devices Inc | Semiconductor element and method of producing same |
| JPS5787120A (en) * | 1980-11-20 | 1982-05-31 | Matsushita Electric Ind Co Ltd | Method and device for plasma cvd |
| JPS5795677A (en) * | 1980-12-03 | 1982-06-14 | Kanegafuchi Chem Ind Co Ltd | Amorphous silicon type photoelectric tranducer |
| JPS57162423A (en) * | 1981-03-16 | 1982-10-06 | Atlantic Richfield Co | Continuously depositing device |
| JPS57194521A (en) * | 1981-05-25 | 1982-11-30 | Sekisui Chem Co Ltd | Manufacture of thin film semiconductor |
| JPS5821817A (ja) * | 1981-07-31 | 1983-02-08 | Nippon Telegr & Teleph Corp <Ntt> | 非晶質多層薄膜作製装置 |
| JPS5850733A (ja) * | 1981-09-21 | 1983-03-25 | Fuji Electric Corp Res & Dev Ltd | 太陽電池用薄膜量産装置 |
| JPS5860537U (ja) * | 1981-10-21 | 1983-04-23 | 市光工業株式会社 | 車輛用灯具 |
| JPS5870524A (ja) * | 1981-09-28 | 1983-04-27 | エナ−ジ−・コンバ−シヨン・デバイセス・インコ−ポレ−テツド | 基板上に本体材料をデポジツトする方法及びシステム |
| JPS5893321A (ja) * | 1981-11-30 | 1983-06-03 | Semiconductor Energy Lab Co Ltd | 半導体装置製造装置 |
| JPS5893322A (ja) * | 1981-11-30 | 1983-06-03 | Semiconductor Energy Lab Co Ltd | 半導体装置製造装置 |
| JPS58174570A (ja) * | 1982-03-29 | 1983-10-13 | エナージー・コンバーション・デバイセス・インコーポレーテッド | グロー放電法による膜形成装置 |
| JPS58190810A (ja) * | 1983-03-16 | 1983-11-07 | Yoshihiro Hamakawa | P型アモルフアスシリコンカ−バイドの製造方法 |
| JPS5916328A (ja) * | 1982-07-19 | 1984-01-27 | Semiconductor Energy Lab Co Ltd | プラズマ気相反応装置 |
| JPS5916329A (ja) * | 1982-07-19 | 1984-01-27 | Semiconductor Energy Lab Co Ltd | プラズマ気相反応装置 |
| JPS5941470A (ja) * | 1982-08-31 | 1984-03-07 | Shimadzu Corp | 多室形薄膜作成装置 |
| JPS5952835A (ja) * | 1982-09-20 | 1984-03-27 | Semiconductor Energy Lab Co Ltd | プラズマ気相反応装置 |
| JPS5958820A (ja) * | 1982-09-28 | 1984-04-04 | Matsushita Electronics Corp | 気相エピタキシヤル成長装置 |
| JPS59100516A (ja) * | 1982-11-12 | 1984-06-09 | エナ−ジ−・コンバ−シヨン・デバイセス・インコ−ポレ−テツド | 光電池素子の製造装置及びアセンブリ |
| JPS59167012A (ja) * | 1983-03-12 | 1984-09-20 | Agency Of Ind Science & Technol | プラズマcvd装置 |
| JPS59167013A (ja) * | 1983-03-12 | 1984-09-20 | Agency Of Ind Science & Technol | プラズマcvd装置 |
| JPS6010681A (ja) * | 1983-06-30 | 1985-01-19 | Canon Inc | 光電変換部材の製造装置 |
| JPS60131970A (ja) * | 1983-12-20 | 1985-07-13 | Canon Inc | 堆積膜形成法 |
| JPS6123760A (ja) * | 1984-07-09 | 1986-02-01 | Canon Inc | 電子写真感光体の製造方法 |
| JPS62112318A (ja) * | 1985-11-12 | 1987-05-23 | Semiconductor Energy Lab Co Ltd | 半導体装置作製方法 |
| JPS62118520A (ja) * | 1985-11-18 | 1987-05-29 | Semiconductor Energy Lab Co Ltd | 電子サイクロトロン共鳴を用いて被膜を形成する方法 |
| JPS62167885A (ja) * | 1986-11-19 | 1987-07-24 | Semiconductor Energy Lab Co Ltd | 炭素被膜を有する複合体の作製方法 |
| JPH01157520A (ja) * | 1988-11-18 | 1989-06-20 | Semiconductor Energy Lab Co Ltd | プラズマ気相反応方法 |
| JPH02283078A (ja) * | 1989-05-15 | 1990-11-20 | Semiconductor Energy Lab Co Ltd | 発光素子 |
| JPH0562919A (ja) * | 1980-10-24 | 1993-03-12 | Semiconductor Energy Lab Co Ltd | セミアモルフアス半導体材料 |
| JPH05251356A (ja) * | 1991-11-06 | 1993-09-28 | Semiconductor Energy Lab Co Ltd | 被膜形成方法 |
| JPH05251340A (ja) * | 1991-06-28 | 1993-09-28 | Semiconductor Energy Lab Co Ltd | 半導体装置作製方法 |
