JP2012164992A5 - - Google Patents
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- JP2012164992A5 JP2012164992A5 JP2012080199A JP2012080199A JP2012164992A5 JP 2012164992 A5 JP2012164992 A5 JP 2012164992A5 JP 2012080199 A JP2012080199 A JP 2012080199A JP 2012080199 A JP2012080199 A JP 2012080199A JP 2012164992 A5 JP2012164992 A5 JP 2012164992A5
- Authority
- JP
- Japan
- Prior art keywords
- liquid
- substrate
- cleaning
- substrate stage
- exposure apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims description 82
- 238000004140 cleaning Methods 0.000 claims description 60
- 239000007788 liquid Substances 0.000 claims description 60
- 238000000034 method Methods 0.000 claims description 30
- 238000007654 immersion Methods 0.000 claims description 28
- 238000011084 recovery Methods 0.000 claims description 21
- 230000003287 optical effect Effects 0.000 claims description 16
- 230000002093 peripheral effect Effects 0.000 claims 4
- 230000002940 repellent Effects 0.000 claims 3
- 239000005871 repellent Substances 0.000 claims 3
- 239000003960 organic solvent Substances 0.000 claims 2
- 238000005406 washing Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012080199A JP2012164992A (ja) | 2006-05-18 | 2012-03-30 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006139614 | 2006-05-18 | ||
| JP2006139614 | 2006-05-18 | ||
| JP2006140957 | 2006-05-19 | ||
| JP2006140957 | 2006-05-19 | ||
| JP2007103343 | 2007-04-10 | ||
| JP2007103343 | 2007-04-10 | ||
| JP2012080199A JP2012164992A (ja) | 2006-05-18 | 2012-03-30 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007132800A Division JP5217239B2 (ja) | 2006-05-18 | 2007-05-18 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012164992A JP2012164992A (ja) | 2012-08-30 |
| JP2012164992A5 true JP2012164992A5 (enExample) | 2013-07-25 |
Family
ID=38723302
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007132800A Expired - Fee Related JP5217239B2 (ja) | 2006-05-18 | 2007-05-18 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
| JP2012080199A Pending JP2012164992A (ja) | 2006-05-18 | 2012-03-30 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007132800A Expired - Fee Related JP5217239B2 (ja) | 2006-05-18 | 2007-05-18 | 露光方法及び装置、メンテナンス方法、並びにデバイス製造方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US8514366B2 (enExample) |
| EP (1) | EP2037486A4 (enExample) |
| JP (2) | JP5217239B2 (enExample) |
| KR (1) | KR20090018024A (enExample) |
| CN (2) | CN102298274A (enExample) |
| SG (1) | SG175671A1 (enExample) |
| TW (1) | TW200805000A (enExample) |
| WO (1) | WO2007135990A1 (enExample) |
Families Citing this family (36)
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|---|---|---|---|---|
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| US8125610B2 (en) | 2005-12-02 | 2012-02-28 | ASML Metherlands B.V. | Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus |
| JP5194799B2 (ja) * | 2005-12-06 | 2013-05-08 | 株式会社ニコン | 露光方法、露光装置、及びデバイス製造方法 |
| US7969548B2 (en) * | 2006-05-22 | 2011-06-28 | Asml Netherlands B.V. | Lithographic apparatus and lithographic apparatus cleaning method |
| EP2043134A4 (en) * | 2006-06-30 | 2012-01-25 | Nikon Corp | MAINTENANCE METHOD, EXPOSURE METHOD AND DEVICE AND COMPONENT MANUFACTURING METHOD |
| US8947629B2 (en) | 2007-05-04 | 2015-02-03 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US7841352B2 (en) | 2007-05-04 | 2010-11-30 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US20090025753A1 (en) | 2007-07-24 | 2009-01-29 | Asml Netherlands B.V. | Lithographic Apparatus And Contamination Removal Or Prevention Method |
| US7916269B2 (en) | 2007-07-24 | 2011-03-29 | Asml Netherlands B.V. | Lithographic apparatus and contamination removal or prevention method |
