JP5514857B2 - リソグラフィ装置およびデバイス製造方法 - Google Patents
リソグラフィ装置およびデバイス製造方法 Download PDFInfo
- Publication number
- JP5514857B2 JP5514857B2 JP2012084835A JP2012084835A JP5514857B2 JP 5514857 B2 JP5514857 B2 JP 5514857B2 JP 2012084835 A JP2012084835 A JP 2012084835A JP 2012084835 A JP2012084835 A JP 2012084835A JP 5514857 B2 JP5514857 B2 JP 5514857B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- liquid
- liquid supply
- supply system
- projection system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 239000007788 liquid Substances 0.000 claims description 222
- 239000000758 substrate Substances 0.000 claims description 212
- 230000003287 optical effect Effects 0.000 claims description 17
- 239000007789 gas Substances 0.000 description 65
- 230000005855 radiation Effects 0.000 description 30
- 238000000059 patterning Methods 0.000 description 16
- 238000007789 sealing Methods 0.000 description 14
- 238000005259 measurement Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 12
- 230000001133 acceleration Effects 0.000 description 10
- 230000033001 locomotion Effects 0.000 description 10
- 238000007654 immersion Methods 0.000 description 9
- 238000000605 extraction Methods 0.000 description 7
- 230000004888 barrier function Effects 0.000 description 6
- 230000008859 change Effects 0.000 description 6
- 239000010410 layer Substances 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 230000002829 reductive effect Effects 0.000 description 5
- 238000013461 design Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000013016 damping Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000001459 lithography Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000005499 meniscus Effects 0.000 description 2
- 230000002441 reversible effect Effects 0.000 description 2
- 238000010008 shearing Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 238000012876 topography Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000000671 immersion lithography Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000002346 layers by function Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000005381 magnetic domain Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- E—FIXED CONSTRUCTIONS
- E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
- E02F—DREDGING; SOIL-SHIFTING
- E02F9/00—Component parts of dredgers or soil-shifting machines, not restricted to one of the kinds covered by groups E02F3/00 - E02F7/00
- E02F9/20—Drives; Control devices
- E02F9/22—Hydraulic or pneumatic drives
- E02F9/2264—Arrangements or adaptations of elements for hydraulic drives
- E02F9/2267—Valves or distributors
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F15—FLUID-PRESSURE ACTUATORS; HYDRAULICS OR PNEUMATICS IN GENERAL
- F15B—SYSTEMS ACTING BY MEANS OF FLUIDS IN GENERAL; FLUID-PRESSURE ACTUATORS, e.g. SERVOMOTORS; DETAILS OF FLUID-PRESSURE SYSTEMS, NOT OTHERWISE PROVIDED FOR
- F15B13/00—Details of servomotor systems ; Valves for servomotor systems
- F15B13/02—Fluid distribution or supply devices characterised by their adaptation to the control of servomotors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70491—Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
- G03F7/70525—Controlling normal operating mode, e.g. matching different apparatus, remote control or prediction of failure
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/709—Vibration, e.g. vibration detection, compensation, suppression or isolation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Environmental & Geological Engineering (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Civil Engineering (AREA)
- Mining & Mineral Resources (AREA)
- Mechanical Engineering (AREA)
- Structural Engineering (AREA)
- Fluid Mechanics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Description
放射線の投影ビームを供給する放射線システムと、
所望するパターンに従って投影ビームをパターン化するパターニング手段を支持する支持構造と、
基板を保持する基板テーブルと、
パターン化されたビームを基板の目標部分に投影する、光軸を有する投影システムと、
投影システムの最終構成要素と基板との間のスペースにおける基板上に浸液を供給する液体供給システムとから成るリソグラフィ投影装置が提供される。ここで、液体供給システムの少なくとも一部分が光軸の方向に自由に可動であり、かつ/または光軸に垂直な少なくとも1つの軸回りに回転することを特徴とする。
上記投影システムの最終構成要素と上記基板テーブル間の上記スペースの境界の少なくとも一部分に沿って延在するシール部材と、
該シール部材と該基板表面間においてガスシールを形成するガスシール手段とから成り、ここで、上記ガスシールにおける圧力は、基板に対する該液体供給システムの高さおよび/または傾きを調整するように変えられる。ガスシールは所望のスペース内に液体を保持するように機能するとともに、投影システム下で基板が走査された後に基板上に残溜する液体も減じる。ガスシールは液体供給システムの高さを調整するためにも使用され、それにより専用アクチュエータを必要としないといったように、構成を単純化する。
放射線感光材料の層により少なくとも部分的に覆われた基板を提供するステップと、
放射線システムを用いて放射線の投影ビームを供給するステップと、
パターニング手段を用いて投影ビームのその断面にパターンを与えるステップと、
放射線感光材料の層の目標部分に放射線のパターン化されたビームを投影するステップと、
該投影ステップにおいて使用される投影システムの最終構成要素と該基板間のスペースを充填するよう、該基板上に液体を供給するステップとからなるデバイス製造方法であり、ここで、上記液体を供給するシステムは、該投影システムの光軸の方向に自由に動くようにされていることを特徴とする。
放射線(例えばUV放射線)の投影ビームPBを供給する照明システム(照明装置)ILと、
パターニング手段(例えばマスク)MAを支持し、また、品目PLに対して正確にパターニング手段の位置決めを行う第一位置決め手段に連結を行った第一支持構造(例えばマスクテーブル)MTと、
基板(例えばレジスト塗布ウェハ)を保持し、また、品目PLに対して正確に基板の位置決めを行う第二位置決め手段PWに連結を行った基板テーブル(例えばウェハテーブル)WTと、
パターニング手段MAにより投影ビームPBに与えられたパターンを、基板Wの目標部分C(例えば、1つあるいはそれ以上のダイから成る)に像形成する投影システム(例えば屈折投影レンズ)PLとにより構成されている。
1. ステップモードにおいて、マスクテーブルMTおよび基板テーブルWTは基本的に静止状態に維持されており、投影ビームに与えられた全体パターンが1回の作動(すなわちシングル静的露光)で目標部分Cに投影される。次に基板テーブルWTがx方向および/あるいはy方向にシフトされ、異なる目標部分Cが露光可能となる。ステップモードにおいては、露光フィールドの最大サイズにより、シングル静的露光にて結像される目標部分Cのサイズが制限される。
2. スキャンモードにおいて、投影ビームに与えられたパターンが目標部分Cに投影されている間、マスクテーブルMTおよび基板テーブルWTは同時走査される(すなわちシングル動的露光)。マスクテーブルMTに対する基板テーブルWTの速度および方向は、投影システムPLの拡大(縮小)および像反転特性により判断される。スキャンモードにおいては、露光フィールドの最大サイズにより、シングル動的露光における目標部分の幅(非走査方向における)が制限される。一方、走査動作長が目標部分の高さ(走査方向における)を決定する。
3. 他のモードにおいて、マスクテーブルMTは、プログラム可能パターニング手段を保持し、基本的に静止状態が維持される。そして、基板テーブルWTは、投影ビームに与えられたパターンが目標部分Cに投影されている間、移動あるいは走査される。このモードにおいては、一般にパルス放射線ソースが用いられ、プログラム可能パターニング手段は、基板テーブルWTの各運動後、もしくは走査中の連続的放射線パルスの間に、要求に応じて更新される。この稼動モードは、上述のようなタイプのプログラム可能ミラーアレイといった、プログラム可能パターニング手段を使用するマスクレスリソグラフィに容易に適用可能である。
第二実施形態を図6および図7において示しており、この実施形態は以下に記載する内容を除いて第一実施形態と同様である。
本発明の第三実施形態を図8において示している。この実施形態の構成は以下に記載の内容を除いて第一実施形態あるいは第二実施形態と同様である。
次における説明は、基板テーブルWT上の液体供給システムの高さは、計測基準フレームMTまでの液体供給システムの距離と、計測基準フレームMTから基板テーブルWTの距離とを比較することによって計測されると仮定する。けれども、基板テーブルWT上の液体供給システムの高さが直接計測される場合、もしくはこの高さが他のポイントかまたは装置の部分を参照にして間接的に計測される場合にも、同一制御プログラムの使用が可能である。
Claims (4)
- 基板を支持する基板支持体と、
基板のターゲット部分にパターン化されたビームを投影する投影システムと、
前記投影システムと、前記基板および/または基板テーブルとによって少なくとも部分的に画定されたスペースに対し、液体を供給するまたは液体を少なくとも部分的に含ませる液体取扱構造と、
前記投影システムの光学軸を横切る方向に前記液体取扱構造を直線的に移動させるアクチュエート可能部材と、
を有する、リソグラフィ装置。 - 基板を支持する基板支持体と、
基板のターゲット部分にパターン化されたビームを投影する投影システムと、
前記投影システムと、前記基板および/または基板テーブルとによって少なくとも部分的に画定されたスペースに対し、液体を供給するまたは液体を少なくとも部分的に含ませる液体取扱構造と、
その最上の位置で、前記液体取扱構造が前記基板および/または基板テーブルと衝突し得ないように、前記基板テーブルに対して実質的に垂直な方向に前記液体取扱構造を移動させるアクチュエータと、
を有する、リソグラフィ装置。 - 基板を支持する基板支持体と、
基板のターゲット部分にパターン化されたビームを投影する投影システムと、
前記投影システムと、基板テーブル、前記基板、もしくは前記基板テーブルおよび基板の双方とによって少なくとも部分的に画定されたスペースに対し、液体を供給するまたは液体を少なくとも部分的に含ませる液体取扱構造であって、前記基板支持体が、前記パターン化されたビームの投影の間、前記液体取扱構造に対して、かつ、前記液体取扱構造の下で、変位可能である、液体取扱構造と、
前記基板テーブルに対して前記液体取扱構造を傾斜および/または直線変位させるアクチュエータと、
を有する、リソグラフィ装置。 - 基板テーブルによって保持された基板のターゲット位置上に、液体を介して、パターン化されたビームを投影するステップであって、前記液体は、前記パターン化されたビームを投影するのに用いられる投影システムと、前記基板テーブル、前記基板、または前記基板テーブルと基板の双方とによって少なくとも部分的に画定されるスペースに対し、液体取扱構造によって供給された、または少なくとも部分的に含められたものである、ステップと、
前記投影システムの光学軸を横切る方向に前記液体取扱構造を直線的に移動させるステップと、
を含むデバイス製造方法。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03252955.4 | 2003-05-13 | ||
EP03252955 | 2003-05-13 | ||