| JPH05304096A (ja) * | 1991-11-06 | 1993-11-16 | Semiconductor Energy Lab Co Ltd | 半導体装置作製方法 |
| JPH05343714A (ja) * | 1991-12-24 | 1993-12-24 | Kanegafuchi Chem Ind Co Ltd | アモルフアスシリコン系光電素子の製造方法 |
| JPH0697473A (ja) * | 1992-05-06 | 1994-04-08 | Kanegafuchi Chem Ind Co Ltd | アモルフアスシリコン系光電素子の製造方法 |
| JPH06101047A (ja) * | 1993-03-30 | 1994-04-12 | Semiconductor Energy Lab Co Ltd | 珪素を含む炭素被膜およびその作製方法 |
| JPH0769613A (ja) * | 1992-08-25 | 1995-03-14 | Semiconductor Energy Lab Co Ltd | 炭素を主成分とする材料の作製方法 |
| JPH0774117A (ja) * | 1994-07-25 | 1995-03-17 | Semiconductor Energy Lab Co Ltd | 半導体装置製造方法 |
| JPH0774118A (ja) * | 1994-07-25 | 1995-03-17 | Semiconductor Energy Lab Co Ltd | 半導体装置製造方法 |
| US5976259A (en) * | 1985-02-14 | 1999-11-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, manufacturing method, and system |
| US6028264A (en) * | 1982-08-24 | 2000-02-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor having low concentration of carbon |
| US6043105A (en) * | 1985-05-07 | 2000-03-28 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor sensitive devices |
| US6180991B1 (en) | 1982-12-23 | 2001-01-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor having low concentration of phosphorous |
| US6221701B1 (en) | 1984-05-18 | 2001-04-24 | Semiconductor Energy Laboratory Co., Ltd. | Insulated gate field effect transistor and its manufacturing method |
| USRE37441E1 (en) | 1982-08-24 | 2001-11-13 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device |
| US6346716B1 (en) | 1982-12-23 | 2002-02-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor material having particular oxygen concentration and semiconductor device comprising the same |
| US6664566B1 (en) | 1982-08-24 | 2003-12-16 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and method of making the same |
| USRE38727E1 (en) | 1982-08-24 | 2005-04-19 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and method of making the same |
| US7038238B1 (en) | 1985-05-07 | 2006-05-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having a non-single crystalline semiconductor layer |
| JP2010040971A (ja) * | 2008-08-08 | 2010-02-18 | Chikao Kimura | 薄膜半導体層の形成方法 |
-
1978
- 1978-12-10 JP JP15288778A patent/JPS5578524A/ja active Granted
Non-Patent Citations (2)
| Title |
|---|
| APPLIED PHYSICS LETTERS=1978 * |
| PHILOS MAG=1977 * |
Cited By (59)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5743413A (en) * | 1980-05-19 | 1982-03-11 | Energy Conversion Devices Inc | Semiconductor element and method of producing same |
| JPS6122622A (ja) * | 1980-05-19 | 1986-01-31 | エナ−ジ−・コンバ−シヨン・デバイセス・インコ−ポレ−テツド | 光起電力パネルの製造方法及び装置 |
| JPS5742331A (en) * | 1980-08-26 | 1982-03-09 | Canon Inc | Manufacture for deposited film |
| JPH0562919A (ja) * | 1980-10-24 | 1993-03-12 | Semiconductor Energy Lab Co Ltd | セミアモルフアス半導体材料 |
| JPS5787120A (en) * | 1980-11-20 | 1982-05-31 | Matsushita Electric Ind Co Ltd | Method and device for plasma cvd |
