ATE209345T1 - Vorrichtung und verfahren zur molekularen charakterisierung - Google Patents

Vorrichtung und verfahren zur molekularen charakterisierung

Info

Publication number
ATE209345T1
ATE209345T1 AT93905926T AT93905926T ATE209345T1 AT E209345 T1 ATE209345 T1 AT E209345T1 AT 93905926 T AT93905926 T AT 93905926T AT 93905926 T AT93905926 T AT 93905926T AT E209345 T1 ATE209345 T1 AT E209345T1
Authority
AT
Austria
Prior art keywords
light
scattered
sample
molecular characterization
cell
Prior art date
Application number
AT93905926T
Other languages
English (en)
Inventor
Norman C Ford Jr
Original Assignee
Prec Detectors Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Prec Detectors Inc filed Critical Prec Detectors Inc
Application granted granted Critical
Publication of ATE209345T1 publication Critical patent/ATE209345T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N2021/0346Capillary cells; Microcells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N2021/0389Windows
    • G01N2021/0392Nonplanar windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4711Multiangle measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4728Optical definition of scattering volume
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/064Stray light conditioning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/064Stray light conditioning
    • G01N2201/0642Light traps; baffles

Landscapes

  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Optical Measuring Cells (AREA)
AT93905926T 1992-02-12 1993-02-12 Vorrichtung und verfahren zur molekularen charakterisierung ATE209345T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/834,415 US5305073A (en) 1992-02-12 1992-02-12 Methods and apparatus for molecular characterization
PCT/US1993/001300 WO1993016372A1 (en) 1992-02-12 1993-02-12 Methods and apparatus for molecular characterization

Publications (1)

Publication Number Publication Date
ATE209345T1 true ATE209345T1 (de) 2001-12-15

Family

ID=25266887

Family Applications (1)

Application Number Title Priority Date Filing Date
AT93905926T ATE209345T1 (de) 1992-02-12 1993-02-12 Vorrichtung und verfahren zur molekularen charakterisierung

Country Status (7)

Country Link
US (1) US5305073A (de)
EP (1) EP0626064B1 (de)
JP (1) JP3352092B2 (de)
AT (1) ATE209345T1 (de)
CA (1) CA2117475A1 (de)
DE (1) DE69331188T2 (de)
WO (1) WO1993016372A1 (de)

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US6072187A (en) * 1994-07-06 2000-06-06 Fisher Pierce Co. Apparatus and method for reducing stray laser light in particle sensors using a narrow band filter
US5701176A (en) * 1995-07-28 1997-12-23 Precision Detectors, Inc. High temperature light scattering measurement device comprising a rigid extension tube
US6586193B2 (en) 1996-04-25 2003-07-01 Genicon Sciences Corporation Analyte assay using particulate labels
IL126544A (en) 1996-04-25 2004-08-31 Genicon Sciences Inc Analyte assay using scattered-light detectable particles
US6653150B1 (en) 1996-11-13 2003-11-25 The Administrators Of The Tulane Educational Fund Automatic mixing and dilution methods for online characterization of equilibrium and non-equilibrium properties of solutions containing polymers and/or colloids
US6052184A (en) * 1996-11-13 2000-04-18 The Administrators Of The Tulane Educational Fund Miniature, submersible, versatile, light scattering probe for absolute equilibrium and non-equilibrium characterization of macromolecular and colloidal solutions
US5952896A (en) * 1997-01-13 1999-09-14 Applied Materials, Inc. Impedance matching network
US6175409B1 (en) 1999-04-02 2001-01-16 Symyx Technologies, Inc. Flow-injection analysis and variable-flow light-scattering methods and apparatus for characterizing polymers
US6795183B2 (en) 1999-02-19 2004-09-21 Metron Instruments, Inc. Measurement systems and methods for determining component particle concentrations in a liquid
US6407813B1 (en) 1999-02-19 2002-06-18 On-Line Instrumentation, Inc. Measurement systems and methods for determining component particle concentrations in a liquid
ATE417262T1 (de) * 1999-02-19 2008-12-15 Metron Instr Inc Messvorrichtung und verfahren zur bestimmung von teilchenkonzentrationen in einer flüssigkeit
WO2002077671A2 (en) * 2000-10-19 2002-10-03 Viscotek Corporation Miniature low angle laser light scattering detector
CA2439307A1 (en) * 2001-02-23 2002-09-06 Genicon Sciences Corporation Methods for providing extended dynamic range in analyte assays
GB2390893A (en) * 2002-07-15 2004-01-21 Pcme Ltd Method and apparatus for monitoring particles in a stack
DE10341520A1 (de) * 2003-09-09 2005-04-07 Schupp, Wolfgang, Dr. Verfahren und Vorrichtung zur Durchführung einer Lichtstreuung
US20050141843A1 (en) * 2003-12-31 2005-06-30 Invitrogen Corporation Waveguide comprising scattered light detectable particles
US7027138B2 (en) * 2004-01-29 2006-04-11 Wyatt Technology Corporation Enhanced sensitivity differential refractometer incorporating a photodetector array
WO2006029017A1 (en) * 2004-09-03 2006-03-16 Symyx Technologies, Inc. System and method for rapid chromatography with fluid temperature and mobile phase composition control
GB2422897A (en) 2005-02-02 2006-08-09 Pcme Ltd A monitor for monitoring particles flowing in a stack
US7630076B2 (en) * 2005-07-26 2009-12-08 University Of Connecticut Dual-detector systems and methods having utility in biomolecular measurements
GB2436871A (en) * 2006-04-04 2007-10-10 Pcme Ltd Optical beam dump for particle monitoring system
US20090046274A1 (en) * 2007-08-16 2009-02-19 Mchugh Mark A Light Scattering Methods and Systems Using Supercritical Fluid Solvents to Measure Polymer Molecular Weight and Molecular Weight Distribution
KR101109968B1 (ko) * 2008-07-23 2012-02-17 올림푸스 메디칼 시스템즈 가부시키가이샤 피검체 관측 장치 및 피검체 관측 방법
JP5191831B2 (ja) * 2008-07-23 2013-05-08 オリンパスメディカルシステムズ株式会社 被検体観測装置及び被検体観測装置の作動方法
US8576396B2 (en) * 2008-11-19 2013-11-05 Postnova Analytics Gmbh Cell construction for light scatter detectors having self-focusing properties
US7659980B1 (en) * 2008-11-24 2010-02-09 Herbert Leckie Mitchell Nephelometric turbidity sensor device
US8531516B2 (en) * 2010-02-03 2013-09-10 The United States Of America As Represented By The Secretary Of Commerce Imaging polar nephelometer
GB201003704D0 (en) * 2010-03-05 2010-04-21 Pcme Ltd Apparatus and method for monitoring particles in a stack
US20120001061A1 (en) * 2010-07-02 2012-01-05 Hamilton Sundstrand Corporation Ion implanted beam dump
AT510765B1 (de) * 2010-12-15 2012-09-15 Wolfgang Dipl Ing Vogl Vorrichtung zur photometrischen bzw. spektrometrischen untersuchung einer flüssigen probe
DE202011107342U1 (de) 2011-10-18 2012-07-18 Postnova Analytics Gmbh Blendensystem für Vielwinkellichtstreudetektoren
EP2584353B1 (de) 2011-10-18 2018-01-24 Postnova Analytics GmbH Blendensystem für Vielwinkellichtstreudetektoren
EP3066452B1 (de) * 2013-11-05 2018-04-04 Malvern Panalytical Limited Verbesserungen in zusammenhang mit partikelcharakterisierung
DE202014102634U1 (de) 2014-06-05 2014-07-01 Postnova Analytics Gmbh Zweiteilige Messzelle für die statische Lichtstreuung
US9677983B2 (en) * 2015-05-01 2017-06-13 Malvern Instruments Ltd. Particle characterization
DE202019104338U1 (de) 2018-08-09 2019-09-04 Postnova Analytics Gmbh Vielwinkellichtstreudetektor auf Basis eines Fotodiodenarray
JP7192675B2 (ja) * 2019-06-26 2022-12-20 株式会社島津製作所 光散乱検出装置および光散乱検出方法
JP7226561B2 (ja) * 2019-08-05 2023-02-21 株式会社島津製作所 液体クロマトグラフ用検出器

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2427996A (en) * 1944-09-28 1947-09-23 American Cyanamid Co Temperature compensator for refractometers
US4027973A (en) * 1973-07-02 1977-06-07 Beckman Instruments, Inc. Detector apparatus for laser light scattering photometers
US4053229A (en) * 1976-01-13 1977-10-11 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration 2°/90° Laboratory scattering photometer
CH668483A5 (de) * 1985-12-17 1988-12-30 Zellweger Uster Ag Verfahren und vorrichtung zur bestimmung der oberflaechenstruktur eines langgestreckten pruefkoerpers, insbesondere zur messung der haarigkeit eines garnes.
US4804853A (en) * 1987-04-23 1989-02-14 High Yield Technology Compact particle flux monitor
JP2635992B2 (ja) * 1988-03-24 1997-07-30 興和株式会社 微粒子測定装置

Also Published As

Publication number Publication date
JPH07503796A (ja) 1995-04-20
EP0626064B1 (de) 2001-11-21
US5305073A (en) 1994-04-19
DE69331188T2 (de) 2002-08-29
DE69331188D1 (de) 2002-01-03
EP0626064A1 (de) 1994-11-30
EP0626064A4 (de) 1995-05-10
JP3352092B2 (ja) 2002-12-03
WO1993016372A1 (en) 1993-08-19
CA2117475A1 (en) 1993-08-19

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