JP2012164992A5 - - Google Patents
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- JP2012164992A5 JP2012164992A5 JP2012080199A JP2012080199A JP2012164992A5 JP 2012164992 A5 JP2012164992 A5 JP 2012164992A5 JP 2012080199 A JP2012080199 A JP 2012080199A JP 2012080199 A JP2012080199 A JP 2012080199A JP 2012164992 A5 JP2012164992 A5 JP 2012164992A5
- Authority
- JP
- Japan
- Prior art keywords
- liquid
- substrate
- cleaning
- substrate stage
- exposure apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims description 82
- 238000004140 cleaning Methods 0.000 claims description 60
- 239000007788 liquid Substances 0.000 claims description 60
- 238000000034 method Methods 0.000 claims description 30
- 238000007654 immersion Methods 0.000 claims description 28
- 238000011084 recovery Methods 0.000 claims description 21
- 230000003287 optical effect Effects 0.000 claims description 16
- 230000002093 peripheral effect Effects 0.000 claims 4
- 230000002940 repellent Effects 0.000 claims 3
- 239000005871 repellent Substances 0.000 claims 3
- 239000003960 organic solvent Substances 0.000 claims 2
- 238000005406 washing Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012080199A JP2012164992A (ja) | 2006-05-18 | 2012-03-30 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006139614 | 2006-05-18 | ||
| JP2006139614 | 2006-05-18 | ||
| JP2006140957 | 2006-05-19 | ||
| JP2006140957 | 2006-05-19 | ||
| JP2007103343 | 2007-04-10 | ||
| JP2007103343 | 2007-04-10 | ||
| JP2012080199A JP2012164992A (ja) | 2006-05-18 | 2012-03-30 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007132800A Division JP5217239B2 (ja) | 2006-05-18 | 2007-05-18 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012164992A JP2012164992A (ja) | 2012-08-30 |
| JP2012164992A5 true JP2012164992A5 (enExample) | 2013-07-25 |
Family
ID=38723302
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007132800A Expired - Fee Related JP5217239B2 (ja) | 2006-05-18 | 2007-05-18 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
| JP2012080199A Pending JP2012164992A (ja) | 2006-05-18 | 2012-03-30 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007132800A Expired - Fee Related JP5217239B2 (ja) | 2006-05-18 | 2007-05-18 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US8514366B2 (enExample) |
| EP (1) | EP2037486A4 (enExample) |
| JP (2) | JP5217239B2 (enExample) |
| KR (1) | KR20090018024A (enExample) |
| CN (2) | CN102298274A (enExample) |
| SG (1) | SG175671A1 (enExample) |
| TW (1) | TW200805000A (enExample) |
| WO (1) | WO2007135990A1 (enExample) |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7880860B2 (en) | 2004-12-20 | 2011-02-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US8125610B2 (en) | 2005-12-02 | 2012-02-28 | ASML Metherlands B.V. | Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus |
| EP1965414A4 (en) * | 2005-12-06 | 2010-08-25 | Nikon Corp | EXPOSURE METHOD, EXPOSURE DEVICE AND METHOD FOR MANUFACTURING COMPONENTS |
| US7969548B2 (en) * | 2006-05-22 | 2011-06-28 | Asml Netherlands B.V. | Lithographic apparatus and lithographic apparatus cleaning method |
| EP2043134A4 (en) * | 2006-06-30 | 2012-01-25 | Nikon Corp | MAINTENANCE METHOD, EXPOSURE METHOD, AND DEVICE AND DEVICE MANUFACTURING METHOD |
| US8947629B2 (en) | 2007-05-04 | 2015-02-03 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US7900641B2 (en) | 2007-05-04 | 2011-03-08 | Asml Netherlands B.V. | Cleaning device and a lithographic apparatus cleaning method |