| JPS5795677A (en) * | 1980-12-03 | 1982-06-14 | Kanegafuchi Chem Ind Co Ltd | Amorphous silicon type photoelectric tranducer |
| JPS57162423A (en) * | 1981-03-16 | 1982-10-06 | Atlantic Richfield Co | Continuously depositing device |
| JPS56169320A (en) * | 1981-04-15 | 1981-12-26 | Shunpei Yamazaki | Silicon carbide semiconductor |
| JPS57194521A (en) * | 1981-05-25 | 1982-11-30 | Sekisui Chem Co Ltd | Manufacture of thin film semiconductor |
| JPS5821817A (ja) * | 1981-07-31 | 1983-02-08 | Nippon Telegr & Teleph Corp <Ntt> | 非晶質多層薄膜作製装置 |
| JPS5850733A (ja) * | 1981-09-21 | 1983-03-25 | Fuji Electric Corp Res & Dev Ltd | 太陽電池用薄膜量産装置 |
| JPS5870524A (ja) * | 1981-09-28 | 1983-04-27 | エナ−ジ−・コンバ−シヨン・デバイセス・インコ−ポレ−テツド | 基板上に本体材料をデポジツトする方法及びシステム |
| JPS5860537U (ja) * | 1981-10-21 | 1983-04-23 | 市光工業株式会社 | 車輛用灯具 |
| JPS5893321A (ja) * | 1981-11-30 | 1983-06-03 | Semiconductor Energy Lab Co Ltd | 半導体装置製造装置 |
| JPS5893322A (ja) * | 1981-11-30 | 1983-06-03 | Semiconductor Energy Lab Co Ltd | 半導体装置製造装置 |
| JPS58174570A (ja) * | 1982-03-29 | 1983-10-13 | エナージー・コンバーション・デバイセス・インコーポレーテッド | グロー放電法による膜形成装置 |
| JPS5916328A (ja) * | 1982-07-19 | 1984-01-27 | Semiconductor Energy Lab Co Ltd | プラズマ気相反応装置 |
| JPS5916329A (ja) * | 1982-07-19 | 1984-01-27 | Semiconductor Energy Lab Co Ltd | プラズマ気相反応装置 |
| US6664566B1 (en) | 1982-08-24 | 2003-12-16 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and method of making the same |
| US6028264A (en) * | 1982-08-24 | 2000-02-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor having low concentration of carbon |
| USRE37441E1 (en) | 1982-08-24 | 2001-11-13 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device |
| USRE38727E1 (en) | 1982-08-24 | 2005-04-19 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and method of making the same |
| JPS5941470A (ja) * | 1982-08-31 | 1984-03-07 | Shimadzu Corp | 多室形薄膜作成装置 |
| JPS5952835A (ja) * | 1982-09-20 | 1984-03-27 | Semiconductor Energy Lab Co Ltd | プラズマ気相反応装置 |
| JPS5958820A (ja) * | 1982-09-28 | 1984-04-04 | Matsushita Electronics Corp | 気相エピタキシヤル成長装置 |
| JPS59100516A (ja) * | 1982-11-12 | 1984-06-09 | エナ−ジ−・コンバ−シヨン・デバイセス・インコ−ポレ−テツド | 光電池素子の製造装置及びアセンブリ |
| US6180991B1 (en) | 1982-12-23 | 2001-01-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor having low concentration of phosphorous |
| US6346716B1 (en) | 1982-12-23 | 2002-02-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor material having particular oxygen concentration and semiconductor device comprising the same |
| JPS59167013A (ja) * | 1983-03-12 | 1984-09-20 | Agency Of Ind Science & Technol | プラズマcvd装置 |
| JPS59167012A (ja) * | 1983-03-12 | 1984-09-20 | Agency Of Ind Science & Technol | プラズマcvd装置 |
| JPS58190810A (ja) * | 1983-03-16 | 1983-11-07 | Yoshihiro Hamakawa | P型アモルフアスシリコンカ−バイドの製造方法 |
| JPS6010681A (ja) * | 1983-06-30 | 1985-01-19 | Canon Inc | 光電変換部材の製造装置 |
| US6503771B1 (en) | 1983-08-22 | 2003-01-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor photoelectrically sensitive device |
| JPS60131970A (ja) * | 1983-12-20 | 1985-07-13 | Canon Inc | 堆積膜形成法 |
