JP6186634B2 - デジタル顕微鏡を備えたシステム及びこれを用いた試料の検査方法 - Google Patents

デジタル顕微鏡を備えたシステム及びこれを用いた試料の検査方法 Download PDF

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JP6186634B2
JP6186634B2 JP2013525005A JP2013525005A JP6186634B2 JP 6186634 B2 JP6186634 B2 JP 6186634B2 JP 2013525005 A JP2013525005 A JP 2013525005A JP 2013525005 A JP2013525005 A JP 2013525005A JP 6186634 B2 JP6186634 B2 JP 6186634B2
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slide
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JP2013536471A (ja
JP2013536471A5 (enExample
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ポール ヒング
ポール ヒング
クリスティアン ロメール
クリスティアン ロメール
スヴェン ヘンスラー
スヴェン ヘンスラー
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サクラ ファインテック ユー．エス．エー．， インコーポレイテッド
サクラ ファインテック ユー．エス．エー．， インコーポレイテッド
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2013525005A 2010-08-20 2011-08-19 デジタル顕微鏡を備えたシステム及びこれを用いた試料の検査方法 Expired - Fee Related JP6186634B2 (ja)

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US37570310P 2010-08-20 2010-08-20
US61/375,703 2010-08-20
PCT/US2011/048488 WO2012024627A1 (en) 2010-08-20 2011-08-19 Digital microscope

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JP2013536471A5 JP2013536471A5 (enExample) 2015-10-01
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JP2017087763A Expired - Fee Related JP6462763B2 (ja) 2010-08-20 2017-04-27 デジタル顕微鏡を備えたシステム及びこれを用いた試料の検査方法

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US (1) US10139613B2 (enExample)
EP (3) EP2606394B1 (enExample)
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CN (2) CN107255863B (enExample)
AU (1) AU2011291517B2 (enExample)
BR (1) BR112013004006A2 (enExample)
CA (1) CA2808105C (enExample)
DE (2) DE202011110631U1 (enExample)
DK (3) DK3018520T3 (enExample)
ES (3) ES2751413T3 (enExample)
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EP2606394B1 (en) 2017-03-01
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EP2910993A1 (en) 2015-08-26
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DK2606394T3 (en) 2017-04-10
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