| NL1035942A1 (nl) | 2007-09-27 | 2009-03-30 | Asml Netherlands Bv | Lithographic Apparatus and Method of Cleaning a Lithographic Apparatus. |
| SG151198A1 (en) | 2007-09-27 | 2009-04-30 | Asml Netherlands Bv | Methods relating to immersion lithography and an immersion lithographic apparatus |
| NL1036273A1 (nl) | 2007-12-18 | 2009-06-19 | Asml Netherlands Bv | Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus. |
| NL1036306A1 (nl) | 2007-12-20 | 2009-06-23 | Asml Netherlands Bv | Lithographic apparatus and in-line cleaning apparatus. |
| US8339572B2 (en) | 2008-01-25 | 2012-12-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
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| NL2004540A (en) * | 2009-05-14 | 2010-11-18 | Asml Netherlands Bv | Lithographic apparatus and a method of operating the apparatus. |
| JP2010278299A (ja) * | 2009-05-29 | 2010-12-09 | Nikon Corp | 露光装置、露光方法、及びデバイス製造方法 |
| NL2005167A (en) * | 2009-10-02 | 2011-04-05 | Asml Netherlands Bv | Lithographic apparatus and a method of operating the apparatus. |
| NL2005610A (en) | 2009-12-02 | 2011-06-06 | Asml Netherlands Bv | Lithographic apparatus and surface cleaning method. |
| CN105185697B (zh) * | 2009-12-18 | 2019-02-15 | 株式会社尼康 | 基板处理装置及其控制方法、控制电路与维护方法 |
| WO2012011512A1 (ja) * | 2010-07-20 | 2012-01-26 | 株式会社ニコン | 露光方法、露光装置および洗浄方法 |
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| US20120188521A1 (en) * | 2010-12-27 | 2012-07-26 | Nikon Corporation | Cleaning method, liquid immersion member, immersion exposure apparatus, device fabricating method, program and storage medium |
| NL2008183A (en) * | 2011-02-25 | 2012-08-28 | Asml Netherlands Bv | A lithographic apparatus, a method of controlling the apparatus and a device manufacturing method. |
| US20130057837A1 (en) * | 2011-04-06 | 2013-03-07 | Nikon Corporation | Exposure apparatus, exposure method, device-manufacturing method, program, and recording medium |
| TWI503553B (zh) * | 2011-10-19 | 2015-10-11 | Johnstech Int Corp | 用於微電路測試器的導電開爾文接觸件 |
| KR102071873B1 (ko) * | 2012-12-27 | 2020-02-03 | 삼성디스플레이 주식회사 | 용매 제거장치 및 이를 포함하는 포토리소그래피 장치 |
| KR101573450B1 (ko) * | 2014-07-17 | 2015-12-11 | 주식회사 아이에스시 | 테스트용 소켓 |
| NL2015049A (en) | 2014-08-07 | 2016-07-08 | Asml Netherlands Bv | A lithography apparatus, a method of manufacturing a device and a control program. |
| KR102410381B1 (ko) * | 2015-11-20 | 2022-06-22 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 리소그래피 장치를 작동시키는 방법 |
| ES2937728T3 (es) | 2018-07-13 | 2023-03-30 | Hewlett Packard Development Co | Suministro de líquido de impresión |
| ES2832495T3 (es) | 2018-07-13 | 2021-06-10 | Hewlett Packard Development Co | Suministro de líquido de impresión |
| US11480885B2 (en) | 2018-11-09 | 2022-10-25 | Asml Holding N. V. | Apparatus for and method cleaning a support inside a lithography apparatus |
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-
2007
- 2007-05-18 JP JP2007132800A patent/JP5217239B2/ja not_active Expired - Fee Related
- 2007-05-18 KR KR1020087024125A patent/KR20090018024A/ko not_active Ceased
- 2007-05-18 TW TW096117939A patent/TW200805000A/zh unknown
- 2007-05-18 CN CN2011102517818A patent/CN102298274A/zh active Pending
- 2007-05-18 WO PCT/JP2007/060228 patent/WO2007135990A1/ja not_active Ceased
- 2007-05-18 EP EP07743663A patent/EP2037486A4/en not_active Withdrawn
- 2007-05-18 CN CN200780011033.4A patent/CN101410948B/zh not_active Expired - Fee Related
- 2007-05-18 SG SG2011077435A patent/SG175671A1/en unknown
-
2008
- 2008-10-21 US US12/289,148 patent/US8514366B2/en not_active Expired - Fee Related
-
2012
- 2012-03-30 JP JP2012080199A patent/JP2012164992A/ja active Pending
-
2013
- 2013-07-16 US US13/943,207 patent/US20130301019A1/en not_active Abandoned
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