JP2007523481A - 埋め込みガードリング及び耐放射線性分離構造並びにその製造方法 - Google Patents
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Abstract
【解決手段】様々な形式の放射線エネルギーによって引き起こされる有害な影響を減少し、又は排除するために、従来の設計及びプロセスを使用する一方で特殊構造を含んで半導体デバイスを作成する。このような半導体デバイスは本願で開示された1台以上の寄生的な分離デバイス、及び/又は、埋め込みガードリング構造を含む。これら新規な構造に対応する設計、及び/又は、工程ステップの導入には、従来のCMOS製作工程との互換性がある。したがって、比較的低い費用で比較的簡単に実施することができる。
【選択図】図3
Description
Claims (52)
- 第1導電型を有する基板と、
前記第1導電型を有し、第1ウェル接触領域を含む第1ウェルと、
前記第1導電型を有し、前記第1ウェルの下に配置され、第1基板の不純物濃度よりも高い埋め込み層不純物濃度を更に含む埋め込み層と、
前記埋め込み層と前記第1ウェル接触領域及び基板表面端子のいずれかとの間に延びる垂直導体と
を含むことを特徴とする半導体デバイス。 - 前記基板が、
基板材料と、
前記基板材料上に形成され、前記第1基板不純物濃度を有し、前記第1ウェル、前記埋め込み層、及び前記垂直導体のうち少なくとも1つがその中に少なくとも部分的に配置された半導体材料のエピタキシャル層と
を更に含むことを特徴とする請求項1に記載の半導体デバイス。 - 前記基板材料は、前記第1導電型を有するとともに前記第1基板不純物濃度と異なる不純物濃度を有する半導体材料であることを特徴とする請求項2に記載の半導体デバイス。
- 前記基板材料は絶縁材料であることを特徴とする請求項2に記載の半導体デバイス。
- 前記第1導電型はp型及びn型のいずれいかであることを特徴とする請求項1に記載の半導体デバイス。
- 前記基板が、
基板材料と、
前記基板材料上に形成された絶縁フィルムと、
前記絶縁フィルム上に形成され、前記第1基板不純物濃度を有し、前記第1ウェル、前記埋め込み層、及び前記垂直導体のうち少なくとも1つがその中に少なくとも部分的に配置された半導体フィルムと
を更に含むことを特徴とする請求項1に記載の半導体デバイス。 - 前記基板が
前記埋め込み層の下に配置された埋め込み絶縁層を更に含むことを特徴とする請求項1に記載の半導体デバイス。 - 前記第1ウェルが電界効果トランジスタを更に含むことを特徴とする請求項1に記載の半導体デバイス。
- 前記電界効果トランジスタが、
第1の幅を有するソース領域と、
第2の幅を有するドレイン領域と、
前記ソース領域と前記ドレイン領域との間に配置され、前記チャネル領域が、チャネル長さと前記第1の幅及び前記第2の幅のいずれよりも広い第3の幅とを有することにより、少なくとも1つのチャネル伸長部を形成し、当該少なくとも1つのチャネル伸長部は前記ソース領域と前記ドレイン領域との間に前記チャネル長さよりも長いチャネルエッジ長さを提供するチャネル領域と
を含むことを特徴とする請求項8に記載の半導体デバイス。 - 前記少なくとも1つのチャネルの伸長部が、その長さに沿い且つ前記ソース領域及び前記ドレイン領域から離間したチャネル伸長部不純物領域を更に含むことを特徴とする請求項9に記載の半導体デバイス。
- 前記チャネル伸長部不純物領域が、前記ソース領域及び前記ドレイン領域の少なくもと1つの深さよりも深く伸びていることを特徴とする請求項10に記載の半導体デバイス。
- 前記チャネル伸長部不純物領域は前記第1基板不純物濃度よりも高い不純物濃度を有することを特徴とする請求項10に記載の半導体デバイス。
- 前記チャネル伸長部不純物領域が第2導電型を有することを特徴とする請求項10に記載の半導体デバイス。
- 前記第2ウェルが前記埋め込み層の上に配置され、第2導電型を有する第2ウェルを更に含むことを特徴とする請求項1に記載の半導体デバイス。
- 前記前記第2ウェルが電界効果トランジスタを更に含むことを特徴とする請求項14に記載の半導体デバイス。