| US7916269B2 (en) | 2007-07-24 | 2011-03-29 | Asml Netherlands B.V. | Lithographic apparatus and contamination removal or prevention method |
| US20090025753A1 (en) | 2007-07-24 | 2009-01-29 | Asml Netherlands B.V. | Lithographic Apparatus And Contamination Removal Or Prevention Method |
| SG151198A1 (en) | 2007-09-27 | 2009-04-30 | Asml Netherlands Bv | Methods relating to immersion lithography and an immersion lithographic apparatus |
| NL1035942A1 (nl) | 2007-09-27 | 2009-03-30 | Asml Netherlands Bv | Lithographic Apparatus and Method of Cleaning a Lithographic Apparatus. |
| NL1036273A1 (nl) | 2007-12-18 | 2009-06-19 | Asml Netherlands Bv | Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus. |
| NL1036306A1 (nl) | 2007-12-20 | 2009-06-23 | Asml Netherlands Bv | Lithographic apparatus and in-line cleaning apparatus. |
| US8339572B2 (en) | 2008-01-25 | 2012-12-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP2009182110A (ja) * | 2008-01-30 | 2009-08-13 | Nikon Corp | 露光装置、露光方法、及びデバイス製造方法 |
| JP2009295933A (ja) | 2008-06-09 | 2009-12-17 | Canon Inc | ダミー露光基板及びその製造方法、液浸露光装置、並びに、デバイス製造方法 |
| JP2010103363A (ja) * | 2008-10-24 | 2010-05-06 | Nec Electronics Corp | 液浸露光装置の洗浄方法、ダミーウェハ、及び液浸露光装置 |
| US20100283979A1 (en) * | 2008-10-31 | 2010-11-11 | Nikon Corporation | Exposure apparatus, exposing method, and device fabricating method |
| NL2004540A (en) * | 2009-05-14 | 2010-11-18 | Asml Netherlands Bv | Lithographic apparatus and a method of operating the apparatus. |
| JP2010278299A (ja) * | 2009-05-29 | 2010-12-09 | Nikon Corp | 露光装置、露光方法、及びデバイス製造方法 |
| NL2005167A (en) * | 2009-10-02 | 2011-04-05 | Asml Netherlands Bv | Lithographic apparatus and a method of operating the apparatus. |
| NL2005610A (en) * | 2009-12-02 | 2011-06-06 | Asml Netherlands Bv | Lithographic apparatus and surface cleaning method. |
| KR101683411B1 (ko) * | 2009-12-18 | 2016-12-06 | 가부시키가이샤 니콘 | 기판 처리 장치의 메인터넌스 방법 및 안전 장치 |
| JPWO2012011512A1 (ja) * | 2010-07-20 | 2013-09-09 | 株式会社ニコン | 露光方法、露光装置および洗浄方法 |
| US20120057139A1 (en) * | 2010-08-04 | 2012-03-08 | Nikon Corporation | Cleaning method, device manufacturing method, cleaning substrate, liquid immersion member, liquid immersion exposure apparatus, and dummy substrate |
| US20120188521A1 (en) * | 2010-12-27 | 2012-07-26 | Nikon Corporation | Cleaning method, liquid immersion member, immersion exposure apparatus, device fabricating method, program and storage medium |
| NL2008183A (en) * | 2011-02-25 | 2012-08-28 | Asml Netherlands Bv | A lithographic apparatus, a method of controlling the apparatus and a device manufacturing method. |
| US20130057837A1 (en) * | 2011-04-06 | 2013-03-07 | Nikon Corporation | Exposure apparatus, exposure method, device-manufacturing method, program, and recording medium |
| TWI503553B (zh) * | 2011-10-19 | 2015-10-11 | Johnstech Int Corp | 用於微電路測試器的導電開爾文接觸件 |
| KR102071873B1 (ko) * | 2012-12-27 | 2020-02-03 | 삼성디스플레이 주식회사 | 용매 제거장치 및 이를 포함하는 포토리소그래피 장치 |
| KR101573450B1 (ko) * | 2014-07-17 | 2015-12-11 | 주식회사 아이에스시 | 테스트용 소켓 |
| NL2015049A (en) | 2014-08-07 | 2016-07-08 | Asml Netherlands Bv | A lithography apparatus, a method of manufacturing a device and a control program. |
| WO2017084797A1 (en) * | 2015-11-20 | 2017-05-26 | Asml Netherlands B.V. | Lithographic apparatus and method of operating a lithographic apparatus |
| EP4155086B1 (en) | 2018-07-13 | 2025-02-12 | Hewlett-Packard Development Company, L.P. | Print liquid supply |
| ES2832495T3 (es) | 2018-07-13 | 2021-06-10 | Hewlett Packard Development Co | Suministro de líquido de impresión |
