JP5513384B2 - 半導体製作に適した表面に改質するための組成物及び方法 - Google Patents
半導体製作に適した表面に改質するための組成物及び方法 Download PDFInfo
- Publication number
- JP5513384B2 JP5513384B2 JP2010521062A JP2010521062A JP5513384B2 JP 5513384 B2 JP5513384 B2 JP 5513384B2 JP 2010521062 A JP2010521062 A JP 2010521062A JP 2010521062 A JP2010521062 A JP 2010521062A JP 5513384 B2 JP5513384 B2 JP 5513384B2
- Authority
- JP
- Japan
- Prior art keywords
- abrasive
- wafer
- article
- abrasive article
- binder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/06—Planarisation of inorganic insulating materials
- H10P95/062—Planarisation of inorganic insulating materials involving a dielectric removal step
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/839,329 US8092707B2 (en) | 1997-04-30 | 2007-08-15 | Compositions and methods for modifying a surface suited for semiconductor fabrication |
| US11/839,329 | 2007-08-15 | ||
| PCT/US2008/069396 WO2009023387A2 (en) | 2007-08-15 | 2008-07-08 | Compositions and methods for modifying a surface suited for semiconductor fabrication |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010537404A JP2010537404A (ja) | 2010-12-02 |
| JP2010537404A5 JP2010537404A5 (enExample) | 2011-08-04 |
| JP5513384B2 true JP5513384B2 (ja) | 2014-06-04 |
Family
ID=38986855
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010521062A Active JP5513384B2 (ja) | 2007-08-15 | 2008-07-08 | 半導体製作に適した表面に改質するための組成物及び方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US8092707B2 (enExample) |
| EP (1) | EP2186121B1 (enExample) |
| JP (1) | JP5513384B2 (enExample) |
| KR (1) | KR101494034B1 (enExample) |
| CN (1) | CN101779274B (enExample) |
| TW (1) | TWI460261B (enExample) |
| WO (1) | WO2009023387A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9960169B2 (en) | 2015-09-01 | 2018-05-01 | Samsung Electronics Co., Ltd. | Methods of manufacturing semiconductor devices |
Families Citing this family (98)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7387970B2 (en) * | 2003-05-07 | 2008-06-17 | Freescale Semiconductor, Inc. | Method of using an aqueous solution and composition thereof |
| US7972970B2 (en) | 2003-10-20 | 2011-07-05 | Novellus Systems, Inc. | Fabrication of semiconductor interconnect structure |
| US8372757B2 (en) | 2003-10-20 | 2013-02-12 | Novellus Systems, Inc. | Wet etching methods for copper removal and planarization in semiconductor processing |
| US8158532B2 (en) | 2003-10-20 | 2012-04-17 | Novellus Systems, Inc. | Topography reduction and control by selective accelerator removal |
| WO2006125462A1 (en) * | 2005-05-25 | 2006-11-30 | Freescale Semiconductor, Inc | Cleaning solution for a semiconductor wafer |
| US20100273330A1 (en) * | 2006-08-23 | 2010-10-28 | Citibank N.A. As Collateral Agent | Rinse formulation for use in the manufacture of an integrated circuit |
| US8048708B2 (en) * | 2008-06-25 | 2011-11-01 | Micron Technology, Inc. | Method and apparatus providing an imager module with a permanent carrier |
| WO2010030499A1 (en) * | 2008-09-12 | 2010-03-18 | Ferro Corporation | Chemical-mechanical polishing compositions and methods of making and using the same |
| JP2010226089A (ja) * | 2009-01-14 | 2010-10-07 | Rohm & Haas Electronic Materials Llc | 半導体ウェハをクリーニングする方法 |
| GB0902429D0 (en) * | 2009-02-13 | 2009-04-01 | Probe Ind Ltd | Compositions and their use |
| US8754021B2 (en) * | 2009-02-27 | 2014-06-17 | Advanced Technology Materials, Inc. | Non-amine post-CMP composition and method of use |
| US8545582B2 (en) * | 2009-03-11 | 2013-10-01 | Saint-Gobain Abrasives, Inc. | Abrasive articles including fused zirconia alumina grain having an improved shape |
| WO2010104816A1 (en) * | 2009-03-11 | 2010-09-16 | Fujifilm Electronic Materials U.S.A., Inc. | Cleaning formulation for removing residues on surfaces |
| CN104845532B (zh) * | 2009-06-22 | 2017-10-03 | 嘉柏微电子材料股份公司 | 化学机械抛光组合物以及用于抑制多晶硅移除速率的方法 |
| KR101126509B1 (ko) * | 2009-07-23 | 2012-03-29 | 노벨러스 시스템즈, 인코포레이티드 | 등방성 구리 식각을 위한 식각 조성물 |
| CN102484061B (zh) | 2009-09-02 | 2015-08-19 | 诺发系统有限公司 | 降低的各向同性蚀刻剂材料消耗及废料产生 |
| JP5646862B2 (ja) * | 2009-09-18 | 2014-12-24 | 長興開発科技股▲ふん▼有限公司 | シリコン貫通ビア構造を有する半導体ウェハーの研磨方法、及びそれに使用する研磨組成物 |
| JP2011110637A (ja) * | 2009-11-25 | 2011-06-09 | Asahi Glass Co Ltd | 磁気ディスク用ガラス基板の製造方法 |
| BR112012013346B1 (pt) * | 2009-12-02 | 2020-06-30 | 3M Innovative Properties Company | partículas abrasivas com formato duplamente afunilado |
| JP5877940B2 (ja) * | 2010-04-08 | 2016-03-08 | 株式会社フジミインコーポレーテッド | 銅及びシリコンが表面に露出したウェーハの研磨方法 |
| US9859141B2 (en) | 2010-04-15 | 2018-01-02 | Suss Microtec Lithography Gmbh | Apparatus and method for aligning and centering wafers |
| US9837295B2 (en) | 2010-04-15 | 2017-12-05 | Suss Microtec Lithography Gmbh | Apparatus and method for semiconductor wafer leveling, force balancing and contact sensing |
| CN102947781B (zh) * | 2010-06-22 | 2016-03-09 | 日本写真印刷株式会社 | 具有防锈性的窄边框触摸输入薄片及其制造方法 |
| GB2484348A (en) * | 2010-10-08 | 2012-04-11 | Rec Wafer Norway As | Abrasive slurry and method of production of photovoltaic wafers |
| TWI575040B (zh) * | 2011-03-18 | 2017-03-21 | 長興開發科技股份有限公司 | 可用於拋光矽通孔晶圓之拋光組成物及其用途 |
| JP5617065B2 (ja) * | 2011-09-09 | 2014-11-05 | 東京エレクトロン株式会社 | 剥離方法、プログラム、コンピュータ記憶媒体及び剥離システム |
