|
JPS5773174A
(en)
*
|
1980-10-24 |
1982-05-07 |
Semiconductor Energy Lab Co Ltd |
Manufacturing apparatus for coating film
|
|
JP2633551B2
(ja)
*
|
1987-03-18 |
1997-07-23 |
株式会社東芝 |
薄膜形成方法
|
|
KR920010885A
(ko)
|
1990-11-30 |
1992-06-27 |
카나이 쯔또무 |
박막반도체와 그 제조방법 및 제조장치 및 화상처리장치
|
|
EP1335419A3
(en)
*
|
1994-06-15 |
2003-08-27 |
Seiko Epson Corporation |
Fabrication method for a thin film semiconductor device, the thin film semiconductor device itself, liquid crystal display, and electronic device
|
|
AUPM982294A0
(en)
|
1994-12-02 |
1995-01-05 |
Pacific Solar Pty Limited |
Method of manufacturing a multilayer solar cell
|
|
JPH08288271A
(ja)
*
|
1995-04-18 |
1996-11-01 |
Sony Corp |
成膜方法およびこれに用いる成膜装置
|
|
WO1997022141A1
(en)
*
|
1995-12-14 |
1997-06-19 |
Seiko Epson Corporation |
Method of manufacturing thin film semiconductor device, and thin film semiconductor device
|
|
FR2743193B1
(fr)
|
1996-01-02 |
1998-04-30 |
Univ Neuchatel |
Procede et dispositif de depot d'au moins une couche de silicium hydrogene microcristallin ou nanocristallin intrinseque, et cellule photovoltaique et transistor a couches minces obtenus par la mise en oeuvre de ce procede
|
|
JPH10117006A
(ja)
|
1996-08-23 |
1998-05-06 |
Kanegafuchi Chem Ind Co Ltd |
薄膜光電変換装置
|
|
JP2985789B2
(ja)
*
|
1996-08-30 |
1999-12-06 |
日本電気株式会社 |
半導体装置の製造方法
|
|
US6730368B1
(en)
*
|
1997-09-25 |
2004-05-04 |
Kabushiki Kaisha Toshiba |
Method of preparing a poly-crystalline silicon film
|
|
JPH11102861A
(ja)
*
|
1997-09-25 |
1999-04-13 |
Toshiba Corp |
多結晶シリコン薄膜の製造方法
|
|
EP1041646B1
(en)
|
1997-11-10 |
2012-12-12 |
Kaneka Corporation |
Method of producing silicon thin-film photoelectric transducer
|
|
EP0994515B1
(en)
|
1998-10-12 |
2007-08-22 |
Kaneka Corporation |
Method of manufacturing silicon-based thin-film photoelectric conversion device
|
|
EP1032052B1
(en)
|
1999-02-26 |
2010-07-21 |
Kaneka Corporation |
Method of manufacturing silicon based thin film photoelectric conversion device
|
|
JP3589581B2
(ja)
|
1999-02-26 |
2004-11-17 |
株式会社カネカ |
タンデム型の薄膜光電変換装置の製造方法
|
|
JP3046965B1
(ja)
|
1999-02-26 |
2000-05-29 |
鐘淵化学工業株式会社 |
非晶質シリコン系薄膜光電変換装置の製造方法
|
|
IT1312150B1
(it)
|
1999-03-25 |
2002-04-09 |
Lpe Spa |
Perfezionata camera di reazione per reattore epitassiale
|
|
TW480554B
(en)
*
|
1999-07-22 |
2002-03-21 |
Semiconductor Energy Lab |
Semiconductor device and manufacturing method thereof
|
|
DE19935046C2
(de)
|
1999-07-26 |
2001-07-12 |
Schott Glas |
Plasma-CVD-Verfahren und Vorrichtung zur Herstellung einer mikrokristallinen Si:H-Schicht auf einem Substrat sowie deren Verwendung
|
|
JP2001110724A
(ja)
*
|
1999-10-06 |
2001-04-20 |
Matsushita Electric Ind Co Ltd |
アモルファスシリコン薄膜とそれを用いたポリシリコン薄膜の製造方法
|
|
JP4493779B2
(ja)
*
|
2000-01-31 |
2010-06-30 |
株式会社半導体エネルギー研究所 |
半導体装置およびその作製方法
|
|
WO2001067521A1
(en)
|
2000-03-03 |
2001-09-13 |
Matsushita Electric Industrial Co., Ltd. |
Semiconductor device
|
|
JP2001345272A
(ja)
|
2000-05-31 |
2001-12-14 |
Canon Inc |
シリコン系薄膜の形成方法、シリコン系薄膜及び光起電力素子
|
|
JP2001168100A
(ja)
*
|
2000-08-25 |
2001-06-22 |
Seiko Epson Corp |
半導体装置の製造方法
|
|
WO2002019363A2
(en)
*
|
2000-08-28 |
2002-03-07 |
Applied Materials, Inc. |
Pre-polycoating of glass substrates
|
|
US6566159B2
(en)
|
2000-10-04 |
2003-05-20 |
Kaneka Corporation |
Method of manufacturing tandem thin-film solar cell
|
|
JP2002176180A
(ja)
*
|
2000-12-06 |
2002-06-21 |
Hitachi Ltd |
薄膜半導体素子及びその製造方法
|
|
JP4610080B2
(ja)
*
|
2000-12-25 |
2011-01-12 |
株式会社半導体エネルギー研究所 |
半導体装置の作製方法
|
|
