HU0004571D0 - - Google Patents

Info

Publication number
HU0004571D0
HU0004571D0 HU0004571A HUP0004571A HU0004571D0 HU 0004571 D0 HU0004571 D0 HU 0004571D0 HU 0004571 A HU0004571 A HU 0004571A HU P0004571 A HUP0004571 A HU P0004571A HU 0004571 D0 HU0004571 D0 HU 0004571D0
Authority
HU
Hungary
Prior art keywords
intensity
point
polarization state
light
polarization
Prior art date
Application number
HU0004571A
Other languages
English (en)
Hungarian (hu)
Original Assignee
Zeiss Carl Jena Gmbh
Mta Szegedi Biolog Koezpont
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeiss Carl Jena Gmbh, Mta Szegedi Biolog Koezpont filed Critical Zeiss Carl Jena Gmbh
Priority to HU0004571A priority Critical patent/HU226937B1/hu
Publication of HU0004571D0 publication Critical patent/HU0004571D0/hu
Priority to EP01996722A priority patent/EP1334339B8/en
Priority to DE60130356T priority patent/DE60130356T2/de
Priority to JP2002542833A priority patent/JP2004514129A/ja
Priority to AT01996722T priority patent/ATE372507T1/de
Priority to PCT/HU2001/000116 priority patent/WO2002040953A1/en
Priority to US10/196,593 priority patent/US6856391B2/en
Publication of HUP0004571A2 publication Critical patent/HUP0004571A2/hu
Publication of HU226937B1 publication Critical patent/HU226937B1/hu

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
HU0004571A 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope HU226937B1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope
EP01996722A EP1334339B8 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope
DE60130356T DE60130356T2 (de) 2000-11-17 2001-11-16 Verfahren und vorrichtung zur bestimmung der polarisationseigenschaften von licht, das durch ein material emittiert, reflektiert oder durchgelassen wird, durch verwendung eines laser-scan-mikroskops
JP2002542833A JP2004514129A (ja) 2000-11-17 2001-11-16 レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置
AT01996722T ATE372507T1 (de) 2000-11-17 2001-11-16 Verfahren und vorrichtung zur bestimmung der polarisationseigenschaften von licht, das durch ein material emittiert, reflektiert oder durchgelassen wird, durch verwendung eines laser- scan-mikroskops
PCT/HU2001/000116 WO2002040953A1 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope
US10/196,593 US6856391B2 (en) 2000-11-17 2002-07-17 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope

Publications (3)

Publication Number Publication Date
HU0004571D0 true HU0004571D0 (enExample) 2001-02-28
HUP0004571A2 HUP0004571A2 (hu) 2002-07-29
HU226937B1 HU226937B1 (en) 2010-03-29

Family

ID=89978770

Family Applications (1)

Application Number Title Priority Date Filing Date
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope

Country Status (7)

Country Link
US (1) US6856391B2 (enExample)
EP (1) EP1334339B8 (enExample)
JP (1) JP2004514129A (enExample)
AT (1) ATE372507T1 (enExample)
DE (1) DE60130356T2 (enExample)
HU (1) HU226937B1 (enExample)
WO (1) WO2002040953A1 (enExample)