EP03256643.2 | 2003-10-22 | ||
EP03256643 | 2003-10-22 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008073704A Division JP5047019B2 (ja) | 2003-05-13 | 2008-03-21 | リソグラフィ装置およびデバイス製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012134561A JP2012134561A (ja) | 2012-07-12 |
JP5514857B2 true JP5514857B2 (ja) | 2014-06-04 |
Family
ID=33542566
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004142059A Expired - Fee Related JP4115964B2 (ja) | 2003-05-13 | 2004-05-12 | リソグラフィ装置およびデバイス製造方法 |
JP2008073704A Expired - Fee Related JP5047019B2 (ja) | 2003-05-13 | 2008-03-21 | リソグラフィ装置およびデバイス製造方法 |
JP2010078262A Expired - Fee Related JP5145369B2 (ja) | 2003-05-13 | 2010-03-30 | リソグラフィ装置 |
JP2012084835A Expired - Lifetime JP5514857B2 (ja) | 2003-05-13 | 2012-04-03 | リソグラフィ装置およびデバイス製造方法 |
Family Applications Before (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004142059A Expired - Fee Related JP4115964B2 (ja) | 2003-05-13 | 2004-05-12 | リソグラフィ装置およびデバイス製造方法 |
JP2008073704A Expired - Fee Related JP5047019B2 (ja) | 2003-05-13 | 2008-03-21 | リソグラフィ装置およびデバイス製造方法 |
JP2010078262A Expired - Fee Related JP5145369B2 (ja) | 2003-05-13 | 2010-03-30 | リソグラフィ装置 |
Country Status (6)
Country | Link |
---|---|
US (8) | US7352434B2 (ja) |
JP (4) | JP4115964B2 (ja) |
KR (1) | KR100620980B1 (ja) |
CN (1) | CN1264065C (ja) |
SG (1) | SG116542A1 (ja) |
TW (1) | TWI295414B (ja) |
Families Citing this family (219)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040031167A1 (en) * | 2002-06-13 | 2004-02-19 | Stein Nathan D. | Single wafer method and apparatus for drying semiconductor substrates using an inert gas air-knife |
SG121818A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
US10503084B2 (en) | 2002-11-12 | 2019-12-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
CN100568101C (zh) * | 2002-11-12 | 2009-12-09 | Asml荷兰有限公司 | 光刻装置和器件制造方法 |
US7372541B2 (en) * | 2002-11-12 | 2008-05-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US9482966B2 (en) | 2002-11-12 | 2016-11-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
DE10261775A1 (de) | 2002-12-20 | 2004-07-01 | Carl Zeiss Smt Ag | Vorrichtung zur optischen Vermessung eines Abbildungssystems |
KR101506408B1 (ko) * | 2003-02-26 | 2015-03-26 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
KR101364889B1 (ko) | 2003-04-10 | 2014-02-19 | 가부시키가이샤 니콘 | 액침 리소그래피 장치용 진공 배출을 포함하는 환경 시스템 |
EP1611486B1 (en) * | 2003-04-10 | 2016-03-16 | Nikon Corporation | Environmental system including a transport region for an immersion lithography apparatus |
SG10201803122UA (en) * | 2003-04-11 | 2018-06-28 | Nikon Corp | Immersion lithography apparatus and device manufacturing method |
KR101861493B1 (ko) | 2003-04-11 | 2018-05-28 | 가부시키가이샤 니콘 | 액침 리소그래피 머신에서 웨이퍼 교환동안 투영 렌즈 아래의 갭에서 액침 액체를 유지하는 장치 및 방법 |
TWI295414B (en) * | 2003-05-13 | 2008-04-01 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
WO2004102646A1 (ja) * | 2003-05-15 | 2004-11-25 | Nikon Corporation | 露光装置及びデバイス製造方法 |
TWI474380B (zh) * | 2003-05-23 | 2015-02-21 | 尼康股份有限公司 | A method of manufacturing an exposure apparatus and an element |
TWI421911B (zh) | 2003-05-23 | 2014-01-01 | 尼康股份有限公司 | An exposure method, an exposure apparatus, and an element manufacturing method |
KR101915914B1 (ko) * | 2003-05-28 | 2018-11-06 | 가부시키가이샤 니콘 | 노광 방법, 노광 장치, 및 디바이스 제조 방법 |
US7213963B2 (en) | 2003-06-09 | 2007-05-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
EP2261741A3 (en) | 2003-06-11 | 2011-05-25 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
KR101940892B1 (ko) * | 2003-06-13 | 2019-01-21 | 가부시키가이샤 니콘 | 노광 방법, 기판 스테이지, 노광 장치, 및 디바이스 제조 방법 |
US6867844B2 (en) | 2003-06-19 | 2005-03-15 | Asml Holding N.V. | Immersion photolithography system and method using microchannel nozzles |
KR101686762B1 (ko) | 2003-06-19 | 2016-12-28 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조방법 |
US6809794B1 (en) * | 2003-06-27 | 2004-10-26 | Asml Holding N.V. | Immersion photolithography system and method using inverted wafer-projection optics interface |
DE60308161T2 (de) | 2003-06-27 | 2007-08-09 | Asml Netherlands B.V. | Lithographischer Apparat und Verfahren zur Herstellung eines Artikels |
JP2007527615A (ja) * | 2003-07-01 | 2007-09-27 | 株式会社ニコン | 同位体特定流体の光学素子としての使用方法 |
WO2005010611A2 (en) * | 2003-07-08 | 2005-02-03 | Nikon Corporation | Wafer table for immersion lithography |
WO2005006418A1 (ja) * | 2003-07-09 | 2005-01-20 | Nikon Corporation | 露光装置及びデバイス製造方法 |
EP2264531B1 (en) | 2003-07-09 | 2013-01-16 | Nikon Corporation | Exposure apparatus and device manufacturing method |
EP1643543B1 (en) | 2003-07-09 | 2010-11-24 | Nikon Corporation | Exposure apparatus and method for manufacturing device |
US7738074B2 (en) * | 2003-07-16 | 2010-06-15 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
EP3346485A1 (en) | 2003-07-25 | 2018-07-11 | Nikon Corporation | Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method |
KR101343720B1 (ko) * | 2003-07-28 | 2013-12-20 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법, 그리고 노광 장치의제어 방법 |
EP1503244A1 (en) * | 2003-07-28 | 2005-02-02 | ASML Netherlands B.V. | Lithographic projection apparatus and device manufacturing method |
US7779781B2 (en) | 2003-07-31 | 2010-08-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
WO2005022616A1 (ja) * | 2003-08-29 | 2005-03-10 | Nikon Corporation | 露光装置及びデバイス製造方法 |
TWI263859B (en) | 2003-08-29 | 2006-10-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
JP4288426B2 (ja) | 2003-09-03 | 2009-07-01 | 株式会社ニコン | 液浸リソグラフィのための流体の供給装置及び方法 |
JP4444920B2 (ja) * | 2003-09-19 | 2010-03-31 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
KR101323396B1 (ko) | 2003-09-29 | 2013-10-29 | 가부시키가이샤 니콘 | 노광장치, 노광방법 및 디바이스 제조방법 |
JP4335213B2 (ja) | 2003-10-08 | 2009-09-30 | 株式会社蔵王ニコン | 基板搬送装置、露光装置、デバイス製造方法 |
JP2005136364A (ja) * | 2003-10-08 | 2005-05-26 | Zao Nikon Co Ltd | 基板搬送装置、露光装置、並びにデバイス製造方法 |
KR101203028B1 (ko) | 2003-10-08 | 2012-11-21 | 가부시키가이샤 자오 니콘 | 기판 반송 장치 및 기판 반송 방법, 노광 장치 및 노광 방법, 디바이스 제조 방법 |
TW201738932A (zh) | 2003-10-09 | 2017-11-01 | Nippon Kogaku Kk | 曝光裝置及曝光方法、元件製造方法 |
JP2005150290A (ja) * | 2003-11-13 | 2005-06-09 | Canon Inc | 露光装置およびデバイスの製造方法 |
JP4295712B2 (ja) | 2003-11-14 | 2009-07-15 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及び装置製造方法 |
KR101682884B1 (ko) | 2003-12-03 | 2016-12-06 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법, 그리고 광학 부품 |
KR101681852B1 (ko) * | 2003-12-15 | 2016-12-01 | 가부시키가이샤 니콘 | 스테이지 장치, 노광 장치, 및 노광 방법 |
JPWO2005057635A1 (ja) * | 2003-12-15 | 2007-07-05 | 株式会社ニコン | 投影露光装置及びステージ装置、並びに露光方法 |
US20070081133A1 (en) * | 2004-12-14 | 2007-04-12 | Niikon Corporation | Projection exposure apparatus and stage unit, and exposure method |
JP4710611B2 (ja) * | 2004-01-15 | 2011-06-29 | 株式会社ニコン | 露光装置及びデバイスの製造方法並びに露光方法 |
US7589822B2 (en) * | 2004-02-02 | 2009-09-15 | Nikon Corporation | Stage drive method and stage unit, exposure apparatus, and device manufacturing method |
KR101377815B1 (ko) | 2004-02-03 | 2014-03-26 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
TW201816844A (zh) * | 2004-03-25 | 2018-05-01 | 日商尼康股份有限公司 | 曝光裝置、曝光方法、及元件製造方法 |
US7034917B2 (en) * | 2004-04-01 | 2006-04-25 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and device manufactured thereby |
