DE69331188D1 - Vorrichtung und verfahren zur molekularen charakterisierung - Google Patents

Vorrichtung und verfahren zur molekularen charakterisierung

Info

Publication number
DE69331188D1
DE69331188D1 DE69331188T DE69331188T DE69331188D1 DE 69331188 D1 DE69331188 D1 DE 69331188D1 DE 69331188 T DE69331188 T DE 69331188T DE 69331188 T DE69331188 T DE 69331188T DE 69331188 D1 DE69331188 D1 DE 69331188D1
Authority
DE
Germany
Prior art keywords
light
scattered
sample
molecular characterization
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69331188T
Other languages
English (en)
Other versions
DE69331188T2 (de
Inventor
C Ford
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Precision Detectors Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Precision Detectors Inc filed Critical Precision Detectors Inc
Publication of DE69331188D1 publication Critical patent/DE69331188D1/de
Application granted granted Critical
Publication of DE69331188T2 publication Critical patent/DE69331188T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N2021/0346—Capillary cells; Microcells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N2021/0389—Windows
    • G01N2021/0392—Nonplanar windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4728—Optical definition of scattering volume
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/064—Stray light conditioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/064—Stray light conditioning
    • G01N2201/0642—Light traps; baffles
DE69331188T 1992-02-12 1993-02-12 Vorrichtung und verfahren zur molekularen charakterisierung Expired - Lifetime DE69331188T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/834,415 US5305073A (en) 1992-02-12 1992-02-12 Methods and apparatus for molecular characterization
PCT/US1993/001300 WO1993016372A1 (en) 1992-02-12 1993-02-12 Methods and apparatus for molecular characterization

Publications (2)

Publication Number Publication Date
DE69331188D1 true DE69331188D1 (de) 2002-01-03
DE69331188T2 DE69331188T2 (de) 2002-08-29

Family

ID=25266887

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69331188T Expired - Lifetime DE69331188T2 (de) 1992-02-12 1993-02-12 Vorrichtung und verfahren zur molekularen charakterisierung

Country Status (7)

Country Link
US (1) US5305073A (de)
EP (1) EP0626064B1 (de)
JP (1) JP3352092B2 (de)
AT (1) ATE209345T1 (de)
CA (1) CA2117475A1 (de)
DE (1) DE69331188T2 (de)
WO (1) WO1993016372A1 (de)