| JP7167333B2 (ja) | 2018-11-09 | 2022-11-08 | エーエスエムエル ホールディング エヌ.ブイ. | リソグラフィ装置内部のサポートをクリーニングするための装置及び方法 |
Family Cites Families (81)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57117238A (en) | 1981-01-14 | 1982-07-21 | Nippon Kogaku Kk <Nikon> | Exposing and baking device for manufacturing integrated circuit with illuminometer |
| JPS6144429A (ja) | 1984-08-09 | 1986-03-04 | Nippon Kogaku Kk <Nikon> | 位置合わせ方法、及び位置合せ装置 |
| US4780617A (en) | 1984-08-09 | 1988-10-25 | Nippon Kogaku K.K. | Method for successive alignment of chip patterns on a substrate |
| JP3200874B2 (ja) | 1991-07-10 | 2001-08-20 | 株式会社ニコン | 投影露光装置 |
| US5243195A (en) | 1991-04-25 | 1993-09-07 | Nikon Corporation | Projection exposure apparatus having an off-axis alignment system and method of alignment therefor |
| US5559582A (en) * | 1992-08-28 | 1996-09-24 | Nikon Corporation | Exposure apparatus |
| JPH08313842A (ja) | 1995-05-15 | 1996-11-29 | Nikon Corp | 照明光学系および該光学系を備えた露光装置 |
| JP4029183B2 (ja) | 1996-11-28 | 2008-01-09 | 株式会社ニコン | 投影露光装置及び投影露光方法 |
| JP4029182B2 (ja) | 1996-11-28 | 2008-01-09 | 株式会社ニコン | 露光方法 |
| AU5067898A (en) | 1996-11-28 | 1998-06-22 | Nikon Corporation | Aligner and method for exposure |
| KR100512450B1 (ko) | 1996-12-24 | 2006-01-27 | 에이에스엠엘 네델란즈 비.브이. | 두개의물체홀더를가진이차원적으로안정화된위치설정장치와이런위치설정장치를구비한리소그래픽장치 |
| JPH1116816A (ja) | 1997-06-25 | 1999-01-22 | Nikon Corp | 投影露光装置、該装置を用いた露光方法、及び該装置を用いた回路デバイスの製造方法 |
| JPH1123692A (ja) | 1997-06-30 | 1999-01-29 | Sekisui Chem Co Ltd | 地中探査用アンテナ |
| JPH1128790A (ja) | 1997-07-09 | 1999-02-02 | Asahi Chem Ind Co Ltd | 紫外線遮蔽用熱可塑性樹脂板 |
| JP4210871B2 (ja) | 1997-10-31 | 2009-01-21 | 株式会社ニコン | 露光装置 |
| US6020964A (en) | 1997-12-02 | 2000-02-01 | Asm Lithography B.V. | Interferometer system and lithograph apparatus including an interferometer system |
| US6897963B1 (en) | 1997-12-18 | 2005-05-24 | Nikon Corporation | Stage device and exposure apparatus |
| JP4264676B2 (ja) | 1998-11-30 | 2009-05-20 | 株式会社ニコン | 露光装置及び露光方法 |
| US6208407B1 (en) | 1997-12-22 | 2001-03-27 | Asm Lithography B.V. | Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement |
| KR100841147B1 (ko) | 1998-03-11 | 2008-06-24 | 가부시키가이샤 니콘 | 레이저 장치, 자외광 조사 장치 및 방법, 물체의 패턴 검출장치 및 방법 |
| AU2747999A (en) | 1998-03-26 | 1999-10-18 | Nikon Corporation | Projection exposure method and system |
| KR100604120B1 (ko) | 1998-05-19 | 2006-07-24 | 가부시키가이샤 니콘 | 수차측정장치와 측정방법 및 이 장치를 구비한투영노광장치와 이 방법을 이용한 디바이스 제조방법,노광방법 |
| WO2001035168A1 (en) | 1999-11-10 | 2001-05-17 | Massachusetts Institute Of Technology | Interference lithography utilizing phase-locked scanning beams |
| JP2002014005A (ja) | 2000-04-25 | 2002-01-18 | Nikon Corp | 空間像計測方法、結像特性計測方法、空間像計測装置及び露光装置 |
| US20020041377A1 (en) | 2000-04-25 | 2002-04-11 | Nikon Corporation | Aerial image measurement method and unit, optical properties measurement method and unit, adjustment method of projection optical system, exposure method and apparatus, making method of exposure apparatus, and device manufacturing method |
| US6611316B2 (en) | 2001-02-27 | 2003-08-26 | Asml Holding N.V. | Method and system for dual reticle image exposure |
| TW529172B (en) | 2001-07-24 | 2003-04-21 | Asml Netherlands Bv | Imaging apparatus |
| WO2003025173A1 (en) | 2001-09-17 | 2003-03-27 | Takeshi Imanishi | Novel antisense oligonucleotide derivatives to hepatitis c virus |