KR101330370B1 (ko) | 2004-04-19 | 2013-11-15 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
US8054448B2 (en) | 2004-05-04 | 2011-11-08 | Nikon Corporation | Apparatus and method for providing fluid for immersion lithography |
US7616383B2 (en) * | 2004-05-18 | 2009-11-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7486381B2 (en) * | 2004-05-21 | 2009-02-03 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
KR101257960B1 (ko) | 2004-06-04 | 2013-04-24 | 칼 짜이스 에스엠테 게엠베하 | 광학적 결상 시스템의 결상 품질을 측정하기 위한 시스템 |
KR101421915B1 (ko) * | 2004-06-09 | 2014-07-22 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
US8373843B2 (en) * | 2004-06-10 | 2013-02-12 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
KR101485650B1 (ko) | 2004-06-10 | 2015-01-23 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
US8508713B2 (en) * | 2004-06-10 | 2013-08-13 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
US8717533B2 (en) * | 2004-06-10 | 2014-05-06 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
US7688421B2 (en) * | 2004-06-17 | 2010-03-30 | Nikon Corporation | Fluid pressure compensation for immersion lithography lens |
WO2006007111A2 (en) * | 2004-07-01 | 2006-01-19 | Nikon Corporation | A dynamic fluid control system for immersion lithography |
US7463330B2 (en) | 2004-07-07 | 2008-12-09 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
DE602005016429D1 (de) * | 2004-07-12 | 2009-10-15 | Nippon Kogaku Kk | Hren |
JP3870207B2 (ja) * | 2004-08-05 | 2007-01-17 | キヤノン株式会社 | 液浸露光装置及びデバイス製造方法 |
US7304715B2 (en) | 2004-08-13 | 2007-12-04 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
KR20070048164A (ko) * | 2004-08-18 | 2007-05-08 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
US7701550B2 (en) | 2004-08-19 | 2010-04-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US20060044533A1 (en) * | 2004-08-27 | 2006-03-02 | Asmlholding N.V. | System and method for reducing disturbances caused by movement in an immersion lithography system |
CN100539019C (zh) * | 2004-09-17 | 2009-09-09 | 株式会社尼康 | 曝光装置、曝光方法以及器件制造方法 |
KR101264939B1 (ko) | 2004-09-17 | 2013-05-15 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
US7522261B2 (en) * | 2004-09-24 | 2009-04-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7411657B2 (en) * | 2004-11-17 | 2008-08-12 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7161654B2 (en) * | 2004-12-02 | 2007-01-09 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7256121B2 (en) * | 2004-12-02 | 2007-08-14 | Texas Instruments Incorporated | Contact resistance reduction by new barrier stack process |
US7446850B2 (en) * | 2004-12-03 | 2008-11-04 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7397533B2 (en) * | 2004-12-07 | 2008-07-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7196770B2 (en) * | 2004-12-07 | 2007-03-27 | Asml Netherlands B.V. | Prewetting of substrate before immersion exposure |
US7180571B2 (en) * | 2004-12-08 | 2007-02-20 | Asml Netherlands B.V. | Lithographic projection apparatus and actuator |
US7365827B2 (en) * | 2004-12-08 | 2008-04-29 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7352440B2 (en) | 2004-12-10 | 2008-04-01 | Asml Netherlands B.V. | Substrate placement in immersion lithography |
US7403261B2 (en) * | 2004-12-15 | 2008-07-22 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
JP2006173295A (ja) * | 2004-12-15 | 2006-06-29 | Jsr Corp | 液浸型露光装置及び液浸型露光方法 |
US7528931B2 (en) | 2004-12-20 | 2009-05-05 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7880860B2 (en) * | 2004-12-20 | 2011-02-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
JP4569291B2 (ja) * | 2004-12-24 | 2010-10-27 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
US7405805B2 (en) | 2004-12-28 | 2008-07-29 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7491661B2 (en) * | 2004-12-28 | 2009-02-17 | Asml Netherlands B.V. | Device manufacturing method, top coat material and substrate |
US20060147821A1 (en) * | 2004-12-30 | 2006-07-06 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
SG124351A1 (en) * | 2005-01-14 | 2006-08-30 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
SG124359A1 (en) * | 2005-01-14 | 2006-08-30 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
US7903233B2 (en) * | 2005-01-21 | 2011-03-08 | Nikon Corporation | Offset partial ring seal in immersion lithographic system |
JP2011258999A (ja) * | 2005-01-31 | 2011-12-22 | Nikon Corp | 露光装置及びデバイス製造方法 |
US8692973B2 (en) * | 2005-01-31 | 2014-04-08 | Nikon Corporation | Exposure apparatus and method for producing device |
KR20180125636A (ko) * | 2005-01-31 | 2018-11-23 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
JP5005226B2 (ja) * | 2005-01-31 | 2012-08-22 | 株式会社ニコン | 露光装置及びデバイス製造方法、液体保持方法 |
SG155256A1 (en) * | 2005-02-10 | 2009-09-30 | Asml Netherlands Bv | Immersion liquid, exposure apparatus, and exposure process |
JP5343958B2 (ja) * | 2005-02-21 | 2013-11-13 | 株式会社ニコン | 露光装置、露光方法、及びデバイス製造方法 |
JP4807086B2 (ja) * | 2005-02-21 | 2011-11-02 | 株式会社ニコン | 露光装置、露光方法、及びデバイス製造方法 |
US7378025B2 (en) | 2005-02-22 | 2008-05-27 | Asml Netherlands B.V. | Fluid filtration method, fluid filtered thereby, lithographic apparatus and device manufacturing method |
US8018573B2 (en) | 2005-02-22 | 2011-09-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7224431B2 (en) * | 2005-02-22 | 2007-05-29 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7428038B2 (en) | 2005-02-28 | 2008-09-23 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and apparatus for de-gassing a liquid |
US7282701B2 (en) * | 2005-02-28 | 2007-10-16 | Asml Netherlands B.V. | Sensor for use in a lithographic apparatus |
JP4262252B2 (ja) * | 2005-03-02 | 2009-05-13 | キヤノン株式会社 | 露光装置 |
US7324185B2 (en) | 2005-03-04 | 2008-01-29 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7684010B2 (en) * | 2005-03-09 | 2010-03-23 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method, seal structure, method of removing an object and a method of sealing |
KR20070115859A (ko) * | 2005-03-18 | 2007-12-06 | 가부시키가이샤 니콘 | 노광 방법 및 노광 장치, 디바이스 제조 방법, 그리고 노광장치의 평가 방법 |
US7330238B2 (en) * | 2005-03-28 | 2008-02-12 | Asml Netherlands, B.V. | Lithographic apparatus, immersion projection apparatus and device manufacturing method |
US20070132976A1 (en) * | 2005-03-31 | 2007-06-14 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
TW200644079A (en) * | 2005-03-31 | 2006-12-16 | Nikon Corp | Exposure apparatus, exposure method, and device production method |
US7411654B2 (en) * | 2005-04-05 | 2008-08-12 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7291850B2 (en) * | 2005-04-08 | 2007-11-06 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
USRE43576E1 (en) | 2005-04-08 | 2012-08-14 | Asml Netherlands B.V. | Dual stage lithographic apparatus and device manufacturing method |
US20060232753A1 (en) * | 2005-04-19 | 2006-10-19 | Asml Holding N.V. | Liquid immersion lithography system with tilted liquid flow |
JP5125505B2 (ja) | 2005-04-25 | 2013-01-23 | 株式会社ニコン | 露光方法及び露光装置、並びにデバイス製造方法 |
US8248577B2 (en) | 2005-05-03 | 2012-08-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7433016B2 (en) * | 2005-05-03 | 2008-10-07 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7317507B2 (en) * | 2005-05-03 | 2008-01-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
