JP4424760B2 - 時間多重相互接続を用いたエミュレーション・システム - Google Patents

時間多重相互接続を用いたエミュレーション・システム Download PDF

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Publication number
JP4424760B2
JP4424760B2 JP50074799A JP50074799A JP4424760B2 JP 4424760 B2 JP4424760 B2 JP 4424760B2 JP 50074799 A JP50074799 A JP 50074799A JP 50074799 A JP50074799 A JP 50074799A JP 4424760 B2 JP4424760 B2 JP 4424760B2
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Prior art keywords
logic
emulation system
signal
chip
input
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JP50074799A
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Japanese (ja)
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JP2002507294A5 (enExample
JP2002507294A (ja
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サンプル，ステファン・ピー
バーシュテイン，ミハイル
バッツ，マイケル・アール
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Quickturn Design Systems Inc
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Quickturn Design Systems Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31717—Interconnect testing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/32—Circuit design at the digital level
    • G06F30/33—Design verification, e.g. functional simulation or model checking
    • G06F30/3308—Design verification, e.g. functional simulation or model checking using simulation
    • G06F30/331—Design verification, e.g. functional simulation or model checking using simulation with hardware acceleration, e.g. by using field programmable gate array [FPGA] or emulation
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S370/00—Multiplex communications
    • Y10S370/916—Multiplexer/demultiplexer

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Logic Circuits (AREA)
JP50074799A 1997-05-30 1998-05-18 時間多重相互接続を用いたエミュレーション・システム Expired - Fee Related JP4424760B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/865,741 1997-05-30
US08/865,741 US5960191A (en) 1997-05-30 1997-05-30 Emulation system with time-multiplexed interconnect
PCT/US1998/010171 WO1998054664A1 (en) 1997-05-30 1998-05-18 Emulation system with time-multiplexed interconnect

Publications (3)

Publication Number Publication Date
JP2002507294A JP2002507294A (ja) 2002-03-05
JP2002507294A5 JP2002507294A5 (enExample) 2005-12-08
JP4424760B2 true JP4424760B2 (ja) 2010-03-03

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JP50074799A Expired - Fee Related JP4424760B2 (ja) 1997-05-30 1998-05-18 時間多重相互接続を用いたエミュレーション・システム

Country Status (10)

Country Link
US (4) US5960191A (enExample)
EP (1) EP0983562B1 (enExample)
JP (1) JP4424760B2 (enExample)
KR (1) KR20010013190A (enExample)
AT (1) ATE225058T1 (enExample)
CA (1) CA2291738A1 (enExample)
DE (1) DE69808286T2 (enExample)
IL (1) IL132983A (enExample)
TW (1) TW440796B (enExample)
WO (1) WO1998054664A1 (enExample)

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* Cited by examiner, † Cited by third party
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CA2291738A1 (en) 1998-12-03
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