| CN103842553B (zh) * | 2011-09-30 | 2016-04-27 | 3M创新有限公司 | 图案化的基底的连续湿法蚀刻方法 |
| US20140197356A1 (en) * | 2011-12-21 | 2014-07-17 | Cabot Microelectronics Corporation | Cmp compositions and methods for suppressing polysilicon removal rates |
| SG11201404930SA (en) | 2012-02-15 | 2014-09-26 | Advanced Tech Materials | Post-cmp removal using compositions and method of use |
| CN102618174A (zh) * | 2012-02-28 | 2012-08-01 | 南通海迅天恒纳米科技有限公司 | 高稀释比和高稳定性的硅片化学机械抛光组合物 |
| TWI456013B (zh) * | 2012-04-10 | 2014-10-11 | 盟智科技股份有限公司 | 研磨液組成物 |
| US20150044812A1 (en) * | 2012-05-09 | 2015-02-12 | National University Of Singapore | Non-acidic isotropic etch-back for silicon wafer solar cells |
| JP5154704B1 (ja) * | 2012-06-29 | 2013-02-27 | 三島光産株式会社 | 研磨パッド成形金型の製造方法、その方法で製造される研磨パッド成形金型、及びその金型で製造した研磨パッド |
| EP2692817A1 (de) * | 2012-08-02 | 2014-02-05 | Robert Bosch Gmbh | Schleifkorn mit unter einem Winkel angeordneten Platten |
| EP2692816A1 (de) * | 2012-08-02 | 2014-02-05 | Robert Bosch Gmbh | Schleifkorn mit einander durchdringenden flächigen Körpern |
| CN104822495A (zh) * | 2012-09-21 | 2015-08-05 | 3M创新有限公司 | 向固定磨料幅材中引入添加剂以改善cmp性能 |
| US9388330B2 (en) * | 2012-12-17 | 2016-07-12 | Fuji Engineering Co., Ltd. | Bag containing blasting material |
| TWI614093B (zh) * | 2013-01-04 | 2018-02-11 | 福吉米股份有限公司 | 研磨用組成物、合金材料、合金材料之硏磨方法及合金材料之製造方法 |
| US8957006B2 (en) * | 2013-03-11 | 2015-02-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Cleaning solution comprising an ether acetate for preventing pattern collapse |
| JP6209845B2 (ja) * | 2013-04-11 | 2017-10-11 | 日立化成株式会社 | 研磨液、研磨液セット及び基体の研磨方法 |
| US10001442B2 (en) * | 2013-06-13 | 2018-06-19 | The Regents Of The University Of California | Optical fiber-based hybrid SERS platform for in vivo detection of bio-molecules |
| KR102289629B1 (ko) * | 2013-09-25 | 2021-08-17 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 세라믹 연마 복합재 폴리싱 용액 |
| MY177717A (en) * | 2013-10-18 | 2020-09-23 | Cmc Mat Inc | Polishing composition and method for nickel-phosphorous coated memory disks |
| JP6599322B2 (ja) * | 2013-10-21 | 2019-10-30 | フジフイルム エレクトロニック マテリアルズ ユー.エス.エー., インコーポレイテッド | 表面の残留物を除去するための洗浄配合物 |
| CN104576351B (zh) * | 2013-10-23 | 2017-09-22 | 中芯国际集成电路制造(上海)有限公司 | 化学机械研磨方法 |
| KR101524624B1 (ko) * | 2013-11-18 | 2015-06-03 | 주식회사 케이씨텍 | 고단차 연마용 슬러리 첨가제 조성물 및 이를 포함하는 고단차 연마용 슬러리 조성물 |
| EP3077129B1 (en) | 2013-12-06 | 2020-11-11 | FujiFilm Electronic Materials USA, Inc. | Cleaning formulation for removing residues on surfaces |
| CN104726061A (zh) * | 2013-12-19 | 2015-06-24 | 3M创新有限公司 | 磨料、研磨件及其制备方法 |
| US11127587B2 (en) | 2014-02-05 | 2021-09-21 | Entegris, Inc. | Non-amine post-CMP compositions and method of use |
| TWI659088B (zh) * | 2014-03-18 | 2019-05-11 | Fujifilm Electronic Materials U. S. A., Inc. | 蝕刻組成物 |
| TWI558850B (zh) * | 2014-03-29 | 2016-11-21 | 精密聚合物股份有限公司 | 電子零件用處理液及電子零件之製造方法 |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| SG10202002601QA (en) | 2014-10-17 | 2020-05-28 | Applied Materials Inc | Cmp pad construction with composite material properties using additive manufacturing processes |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| WO2016068182A1 (ja) * | 2014-10-31 | 2016-05-06 | 富士フイルム株式会社 | Mramドライエッチング残渣除去組成物、磁気抵抗メモリの製造方法、及び、コバルト除去組成物 |
| CN104659156B (zh) * | 2015-03-03 | 2017-05-17 | 中节能太阳能科技(镇江)有限公司 | 一种单晶硅太阳能电池的刻蚀方法 |
| TWI609742B (zh) * | 2015-04-20 | 2018-01-01 | 中國砂輪企業股份有限公司 | 研磨工具 |
| TWI603813B (zh) * | 2015-04-20 | 2017-11-01 | 中國砂輪企業股份有限公司 | 研磨工具及其製造方法 |
| CN113103145B (zh) | 2015-10-30 | 2023-04-11 | 应用材料公司 | 形成具有期望ζ电位的抛光制品的设备与方法 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| US9944829B2 (en) * | 2015-12-03 | 2018-04-17 | Treliant Fang | Halite salts as silicon carbide etchants for enhancing CMP material removal rate for SiC wafer |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| CN105710760A (zh) * | 2016-04-22 | 2016-06-29 | 衡阳市宏达威环保科技有限公司 | 一种铝合金碱性研磨液 |
| KR102275303B1 (ko) * | 2016-10-11 | 2021-07-12 | 후지필름 일렉트로닉 머티리얼스 유.에스.에이., 아이엔씨. | 상승된 온도 cmp 조성물 및 이의 사용 방법 |
| KR20190098225A (ko) | 2016-12-30 | 2019-08-21 | 후지필름 일렉트로닉 머티리얼스 유.에스.에이., 아이엔씨. | 폴리싱 조성물 |
| CN106956212B (zh) * | 2017-03-17 | 2018-12-04 | 衢州学院 | 一种采用化学抛光液和陶瓷抛光盘的氮化铝基片抛光方法 |
| JP6938262B2 (ja) * | 2017-07-24 | 2021-09-22 | 株式会社ディスコ | ウエーハの加工方法 |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| US10170335B1 (en) * | 2017-09-21 | 2019-01-01 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing method for cobalt |
| SG11202008828VA (en) | 2018-03-28 | 2020-10-29 | Fujifilm Electronic Materials Usa Inc | Cleaning compositions |
| CN108504289A (zh) * | 2018-04-03 | 2018-09-07 | 苏州晶瑞化学股份有限公司 | 一种金刚线切割多晶硅片制绒抛光调控剂 |
| KR102690701B1 (ko) | 2018-06-22 | 2024-08-05 | 어플라이드 머티어리얼스, 인코포레이티드 | 루테늄 증착을 제어하는 방법 |
| US10947414B2 (en) * | 2018-07-31 | 2021-03-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Compositions for use in chemical mechanical polishing |
| CN109015204B (zh) * | 2018-08-29 | 2020-11-27 | 包头市利晨科技有限公司 | 一种适用于cr39树脂镜片的抛光方法 |
| WO2020050932A1 (en) | 2018-09-04 | 2020-03-12 | Applied Materials, Inc. | Formulations for advanced polishing pads |