JP2006339448A (ja) | 2005-06-02 | 2006-12-14 | Canon Inc | 受光ユニットを有する露光装置 |
US7652746B2 (en) * | 2005-06-21 | 2010-01-26 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7751027B2 (en) | 2005-06-21 | 2010-07-06 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
JP4708876B2 (ja) * | 2005-06-21 | 2011-06-22 | キヤノン株式会社 | 液浸露光装置 |
US7474379B2 (en) | 2005-06-28 | 2009-01-06 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7834974B2 (en) * | 2005-06-28 | 2010-11-16 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7468779B2 (en) * | 2005-06-28 | 2008-12-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7170583B2 (en) * | 2005-06-29 | 2007-01-30 | Asml Netherlands B.V. | Lithographic apparatus immersion damage control |
JP5194792B2 (ja) * | 2005-06-30 | 2013-05-08 | 株式会社ニコン | 露光装置及び方法、露光装置のメンテナンス方法、並びにデバイス製造方法 |
US20070002336A1 (en) * | 2005-06-30 | 2007-01-04 | Asml Netherlands B.V. | Metrology apparatus, lithographic apparatus, process apparatus, metrology method and device manufacturing method |
US8054445B2 (en) * | 2005-08-16 | 2011-11-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7580112B2 (en) * | 2005-08-25 | 2009-08-25 | Nikon Corporation | Containment system for immersion fluid in an immersion lithography apparatus |
KR101388345B1 (ko) | 2005-09-09 | 2014-04-22 | 가부시키가이샤 니콘 | 노광 장치 및 노광 방법, 그리고 디바이스 제조 방법 |
US20070058263A1 (en) * | 2005-09-13 | 2007-03-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and methods for immersion lithography |
JP4125315B2 (ja) * | 2005-10-11 | 2008-07-30 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
JPWO2007055237A1 (ja) * | 2005-11-09 | 2009-04-30 | 株式会社ニコン | 露光装置及び露光方法、並びにデバイス製造方法 |
CN1963675B (zh) * | 2005-11-11 | 2012-12-05 | 台湾积体电路制造股份有限公司 | 浸没式微影设备及制程 |
US7804577B2 (en) * | 2005-11-16 | 2010-09-28 | Asml Netherlands B.V. | Lithographic apparatus |
JP4567651B2 (ja) * | 2005-11-16 | 2010-10-20 | エーエスエムエル ネザーランズ ビー.ブイ. | 露光装置及びデバイス製造方法 |
US7864292B2 (en) | 2005-11-16 | 2011-01-04 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7656501B2 (en) * | 2005-11-16 | 2010-02-02 | Asml Netherlands B.V. | Lithographic apparatus |
US7633073B2 (en) * | 2005-11-23 | 2009-12-15 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7773195B2 (en) * | 2005-11-29 | 2010-08-10 | Asml Holding N.V. | System and method to increase surface tension and contact angle in immersion lithography |
US20070124987A1 (en) * | 2005-12-05 | 2007-06-07 | Brown Jeffrey K | Electronic pest control apparatus |
US7420194B2 (en) | 2005-12-27 | 2008-09-02 | Asml Netherlands B.V. | Lithographic apparatus and substrate edge seal |
US7839483B2 (en) * | 2005-12-28 | 2010-11-23 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and a control system |
US7649611B2 (en) | 2005-12-30 | 2010-01-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
JP4984810B2 (ja) * | 2006-02-16 | 2012-07-25 | 株式会社ニコン | 露光方法、露光装置及びフォトマスク |
US8045134B2 (en) | 2006-03-13 | 2011-10-25 | Asml Netherlands B.V. | Lithographic apparatus, control system and device manufacturing method |
JP4889331B2 (ja) * | 2006-03-22 | 2012-03-07 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
JP2007266504A (ja) * | 2006-03-29 | 2007-10-11 | Canon Inc | 露光装置 |
EP1843206B1 (en) * | 2006-04-06 | 2012-09-05 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US9477158B2 (en) * | 2006-04-14 | 2016-10-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
EP2023378B1 (en) * | 2006-05-10 | 2013-03-13 | Nikon Corporation | Exposure apparatus and device manufacturing method |
US7969548B2 (en) * | 2006-05-22 | 2011-06-28 | Asml Netherlands B.V. | Lithographic apparatus and lithographic apparatus cleaning method |
US7532309B2 (en) * | 2006-06-06 | 2009-05-12 | Nikon Corporation | Immersion lithography system and method having an immersion fluid containment plate for submerging the substrate to be imaged in immersion fluid |
US7656502B2 (en) * | 2006-06-22 | 2010-02-02 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US20080100812A1 (en) * | 2006-10-26 | 2008-05-01 | Nikon Corporation | Immersion lithography system and method having a wafer chuck made of a porous material |
US8045135B2 (en) * | 2006-11-22 | 2011-10-25 | Asml Netherlands B.V. | Lithographic apparatus with a fluid combining unit and related device manufacturing method |
US8634053B2 (en) | 2006-12-07 | 2014-01-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US9632425B2 (en) | 2006-12-07 | 2017-04-25 | Asml Holding N.V. | Lithographic apparatus, a dryer and a method of removing liquid from a surface |
US7791709B2 (en) * | 2006-12-08 | 2010-09-07 | Asml Netherlands B.V. | Substrate support and lithographic process |
JP2008147577A (ja) * | 2006-12-13 | 2008-06-26 | Canon Inc | 露光装置及びデバイス製造方法 |
US8654305B2 (en) * | 2007-02-15 | 2014-02-18 | Asml Holding N.V. | Systems and methods for insitu lens cleaning in immersion lithography |
US8817226B2 (en) | 2007-02-15 | 2014-08-26 | Asml Holding N.V. | Systems and methods for insitu lens cleaning using ozone in immersion lithography |
JP2008227007A (ja) * | 2007-03-09 | 2008-09-25 | Toshiba Corp | 液浸露光方法及び液浸露光装置 |
US8068209B2 (en) * | 2007-03-23 | 2011-11-29 | Nikon Corporation | Nozzle to help reduce the escape of immersion liquid from an immersion lithography tool |
US8947629B2 (en) * | 2007-05-04 | 2015-02-03 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
US8011377B2 (en) | 2007-05-04 | 2011-09-06 | Asml Netherlands B.V. | Cleaning device and a lithographic apparatus cleaning method |
US7866330B2 (en) * | 2007-05-04 | 2011-01-11 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
US7841352B2 (en) * | 2007-05-04 | 2010-11-30 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
US7576833B2 (en) * | 2007-06-28 | 2009-08-18 | Nikon Corporation | Gas curtain type immersion lithography tool using porous material for fluid removal |
US7708289B2 (en) * | 2007-09-07 | 2010-05-04 | Jaime Sr Richard A | Removable tubular variable lighting system for a skateboard |
US8681308B2 (en) * | 2007-09-13 | 2014-03-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7967960B2 (en) * | 2007-11-06 | 2011-06-28 | United Microelectronics Corp. | Fluid-confining apparatus |
JP2009188241A (ja) * | 2008-02-07 | 2009-08-20 | Toshiba Corp | 液浸露光装置及び液浸露光方法 |
KR101448152B1 (ko) * | 2008-03-26 | 2014-10-07 | 삼성전자주식회사 | 수직 포토게이트를 구비한 거리측정 센서 및 그를 구비한입체 컬러 이미지 센서 |
US8233139B2 (en) * | 2008-03-27 | 2012-07-31 | Nikon Corporation | Immersion system, exposure apparatus, exposing method, and device fabricating method |
JP5097166B2 (ja) * | 2008-05-28 | 2012-12-12 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及び装置の動作方法 |
EP2131242A1 (en) * | 2008-06-02 | 2009-12-09 | ASML Netherlands B.V. | Substrate table, lithographic apparatus and device manufacturing method |
NL1036924A1 (nl) * | 2008-06-02 | 2009-12-03 | Asml Netherlands Bv | Substrate table, lithographic apparatus and device manufacturing method. |
SG159467A1 (en) * | 2008-09-02 | 2010-03-30 | Asml Netherlands Bv | Fluid handling structure, lithographic apparatus and device manufacturing method |
KR101059288B1 (ko) * | 2008-11-18 | 2011-08-24 | 대구텍 유한회사 | 드릴용 절삭공구 |