| AU2002351933A1 (en) | 2001-11-08 | 2003-05-19 | Develogen Aktiengesellschaft Fur Entwicklungsbiologische Forschung | Men protein, gst2, rab-rp1, csp, f-box protein lilina/fbl7, abc50, coronin, sec61 alpha, or vhappa1-1, or homologous proteins involved in the regulation of energy homeostasis |
| JP4214729B2 (ja) | 2002-07-25 | 2009-01-28 | コニカミノルタホールディングス株式会社 | 硬化性白インク組成物 |
| WO2004019128A2 (en) | 2002-08-23 | 2004-03-04 | Nikon Corporation | Projection optical system and method for photolithography and exposure apparatus and method using same |
| US6893629B2 (en) | 2002-10-30 | 2005-05-17 | Isp Investments Inc. | Delivery system for a tooth whitener |
| EP1420298B1 (en) | 2002-11-12 | 2013-02-20 | ASML Netherlands B.V. | Lithographic apparatus |
| SG121818A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| KR101036114B1 (ko) * | 2002-12-10 | 2011-05-23 | 가부시키가이샤 니콘 | 노광장치 및 노광방법, 디바이스 제조방법 |
| CN100370533C (zh) | 2002-12-13 | 2008-02-20 | 皇家飞利浦电子股份有限公司 | 用于照射层的方法和用于将辐射导向层的装置 |
| WO2004057589A1 (en) | 2002-12-19 | 2004-07-08 | Koninklijke Philips Electronics N.V. | Method and device for irradiating spots on a layer |
| WO2004057590A1 (en) | 2002-12-19 | 2004-07-08 | Koninklijke Philips Electronics N.V. | Method and device for irradiating spots on a layer |
| KR101442361B1 (ko) | 2003-02-26 | 2014-09-23 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
| JP2004304135A (ja) | 2003-04-01 | 2004-10-28 | Nikon Corp | 露光装置、露光方法及びマイクロデバイスの製造方法 |
| SG185136A1 (en) | 2003-04-11 | 2012-11-29 | Nikon Corp | Cleanup method for optics in immersion lithography |
| JP2005277363A (ja) * | 2003-05-23 | 2005-10-06 | Nikon Corp | 露光装置及びデバイス製造方法 |
| TW201806001A (zh) | 2003-05-23 | 2018-02-16 | 尼康股份有限公司 | 曝光裝置及元件製造方法 |
| US7684008B2 (en) | 2003-06-11 | 2010-03-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101520591B1 (ko) * | 2003-06-13 | 2015-05-14 | 가부시키가이샤 니콘 | 노광 방법, 기판 스테이지, 노광 장치, 및 디바이스 제조 방법 |
| US7370659B2 (en) * | 2003-08-06 | 2008-05-13 | Micron Technology, Inc. | Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines |
| JP4305095B2 (ja) * | 2003-08-29 | 2009-07-29 | 株式会社ニコン | 光学部品の洗浄機構を搭載した液浸投影露光装置及び液浸光学部品洗浄方法 |
| JP4444920B2 (ja) | 2003-09-19 | 2010-03-31 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| EP1672682A4 (en) | 2003-10-08 | 2008-10-15 | Zao Nikon Co Ltd | SUBSTRATE TRANSPORT DEVICE AND METHOD, EXPOSURE DEVICE AND METHOD AND COMPONENT MANUFACTURING METHOD |
| US20050122218A1 (en) | 2003-12-06 | 2005-06-09 | Goggin Christopher M. | Ranging and warning device using emitted and reflected wave energy |
| KR101200654B1 (ko) | 2003-12-15 | 2012-11-12 | 칼 짜이스 에스엠티 게엠베하 | 고 개구율 및 평평한 단부면을 가진 투사 대물렌즈 |
| WO2005059645A2 (en) | 2003-12-19 | 2005-06-30 | Carl Zeiss Smt Ag | Microlithography projection objective with crystal elements |
| US7589822B2 (en) | 2004-02-02 | 2009-09-15 | Nikon Corporation | Stage drive method and stage unit, exposure apparatus, and device manufacturing method |
| JP4548341B2 (ja) * | 2004-02-10 | 2010-09-22 | 株式会社ニコン | 露光装置及びデバイス製造方法、メンテナンス方法及び露光方法 |
| US7898642B2 (en) | 2004-04-14 | 2011-03-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7616383B2 (en) | 2004-05-18 | 2009-11-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| KR101264936B1 (ko) * | 2004-06-04 | 2013-05-15 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
| EP2966670B1 (en) * | 2004-06-09 | 2017-02-22 | Nikon Corporation | Exposure apparatus and device manufacturing method |
| US20090225286A1 (en) | 2004-06-21 | 2009-09-10 | Nikon Corporation | Exposure apparatus, method for cleaning member thereof , maintenance method for exposure apparatus, maintenance device, and method for producing device |