| US6635520B1 (en) | 1984-05-18 | 2003-10-21 | Semiconductor Energy Laboratory Co., Ltd. | Operation method of semiconductor devices |
| US6660574B1 (en) | 1984-05-18 | 2003-12-09 | Semiconductor Energy Laboratory Co., Ltd. | Method of forming a semiconductor device including recombination center neutralizer |
| US6680486B1 (en) | 1984-05-18 | 2004-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Insulated gate field effect transistor and its manufacturing method |
| US6221701B1 (en) | 1984-05-18 | 2001-04-24 | Semiconductor Energy Laboratory Co., Ltd. | Insulated gate field effect transistor and its manufacturing method |
| US6734499B1 (en) | 1984-05-18 | 2004-05-11 | Semiconductor Energy Laboratory Co., Ltd. | Operation method of semiconductor devices |
| JPS6123760A (ja) * | 1984-07-09 | 1986-02-01 | Canon Inc | 電子写真感光体の製造方法 |
| US5976259A (en) * | 1985-02-14 | 1999-11-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, manufacturing method, and system |
| US6113701A (en) * | 1985-02-14 | 2000-09-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, manufacturing method, and system |
| US7038238B1 (en) | 1985-05-07 | 2006-05-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having a non-single crystalline semiconductor layer |
| US6043105A (en) * | 1985-05-07 | 2000-03-28 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor sensitive devices |
| JPS62112318A (ja) * | 1985-11-12 | 1987-05-23 | Semiconductor Energy Lab Co Ltd | 半導体装置作製方法 |
| JPS62118520A (ja) * | 1985-11-18 | 1987-05-29 | Semiconductor Energy Lab Co Ltd | 電子サイクロトロン共鳴を用いて被膜を形成する方法 |
| JPS62167885A (ja) * | 1986-11-19 | 1987-07-24 | Semiconductor Energy Lab Co Ltd | 炭素被膜を有する複合体の作製方法 |
| JPH01157520A (ja) * | 1988-11-18 | 1989-06-20 | Semiconductor Energy Lab Co Ltd | プラズマ気相反応方法 |
| JPH02283078A (ja) * | 1989-05-15 | 1990-11-20 | Semiconductor Energy Lab Co Ltd | 発光素子 |
| JPH05251340A (ja) * | 1991-06-28 | 1993-09-28 | Semiconductor Energy Lab Co Ltd | 半導体装置作製方法 |
| JPH05304096A (ja) * | 1991-11-06 | 1993-11-16 | Semiconductor Energy Lab Co Ltd | 半導体装置作製方法 |
| JPH05251356A (ja) * | 1991-11-06 | 1993-09-28 | Semiconductor Energy Lab Co Ltd | 被膜形成方法 |
| JPH05343714A (ja) * | 1991-12-24 | 1993-12-24 | Kanegafuchi Chem Ind Co Ltd | アモルフアスシリコン系光電素子の製造方法 |
| JPH0697473A (ja) * | 1992-05-06 | 1994-04-08 | Kanegafuchi Chem Ind Co Ltd | アモルフアスシリコン系光電素子の製造方法 |
| JPH0769613A (ja) * | 1992-08-25 | 1995-03-14 | Semiconductor Energy Lab Co Ltd | 炭素を主成分とする材料の作製方法 |
| JPH06101047A (ja) * | 1993-03-30 | 1994-04-12 | Semiconductor Energy Lab Co Ltd | 珪素を含む炭素被膜およびその作製方法 |
| JPH0774118A (ja) * | 1994-07-25 | 1995-03-17 | Semiconductor Energy Lab Co Ltd | 半導体装置製造方法 |
| JPH0774117A (ja) * | 1994-07-25 | 1995-03-17 | Semiconductor Energy Lab Co Ltd | 半導体装置製造方法 |
| JP2010040971A (ja) * | 2008-08-08 | 2010-02-18 | Chikao Kimura | 薄膜半導体層の形成方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6237527B2 (enrdf_load_stackoverflow) | 1987-08-13 |
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