US7026219B2
(en)
*
|
2001-02-12 |
2006-04-11 |
Asm America, Inc. |
Integration of high k gate dielectric
|
|
TW523931B
(en)
*
|
2001-02-20 |
2003-03-11 |
Hitachi Ltd |
Thin film transistor and method of manufacturing the same
|
|
JP4433131B2
(ja)
|
2001-03-22 |
2010-03-17 |
キヤノン株式会社 |
シリコン系薄膜の形成方法
|
|
US6649032B2
(en)
*
|
2001-05-21 |
2003-11-18 |
Sharp Laboratories Of America, Inc. |
System and method for sputtering silicon films using hydrogen gas mixtures
|
|
US6869838B2
(en)
*
|
2002-04-09 |
2005-03-22 |
Applied Materials, Inc. |
Deposition of passivation layers for active matrix liquid crystal display (AMLCD) applications
|
|
JP2003264198A
(ja)
*
|
2003-02-06 |
2003-09-19 |
Nec Corp |
薄膜トランジスタおよび薄膜トランジスタを用いた電子機器
|
|
JP4341062B2
(ja)
*
|
2003-02-12 |
2009-10-07 |
日本電気株式会社 |
薄膜トランジスタおよびその製造方法
|
|
US6759277B1
(en)
|
2003-02-27 |
2004-07-06 |
Sharp Laboratories Of America, Inc. |
Crystalline silicon die array and method for assembling crystalline silicon sheets onto substrates
|
|
JP2005004183A
(ja)
*
|
2003-05-20 |
2005-01-06 |
Advanced Lcd Technologies Development Center Co Ltd |
発光型表示装置
|
|
JP2005247678A
(ja)
*
|
2004-02-03 |
2005-09-15 |
Seiko Epson Corp |
酸化シリコン膜の形成方法および酸化シリコン膜
|
|
US8083853B2
(en)
|
2004-05-12 |
2011-12-27 |
Applied Materials, Inc. |
Plasma uniformity control by gas diffuser hole design
|
|
US8119210B2
(en)
*
|
2004-05-21 |
2012-02-21 |
Applied Materials, Inc. |
Formation of a silicon oxynitride layer on a high-k dielectric material
|
|
US7429410B2
(en)
|
2004-09-20 |
2008-09-30 |
Applied Materials, Inc. |
Diffuser gravity support
|
|
KR100718837B1
(ko)
|
2004-12-30 |
2007-05-16 |
삼성전자주식회사 |
반구형 실리콘을 갖는 캐패시터의 제조 방법 및 이를이용한 반도체 장치의 제조 방법
|
|
US7816236B2
(en)
|
2005-02-04 |
2010-10-19 |
Asm America Inc. |
Selective deposition of silicon-containing films
|
|
US8709162B2
(en)
|
2005-08-16 |
2014-04-29 |
Applied Materials, Inc. |
Active cooling substrate support
|
|
US7829159B2
(en)
*
|
2005-12-16 |
2010-11-09 |
Asm Japan K.K. |
Method of forming organosilicon oxide film and multilayer resist structure
|
|
JP5309426B2
(ja)
|
2006-03-29 |
2013-10-09 |
株式会社Ihi |
微結晶シリコン膜形成方法及び太陽電池
|
|
US7655542B2
(en)
|
2006-06-23 |
2010-02-02 |
Applied Materials, Inc. |
Methods and apparatus for depositing a microcrystalline silicon film for photovoltaic device
|
|
JP5105842B2
(ja)
*
|
2006-12-05 |
2012-12-26 |
キヤノン株式会社 |
酸化物半導体を用いた表示装置及びその製造方法
|
|
KR101344483B1
(ko)
*
|
2007-06-27 |
2013-12-24 |
삼성전자주식회사 |
박막 트랜지스터
|
|
US8334537B2
(en)
*
|
2007-07-06 |
2012-12-18 |
Semiconductor Energy Laboratory Co., Ltd. |
Light-emitting device
|
|
JP5395384B2
(ja)
*
|
2007-09-07 |
2014-01-22 |
株式会社半導体エネルギー研究所 |
薄膜トランジスタの作製方法
|
|
JP4606450B2
(ja)
*
|
2007-11-05 |
2011-01-05 |
株式会社日立製作所 |
表示装置
|
|
JP5469851B2
(ja)
*
|
2007-11-27 |
2014-04-16 |
株式会社半導体エネルギー研究所 |
半導体装置の作製方法
|
|
KR101412761B1
(ko)
*
|
2008-01-18 |
2014-07-02 |
삼성디스플레이 주식회사 |
박막 트랜지스터 기판 및 이의 제조 방법
|
|
JP5306705B2
(ja)
*
|
2008-05-23 |
2013-10-02 |
株式会社半導体エネルギー研究所 |
半導体装置
|
|
US8258511B2
(en)
*
|
2008-07-02 |
2012-09-04 |
Applied Materials, Inc. |
Thin film transistors using multiple active channel layers
|
|
JP5564331B2
(ja)
*
|
2009-05-29 |
2014-07-30 |
株式会社半導体エネルギー研究所 |
半導体装置の作製方法
|
|
KR101293261B1
(ko)
*
|
2009-10-21 |
2013-08-09 |
가부시키가이샤 한도오따이 에네루기 켄큐쇼 |
표시 장치 및 표시 장치를 갖는 전자 기기
|
|
KR101810254B1
(ko)
*
|
2009-11-06 |
2017-12-18 |
가부시키가이샤 한도오따이 에네루기 켄큐쇼 |
반도체 장치 및 그 동작 방법
|
|
JP2011139052A
(ja)
*
|
2009-12-04 |
2011-07-14 |
Semiconductor Energy Lab Co Ltd |
半導体記憶装置
|