| TWI856104B (zh) * | 2019-06-03 | 2024-09-21 | 美商富士軟片電子材料美國股份有限公司 | 蝕刻組成物 |
| EP3983499A4 (en) * | 2019-06-13 | 2023-08-02 | Versum Materials US, LLC | LIQUID COMPOSITIONS FOR SELECTIVE REMOVAL OF POLYSILICON OVER P-DOped SILICON AND SILICON-GERMANIUM DURING FABRICATION OF A SEMICONDUCTOR DEVICE |
| CN110273158B (zh) * | 2019-07-25 | 2021-02-26 | 郑州大学 | 一种用作医用镁合金缓蚀剂的席夫碱、其制备方法及利用其制备自修复耐蚀杂化涂层的方法 |
| KR102869325B1 (ko) * | 2019-09-10 | 2025-10-14 | 후지필름 일렉트로닉 머티리얼스 유.에스.에이., 아이엔씨. | 에칭 조성물 |
| KR102358801B1 (ko) * | 2019-12-27 | 2022-02-08 | 주식회사 케이씨텍 | 표면 처리 조성물 및 이를 이용한 표면 처리 방법 |
| CN111170042A (zh) * | 2020-02-21 | 2020-05-19 | 苏州凌云视界智能设备有限责任公司 | 一种柔性屏搬运载台 |
| JP6780800B1 (ja) * | 2020-04-09 | 2020-11-04 | 信越半導体株式会社 | ウェーハの研磨方法及び研磨装置 |
| CN111469062B (zh) * | 2020-04-15 | 2021-08-17 | 浙江工业大学 | 制动分离式液态金属研磨盘装置 |
| JP7453874B2 (ja) | 2020-07-30 | 2024-03-21 | 芝浦メカトロニクス株式会社 | 基板処理方法、および基板処理装置 |
| CN112266832B (zh) * | 2020-09-21 | 2021-08-24 | 江苏奥首材料科技有限公司 | 一种半导体芯片清洗剂及制备方法与应用 |
| CN112408485B (zh) * | 2020-11-26 | 2023-02-03 | 江西理工大学 | 一种制备阵列微/纳结构钨氧化物的方法 |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
| CN113265224B (zh) * | 2021-04-29 | 2021-11-30 | 郑州磨料磨具磨削研究所有限公司 | 一种喷雾型金刚石研磨液及其制备方法 |
| KR20240031958A (ko) * | 2021-05-13 | 2024-03-08 | 아라카 인코포레이션 | 슬러리 제형 및 공정을 사용한 탄화규소(sic) 웨이퍼 연마 |
| CN114907022B (zh) * | 2022-04-28 | 2023-04-25 | 中国科学院合肥物质科学研究院 | 一种具有防结冰和除冰性能的高透明太阳光热转换涂层玻璃及其制备方法 |
| US12237166B2 (en) * | 2022-06-13 | 2025-02-25 | Tokyo Electron Limited | Methods for selective removal of surface oxides on metal films |
| CN115798820B (zh) * | 2022-12-23 | 2026-03-17 | 中天科技海缆股份有限公司 | 电力电缆的生产方法及电力电缆 |
| WO2026010932A1 (en) * | 2024-07-01 | 2026-01-08 | Applied Materials, Inc. | Enhanced silicon grind using chemical additives in fluid during grinding process |
| CN118835250B (zh) * | 2024-07-24 | 2025-09-26 | 河北工业大学 | 低去除速率铜布线钼阻挡层化学机械抛光液及其制备方法 |
| CN119954532B (zh) * | 2025-04-11 | 2025-09-05 | 湖北世宇新型建材有限公司 | 一种纸面石膏板 |
Family Cites Families (189)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1910444A (en) * | 1931-02-13 | 1933-05-23 | Carborundum Co | Process of making abrasive materials |
| US2115897A (en) * | 1935-05-15 | 1938-05-03 | Carborundum Co | Abrasive article |
| US2286208A (en) * | 1940-12-03 | 1942-06-16 | Carborundum Co | Granular coated article and its manufacture |
| US2485295A (en) * | 1947-09-17 | 1949-10-18 | Adolph J Larson | Pack of abrasive coated sheets |
| US2667436A (en) * | 1950-09-21 | 1954-01-26 | Carborundum Co | Pressure sensitive adhesive coated sheet material |
| US2952951A (en) * | 1952-07-28 | 1960-09-20 | Simpson Harry Arthur | Abrasive or like materials and articles |
| US2755607A (en) * | 1953-06-01 | 1956-07-24 | Norton Co | Coated abrasives |
| US3188265A (en) * | 1957-11-12 | 1965-06-08 | Minnesota Mining & Mfg | Packaging films |
| US2888785A (en) * | 1958-06-30 | 1959-06-02 | Thelma E Kellican | Eraser cleaner |
| US3041156A (en) * | 1959-07-22 | 1962-06-26 | Norton Co | Phenolic resin bonded grinding wheels |
| NL149551B (nl) * | 1964-08-04 | 1976-05-17 | Dow Chemical Co | Werkwijze voor het reinigen en passiveren van ijzerhoudende metaaloppervlakken, waarop metallisch koper is afgezet. |
| US3324608A (en) * | 1965-01-27 | 1967-06-13 | Thompson Proc Co Inc | Facing assembly for lens grinding tools and the like |
| US3504457A (en) | 1966-07-05 | 1970-04-07 | Geoscience Instr Corp | Polishing apparatus |
| US3499250A (en) * | 1967-04-07 | 1970-03-10 | Geoscience Instr Corp | Polishing apparatus |
| US3605349A (en) | 1969-05-08 | 1971-09-20 | Frederick B Anthon | Abrasive finishing article |
| US3594865A (en) | 1969-07-10 | 1971-07-27 | American Velcro Inc | Apparatus for molding plastic shapes in molding recesses formed in moving endless wire dies |
| US3849949A (en) | 1972-10-10 | 1974-11-26 | Minnesota Mining & Mfg | Roll of pressure sensitive adhesive, adhesive coated abrasive discs and dispenser |
| US3916584A (en) | 1973-03-22 | 1975-11-04 | Minnesota Mining & Mfg | Spheroidal composite particle and method of making |
| US3875703A (en) | 1973-12-26 | 1975-04-08 | Joseph V Clemente | Flexible sanding disc unit |
| US3911562A (en) | 1974-01-14 | 1975-10-14 | Signetics Corp | Method of chemical polishing of planar silicon structures having filled grooves therein |
| US3887446A (en) | 1974-07-26 | 1975-06-03 | Us Navy | Electrochemical preparation of metallic tellurides |
| US4138228A (en) | 1977-02-02 | 1979-02-06 | Ralf Hoehn | Abrasive of a microporous polymer matrix with inorganic particles thereon |
| US4255164A (en) | 1979-04-30 | 1981-03-10 | Minnesota Mining And Manufacturing Company | Fining sheet and method of making and using the same |
| US4314827A (en) | 1979-06-29 | 1982-02-09 | Minnesota Mining And Manufacturing Company | Non-fused aluminum oxide-based abrasive mineral |
| US4355110A (en) | 1979-07-19 | 1982-10-19 | Miller Brewing Company | Preparation of debranching enzyme from rice for producing a low calorie beer |
| US4479981A (en) * | 1982-05-03 | 1984-10-30 | Ashland Oil, Inc. | Water-borne hard coating compositions and processes therefor |
| US4509581A (en) | 1982-05-20 | 1985-04-09 | Wirtz Manufacturing Company, Inc. | Machine for continuously casting battery grids |