EP2221669A3 (en) * | 2009-02-19 | 2011-02-09 | ASML Netherlands B.V. | A lithographic apparatus, a method of controlling the apparatus and a device manufacturing method |
US8226009B2 (en) * | 2009-04-29 | 2012-07-24 | Hand Held Products, Inc. | Laser scanner with improved decoding |
US8282004B2 (en) * | 2009-04-29 | 2012-10-09 | Hand Held Products, Inc. | Focusing apparatus and terminal comprising variable focus lens assembly |
US8038066B2 (en) * | 2009-04-29 | 2011-10-18 | Hand Held Products, Inc. | Laser scanner with deformable lens |
US8305691B2 (en) * | 2009-04-29 | 2012-11-06 | Hand Held Products, Inc. | Fluid lens element for use in changing thermal operating environment |
EP2264529A3 (en) * | 2009-06-16 | 2011-02-09 | ASML Netherlands B.V. | A lithographic apparatus, a method of controlling the apparatus and a method of manufacturing a device using a lithographic apparatus |
NL2005207A (en) * | 2009-09-28 | 2011-03-29 | Asml Netherlands Bv | Heat pipe, lithographic apparatus and device manufacturing method. |
US8946514B2 (en) * | 2009-12-28 | 2015-02-03 | E.I. Du Pont De Nemours And Company | Sorghum fertility restorer genotypes and methods of marker-assisted selection |
NL2006196A (en) | 2010-03-12 | 2011-09-13 | Asml Netherlands Bv | Lithographic apparatus and method. |
NL2006244A (en) * | 2010-03-16 | 2011-09-19 | Asml Netherlands Bv | Lithographic apparatus, cover for use in a lithographic apparatus and method for designing a cover for use in a lithographic apparatus. |
NL2006203A (en) * | 2010-03-16 | 2011-09-19 | Asml Netherlands Bv | Cover for a substrate table, substrate table for a lithographic apparatus, lithographic apparatus, and device manufacturing method. |
EP2381310B1 (en) | 2010-04-22 | 2015-05-06 | ASML Netherlands BV | Fluid handling structure and lithographic apparatus |
JP5313293B2 (ja) | 2010-05-19 | 2013-10-09 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置、リソグラフィ装置で使用する流体ハンドリング構造およびデバイス製造方法 |
NL2008183A (en) * | 2011-02-25 | 2012-08-28 | Asml Netherlands Bv | A lithographic apparatus, a method of controlling the apparatus and a device manufacturing method. |
NL2008695A (en) * | 2011-05-25 | 2012-11-27 | Asml Netherlands Bv | Lithographic apparatus comprising substrate table. |
JP5943557B2 (ja) * | 2011-06-01 | 2016-07-05 | キヤノン株式会社 | 位置決め装置、露光装置およびデバイス製造方法 |
US8823921B2 (en) * | 2011-08-19 | 2014-09-02 | Ultratech, Inc. | Programmable illuminator for a photolithography system |
WO2013072144A1 (en) | 2011-11-17 | 2013-05-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
NL2009692A (en) * | 2011-12-07 | 2013-06-10 | Asml Netherlands Bv | A lithographic apparatus and a device manufacturing method. |
CN103186056B (zh) * | 2011-12-31 | 2016-01-06 | 中芯国际集成电路制造(上海)有限公司 | 浸没式光刻系统的投影系统 |
WO2013135494A2 (en) | 2012-03-14 | 2013-09-19 | Asml Netherlands B.V. | Lithographic apparatus |
US9268231B2 (en) * | 2012-04-10 | 2016-02-23 | Nikon Corporation | Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium |
NL2010679A (en) | 2012-05-23 | 2013-11-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
US9494870B2 (en) * | 2012-10-12 | 2016-11-15 | Nikon Corporation | Exposure apparatus, exposing method, device manufacturing method, program, and recording medium |
CN104345576A (zh) * | 2013-08-09 | 2015-02-11 | 联华电子股份有限公司 | 形成图案的方法 |
CN104678712B (zh) * | 2013-12-03 | 2017-05-31 | 上海微电子装备有限公司 | 一种浸没式曝光设备 |
JP6251073B2 (ja) | 2014-02-05 | 2017-12-20 | 浜松ホトニクス株式会社 | 分光器、及び分光器の製造方法 |
CN105739245B (zh) * | 2014-12-12 | 2018-12-14 | 上海微电子装备(集团)股份有限公司 | 一种浸没光刻机浸没单元防碰撞装置及方法 |
CN105988294B (zh) * | 2015-01-28 | 2018-05-04 | 上海微电子装备(集团)股份有限公司 | 一种浸没式光刻机浸液流场维持防碰撞系统 |
CN106227000B (zh) * | 2016-07-22 | 2018-04-13 | 中国科学院上海光学精密机械研究所 | 激光诱导瞬态热探针的纳米光刻方法 |
CN109690406A (zh) * | 2016-09-09 | 2019-04-26 | Asml控股股份有限公司 | 光刻设备和支撑结构背景 |
US10503085B2 (en) * | 2017-11-16 | 2019-12-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Lithography apparatus and method |
US11106140B2 (en) * | 2019-07-16 | 2021-08-31 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor apparatus and method of operating the same |
Family Cites Families (195)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE221563C (ja) | ||||
DE242880C (ja) | ||||
DE224448C (ja) | ||||
DE206607C (ja) | ||||
GB1242527A (en) | 1967-10-20 | 1971-08-11 | Kodak Ltd | Optical instruments |
US3573975A (en) | 1968-07-10 | 1971-04-06 | Ibm | Photochemical fabrication process |
JPS5919912Y2 (ja) | 1978-08-21 | 1984-06-08 | 清水建設株式会社 | 複合熱交換器 |
DE2963537D1 (en) | 1979-07-27 | 1982-10-07 | Tabarelli Werner W | Optical lithographic method and apparatus for copying a pattern onto a semiconductor wafer |
FR2474708B1 (fr) | 1980-01-24 | 1987-02-20 | Dme | Procede de microphotolithographie a haute resolution de traits |
JPS5754317A (en) | 1980-09-19 | 1982-03-31 | Hitachi Ltd | Method and device for forming pattern |
US4346164A (en) | 1980-10-06 | 1982-08-24 | Werner Tabarelli | Photolithographic method for the manufacture of integrated circuits |
US4509852A (en) * | 1980-10-06 | 1985-04-09 | Werner Tabarelli | Apparatus for the photolithographic manufacture of integrated circuit elements |
US4390273A (en) | 1981-02-17 | 1983-06-28 | Censor Patent-Und Versuchsanstalt | Projection mask as well as a method and apparatus for the embedding thereof and projection printing system |
JPS57153433A (en) | 1981-03-18 | 1982-09-22 | Hitachi Ltd | Manufacturing device for semiconductor |
JPS57153433U (ja) | 1981-03-20 | 1982-09-27 | ||
JPS58202448A (ja) | 1982-05-21 | 1983-11-25 | Hitachi Ltd | 露光装置 |
DD206607A1 (de) | 1982-06-16 | 1984-02-01 | Mikroelektronik Zt Forsch Tech | Verfahren und vorrichtung zur beseitigung von interferenzeffekten |
JPS5919912A (ja) | 1982-07-26 | 1984-02-01 | Hitachi Ltd | 液浸距離保持装置 |
DD242880A1 (de) | 1983-01-31 | 1987-02-11 | Kuch Karl Heinz | Einrichtung zur fotolithografischen strukturuebertragung |
DD221563A1 (de) | 1983-09-14 | 1985-04-24 | Mikroelektronik Zt Forsch Tech | Immersionsobjektiv fuer die schrittweise projektionsabbildung einer maskenstruktur |
DD224448A1 (de) | 1984-03-01 | 1985-07-03 | Zeiss Jena Veb Carl | Einrichtung zur fotolithografischen strukturuebertragung |
JPS61113376A (ja) | 1984-11-07 | 1986-05-31 | Sony Corp | テレビジヨン信号の動き検出装置 |
JPS6265326A (ja) | 1985-09-18 | 1987-03-24 | Hitachi Ltd | 露光装置 |
JPS6265326U (ja) | 1985-10-16 | 1987-04-23 | ||
JPS62121417A (ja) | 1985-11-22 | 1987-06-02 | Hitachi Ltd | 液浸対物レンズ装置 |
JPS62121417U (ja) | 1986-01-24 | 1987-08-01 | ||
JPS63157419A (ja) | 1986-12-22 | 1988-06-30 | Toshiba Corp | 微細パタ−ン転写装置 |
JPS63157419U (ja) | 1987-03-31 | 1988-10-14 | ||
US5040020A (en) | 1988-03-31 | 1991-08-13 | Cornell Research Foundation, Inc. | Self-aligned, high resolution resonant dielectric lithography |
JPH03209479A (ja) | 1989-09-06 | 1991-09-12 | Sanee Giken Kk | 露光方法 |
US5121256A (en) | 1991-03-14 | 1992-06-09 | The Board Of Trustees Of The Leland Stanford Junior University | Lithography system employing a solid immersion lens |
JPH04305917A (ja) | 1991-04-02 | 1992-10-28 | Nikon Corp | 密着型露光装置 |
JPH04305915A (ja) | 1991-04-02 | 1992-10-28 | Nikon Corp | 密着型露光装置 |
JPH0562877A (ja) | 1991-09-02 | 1993-03-12 | Yasuko Shinohara | 光によるlsi製造縮小投影露光装置の光学系 |