| JP2006013806A (ja) | 2004-06-24 | 2006-01-12 | Maspro Denkoh Corp | 信号処理装置及びcatv用ヘッドエンド装置 |
| US7463330B2 (en) | 2004-07-07 | 2008-12-09 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP2006032750A (ja) * | 2004-07-20 | 2006-02-02 | Canon Inc | 液浸型投影露光装置、及びデバイス製造方法 |
| JP4534651B2 (ja) * | 2004-08-03 | 2010-09-01 | 株式会社ニコン | 露光装置、デバイス製造方法及び液体回収方法 |
| EP3258318B1 (en) | 2004-08-03 | 2019-02-27 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
| US7224427B2 (en) | 2004-08-03 | 2007-05-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Megasonic immersion lithography exposure apparatus and method |
| US7701550B2 (en) * | 2004-08-19 | 2010-04-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP4772306B2 (ja) | 2004-09-06 | 2011-09-14 | 株式会社東芝 | 液浸光学装置及び洗浄方法 |
| SG149819A1 (en) | 2004-09-30 | 2009-02-27 | Nikon Corp | Projection optical device and exposure apparatus |
| WO2006046562A1 (ja) * | 2004-10-26 | 2006-05-04 | Nikon Corporation | 基板処理方法、露光装置及びデバイス製造方法 |
| KR101318037B1 (ko) * | 2004-11-01 | 2013-10-14 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
| US7362412B2 (en) | 2004-11-18 | 2008-04-22 | International Business Machines Corporation | Method and apparatus for cleaning a semiconductor substrate in an immersion lithography system |
| US7732123B2 (en) | 2004-11-23 | 2010-06-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | Immersion photolithography with megasonic rinse |
| US7804576B2 (en) | 2004-12-06 | 2010-09-28 | Nikon Corporation | Maintenance method, maintenance device, exposure apparatus, and device manufacturing method |
| JP4752473B2 (ja) * | 2004-12-09 | 2011-08-17 | 株式会社ニコン | 露光装置、露光方法及びデバイス製造方法 |
| US7880860B2 (en) | 2004-12-20 | 2011-02-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US20060250588A1 (en) | 2005-05-03 | 2006-11-09 | Stefan Brandl | Immersion exposure tool cleaning system and method |
| WO2006122578A1 (en) | 2005-05-17 | 2006-11-23 | Freescale Semiconductor, Inc. | Contaminant removal apparatus and method therefor |
| US7986395B2 (en) | 2005-10-24 | 2011-07-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Immersion lithography apparatus and methods |
| US8125610B2 (en) | 2005-12-02 | 2012-02-28 | ASML Metherlands B.V. | Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus |
| US7969548B2 (en) | 2006-05-22 | 2011-06-28 | Asml Netherlands B.V. | Lithographic apparatus and lithographic apparatus cleaning method |
| US8564759B2 (en) | 2006-06-29 | 2013-10-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and method for immersion lithography |
-
2007
- 2007-05-18 CN CN2011102517818A patent/CN102298274A/zh active Pending
- 2007-05-18 CN CN200780011033.4A patent/CN101410948B/zh not_active Expired - Fee Related
- 2007-05-18 JP JP2007132800A patent/JP5217239B2/ja not_active Expired - Fee Related
- 2007-05-18 SG SG2011077435A patent/SG175671A1/en unknown
- 2007-05-18 EP EP07743663A patent/EP2037486A4/en not_active Withdrawn
- 2007-05-18 KR KR1020087024125A patent/KR20090018024A/ko not_active Ceased
- 2007-05-18 WO PCT/JP2007/060228 patent/WO2007135990A1/ja not_active Ceased
- 2007-05-18 TW TW096117939A patent/TW200805000A/zh unknown
-
2008
- 2008-10-21 US US12/289,148 patent/US8514366B2/en not_active Expired - Fee Related
-
2012
- 2012-03-30 JP JP2012080199A patent/JP2012164992A/ja active Pending
-
2013
- 2013-07-16 US US13/943,207 patent/US20130301019A1/en not_active Abandoned
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