| US4512113A (en) | 1982-09-23 | 1985-04-23 | Budinger William D | Workpiece holder for polishing operation |
| US5527368C1 (en) | 1983-03-11 | 2001-05-08 | Norton Co | Coated abrasives with rapidly curable adhesives |
| US4563388A (en) | 1983-03-28 | 1986-01-07 | Minnesota Mining And Manufacturing Company | Polyolefin substrate coated with acrylic-type normally tacky and pressure-sensitive adhesive and a method of making same |
| US4642221A (en) | 1983-07-05 | 1987-02-10 | Atlantic Richfield Company | Method and composition for inhibiting corrosion in aqueous heat transfer systems |
| US4623364A (en) | 1984-03-23 | 1986-11-18 | Norton Company | Abrasive material and method for preparing the same |
| US4642126A (en) | 1985-02-11 | 1987-02-10 | Norton Company | Coated abrasives with rapidly curable adhesives and controllable curvature |
| US4609581A (en) | 1985-04-15 | 1986-09-02 | Minnesota Mining And Manufacturing Company | Coated abrasive sheet material with loop attachment means |
| CA1254238A (en) | 1985-04-30 | 1989-05-16 | Alvin P. Gerk | Process for durable sol-gel produced alumina-based ceramics, abrasive grain and abrasive products |
| US4652274A (en) | 1985-08-07 | 1987-03-24 | Minnesota Mining And Manufacturing Company | Coated abrasive product having radiation curable binder |
| US4652275A (en) | 1985-08-07 | 1987-03-24 | Minnesota Mining And Manufacturing Company | Erodable agglomerates and abrasive products containing the same |
| US4671851A (en) | 1985-10-28 | 1987-06-09 | International Business Machines Corporation | Method for removing protuberances at the surface of a semiconductor wafer using a chem-mech polishing technique |
| US4944836A (en) | 1985-10-28 | 1990-07-31 | International Business Machines Corporation | Chem-mech polishing method for producing coplanar metal/insulator films on a substrate |
| US4773920B1 (en) | 1985-12-16 | 1995-05-02 | Minnesota Mining & Mfg | Coated abrasive suitable for use as a lapping material. |
| US4749617A (en) | 1985-12-18 | 1988-06-07 | Minnesota Mining And Manufacturing Company | Composite article containing rigid layers |
| US4770671A (en) | 1985-12-30 | 1988-09-13 | Minnesota Mining And Manufacturing Company | Abrasive grits formed of ceramic containing oxides of aluminum and yttrium, method of making and using the same and products made therewith |
| US4644703A (en) | 1986-03-13 | 1987-02-24 | Norton Company | Plural layered coated abrasive |
| US4927432A (en) | 1986-03-25 | 1990-05-22 | Rodel, Inc. | Pad material for grinding, lapping and polishing |
| US4751138A (en) | 1986-08-11 | 1988-06-14 | Minnesota Mining And Manufacturing Company | Coated abrasive having radiation curable binder |
| US4799939A (en) | 1987-02-26 | 1989-01-24 | Minnesota Mining And Manufacturing Company | Erodable agglomerates and abrasive products containing the same |
| US4735632A (en) | 1987-04-02 | 1988-04-05 | Minnesota Mining And Manufacturing Company | Coated abrasive binder containing ternary photoinitiator system |
| US4881951A (en) | 1987-05-27 | 1989-11-21 | Minnesota Mining And Manufacturing Co. | Abrasive grits formed of ceramic containing oxides of aluminum and rare earth metal, method of making and products made therewith |
| GB8718219D0 (en) * | 1987-07-31 | 1987-09-09 | Unilever Plc | Liquid abrasive cleaning composition |
| US4933234A (en) | 1987-08-13 | 1990-06-12 | Minnesota Mining And Manufacturing Company | Primed polymeric surfaces for cyanoacrylate adhesives |
| US4950696A (en) | 1987-08-28 | 1990-08-21 | Minnesota Mining And Manufacturing Company | Energy-induced dual curable compositions |
| US4906523A (en) | 1987-09-24 | 1990-03-06 | Minnesota Mining And Manufacturing Company | Primer for surfaces containing inorganic oxide |
| JP2707264B2 (ja) | 1987-12-28 | 1998-01-28 | ハイ・コントロール・リミテッド | 研磨シートおよびその製造方法 |
| JPH01188599A (ja) * | 1988-01-22 | 1989-07-27 | Daikin Ind Ltd | 共沸溶剤組成物 |
| US4930266A (en) | 1988-02-26 | 1990-06-05 | Minnesota Mining And Manufacturing Company | Abrasive sheeting having individually positioned abrasive granules |
| US4974373A (en) | 1988-03-14 | 1990-12-04 | Tokyo Magnetic Printing Co., Ltd. | Abrasive tools |
| US4885332A (en) | 1988-04-11 | 1989-12-05 | Minnesota Mining And Manufacturing Company | Photocurable abrasion resistant coatings comprising silicon dioxide dispersions |
| US5104929A (en) | 1988-04-11 | 1992-04-14 | Minnesota Mining And Manufacturing Company | Abrasion resistant coatings comprising silicon dioxide dispersions |
| US5254194A (en) | 1988-05-13 | 1993-10-19 | Minnesota Mining And Manufacturing Company | Coated abrasive sheet material with loop material for attachment incorporated therein |
| US4985340A (en) | 1988-06-01 | 1991-01-15 | Minnesota Mining And Manufacturing Company | Energy curable compositions: two component curing agents |
| CH675250A5 (enExample) | 1988-06-17 | 1990-09-14 | Lonza Ag | |
| US4879258A (en) | 1988-08-31 | 1989-11-07 | Texas Instruments Incorporated | Integrated circuit planarization by mechanical polishing |