JPH06124873A (ja) | 1992-10-09 | 1994-05-06 | Canon Inc | 液浸式投影露光装置 |
JP2753930B2 (ja) * | 1992-11-27 | 1998-05-20 | キヤノン株式会社 | 液浸式投影露光装置 |
JP2520833B2 (ja) | 1992-12-21 | 1996-07-31 | 東京エレクトロン株式会社 | 浸漬式の液処理装置 |
JP3747958B2 (ja) | 1995-04-07 | 2006-02-22 | 株式会社ニコン | 反射屈折光学系 |
JP3212199B2 (ja) | 1993-10-04 | 2001-09-25 | 旭硝子株式会社 | 平板型陰極線管 |
JPH07220990A (ja) | 1994-01-28 | 1995-08-18 | Hitachi Ltd | パターン形成方法及びその露光装置 |
US5874820A (en) | 1995-04-04 | 1999-02-23 | Nikon Corporation | Window frame-guided stage mechanism |
JPH0845812A (ja) * | 1994-07-27 | 1996-02-16 | Nikon Corp | 面位置設定装置 |
JPH08136475A (ja) | 1994-11-14 | 1996-05-31 | Kawasaki Steel Corp | 板状材の表面観察装置 |
JPH08171054A (ja) | 1994-12-16 | 1996-07-02 | Nikon Corp | 反射屈折光学系 |
JPH08316124A (ja) | 1995-05-19 | 1996-11-29 | Hitachi Ltd | 投影露光方法及び露光装置 |
JPH08316125A (ja) | 1995-05-19 | 1996-11-29 | Hitachi Ltd | 投影露光方法及び露光装置 |
JPH103039A (ja) | 1996-06-14 | 1998-01-06 | Nikon Corp | 反射屈折光学系 |
JPH1020195A (ja) | 1996-06-28 | 1998-01-23 | Nikon Corp | 反射屈折光学系 |
WO1998009278A1 (en) | 1996-08-26 | 1998-03-05 | Digital Papyrus Technologies | Method and apparatus for coupling an optical lens to a disk through a coupling medium having a relatively high index of refraction |
US5825043A (en) * | 1996-10-07 | 1998-10-20 | Nikon Precision Inc. | Focusing and tilting adjustment system for lithography aligner, manufacturing apparatus or inspection apparatus |
JP3612920B2 (ja) | 1997-02-14 | 2005-01-26 | ソニー株式会社 | 光学記録媒体の原盤作製用露光装置 |
JPH10255319A (ja) * | 1997-03-12 | 1998-09-25 | Hitachi Maxell Ltd | 原盤露光装置及び方法 |
JP3747566B2 (ja) * | 1997-04-23 | 2006-02-22 | 株式会社ニコン | 液浸型露光装置 |
JP3817836B2 (ja) * | 1997-06-10 | 2006-09-06 | 株式会社ニコン | 露光装置及びその製造方法並びに露光方法及びデバイス製造方法 |
US5900354A (en) | 1997-07-03 | 1999-05-04 | Batchelder; John Samuel | Method for optical inspection and lithography |
JPH11176727A (ja) * | 1997-12-11 | 1999-07-02 | Nikon Corp | 投影露光装置 |
WO1999031717A1 (fr) | 1997-12-12 | 1999-06-24 | Nikon Corporation | Procede d'exposition par projection et graveur a projection |
US6208407B1 (en) * | 1997-12-22 | 2001-03-27 | Asm Lithography B.V. | Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement |
AU2747999A (en) * | 1998-03-26 | 1999-10-18 | Nikon Corporation | Projection exposure method and system |
JP2000058436A (ja) | 1998-08-11 | 2000-02-25 | Nikon Corp | 投影露光装置及び露光方法 |
JP2000076707A (ja) | 1998-08-31 | 2000-03-14 | Sony Corp | 光学記録媒体作製用原盤記録装置 |
TW490596B (en) * | 1999-03-08 | 2002-06-11 | Asm Lithography Bv | Lithographic projection apparatus, method of manufacturing a device using the lithographic projection apparatus, device manufactured according to the method and method of calibrating the lithographic projection apparatus |
TWI242111B (en) | 1999-04-19 | 2005-10-21 | Asml Netherlands Bv | Gas bearings for use in vacuum chambers and their application in lithographic projection apparatus |
TW552480B (en) * | 1999-04-19 | 2003-09-11 | Asml Netherlands Bv | Moveable support in a vacuum chamber and its application in lithographic projection apparatus |
JP4504479B2 (ja) | 1999-09-21 | 2010-07-14 | オリンパス株式会社 | 顕微鏡用液浸対物レンズ |
US7187503B2 (en) | 1999-12-29 | 2007-03-06 | Carl Zeiss Smt Ag | Refractive projection objective for immersion lithography |
US6995930B2 (en) | 1999-12-29 | 2006-02-07 | Carl Zeiss Smt Ag | Catadioptric projection objective with geometric beam splitting |
JP2001272604A (ja) | 2000-03-27 | 2001-10-05 | Olympus Optical Co Ltd | 液浸対物レンズおよびそれを用いた光学装置 |
TW591653B (en) | 2000-08-08 | 2004-06-11 | Koninkl Philips Electronics Nv | Method of manufacturing an optically scannable information carrier |
KR100866818B1 (ko) | 2000-12-11 | 2008-11-04 | 가부시키가이샤 니콘 | 투영광학계 및 이 투영광학계를 구비한 노광장치 |
WO2002091078A1 (en) | 2001-05-07 | 2002-11-14 | Massachusetts Institute Of Technology | Methods and apparatus employing an index matching medium |
US6600547B2 (en) | 2001-09-24 | 2003-07-29 | Nikon Corporation | Sliding seal |
EP1446703A2 (en) | 2001-11-07 | 2004-08-18 | Applied Materials, Inc. | Optical spot grid array printer |
US7092069B2 (en) | 2002-03-08 | 2006-08-15 | Carl Zeiss Smt Ag | Projection exposure method and projection exposure system |
DE10229818A1 (de) | 2002-06-28 | 2004-01-15 | Carl Zeiss Smt Ag | Verfahren zur Fokusdetektion und Abbildungssystem mit Fokusdetektionssystem |
DE10210899A1 (de) | 2002-03-08 | 2003-09-18 | Zeiss Carl Smt Ag | Refraktives Projektionsobjektiv für Immersions-Lithographie |
US7099682B2 (en) * | 2002-08-01 | 2006-08-29 | Intel Corporation | Method for allocating resources in a wireless system |
CN100462844C (zh) | 2002-08-23 | 2009-02-18 | 株式会社尼康 | 投影光学系统、微影方法、曝光装置及使用此装置的方法 |
US6988326B2 (en) | 2002-09-30 | 2006-01-24 | Lam Research Corporation | Phobic barrier meniscus separation and containment |
US6954993B1 (en) | 2002-09-30 | 2005-10-18 | Lam Research Corporation | Concentric proximity processing head |
US7093375B2 (en) | 2002-09-30 | 2006-08-22 | Lam Research Corporation | Apparatus and method for utilizing a meniscus in substrate processing |
US7367345B1 (en) | 2002-09-30 | 2008-05-06 | Lam Research Corporation | Apparatus and method for providing a confined liquid for immersion lithography |
US6788477B2 (en) * | 2002-10-22 | 2004-09-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus for method for immersion lithography |
SG121822A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
CN100568101C (zh) | 2002-11-12 | 2009-12-09 | Asml荷兰有限公司 | 光刻装置和器件制造方法 |
CN101349876B (zh) | 2002-11-12 | 2010-12-01 | Asml荷兰有限公司 | 光刻装置和器件制造方法 |
DE60335595D1 (de) | 2002-11-12 | 2011-02-17 | Asml Netherlands Bv | Lithographischer Apparat mit Immersion und Verfahren zur Herstellung einer Vorrichtung |
US7110081B2 (en) | 2002-11-12 | 2006-09-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
SG121818A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
SG131766A1 (en) | 2002-11-18 | 2007-05-28 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
DE10253679A1 (de) | 2002-11-18 | 2004-06-03 | Infineon Technologies Ag | Optische Einrichtung zur Verwendung bei einem Lithographie-Verfahren, insbesondere zur Herstellung eines Halbleiter-Bauelements, sowie optisches Lithographieverfahren |
EP1420302A1 (en) | 2002-11-18 | 2004-05-19 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
TWI255971B (en) | 2002-11-29 | 2006-06-01 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
DE10258718A1 (de) | 2002-12-09 | 2004-06-24 | Carl Zeiss Smt Ag | Projektionsobjektiv, insbesondere für die Mikrolithographie, sowie Verfahren zur Abstimmung eines Projektionsobjektives |
DE10257766A1 (de) | 2002-12-10 | 2004-07-15 | Carl Zeiss Smt Ag | Verfahren zur Einstellung einer gewünschten optischen Eigenschaft eines Projektionsobjektivs sowie mikrolithografische Projektionsbelichtungsanlage |
JP4352874B2 (ja) * | 2002-12-10 | 2009-10-28 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
US6992750B2 (en) | 2002-12-10 | 2006-01-31 | Canon Kabushiki Kaisha | Exposure apparatus and method |
JP4645027B2 (ja) * | 2002-12-10 | 2011-03-09 | 株式会社ニコン | 露光装置及び露光方法、デバイス製造方法 |
JP4232449B2 (ja) | 2002-12-10 | 2009-03-04 | 株式会社ニコン | 露光方法、露光装置、及びデバイス製造方法 |
WO2004053954A1 (ja) | 2002-12-10 | 2004-06-24 | Nikon Corporation | 露光装置及びデバイス製造方法 |
KR101101737B1 (ko) | 2002-12-10 | 2012-01-05 | 가부시키가이샤 니콘 | 노광장치 및 노광방법, 디바이스 제조방법 |