- 前記電界効果トランジスタが、
第1の幅を有するソース領域と、
第2の幅を有するドレイン領域と、
前記ソース領域と前記ドレイン領域との間に配置され、前記チャネル領域が、チャネル長さと前記第1の幅及び前記第2の幅のいずれよりも広い第3の幅とを有することにより、少なくとも1つのチャネル伸長部を形成し、当該少なくとも1つのチャネル伸長部は前記ソース領域と前記ドレイン領域との間に前記チャネル長さよりも長いネットチャネルエッジを提供するチャネル領域と
を含むことを特徴とする請求項15に記載の半導体デバイス。 - 前記少なくとも1つのチャネル伸長部が、その長さに沿い且つ前記ソース領域及び前記ドレイン領域から離間したチャネル伸長部不純物領域を更に含むことを特徴とする請求項16に記載の半導体デバイス。
- 前記チャネル伸長部不純物領域が、前記ソース領域及び前記ドレイン領域の少なくもといずれかの深さよりも深く伸びていることを特徴とする請求項17に記載の半導体デバイス。
- 前記チャネル伸長部不純物領域は、前記第2ウェルの不純物濃度よりも高い不純物濃度を有することを特徴とする請求項17に記載の半導体デバイス。
- 前記チャネル伸長部不純物領域が前記第1導電型を有することを特徴とする請求項17に記載の半導体デバイス。
- 前記第2ウェルのカウンタードープを実質的に防止するために、前記埋め込み層が前記第2ウェルの十分下にあることを特徴とする請求項14に記載の半導体デバイス。
- 前記第1ウェルが端子を有する電界効果トランジスタを含み、前記第1ウェル接触領域及び前記基板表面端子のいずれかが前記端子に電気的に接続されたことを特徴とする請求項1に記載の半導体デバイス。
- 前記第1ウェル接触領域及び前記基板表面端子のいずれかが、電圧レールに電気的に接続されたことを特徴とする請求項1に記載の半導体デバイス。
- 前記第1ウェルが前記第1基板不純物濃度と異なる不純物濃度を有することを特徴とする請求項1に記載の半導体デバイス。
- 前記垂直導体が、前記埋め込み層と前記第1ウェル接触領域との間に伸び、前記垂直導体が、前記第1導電型を有し且つ前記第1基板不純物濃度よりも高い垂直不純物領域不純物濃度を含むことを特徴とする請求項1に記載の半導体デバイス。
- 前記埋め込み層不純物濃度及び前記垂直不順物領域不純物濃度が、同程度であることを特徴とする請求項25に記載の半導体デバイス。
- 前記埋め込み層及び前記垂直不純物領域の少なくともいずれかが、高エネルギーイオン注入によって形成されたことを特徴とする請求項25に記載の半導体デバイス。
- 前記垂直不純物領域が前記第1ウェル接触の完全に下に配置されたことを特徴とする請求項25記載の半導体デバイス。
- 前記基板はp−型基板であり且つ前記埋め込み層はp+埋め込み層であることを特徴とする請求項1に記載の半導体デバイス。
- 前記基板はn−型基板であり、前記埋め込み層はn+埋め込み層であることを特徴とする請求項1に記載の半導体デバイス。
- 前記埋め込み層は、インジウムイオン、ホウ素イオン、及びリンイオンの少なくとも1つを使用して注入されたことを特徴とする請求項1に記載の半導体デバイス。
- 第1導電型を有し、上面を有する基板を提供する工程と、
前記基板の上面の下に配置され、前記第1導電型を有し、第1基板不純物濃度よりも高い層不純物濃度を更に含む層を形成する工程と、
前記第1導電型を有し、第1ウェル接触領域を含み、前記層と前記基板の上面との間の第1ウェル領域を形成する工程と、
前記層から前記基板の前記上面に伸びる垂直導体を形成する工程と
を含むことを特徴とする方法。 - 前記基板が、
基板材料と、
前記基板材料上に形成され、前記層を形成する工程、前記第1ウェル領域を形成する工程、および前記垂直導体を形成する工程のうち少なくとも1つが、その内部で少なくとも部分的に現れる半導体材料のエピキシャル層と
を更に含むことを特徴とする請求項32に記載の方法。 - 前記基板材料が絶縁体を含むことを特徴とする請求項33に記載の方法。
- 前記層を形成する工程、および前記垂直の導体を形成する工程の少なくとも1つが、