| US5011508A (en) | 1988-10-14 | 1991-04-30 | Minnesota Mining And Manufacturing Company | Shelling-resistant abrasive grain, a method of making the same, and abrasive products |
| US4903440A (en) | 1988-11-23 | 1990-02-27 | Minnesota Mining And Manufacturing Company | Abrasive product having binder comprising an aminoplast resin |
| US4954142A (en) | 1989-03-07 | 1990-09-04 | International Business Machines Corporation | Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor |
| US4959265A (en) | 1989-04-17 | 1990-09-25 | Minnesota Mining And Manufacturing Company | Pressure-sensitive adhesive tape fastener for releasably attaching an object to a fabric |
| US5014468A (en) | 1989-05-05 | 1991-05-14 | Norton Company | Patterned coated abrasive for fine surface finishing |
| US5061294A (en) | 1989-05-15 | 1991-10-29 | Minnesota Mining And Manufacturing Company | Abrasive article with conductive, doped, conjugated, polymer coat and method of making same |
| US5011513A (en) | 1989-05-31 | 1991-04-30 | Norton Company | Single step, radiation curable ophthalmic fining pad |
| US4997461A (en) | 1989-09-11 | 1991-03-05 | Norton Company | Nitrified bonded sol gel sintered aluminous abrasive bodies |
| US5068280A (en) | 1989-09-12 | 1991-11-26 | The Dow Chemical Company | Polyurethane and/or polyurea dispersions in active hydrogen-containing compositions |
| US5141790A (en) | 1989-11-20 | 1992-08-25 | Minnesota Mining And Manufacturing Company | Repositionable pressure-sensitive adhesive tape |
| US5199227A (en) | 1989-12-20 | 1993-04-06 | Minnesota Mining And Manufacturing Company | Surface finishing tape |
| US5177908A (en) | 1990-01-22 | 1993-01-12 | Micron Technology, Inc. | Polishing pad |
| US5020283A (en) | 1990-01-22 | 1991-06-04 | Micron Technology, Inc. | Polishing pad with uniform abrasion |
| US5257478A (en) | 1990-03-22 | 1993-11-02 | Rodel, Inc. | Apparatus for interlayer planarization of semiconductor material |
| US5104421B1 (en) | 1990-03-23 | 1993-11-16 | Fujimi Abrasives Co.,Ltd. | Polishing method of goods and abrasive pad therefor |
| ATE118713T1 (de) | 1990-03-30 | 1995-03-15 | Wiand Ronald C | Marmor-, granit- und steinenbearbeitungsverfahren und schleifpolster hierfür. |
| US5085671A (en) | 1990-05-02 | 1992-02-04 | Minnesota Mining And Manufacturing Company | Method of coating alumina particles with refractory material, abrasive particles made by the method and abrasive products containing the same |
| US5082540A (en) | 1990-05-07 | 1992-01-21 | The Secretary Of State For Defence In Her Britannic Majesty's Government Of The United Kingdom Of Great Britain And Northern Ireland | Fluoride ion sensitive materials |
| US5607488A (en) | 1990-05-21 | 1997-03-04 | Wiand; Ronald C. | Molded abrasive article and process |
| US5174795A (en) | 1990-05-21 | 1992-12-29 | Wiand Ronald C | Flexible abrasive pad with ramp edge surface |
| US5137542A (en) | 1990-08-08 | 1992-08-11 | Minnesota Mining And Manufacturing Company | Abrasive printed with an electrically conductive ink |
| US5370718A (en) | 1990-08-22 | 1994-12-06 | Hitachi Maxell, Ltd. | Abrasive tape |
| US5077870A (en) | 1990-09-21 | 1992-01-07 | Minnesota Mining And Manufacturing Company | Mushroom-type hook strip for a mechanical fastener |
| US5981454A (en) | 1993-06-21 | 1999-11-09 | Ekc Technology, Inc. | Post clean treatment composition comprising an organic acid and hydroxylamine |
| US6546939B1 (en) | 1990-11-05 | 2003-04-15 | Ekc Technology, Inc. | Post clean treatment |
| US5279771A (en) | 1990-11-05 | 1994-01-18 | Ekc Technology, Inc. | Stripping compositions comprising hydroxylamine and alkanolamine |
| US6110881A (en) | 1990-11-05 | 2000-08-29 | Ekc Technology, Inc. | Cleaning solutions including nucleophilic amine compound having reduction and oxidation potentials |
| US5107626A (en) | 1991-02-06 | 1992-04-28 | Minnesota Mining And Manufacturing Company | Method of providing a patterned surface on a substrate |
| US5152917B1 (en) | 1991-02-06 | 1998-01-13 | Minnesota Mining & Mfg | Structured abrasive article |
| US5378251A (en) | 1991-02-06 | 1995-01-03 | Minnesota Mining And Manufacturing Company | Abrasive articles and methods of making and using same |
| US5236472A (en) | 1991-02-22 | 1993-08-17 | Minnesota Mining And Manufacturing Company | Abrasive product having a binder comprising an aminoplast binder |
| JPH05177523A (ja) | 1991-06-06 | 1993-07-20 | Commiss Energ Atom | 張設された微小研磨剤小板、および改良されたウエハー支持ヘッドを備えた研磨装置 |
| US5197999A (en) | 1991-09-30 | 1993-03-30 | National Semiconductor Corporation | Polishing pad for planarization |
| US5320706A (en) | 1991-10-15 | 1994-06-14 | Texas Instruments Incorporated | Removing slurry residue from semiconductor wafer planarization |
| US5437754A (en) | 1992-01-13 | 1995-08-01 | Minnesota Mining And Manufacturing Company | Abrasive article having precise lateral spacing between abrasive composite members |
| US5219462A (en) | 1992-01-13 | 1993-06-15 | Minnesota Mining And Manufacturing Company | Abrasive article having abrasive composite members positioned in recesses |
| US5178646A (en) | 1992-01-22 | 1993-01-12 | Minnesota Mining And Manufacturing Company | Coatable thermally curable binder presursor solutions modified with a reactive diluent, abrasive articles incorporating same, and methods of making said abrasive articles |