CN101424883B (zh) | 2002-12-10 | 2013-05-15 | 株式会社尼康 | 曝光设备和器件制造法 |
EP1571694A4 (en) | 2002-12-10 | 2008-10-15 | Nikon Corp | EXPOSURE APPARATUS AND METHOD FOR MANUFACTURING THE DEVICE |
JP4179283B2 (ja) | 2002-12-10 | 2008-11-12 | 株式会社ニコン | 光学素子及びその光学素子を用いた投影露光装置 |
JP2004301825A (ja) * | 2002-12-10 | 2004-10-28 | Nikon Corp | 面位置検出装置、露光方法、及びデバイス製造方法 |
SG152063A1 (en) | 2002-12-10 | 2009-05-29 | Nikon Corp | Exposure apparatus and method for producing device |
AU2003289272A1 (en) | 2002-12-10 | 2004-06-30 | Nikon Corporation | Surface position detection apparatus, exposure method, and device porducing method |
KR20120127755A (ko) | 2002-12-10 | 2012-11-23 | 가부시키가이샤 니콘 | 노광장치 및 디바이스 제조방법 |
WO2004053951A1 (ja) | 2002-12-10 | 2004-06-24 | Nikon Corporation | 露光方法及び露光装置並びにデバイス製造方法 |
CN100370533C (zh) * | 2002-12-13 | 2008-02-20 | 皇家飞利浦电子股份有限公司 | 用于照射层的方法和用于将辐射导向层的装置 |
CN1316482C (zh) | 2002-12-19 | 2007-05-16 | 皇家飞利浦电子股份有限公司 | 照射层上斑点的方法和装置 |
US7010958B2 (en) | 2002-12-19 | 2006-03-14 | Asml Holding N.V. | High-resolution gas gauge proximity sensor |
JP4364806B2 (ja) | 2002-12-19 | 2009-11-18 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 層上にスポットを照射する方法及び装置 |
US6781670B2 (en) | 2002-12-30 | 2004-08-24 | Intel Corporation | Immersion lithography |
TWI247339B (en) | 2003-02-21 | 2006-01-11 | Asml Holding Nv | Lithographic printing with polarized light |
JP4352930B2 (ja) * | 2003-02-26 | 2009-10-28 | 株式会社ニコン | 露光装置、露光方法及びデバイス製造方法 |
US6943941B2 (en) | 2003-02-27 | 2005-09-13 | Asml Netherlands B.V. | Stationary and dynamic radial transverse electric polarizer for high numerical aperture systems |
US7206059B2 (en) | 2003-02-27 | 2007-04-17 | Asml Netherlands B.V. | Stationary and dynamic radial transverse electric polarizer for high numerical aperture systems |
FR2852316B1 (fr) | 2003-03-11 | 2006-07-21 | Solvay | Monomere fluore fonctionnalise et ses copolymeres avec le fluorure de vinyledene |
US7029832B2 (en) | 2003-03-11 | 2006-04-18 | Samsung Electronics Co., Ltd. | Immersion lithography methods using carbon dioxide |
US20050164522A1 (en) | 2003-03-24 | 2005-07-28 | Kunz Roderick R. | Optical fluids, and systems and methods of making and using the same |
KR20110104084A (ko) * | 2003-04-09 | 2011-09-21 | 가부시키가이샤 니콘 | 액침 리소그래피 유체 제어 시스템 |
JP4656057B2 (ja) | 2003-04-10 | 2011-03-23 | 株式会社ニコン | 液浸リソグラフィ装置用電気浸透素子 |
JP4488005B2 (ja) | 2003-04-10 | 2010-06-23 | 株式会社ニコン | 液浸リソグラフィ装置用の液体を捕集するための流出通路 |
KR101364889B1 (ko) | 2003-04-10 | 2014-02-19 | 가부시키가이샤 니콘 | 액침 리소그래피 장치용 진공 배출을 포함하는 환경 시스템 |
EP1611486B1 (en) * | 2003-04-10 | 2016-03-16 | Nikon Corporation | Environmental system including a transport region for an immersion lithography apparatus |
JP4582089B2 (ja) * | 2003-04-11 | 2010-11-17 | 株式会社ニコン | 液浸リソグラフィ用の液体噴射回収システム |
JP4428115B2 (ja) * | 2003-04-11 | 2010-03-10 | 株式会社ニコン | 液浸リソグラフィシステム |
KR101861493B1 (ko) | 2003-04-11 | 2018-05-28 | 가부시키가이샤 니콘 | 액침 리소그래피 머신에서 웨이퍼 교환동안 투영 렌즈 아래의 갭에서 액침 액체를 유지하는 장치 및 방법 |
SG10201803122UA (en) | 2003-04-11 | 2018-06-28 | Nikon Corp | Immersion lithography apparatus and device manufacturing method |
WO2004095135A2 (en) * | 2003-04-17 | 2004-11-04 | Nikon Corporation | Optical arrangement of autofocus elements for use with immersion lithography |
JP4025683B2 (ja) * | 2003-05-09 | 2007-12-26 | 松下電器産業株式会社 | パターン形成方法及び露光装置 |
JP4146755B2 (ja) | 2003-05-09 | 2008-09-10 | 松下電器産業株式会社 | パターン形成方法 |
TWI295414B (en) * | 2003-05-13 | 2008-04-01 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
JP4084710B2 (ja) | 2003-06-12 | 2008-04-30 | 松下電器産業株式会社 | パターン形成方法 |
JP4054285B2 (ja) | 2003-06-12 | 2008-02-27 | 松下電器産業株式会社 | パターン形成方法 |
KR101686762B1 (ko) | 2003-06-19 | 2016-12-28 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조방법 |
US6867844B2 (en) | 2003-06-19 | 2005-03-15 | Asml Holding N.V. | Immersion photolithography system and method using microchannel nozzles |
JP4084712B2 (ja) | 2003-06-23 | 2008-04-30 | 松下電器産業株式会社 | パターン形成方法 |
JP4029064B2 (ja) | 2003-06-23 | 2008-01-09 | 松下電器産業株式会社 | パターン形成方法 |
US6809794B1 (en) | 2003-06-27 | 2004-10-26 | Asml Holding N.V. | Immersion photolithography system and method using inverted wafer-projection optics interface |
JP3862678B2 (ja) | 2003-06-27 | 2006-12-27 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
JP2007527615A (ja) | 2003-07-01 | 2007-09-27 | 株式会社ニコン | 同位体特定流体の光学素子としての使用方法 |
US7384149B2 (en) | 2003-07-21 | 2008-06-10 | Asml Netherlands B.V. | Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system |
US7006209B2 (en) | 2003-07-25 | 2006-02-28 | Advanced Micro Devices, Inc. | Method and apparatus for monitoring and controlling imaging in immersion lithography systems |
US7326522B2 (en) | 2004-02-11 | 2008-02-05 | Asml Netherlands B.V. | Device manufacturing method and a substrate |
US7175968B2 (en) | 2003-07-28 | 2007-02-13 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and a substrate |
EP1503244A1 (en) | 2003-07-28 | 2005-02-02 | ASML Netherlands B.V. | Lithographic projection apparatus and device manufacturing method |
US7700267B2 (en) | 2003-08-11 | 2010-04-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Immersion fluid for immersion lithography, and method of performing immersion lithography |
US7061578B2 (en) | 2003-08-11 | 2006-06-13 | Advanced Micro Devices, Inc. | Method and apparatus for monitoring and controlling imaging in immersion lithography systems |
US7579135B2 (en) | 2003-08-11 | 2009-08-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Lithography apparatus for manufacture of integrated circuits |
US7085075B2 (en) | 2003-08-12 | 2006-08-01 | Carl Zeiss Smt Ag | Projection objectives including a plurality of mirrors with lenses ahead of mirror M3 |
US6844206B1 (en) | 2003-08-21 | 2005-01-18 | Advanced Micro Devices, Llp | Refractive index system monitor and control for immersion lithography |
US7070915B2 (en) | 2003-08-29 | 2006-07-04 | Tokyo Electron Limited | Method and system for drying a substrate |
US6954256B2 (en) | 2003-08-29 | 2005-10-11 | Asml Netherlands B.V. | Gradient immersion lithography |
US7014966B2 (en) | 2003-09-02 | 2006-03-21 | Advanced Micro Devices, Inc. | Method and apparatus for elimination of bubbles in immersion medium in immersion lithography systems |
JP4288426B2 (ja) | 2003-09-03 | 2009-07-01 | 株式会社ニコン | 液浸リソグラフィのための流体の供給装置及び方法 |
US6961186B2 (en) | 2003-09-26 | 2005-11-01 | Takumi Technology Corp. | Contact printing using a magnified mask image |
EP1519230A1 (en) | 2003-09-29 | 2005-03-30 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7369217B2 (en) | 2003-10-03 | 2008-05-06 | Micronic Laser Systems Ab | Method and device for immersion lithography |
US7678527B2 (en) | 2003-10-16 | 2010-03-16 | Intel Corporation | Methods and compositions for providing photoresist with improved properties for contacting liquids |
WO2005050324A2 (en) | 2003-11-05 | 2005-06-02 | Dsm Ip Assets B.V. | A method and apparatus for producing microchips |
US7924397B2 (en) | 2003-11-06 | 2011-04-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Anti-corrosion layer on objective lens for liquid immersion lithography applications |
US8854602B2 (en) | 2003-11-24 | 2014-10-07 | Asml Netherlands B.V. | Holding device for an optical element in an objective |