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US7630075B2 (en) * 2004-09-27 2009-12-08 Honeywell International Inc. Circular polarization illumination based analyzer system
RU2285279C1 (ru) * 2005-01-21 2006-10-10 Общество с ограниченной ответственностью Научно-технический центр "ЭконЦНИИМаш" (ООО НТЦ "ЭконЦНИИМаш") Лазерный сканирующий микроскоп
US7412175B2 (en) * 2005-06-20 2008-08-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Interferometric polarization control
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JP4921090B2 (ja) * 2006-09-25 2012-04-18 株式会社モリテックス 光学異方性パラメータ測定方法及び測定装置
JP5189301B2 (ja) 2007-03-12 2013-04-24 オリンパス株式会社 レーザー走査型顕微鏡
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HUP0700635A2 (en) * 2007-09-28 2009-05-28 Mta Szegedi Biolog Koezpont Differential-polarizing accessory measuring block for laser scanning microscopes
KR20100010137A (ko) * 2008-07-22 2010-02-01 삼성전기주식회사 프로젝션 디스플레이 장치
EP2584343B1 (en) 2010-07-26 2017-05-10 Olympus Corporation Method for detecting dilute particles in solution using luminescent probe
JP5856962B2 (ja) 2010-09-10 2016-02-10 オリンパス株式会社 単一発光粒子の光強度を用いた光分析方法
WO2012032955A1 (ja) 2010-09-10 2012-03-15 オリンパス株式会社 複数の波長帯域の光計測を用いた光分析方法
EP2620763A4 (en) * 2010-10-19 2015-05-27 Olympus Corp OPTICAL ANALYSIS DEVICE FOR OBSERVING THE POLARIZATION CHARACTERISTICS OF A SINGLE LIGHT-EMITTING PARTICLE, OPTICAL ANALYSIS METHOD, AND OPTICAL ANALYSIS COMPUTER PROGRAM
DE102010049751B4 (de) * 2010-10-29 2020-11-05 "Stiftung Caesar" (Center Of Advanced European Studies And Research) Optischer Strahlteiler zur simultanen Aufnahme eines Z-Stapels auf einem Halbleiterchip, Bausatz zum Aufbau eines optischen Strahlteilers und Lichtmikroskop
CN103229042B (zh) 2010-11-25 2016-06-29 奥林巴斯株式会社 利用单个发光粒子的光的波长特性的光分析装置和光分析方法
WO2012099234A1 (ja) 2011-01-20 2012-07-26 オリンパス株式会社 単一発光粒子からの光の検出を用いた光分析方法及び光分析装置
CN103328956B (zh) 2011-01-26 2015-08-12 奥林巴斯株式会社 鉴别核酸分子多态性的方法
JP6009944B2 (ja) 2011-01-26 2016-10-19 オリンパス株式会社 核酸分子の多型識別方法
EP2693201A4 (en) 2011-03-29 2014-10-29 Olympus Corp PHOTOMETRIC ANALYSIS DEVICE, PHOTOMETRIC ANALYSIS METHOD, AND COMPUTER PROGRAM FOR PHOTOMETRIC ANALYSIS, DETECTING SINGLE LIGHT EMITTING PARTICLE
EP2706346A4 (en) 2011-04-13 2014-11-19 Olympus Corp PHOTO-ANALYSIS DEVICE USING SINGLE-LIGHT EMITTING PARTICLE DETECTION, METHOD FOR PHOTO-ANALYSIS, AND COMPUTER PROGRAM FOR PHOTO-ANALYSIS
CN103620389B (zh) 2011-04-18 2016-08-17 奥林巴斯株式会社 目标粒子的定量方法、光分析装置以及光分析用计算机程序
CN103733047B (zh) 2011-08-11 2016-03-30 奥林巴斯株式会社 目标粒子的检测方法
EP2746748B1 (en) 2011-08-15 2017-12-06 Olympus Corporation Photometric analysis device using single light emitting particle detection, photometric analysis method and computer program for photometric analysis,
WO2013031439A1 (ja) 2011-08-26 2013-03-07 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
WO2013031309A1 (ja) 2011-08-26 2013-03-07 オリンパス株式会社 光分析を用いた単一粒子検出装置、単一粒子検出方法及び単一粒子検出用コンピュータプログラム
EP2752655A4 (en) 2011-08-30 2015-06-17 Olympus Corp PROCEDURE FOR DETECTING TARGET PARTICLES
WO2013031377A1 (ja) 2011-08-30 2013-03-07 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
EP2778658A4 (en) 2011-11-10 2015-12-02 Olympus Corp SPECTROSCOPY DEVICE, SPECTROSCOPY PROCESS AND SPECTROSCOPY COMPUTER PROGRAM DETECTING SINGLE LIGHT-EMITTING PARTICLES
EP2816344A4 (en) 2012-02-17 2015-09-23 Olympus Corp OPTICAL ANALYSIS DEVICE USING SINGLE PARTICLE DETECTION TECHNIQUE, OPTICAL ANALYSIS METHOD, AND COMPUTER PROGRAM FOR OPTICAL ANALYSIS
JP5940644B2 (ja) 2012-02-22 2016-06-29 オリンパス株式会社 標的粒子の検出方法
JP6095645B2 (ja) 2012-03-21 2017-03-15 オリンパス株式会社 標的核酸分子の検出方法
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JP6087751B2 (ja) * 2013-07-05 2017-03-01 株式会社モリテックス 光学異方性パラメータ測定装置、測定方法及び測定用プログラム
CN105431759B (zh) 2013-07-31 2018-04-13 奥林巴斯株式会社 利用单个发光粒子检测技术的光学显微镜装置、显微镜观察法以及用于显微镜观察的计算机程序
US9989454B2 (en) * 2013-10-04 2018-06-05 Axometrics, Inc. Method and apparatus for measuring parameters of optical anisotropy
EP3059577A4 (en) 2013-10-07 2017-05-31 Olympus Corporation Photometric analysis device employing single light-emitting particle detection, photometric analysis method, and computer program for photometric analysis
WO2015084964A1 (en) * 2013-12-03 2015-06-11 The General Hospital Corporation Compensating for input polarization mode variations
CN103940537A (zh) * 2014-04-10 2014-07-23 中国科学院半导体研究所 材料的微区应力测试系统
GB201411478D0 (en) * 2014-06-27 2014-08-13 Univ Salford Entpr Ltd Measuring polarisation
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CN105518711B (zh) * 2015-06-29 2019-11-29 北京旷视科技有限公司 活体检测方法、活体检测系统以及计算机程序产品
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JPWO2017098597A1 (ja) 2015-12-09 2018-10-11 オリンパス株式会社 単一発光粒子検出を用いた光分析方法及び光分析装置
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
JP6351893B1 (ja) * 2018-02-26 2018-07-04 日本分光株式会社 位相差制御装置
EP3884295A4 (en) * 2018-11-21 2022-08-17 The Board of Trustees of the Leland Stanford Junior University WIDE FIELD DNANOSIS IMAGE METHODS USING WIDE FIELD OPTICAL MODULATORS
CN110261319B (zh) * 2019-06-24 2021-11-16 西安理工大学 基于四次测量Mueller矩阵光谱的装置及测量方法
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Also Published As

Publication number Publication date
ATE372507T1 (de) 2007-09-15
EP1334339B1 (en) 2007-09-05
WO2002040953A1 (en) 2002-05-23
HUP0004571A2 (hu) 2002-07-29
JP2004514129A (ja) 2004-05-13
EP1334339A1 (en) 2003-08-13
US20030058442A1 (en) 2003-03-27
US6856391B2 (en) 2005-02-15
DE60130356T2 (de) 2008-05-08
DE60130356D1 (de) 2007-10-18
EP1334339B8 (en) 2007-12-26
HU226937B1 (en) 2010-03-29

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Legal Events

Date Code Title Description
GB9A Succession in title

Owner name: MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI K, HU

Free format text: FORMER OWNER(S): MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI KOEZPONT, HU; CARL ZEISS JENA GMBH., DE

QB4A Exploitation contract

Name of requester: CARL ZEISS JENA GMBH, DE

MM4A Lapse of definitive patent protection due to non-payment of fees