高エネルギーイオンを前記基板に注入する工程を更に含むことを特徴とする請求項32に記載の方法。 - 前記注入が、インジウムイオン、ホウ素イオン、及びリンイオンの少なくとも1つを使用することを特徴とする請求項35に記載の方法。
- 前記層を形成する工程の前に、前記基板内に絶縁層を形成する工程を更に含むことを特徴とする請求項32に記載の方法。
- 前記絶縁層を形成する工程が、酸素の層を前記基板に注入する工程を更に含むことを特徴とする請求項37に記載の方法。
- 前記層を形成する工程が高エネルギーイオンを前記基板に注入する工程を更に含み、
前記層を形成する工程の前に、エピキシャル層を前記基板上に蒸着する工程を更に含むことを特徴とする請求項32に記載の方法。 - 前記垂直導体を形成する工程が、
前記第1ウェル領域に隣接し且つ前記第1ウェルの一部である延長ウェル領域を形成する工程を更に含むことを特徴とする請求項32に記載の方法。 - 前記垂直導体を形成する工程が、複数のイオン注入操作を行う工程を更に含むことを特徴とする請求項32に記載の方法。
- 前記複数のイオン注入操作の少なくとも1つが、前記基板の法線に対して実質的に0度イオン注入工程を更に含むことを特徴とする請求項41に記載の方法。
- 前記垂直導体を形成する工程が、
前記基板にトレンチをエッチングする工程と、
前記トレンチの壁に絶縁材料を蒸着する工程と、
前記トレンチ内に導電材料を蒸着する工程と
を更に含むことを特徴とする請求項32に記載の方法。 - 前記垂直導電体と前記第1導電型を有する前記層との間の電気的接続を増強するために、前記基板の限局領域にイオン注入する工程を更に含むことを特徴とする請求項43に記載の方法。
- 前記垂直導体は、前記層と前記第1接触領域および基板表面端子のいずれかとの間に伸びることを特徴とする請求項32に記載の方法。
- 第1の幅を有するソース領域を前記第1ウェル領域に形成する工程と、
第2の幅を有するドレイン領域を前記第1ウェル領域に形成する工程と、
前記ソース領域と前記ドレイン領域との間に配置され、チャネル長さと、前記第1の幅および前記第2の幅のいずれよりも広い第3の幅とを有することにより、前記ソース領域と前記ドレイン領域との間に前記チャネル長さよりも長いネットチャネルエッジ長さを提供する少なくとも1つのチャネル延長部を形成するチャネル領域を、前記第1ウェル領域に形成する工程と
を更に含むことを特徴とする請求項32に記載の方法。 - 前記チャネル領域を形成する工程が、
前記少なくとも1つのチャネル延長部の前記長さに沿って、前記ソース領域および前記ドレイン領域から離れて配置されたチャネル延長部不純物を形成するために、高エネルギーイオンを注入する工程
を更に含むことを特徴とする請求項46に記載の方法。 - 前記チャネル延長部不純物領域が、前記ソース領域および前記ドレイン領域の少なくとも1つの深さよりも深く伸びていることを特徴とする請求項47に記載の方法。
- 前記チャネル延長部不純物領域は、前記第1基板不純物濃度よりも高い不純物濃度を有することを特徴とする請求項47に記載の方法。
- 前記チャネル延長部不純物領域は第2導電型を有することを特徴とする請求項47に記載の方法。
- 端子を含む電界効果トランジスタを前記第1ウェル領域に形成する工程と、
前記第1ウェル接触領域を前記端子に電気的に接続する工程と
を更に含むことを特徴とする請求項32に記載の方法。 - 前記層を形成する工程が前記基板の表面上に前記層を蒸着する工程を含み、
前記層を形成する工程の後に、上面を含むエピキシャル層を前記基板上に蒸着する工程を更に含むことを特徴とする請求項32に記載の方法。
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WO2005079400A2 (en) | 2005-09-01 |
US20050179093A1 (en) | 2005-08-18 |
US8729640B2 (en) | 2014-05-20 |
US20080188045A1 (en) | 2008-08-07 |
US20130313620A1 (en) | 2013-11-28 |
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