US7545481B2 (en) | 2003-11-24 | 2009-06-09 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7125652B2 (en) | 2003-12-03 | 2006-10-24 | Advanced Micro Devices, Inc. | Immersion lithographic process using a conforming immersion medium |
EP1700163A1 (en) | 2003-12-15 | 2006-09-13 | Carl Zeiss SMT AG | Objective as a microlithography projection objective with at least one liquid lens |
EP1697798A2 (en) | 2003-12-15 | 2006-09-06 | Carl Zeiss SMT AG | Projection objective having a high aperture and a planar end surface |
WO2005059645A2 (en) | 2003-12-19 | 2005-06-30 | Carl Zeiss Smt Ag | Microlithography projection objective with crystal elements |
US7460206B2 (en) | 2003-12-19 | 2008-12-02 | Carl Zeiss Smt Ag | Projection objective for immersion lithography |
US20050185269A1 (en) | 2003-12-19 | 2005-08-25 | Carl Zeiss Smt Ag | Catadioptric projection objective with geometric beam splitting |
US7394521B2 (en) | 2003-12-23 | 2008-07-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7589818B2 (en) | 2003-12-23 | 2009-09-15 | Asml Netherlands B.V. | Lithographic apparatus, alignment apparatus, device manufacturing method, and a method of converting an apparatus |
US7119884B2 (en) | 2003-12-24 | 2006-10-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US20050147920A1 (en) | 2003-12-30 | 2005-07-07 | Chia-Hui Lin | Method and system for immersion lithography |
US7088422B2 (en) | 2003-12-31 | 2006-08-08 | International Business Machines Corporation | Moving lens for immersion optical lithography |
JP4371822B2 (ja) | 2004-01-06 | 2009-11-25 | キヤノン株式会社 | 露光装置 |
JP4429023B2 (ja) | 2004-01-07 | 2010-03-10 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
US20050153424A1 (en) | 2004-01-08 | 2005-07-14 | Derek Coon | Fluid barrier with transparent areas for immersion lithography |
KR101309242B1 (ko) | 2004-01-14 | 2013-09-16 | 칼 짜이스 에스엠티 게엠베하 | 반사굴절식 투영 대물렌즈 |
KR101233879B1 (ko) | 2004-01-16 | 2013-02-15 | 칼 짜이스 에스엠티 게엠베하 | 편광변조 광학소자 |
WO2005069078A1 (en) | 2004-01-19 | 2005-07-28 | Carl Zeiss Smt Ag | Microlithographic projection exposure apparatus with immersion projection lens |
CN1938646B (zh) | 2004-01-20 | 2010-12-15 | 卡尔蔡司Smt股份公司 | 曝光装置和用于投影透镜的测量装置 |
US7026259B2 (en) | 2004-01-21 | 2006-04-11 | International Business Machines Corporation | Liquid-filled balloons for immersion lithography |
US7391501B2 (en) | 2004-01-22 | 2008-06-24 | Intel Corporation | Immersion liquids with siloxane polymer for immersion lithography |
EP1723467A2 (en) | 2004-02-03 | 2006-11-22 | Rochester Institute of Technology | Method of photolithography using a fluid and a system thereof |
WO2005076084A1 (en) | 2004-02-09 | 2005-08-18 | Carl Zeiss Smt Ag | Projection objective for a microlithographic projection exposure apparatus |
US7050146B2 (en) | 2004-02-09 | 2006-05-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
EP1714192A1 (en) | 2004-02-13 | 2006-10-25 | Carl Zeiss SMT AG | Projection objective for a microlithographic projection exposure apparatus |
EP1721201A1 (en) | 2004-02-18 | 2006-11-15 | Corning Incorporated | Catadioptric imaging system for high numerical aperture imaging with deep ultraviolet light |
US20050205108A1 (en) | 2004-03-16 | 2005-09-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and system for immersion lithography lens cleaning |
US7027125B2 (en) | 2004-03-25 | 2006-04-11 | International Business Machines Corporation | System and apparatus for photolithography |
US7084960B2 (en) | 2004-03-29 | 2006-08-01 | Intel Corporation | Lithography using controlled polarization |
US7295283B2 (en) | 2004-04-02 | 2007-11-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7486381B2 (en) | 2004-05-21 | 2009-02-03 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
-
2004
- 2004-05-04 TW TW093112560A patent/TWI295414B/zh not_active IP Right Cessation
- 2004-05-06 SG SG200402415A patent/SG116542A1/en unknown
- 2004-05-12 JP JP2004142059A patent/JP4115964B2/ja not_active Expired - Fee Related
- 2004-05-13 KR KR1020040033745A patent/KR100620980B1/ko active IP Right Grant
- 2004-05-13 CN CNB2004100431808A patent/CN1264065C/zh not_active Expired - Lifetime
- 2004-05-13 US US10/844,575 patent/US7352434B2/en not_active Expired - Lifetime
-
2008
- 2008-02-07 US US12/068,546 patent/US7936444B2/en not_active Expired - Fee Related
- 2008-03-21 JP JP2008073704A patent/JP5047019B2/ja not_active Expired - Fee Related
-
2010
- 2010-03-30 JP JP2010078262A patent/JP5145369B2/ja not_active Expired - Fee Related
-
2011
- 2011-04-07 US US13/082,038 patent/US8724083B2/en not_active Expired - Fee Related
- 2011-07-21 US US13/188,026 patent/US8964164B2/en not_active Expired - Fee Related
- 2011-07-22 US US13/189,255 patent/US8724084B2/en not_active Expired - Fee Related
-
2012
- 2012-04-03 JP JP2012084835A patent/JP5514857B2/ja not_active Expired - Lifetime
-
2015
- 2015-02-17 US US14/624,167 patent/US9477160B2/en not_active Expired - Fee Related
-
2016
- 2016-06-16 US US15/184,770 patent/US9798246B2/en not_active Expired - Fee Related
-
2017
- 2017-10-23 US US15/790,287 patent/US10466595B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR100620980B1 (ko) | 2006-09-08 |
JP2012134561A (ja) | 2012-07-12 |
KR20040098563A (ko) | 2004-11-20 |
US9477160B2 (en) | 2016-10-25 |
JP4115964B2 (ja) | 2008-07-09 |
US9798246B2 (en) | 2017-10-24 |
US20110273683A1 (en) | 2011-11-10 |
US7936444B2 (en) | 2011-05-03 |
US7352434B2 (en) | 2008-04-01 |
JP5145369B2 (ja) | 2013-02-13 |
US20110181859A1 (en) | 2011-07-28 |
JP2008160155A (ja) | 2008-07-10 |
JP2004343114A (ja) | 2004-12-02 |
SG116542A1 (en) | 2005-11-28 |
US20180046089A1 (en) | 2018-02-15 |
US20110279795A1 (en) | 2011-11-17 |
US20050007569A1 (en) | 2005-01-13 |
JP5047019B2 (ja) | 2012-10-10 |
US20080218717A1 (en) | 2008-09-11 |
US8724084B2 (en) | 2014-05-13 |
US8964164B2 (en) | 2015-02-24 |
JP2010157766A (ja) | 2010-07-15 |
CN1550905A (zh) | 2004-12-01 |
US10466595B2 (en) | 2019-11-05 |
US8724083B2 (en) | 2014-05-13 |
US20150168850A1 (en) | 2015-06-18 |
US20160299440A1 (en) | 2016-10-13 |
TWI295414B (en) | 2008-04-01 |
TW200517787A (en) | 2005-06-01 |
CN1264065C (zh) | 2006-07-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5514857B2 (ja) | リソグラフィ装置およびデバイス製造方法 | |
KR100666739B1 (ko) | 리소그래피 장치 및 디바이스 제조방법 | |
US8638418B2 (en) | Lithographic apparatus | |
EP1477856A1 (en) | Lithographic apparatus and device manufacturing method | |
JP4457082B2 (ja) | リソグラフィー装置、液浸型投影装置とデバイスの製造方法 | |
US8619258B2 (en) | Lithographic apparatus and device manufacturing method | |
EP1666973A1 (en) | Lithographic apparatus and device manufacturing method | |
JP5412399B2 (ja) | リソグラフィ装置およびデバイス製造方法 | |
US20110292369A1 (en) | Substrate table, a lithographic apparatus, a method of flattening an edge of a substrate and a device manufacturing method | |
KR20120098494A (ko) | 리소그래피 장치, 리소그래피 장치를 제어하는 방법 및 디바이스 제조 방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130613 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130618 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20140304 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20140331 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5514857 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |