IN2012DN02336A - - Google Patents
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- Publication number
- IN2012DN02336A IN2012DN02336A IN2336DEN2012A IN2012DN02336A IN 2012DN02336 A IN2012DN02336 A IN 2012DN02336A IN 2336DEN2012 A IN2336DEN2012 A IN 2336DEN2012A IN 2012DN02336 A IN2012DN02336 A IN 2012DN02336A
- Authority
- IN
- India
- Prior art keywords
- snapshot
- focusing
- slide
- techniques
- images
- Prior art date
Links
- 238000000034 method Methods 0.000 abstract 2
- 238000003384 imaging method Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 230000007170 pathology Effects 0.000 abstract 1
- 230000009467 reduction Effects 0.000 abstract 1
Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/241—Devices for focusing
- G02B21/245—Devices for focusing using auxiliary sources, detectors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/26—Stages; Adjusting means therefor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/02—Viewing or reading apparatus
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
- G01N1/31—Apparatus therefor
- G01N1/312—Apparatus therefor for samples mounted on planar substrates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
- G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
- G01N2035/00049—Transport arrangements specific to flat sample substrates, e.g. pusher blade for loading/unloading a carousel
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
- G01N2035/00099—Characterised by type of test elements
- G01N2035/00138—Slides
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0439—Rotary sample carriers, i.e. carousels
- G01N2035/0441—Rotary sample carriers, i.e. carousels for samples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/046—General conveyor features
- G01N2035/0462—Buffers [FIFO] or stacks [LIFO] for holding carriers between operations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0474—Details of actuating means for conveyors or pipettes
- G01N2035/0491—Position sensing, encoding; closed-loop control
- G01N2035/0493—Locating samples; identifying different tube sizes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/0099—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor comprising robots or similar manipulators
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Microscoopes, Condenser (AREA)
- Automatic Focus Adjustment (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US25299509P | 2009-10-19 | 2009-10-19 | |
US25622809P | 2009-10-29 | 2009-10-29 | |
US26125109P | 2009-11-13 | 2009-11-13 | |
US29923110P | 2010-01-28 | 2010-01-28 | |
US36734110P | 2010-07-23 | 2010-07-23 | |
PCT/US2010/002772 WO2011049608A2 (en) | 2009-10-19 | 2010-10-18 | Imaging system and techniques |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2012DN02336A true IN2012DN02336A (es) | 2015-08-21 |
Family
ID=43900872
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN2336DEN2012 IN2012DN02336A (es) | 2009-10-19 | 2010-10-18 |
Country Status (13)
Country | Link |
---|---|
US (4) | US9036255B2 (es) |
EP (4) | EP2993510B1 (es) |
JP (4) | JP5627698B2 (es) |
KR (4) | KR101423896B1 (es) |
CN (4) | CN102687061B (es) |
AU (1) | AU2010308550B2 (es) |
BR (1) | BR112012009241A2 (es) |
CA (4) | CA2842723C (es) |
HK (4) | HK1176683A1 (es) |
IL (4) | IL218822A (es) |
IN (1) | IN2012DN02336A (es) |
SG (3) | SG187479A1 (es) |
WO (1) | WO2011049608A2 (es) |
Families Citing this family (152)
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JP5739351B2 (ja) | 2009-03-11 | 2015-06-24 | サクラ ファインテック ユー.エス.エー., インコーポレイテッド | 自動合焦方法および自動合焦装置 |
CA2842723C (en) | 2009-10-19 | 2016-02-16 | Ventana Medical Systems, Inc. | Imaging system and techniques |
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JP5577885B2 (ja) * | 2010-06-28 | 2014-08-27 | ソニー株式会社 | 顕微鏡及び合焦点方法 |
EP2633358A1 (en) * | 2010-10-29 | 2013-09-04 | Canon Kabushiki Kaisha | Microscope, image acquisition apparatus, and image acquisition system |
US9522396B2 (en) | 2010-12-29 | 2016-12-20 | S.D. Sight Diagnostics Ltd. | Apparatus and method for automatic detection of pathogens |
DE102011121928B4 (de) | 2011-08-01 | 2015-03-05 | Physik Instrumente (Pi) Gmbh & Co. Kg | Anordnung zum Betreiben eines dynamischen Nanofokussiersystems |
KR101734628B1 (ko) * | 2011-09-09 | 2017-05-11 | 벤타나 메디컬 시스템즈, 인코포레이티드 | 에러 신호를 이용한 포커스 및 이미징 시스템 및 기법들 |
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