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US6072187A (en) * 1994-07-06 2000-06-06 Fisher Pierce Co. Apparatus and method for reducing stray laser light in particle sensors using a narrow band filter
US5701176A (en) * 1995-07-28 1997-12-23 Precision Detectors, Inc. High temperature light scattering measurement device comprising a rigid extension tube
JP2000510582A (ja) 1996-04-25 2000-08-15 ゼニコン・サイエンシーズ・コーポレーション 微粒子標識を使用した分析物アッセイ
US6586193B2 (en) * 1996-04-25 2003-07-01 Genicon Sciences Corporation Analyte assay using particulate labels
US6653150B1 (en) 1996-11-13 2003-11-25 The Administrators Of The Tulane Educational Fund Automatic mixing and dilution methods for online characterization of equilibrium and non-equilibrium properties of solutions containing polymers and/or colloids
US6052184A (en) * 1996-11-13 2000-04-18 The Administrators Of The Tulane Educational Fund Miniature, submersible, versatile, light scattering probe for absolute equilibrium and non-equilibrium characterization of macromolecular and colloidal solutions
US5952896A (en) * 1997-01-13 1999-09-14 Applied Materials, Inc. Impedance matching network
US6175409B1 (en) 1999-04-02 2001-01-16 Symyx Technologies, Inc. Flow-injection analysis and variable-flow light-scattering methods and apparatus for characterizing polymers
DK1161670T3 (da) * 1999-02-19 2009-03-30 Metron Instr Inc Målesystemer og fremgangsmåder til bestemmelse af komponentpartikelkoncentrationer i en væske
US6407813B1 (en) 1999-02-19 2002-06-18 On-Line Instrumentation, Inc. Measurement systems and methods for determining component particle concentrations in a liquid
US6795183B2 (en) 1999-02-19 2004-09-21 Metron Instruments, Inc. Measurement systems and methods for determining component particle concentrations in a liquid
WO2002077671A2 (en) * 2000-10-19 2002-10-03 Viscotek Corporation Miniature low angle laser light scattering detector
EP1488208A4 (de) * 2001-02-23 2008-05-28 Invitrogen Corp Verfahren zur bereitstellung eines erweiterten dynamikbereichs in analytentests
GB2390893A (en) * 2002-07-15 2004-01-21 Pcme Ltd Method and apparatus for monitoring particles in a stack
DE10341520A1 (de) * 2003-09-09 2005-04-07 Schupp, Wolfgang, Dr. Verfahren und Vorrichtung zur Durchführung einer Lichtstreuung
US20050141843A1 (en) * 2003-12-31 2005-06-30 Invitrogen Corporation Waveguide comprising scattered light detectable particles
US7027138B2 (en) * 2004-01-29 2006-04-11 Wyatt Technology Corporation Enhanced sensitivity differential refractometer incorporating a photodetector array
US7507337B2 (en) * 2004-09-03 2009-03-24 Symyx Technologies, Inc. System and method for rapid chromatography with fluid temperature and mobile phase composition control
GB2422897A (en) 2005-02-02 2006-08-09 Pcme Ltd A monitor for monitoring particles flowing in a stack
US7630076B2 (en) * 2005-07-26 2009-12-08 University Of Connecticut Dual-detector systems and methods having utility in biomolecular measurements
GB2436871A (en) * 2006-04-04 2007-10-10 Pcme Ltd Optical beam dump for particle monitoring system
US20090046274A1 (en) * 2007-08-16 2009-02-19 Mchugh Mark A Light Scattering Methods and Systems Using Supercritical Fluid Solvents to Measure Polymer Molecular Weight and Molecular Weight Distribution
JP5191831B2 (ja) * 2008-07-23 2013-05-08 オリンパスメディカルシステムズ株式会社 被検体観測装置及び被検体観測装置の作動方法
KR101109968B1 (ko) * 2008-07-23 2012-02-17 올림푸스 메디칼 시스템즈 가부시키가이샤 피검체 관측 장치 및 피검체 관측 방법
EP2361375B1 (de) 2008-11-19 2018-10-10 Postnova Analytics GmbH Zellaufbau für lichtstreudetektoren mit selbstfokussierenden eigenschaften
US7659980B1 (en) * 2008-11-24 2010-02-09 Herbert Leckie Mitchell Nephelometric turbidity sensor device
US8531516B2 (en) * 2010-02-03 2013-09-10 The United States Of America As Represented By The Secretary Of Commerce Imaging polar nephelometer
GB201003704D0 (en) 2010-03-05 2010-04-21 Pcme Ltd Apparatus and method for monitoring particles in a stack
US20120001061A1 (en) * 2010-07-02 2012-01-05 Hamilton Sundstrand Corporation Ion implanted beam dump
AT510765B1 (de) * 2010-12-15 2012-09-15 Wolfgang Dipl Ing Vogl Vorrichtung zur photometrischen bzw. spektrometrischen untersuchung einer flüssigen probe
EP2584353B1 (de) 2011-10-18 2018-01-24 Postnova Analytics GmbH Blendensystem für Vielwinkellichtstreudetektoren
DE202011107342U1 (de) 2011-10-18 2012-07-18 Postnova Analytics Gmbh Blendensystem für Vielwinkellichtstreudetektoren
US10048187B2 (en) * 2013-11-05 2018-08-14 Malvern Panalytical Limited Improvements relating to particle characterisation
DE202014102634U1 (de) 2014-06-05 2014-07-01 Postnova Analytics Gmbh Zweiteilige Messzelle für die statische Lichtstreuung
US9677983B2 (en) * 2015-05-01 2017-06-13 Malvern Instruments Ltd. Particle characterization
DE202019104338U1 (de) 2018-08-09 2019-09-04 Postnova Analytics Gmbh Vielwinkellichtstreudetektor auf Basis eines Fotodiodenarray
JP7192675B2 (ja) * 2019-06-26 2022-12-20 株式会社島津製作所 光散乱検出装置および光散乱検出方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2427996A (en) * 1944-09-28 1947-09-23 American Cyanamid Co Temperature compensator for refractometers
US4027973A (en) * 1973-07-02 1977-06-07 Beckman Instruments, Inc. Detector apparatus for laser light scattering photometers
US4053229A (en) * 1976-01-13 1977-10-11 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration 2°/90° Laboratory scattering photometer
CH668483A5 (de) * 1985-12-17 1988-12-30 Zellweger Uster Ag Verfahren und vorrichtung zur bestimmung der oberflaechenstruktur eines langgestreckten pruefkoerpers, insbesondere zur messung der haarigkeit eines garnes.
US4804853A (en) * 1987-04-23 1989-02-14 High Yield Technology Compact particle flux monitor
JP2635992B2 (ja) * 1988-03-24 1997-07-30 興和株式会社 微粒子測定装置

Also Published As

Publication number Publication date
WO1993016372A1 (en) 1993-08-19
JP3352092B2 (ja) 2002-12-03
JPH07503796A (ja) 1995-04-20
EP0626064B1 (de) 2001-11-21
EP0626064A4 (de) 1995-05-10
US5305073A (en) 1994-04-19
ATE209345T1 (de) 2001-12-15
EP0626064A1 (de) 1994-11-30
DE69331188T2 (de) 2002-08-29
CA2117475A1 (en) 1993-08-19

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