| US5368618A (en) | 1992-01-22 | 1994-11-29 | Minnesota Mining And Manufacturing Company | Method of making a coated abrasive article |
| US5256170A (en) | 1992-01-22 | 1993-10-26 | Minnesota Mining And Manufacturing Company | Coated abrasive article and method of making same |
| US5222329A (en) | 1992-03-26 | 1993-06-29 | Micron Technology, Inc. | Acoustical method and system for detecting and controlling chemical-mechanical polishing (CMP) depths into layers of conductors, semiconductors, and dielectric materials |
| US5445996A (en) | 1992-05-26 | 1995-08-29 | Kabushiki Kaisha Toshiba | Method for planarizing a semiconductor device having a amorphous layer |
| US5203884A (en) | 1992-06-04 | 1993-04-20 | Minnesota Mining And Manufacturing Company | Abrasive article having vanadium oxide incorporated therein |
| US5366523A (en) | 1992-07-23 | 1994-11-22 | Minnesota Mining And Manufacturing Company | Abrasive article containing shaped abrasive particles |
| US5213591A (en) | 1992-07-28 | 1993-05-25 | Ahmet Celikkaya | Abrasive grain, method of making same and abrasive products |
| US6069080A (en) | 1992-08-19 | 2000-05-30 | Rodel Holdings, Inc. | Fixed abrasive polishing system for the manufacture of semiconductor devices, memory disks and the like |
| MY114512A (en) | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| US5307593A (en) | 1992-08-31 | 1994-05-03 | Minnesota Mining And Manufacturing Company | Method of texturing rigid memory disks using an abrasive article |
| JP2839801B2 (ja) | 1992-09-18 | 1998-12-16 | 三菱マテリアル株式会社 | ウェーハの製造方法 |
| US5232875A (en) | 1992-10-15 | 1993-08-03 | Micron Technology, Inc. | Method and apparatus for improving planarity of chemical-mechanical planarization operations |
| CA2151932A1 (en) | 1992-12-17 | 1994-06-23 | Scott R. Culler | Reduced viscosity slurries, abrasive articles made therefrom, and methods of making said articles |
| US5342419A (en) | 1992-12-31 | 1994-08-30 | Minnesota Mining And Manufacturing Company | Abrasive composites having a controlled rate of erosion, articles incorporating same, and methods of making and using same |
| US5435816A (en) | 1993-01-14 | 1995-07-25 | Minnesota Mining And Manufacturing Company | Method of making an abrasive article |
| US5424224A (en) | 1993-01-19 | 1995-06-13 | Texas Instruments Incorporated | Method of surface protection of a semiconductor wafer during polishing |
| CA2113318A1 (en) | 1993-01-28 | 1994-07-29 | Robert J. Jantschek | Abrasive attachment system for rotative abrading applications |
| KR940022734A (ko) | 1993-03-15 | 1994-10-21 | 사또 후미오 | 연마 방법 및 연마 장치 |
| GB9309972D0 (en) | 1993-05-14 | 1993-06-30 | De Beers Ind Diamond | Tool insert |
| US5460742A (en) * | 1993-05-18 | 1995-10-24 | Reckitt & Colman Inc. | Aqueous acidic hard surface cleaner with abrasive |
| US5391258A (en) * | 1993-05-26 | 1995-02-21 | Rodel, Inc. | Compositions and methods for polishing |
| US5549962A (en) | 1993-06-30 | 1996-08-27 | Minnesota Mining And Manufacturing Company | Precisely shaped particles and method of making the same |
| JP2622069B2 (ja) | 1993-06-30 | 1997-06-18 | 三菱マテリアル株式会社 | 研磨布のドレッシング装置 |
| BE1007281A3 (nl) | 1993-07-12 | 1995-05-09 | Philips Electronics Nv | Werkwijze voor het polijsten van een oppervlak van koper of een in hoofdzaak koper bevattende legering, magneetkop vervaardigbaar met gebruikmaking van de werkwijze, röntgenstralingcollimerend element en röntgenstralingreflecterend element, beide voorzien van een volgens de werkwijze gepolijst oppervlak en polijstmiddel geschikt voor toepassing in de werkwijze. |
| US5378252A (en) | 1993-09-03 | 1995-01-03 | Minnesota Mining And Manufacturing Company | Abrasive articles |
| US5489235A (en) | 1993-09-13 | 1996-02-06 | Minnesota Mining And Manufacturing Company | Abrasive article and method of making same |
| JP2832138B2 (ja) | 1993-09-30 | 1998-12-02 | 信越半導体株式会社 | ウェーハ外周部の研磨装置 |
| US5454844A (en) | 1993-10-29 | 1995-10-03 | Minnesota Mining And Manufacturing Company | Abrasive article, a process of making same, and a method of using same to finish a workpiece surface |
| US5453312A (en) | 1993-10-29 | 1995-09-26 | Minnesota Mining And Manufacturing Company | Abrasive article, a process for its manufacture, and a method of using it to reduce a workpiece surface |
| CA2133259A1 (en) | 1993-10-29 | 1995-04-30 | Gene O. Lindholm | Method for the polishing and finishing of optical lenses |
| US5340370A (en) | 1993-11-03 | 1994-08-23 | Intel Corporation | Slurries for chemical mechanical polishing |
| CA2134156A1 (en) | 1993-11-22 | 1995-05-23 | Thomas P. Klun | Coatable compositions, abrasive articles made therefrom, and methods of making and using same |
| US5575885A (en) | 1993-12-14 | 1996-11-19 | Kabushiki Kaisha Toshiba | Copper-based metal polishing solution and method for manufacturing semiconductor device |
| US5653623A (en) | 1993-12-14 | 1997-08-05 | Ebara Corporation | Polishing apparatus with improved exhaust |
| US5391210A (en) | 1993-12-16 | 1995-02-21 | Minnesota Mining And Manufacturing Company | Abrasive article |
| US5441598A (en) | 1993-12-16 | 1995-08-15 | Motorola, Inc. | Polishing pad for chemical-mechanical polishing of a semiconductor substrate |
| US5505747A (en) | 1994-01-13 | 1996-04-09 | Minnesota Mining And Manufacturing Company | Method of making an abrasive article |
| US5417725A (en) | 1994-02-01 | 1995-05-23 | Graves; Gordon C. | Penetration and fixture freeing agent |
| US5422316A (en) | 1994-03-18 | 1995-06-06 | Memc Electronic Materials, Inc. | Semiconductor wafer polisher and method |
| US5489233A (en) | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| US5466389A (en) * | 1994-04-20 | 1995-11-14 | J. T. Baker Inc. | PH adjusted nonionic surfactant-containing alkaline cleaner composition for cleaning microelectronics substrates |
| US5622875A (en) | 1994-05-06 | 1997-04-22 | Kobe Precision, Inc. | Method for reclaiming substrate from semiconductor wafers |
| USD366365S (en) | 1994-05-11 | 1996-01-23 | Minnesota Mining And Manufacturing Company | Coated abrasive sheet article |
| JP2894209B2 (ja) | 1994-06-03 | 1999-05-24 | 信越半導体株式会社 | シリコンウェーハ研磨用パッド及び研磨方法 |
| JP3397501B2 (ja) | 1994-07-12 | 2003-04-14 | 株式会社東芝 | 研磨剤および研磨方法 |
| US5607341A (en) | 1994-08-08 | 1997-03-04 | Leach; Michael A. | Method and structure for polishing a wafer during manufacture of integrated circuits |
| JPH0947947A (ja) * | 1994-08-30 | 1997-02-18 | Seiko Seiki Co Ltd | 研削装置、並びに研削方法、並びに半導体装置及び半導体基板の製造方法 |
| US5527423A (en) | 1994-10-06 | 1996-06-18 | Cabot Corporation | Chemical mechanical polishing slurry for metal layers |
| US5643044A (en) | 1994-11-01 | 1997-07-01 | Lund; Douglas E. | Automatic chemical and mechanical polishing system for semiconductor wafers |
| JP2616736B2 (ja) | 1995-01-25 | 1997-06-04 | 日本電気株式会社 | ウエーハ研磨装置 |
| JP3305557B2 (ja) | 1995-04-10 | 2002-07-22 | 大日本印刷株式会社 | 研磨テープ、その製造方法および研磨テープ用塗工剤 |
| US5507978A (en) * | 1995-05-08 | 1996-04-16 | Ocg Microelectronic Materials, Inc. | Novolak containing photoresist stripper composition |
| TW303487B (enExample) | 1995-05-29 | 1997-04-21 | Shinetsu Handotai Co Ltd | |
| US6046110A (en) | 1995-06-08 | 2000-04-04 | Kabushiki Kaisha Toshiba | Copper-based metal polishing solution and method for manufacturing a semiconductor device |
| JPH0982668A (ja) | 1995-09-20 | 1997-03-28 | Sony Corp | 研磨用スラリー及びこの研磨用スラリーを用いる研磨方法 |
| US5958794A (en) * | 1995-09-22 | 1999-09-28 | Minnesota Mining And Manufacturing Company | Method of modifying an exposed surface of a semiconductor wafer |
| US5609517A (en) | 1995-11-20 | 1997-03-11 | International Business Machines Corporation | Composite polishing pad |
| US5840629A (en) | 1995-12-14 | 1998-11-24 | Sematech, Inc. | Copper chemical mechanical polishing slurry utilizing a chromate oxidant |
| US5700383A (en) | 1995-12-21 | 1997-12-23 | Intel Corporation | Slurries and methods for chemical mechanical polish of aluminum and titanium aluminide |
| US5624303A (en) | 1996-01-22 | 1997-04-29 | Micron Technology, Inc. | Polishing pad and a method for making a polishing pad with covalently bonded particles |
| JPH09258397A (ja) | 1996-03-19 | 1997-10-03 | Fuji Photo Film Co Ltd | ハロゲン化銀感光材料 |
| US5780358A (en) | 1996-04-08 | 1998-07-14 | Chartered Semiconductor Manufacturing Ltd. | Method for chemical-mechanical polish (CMP) planarizing of cooper containing conductor layers |
| US5692950A (en) | 1996-08-08 | 1997-12-02 | Minnesota Mining And Manufacturing Company | Abrasive construction for semiconductor wafer modification |
| US5972792A (en) | 1996-10-18 | 1999-10-26 | Micron Technology, Inc. | Method for chemical-mechanical planarization of a substrate on a fixed-abrasive polishing pad |
| US5958288A (en) | 1996-11-26 | 1999-09-28 | Cabot Corporation | Composition and slurry useful for metal CMP |
| SG68005A1 (en) | 1996-12-02 | 1999-10-19 | Fujimi Inc | Polishing composition |
| US6309560B1 (en) | 1996-12-09 | 2001-10-30 | Cabot Microelectronics Corporation | Chemical mechanical polishing slurry useful for copper substrates |
| US5954997A (en) * | 1996-12-09 | 1999-09-21 | Cabot Corporation | Chemical mechanical polishing slurry useful for copper substrates |
| US6194317B1 (en) * | 1998-04-30 | 2001-02-27 | 3M Innovative Properties Company | Method of planarizing the upper surface of a semiconductor wafer |
| WO1998049723A1 (en) * | 1997-04-30 | 1998-11-05 | Minnesota Mining And Manufacturing Company | Method of planarizing the upper surface of a semiconductor wafer |
| US6083419A (en) | 1997-07-28 | 2000-07-04 | Cabot Corporation | Polishing composition including an inhibitor of tungsten etching |
| US6121143A (en) * | 1997-09-19 | 2000-09-19 | 3M Innovative Properties Company | Abrasive articles comprising a fluorochemical agent for wafer surface modification |
| US5897375A (en) | 1997-10-20 | 1999-04-27 | Motorola, Inc. | Chemical mechanical polishing (CMP) slurry for copper and method of use in integrated circuit manufacture |
| JP3371775B2 (ja) | 1997-10-31 | 2003-01-27 | 株式会社日立製作所 | 研磨方法 |
| US6096652A (en) | 1997-11-03 | 2000-08-01 | Motorola, Inc. | Method of chemical mechanical planarization using copper coordinating ligands |
| US5897426A (en) | 1998-04-24 | 1999-04-27 | Applied Materials, Inc. | Chemical mechanical polishing with multiple polishing pads |
| US6066028A (en) | 1998-12-14 | 2000-05-23 | The United States Of America As Represented By The Secretary Of The Navy | Polishing of copper |
| US6592676B1 (en) * | 1999-01-08 | 2003-07-15 | Interuniversitair Micro-Elektronica Centrum | Chemical solution and method for reducing the metal contamination on the surface of a semiconductor substrate |
| US6376381B1 (en) * | 1999-08-31 | 2002-04-23 | Micron Technology, Inc. | Planarizing solutions, planarizing machines, and methods for mechanical and/or chemical-mechanical planarization of microelectronic substrate assemblies |
| US6491843B1 (en) * | 1999-12-08 | 2002-12-10 | Eastman Kodak Company | Slurry for chemical mechanical polishing silicon dioxide |
| US20030006396A1 (en) | 1999-12-14 | 2003-01-09 | Hongyu Wang | Polishing composition for CMP having abrasive particles |
| JP2004533115A (ja) * | 2001-04-12 | 2004-10-28 | ロデール ホールディングス インコーポレイテッド | 界面活性剤を有する研磨用組成物 |
| US20030176151A1 (en) * | 2002-02-12 | 2003-09-18 | Applied Materials, Inc. | STI polish enhancement using fixed abrasives with amino acid additives |
| US6936543B2 (en) * | 2002-06-07 | 2005-08-30 | Cabot Microelectronics Corporation | CMP method utilizing amphiphilic nonionic surfactants |
| JP4159084B2 (ja) | 2002-11-15 | 2008-10-01 | シチズン電子株式会社 | 傾斜スイッチ |
| US20050056810A1 (en) | 2003-09-17 | 2005-03-17 | Jinru Bian | Polishing composition for semiconductor wafers |
| US20070077865A1 (en) | 2005-10-04 | 2007-04-05 | Cabot Microelectronics Corporation | Method for controlling polysilicon removal |
| US20080182413A1 (en) | 2006-08-16 | 2008-07-31 | Menk Gregory E | Selective chemistry for fixed abrasive cmp |
| US8591764B2 (en) | 2006-12-20 | 2013-11-26 | 3M Innovative Properties Company | Chemical mechanical planarization composition, system, and method of use |
| CN101910353A (zh) | 2007-10-31 | 2010-12-08 | 3M创新有限公司 | 用于打磨晶片的组合物、方法和工艺 |
-
2007
- 2007-08-15 US US11/839,329 patent/US8092707B2/en not_active Expired - Fee Related
-
2008
- 2008-07-08 KR KR1020107005679A patent/KR101494034B1/ko not_active Expired - Fee Related
- 2008-07-08 CN CN200880102726.9A patent/CN101779274B/zh not_active Expired - Fee Related
- 2008-07-08 JP JP2010521062A patent/JP5513384B2/ja active Active
- 2008-07-08 WO PCT/US2008/069396 patent/WO2009023387A2/en not_active Ceased
- 2008-07-08 EP EP08781482.8A patent/EP2186121B1/en not_active Not-in-force
- 2008-07-29 TW TW097128663A patent/TWI460261B/zh not_active IP Right Cessation
-
2011
- 2011-12-07 US US13/313,529 patent/US20120094487A1/en not_active Abandoned
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9960169B2 (en) | 2015-09-01 | 2018-05-01 | Samsung Electronics Co., Ltd. | Methods of manufacturing semiconductor devices |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2186121A4 (en) | 2011-10-12 |
| EP2186121B1 (en) | 2017-05-17 |
| US20120094487A1 (en) | 2012-04-19 |
| EP2186121A2 (en) | 2010-05-19 |
| WO2009023387A2 (en) | 2009-02-19 |
| KR101494034B1 (ko) | 2015-02-16 |
| JP2010537404A (ja) | 2010-12-02 |
| US20080026583A1 (en) | 2008-01-31 |
| TW200918654A (en) | 2009-05-01 |
| US8092707B2 (en) | 2012-01-10 |
| KR20100065328A (ko) | 2010-06-16 |
| WO2009023387A3 (en) | 2009-04-02 |
| CN101779274B (zh) | 2012-09-05 |
| TWI460261B (zh) | 2014-11-11 |
| CN101779274A (zh) | 2010-07-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP2186121B1 (en) | Compositions and methods for modifying a surface suited for semiconductor fabrication | |
| US6194317B1 (en) | Method of planarizing the upper surface of a semiconductor wafer | |
| CA2287404C (en) | Method of planarizing the upper surface of a semiconductor wafer | |
| TWI267540B (en) | Mixed-abrasive polishing composition and method for using the same | |
| US6238592B1 (en) | Working liquids and methods for modifying structured wafers suited for semiconductor fabrication | |
| EP1015175B1 (en) | Abrasive articles comprising a fluorochemical agent for wafer surface modification | |
| US6039633A (en) | Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies | |
| JP4515316B2 (ja) | 半導体ウェーハの露出面を研磨する方法 | |
| JP4634381B2 (ja) | 三次元固定砥粒物品のインサイチュ活性化 | |
| JP6367815B2 (ja) | 平滑なダイヤモンド表面、及びその形成のためのcmp方法 | |
| JP2010513050A (ja) | ナノ微粒子充填剤を有する研磨物品並びにそれを作製及び使用する方法 | |
| WO2005099963A1 (en) | Low surface energy cmp pad | |
| JP2011502362A (ja) | ウエハを研磨するための組成物、方法及びプロセス | |
| JP2003257910A (ja) | 基板における銅層の研磨方法 | |
| JP4573492B2 (ja) | 合成砥石 | |
| KR100286393B1 (ko) | 연마포,연마포의표면처리방법및연마포의세정방법 | |
| JP2003347244A (ja) | 半導体ウエハの研磨方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110614 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20110614 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130305 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130605 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130924 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20131224 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20140225 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20140327 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5513384 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |