HUP0004571A2 - Eljárás és berendezés anyagok által emittált, reflektált vagy áteresztett fény polarizációs tulajdonságainak vizsgálatára lézersugár-pásztázó mikroszkóppal - Google Patents

Eljárás és berendezés anyagok által emittált, reflektált vagy áteresztett fény polarizációs tulajdonságainak vizsgálatára lézersugár-pásztázó mikroszkóppal

Info

Publication number
HUP0004571A2
HUP0004571A2 HU0004571A HUP0004571A HUP0004571A2 HU P0004571 A2 HUP0004571 A2 HU P0004571A2 HU 0004571 A HU0004571 A HU 0004571A HU P0004571 A HUP0004571 A HU P0004571A HU P0004571 A2 HUP0004571 A2 HU P0004571A2
Authority
HU
Hungary
Prior art keywords
reflected
transmitted
determining
light emitted
laser scanning
Prior art date
Application number
HU0004571A
Other languages
English (en)
Inventor
Győző Garab
Reinhard Jörgens
István Pomozi
Georg Weiss
Original Assignee
Carl Zeiss Jena Gmbh.
Magyar Tudományos Akadémia Szegedi Biológiai Központ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Jena Gmbh., Magyar Tudományos Akadémia Szegedi Biológiai Központ filed Critical Carl Zeiss Jena Gmbh.
Priority to HU0004571A priority Critical patent/HU226937B1/hu
Publication of HU0004571D0 publication Critical patent/HU0004571D0/hu
Priority to EP01996722A priority patent/EP1334339B8/en
Priority to JP2002542833A priority patent/JP2004514129A/ja
Priority to PCT/HU2001/000116 priority patent/WO2002040953A1/en
Priority to AT01996722T priority patent/ATE372507T1/de
Priority to DE60130356T priority patent/DE60130356T2/de
Priority to US10/196,593 priority patent/US6856391B2/en
Publication of HUP0004571A2 publication Critical patent/HUP0004571A2/hu
Publication of HU226937B1 publication Critical patent/HU226937B1/hu

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
HU0004571A 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope HU226937B1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope
EP01996722A EP1334339B8 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope
JP2002542833A JP2004514129A (ja) 2000-11-17 2001-11-16 レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置
PCT/HU2001/000116 WO2002040953A1 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope
AT01996722T ATE372507T1 (de) 2000-11-17 2001-11-16 Verfahren und vorrichtung zur bestimmung der polarisationseigenschaften von licht, das durch ein material emittiert, reflektiert oder durchgelassen wird, durch verwendung eines laser- scan-mikroskops
DE60130356T DE60130356T2 (de) 2000-11-17 2001-11-16 Verfahren und vorrichtung zur bestimmung der polarisationseigenschaften von licht, das durch ein material emittiert, reflektiert oder durchgelassen wird, durch verwendung eines laser-scan-mikroskops
US10/196,593 US6856391B2 (en) 2000-11-17 2002-07-17 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope

Publications (3)

Publication Number Publication Date
HU0004571D0 HU0004571D0 (hu) 2001-02-28
HUP0004571A2 true HUP0004571A2 (hu) 2002-07-29
HU226937B1 HU226937B1 (en) 2010-03-29

Family

ID=89978770

Family Applications (1)

Application Number Title Priority Date Filing Date
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope

Country Status (7)

Country Link
US (1) US6856391B2 (hu)
EP (1) EP1334339B8 (hu)
JP (1) JP2004514129A (hu)
AT (1) ATE372507T1 (hu)
DE (1) DE60130356T2 (hu)
HU (1) HU226937B1 (hu)
WO (1) WO2002040953A1 (hu)

Families Citing this family (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7251029B2 (en) * 2002-07-01 2007-07-31 Canon Kabushiki Kaisha Birefringence measurement apparatus, strain remover, polarimeter and exposure apparatus
US7038848B2 (en) * 2002-12-27 2006-05-02 Olympus Corporation Confocal microscope
US7369234B2 (en) * 2003-02-03 2008-05-06 Rudolph Technologies, Inc. Method of performing optical measurement on a sample
EP1637871B1 (en) * 2003-05-30 2011-03-23 Olympus Corporation Measuring apparatus including a light-receiving unit
JP2005017282A (ja) * 2003-05-30 2005-01-20 Olympus Corp 受光ユニットおよびそれを含む測定装置
US7317517B2 (en) * 2003-07-31 2008-01-08 Intel Corporation Birefringence profiler
FR2872287B1 (fr) * 2004-06-28 2007-03-16 Cis Bio Internat Sa Procede d'amelioration de la detection des signaux de fluorescence lors d'un transfert d'energie non radiatif
US7630075B2 (en) * 2004-09-27 2009-12-08 Honeywell International Inc. Circular polarization illumination based analyzer system
US7412175B2 (en) * 2005-06-20 2008-08-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Interferometric polarization control
EP1980842A4 (en) * 2006-02-02 2011-01-05 Nat Univ Corp Nara Inst FLUORESCENT MICROSCOPE WITH CIRCULAR DICHROISM
JP4921090B2 (ja) * 2006-09-25 2012-04-18 株式会社モリテックス 光学異方性パラメータ測定方法及び測定装置
JP5189301B2 (ja) 2007-03-12 2013-04-24 オリンパス株式会社 レーザー走査型顕微鏡
EP1988373A1 (en) * 2007-05-02 2008-11-05 National University of Ireland Galway A vectorial polarimetry method and apparatus for analysing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating field and a sample to be observed
HUP0700635A2 (en) * 2007-09-28 2009-05-28 Mta Szegedi Biolog Koezpont Differential-polarizing accessory measuring block for laser scanning microscopes
KR20100010137A (ko) * 2008-07-22 2010-02-01 삼성전기주식회사 프로젝션 디스플레이 장치
JP5877155B2 (ja) 2010-07-26 2016-03-02 オリンパス株式会社 発光プローブを用いて溶液中の希薄粒子を検出する方法
JP5856962B2 (ja) 2010-09-10 2016-02-10 オリンパス株式会社 単一発光粒子の光強度を用いた光分析方法
WO2012032955A1 (ja) 2010-09-10 2012-03-15 オリンパス株式会社 複数の波長帯域の光計測を用いた光分析方法
EP2620763A4 (en) * 2010-10-19 2015-05-27 Olympus Corp OPTICAL ANALYSIS DEVICE FOR OBSERVING THE POLARIZATION CHARACTERISTICS OF A SINGLE LIGHT-EMITTING PARTICLE, OPTICAL ANALYSIS METHOD, AND OPTICAL ANALYSIS COMPUTER PROGRAM
DE102010049751B4 (de) * 2010-10-29 2020-11-05 "Stiftung Caesar" (Center Of Advanced European Studies And Research) Optischer Strahlteiler zur simultanen Aufnahme eines Z-Stapels auf einem Halbleiterchip, Bausatz zum Aufbau eines optischen Strahlteilers und Lichtmikroskop
EP2631631B1 (en) 2010-11-25 2016-01-20 Olympus Corporation Photometric analysis device and photometric analysis method using wavelength characteristic of light emitted from single illuminant particle
JP5856983B2 (ja) 2011-01-20 2016-02-10 オリンパス株式会社 単一発光粒子からの光の検出を用いた光分析方法及び光分析装置
WO2012102326A1 (ja) 2011-01-26 2012-08-02 オリンパス株式会社 核酸分子の多型識別方法
JP5856984B2 (ja) 2011-01-26 2016-02-10 オリンパス株式会社 核酸分子の多型識別方法
JP5904996B2 (ja) 2011-03-29 2016-04-20 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法並びに光分析用コンピュータプログラム
WO2012141019A1 (ja) 2011-04-13 2012-10-18 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
JP6013328B2 (ja) 2011-04-18 2016-10-25 オリンパス株式会社 標的粒子の定量方法
JP6013335B2 (ja) 2011-08-11 2016-10-25 オリンパス株式会社 標的粒子の計数方法
CN103733049B (zh) 2011-08-15 2016-01-20 奥林巴斯株式会社 利用单个发光粒子检测的光分析装置、光分析方法以及光分析用计算机程序
EP2749868B1 (en) 2011-08-26 2019-02-27 Olympus Corporation Single-particle detector using optical analysis, single-particle detection method using same, and computer program for single-particle detection
WO2013031439A1 (ja) 2011-08-26 2013-03-07 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
JP6010035B2 (ja) 2011-08-30 2016-10-19 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
EP2752655A4 (en) 2011-08-30 2015-06-17 Olympus Corp PROCEDURE FOR DETECTING TARGET PARTICLES
EP2778658A4 (en) 2011-11-10 2015-12-02 Olympus Corp SPECTROSCOPY DEVICE, SPECTROSCOPY PROCESS AND SPECTROSCOPY COMPUTER PROGRAM DETECTING SINGLE LIGHT-EMITTING PARTICLES
JP5996625B2 (ja) 2012-02-17 2016-09-21 オリンパス株式会社 単一粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
CN104115003B (zh) 2012-02-22 2016-03-23 奥林巴斯株式会社 目标粒子的检测方法
WO2013140890A1 (ja) 2012-03-21 2013-09-26 オリンパス株式会社 標的核酸分子の検出方法
EP2840380A4 (en) 2012-04-18 2015-11-25 Olympus Corp SINGLE PARTICLE DETECTOR WITH PHOTO ANALYSIS, SINGLE PARTICLE PROCESSING AND COMPUTER PROGRAM FOR SINGLE PARTICLE DETECTION
WO2013157283A1 (ja) 2012-04-18 2013-10-24 オリンパス株式会社 標的粒子の検出方法
JP6087751B2 (ja) * 2013-07-05 2017-03-01 株式会社モリテックス 光学異方性パラメータ測定装置、測定方法及び測定用プログラム
EP3029505A4 (en) 2013-07-31 2017-03-15 Olympus Corporation Optical microscope device, microscopy method, and computer program for microscopy using single-light-emitting-particle detection technology
US9989454B2 (en) * 2013-10-04 2018-06-05 Axometrics, Inc. Method and apparatus for measuring parameters of optical anisotropy
EP3059577A4 (en) 2013-10-07 2017-05-31 Olympus Corporation Photometric analysis device employing single light-emitting particle detection, photometric analysis method, and computer program for photometric analysis
WO2015084964A1 (en) * 2013-12-03 2015-06-11 The General Hospital Corporation Compensating for input polarization mode variations
CN103940537A (zh) * 2014-04-10 2014-07-23 中国科学院半导体研究所 材料的微区应力测试系统
GB201411478D0 (en) * 2014-06-27 2014-08-13 Univ Salford Entpr Ltd Measuring polarisation
TWI542864B (zh) * 2014-12-30 2016-07-21 財團法人工業技術研究院 異向性量測系統、異向性量測方法及其校正方法
WO2017000116A1 (zh) * 2015-06-29 2017-01-05 北京旷视科技有限公司 活体检测方法、活体检测系统以及计算机程序产品
GB201515862D0 (en) 2015-09-08 2015-10-21 Univ Southampton Polarisation microscope
JPWO2017098597A1 (ja) 2015-12-09 2018-10-11 オリンパス株式会社 単一発光粒子検出を用いた光分析方法及び光分析装置
JP2020502558A (ja) 2016-11-10 2020-01-23 ザ トラスティーズ オブ コロンビア ユニバーシティ イン ザ シティ オブ ニューヨーク 大型試料のための高速・高解像度イメージング方法
JP6351893B1 (ja) * 2018-02-26 2018-07-04 日本分光株式会社 位相差制御装置
EP3884295A4 (en) * 2018-11-21 2022-08-17 The Board of Trustees of the Leland Stanford Junior University METHODS OF EXTENDED FIELD NANOSECOND IMAGING USING EXTENDED FIELD OPTICAL MODULATORS
CN110261319B (zh) * 2019-06-24 2021-11-16 西安理工大学 基于四次测量Mueller矩阵光谱的装置及测量方法
EP3907492A1 (en) * 2020-05-08 2021-11-10 ETH Zurich Optical activity measurements with frequency modulation
US20240027186A1 (en) * 2022-07-22 2024-01-25 Onto Innovation Inc. Apparatus to characterize substrates and films

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4306809A (en) * 1979-03-26 1981-12-22 The Board Of Regents Of The University Of Nebraska Polarimeter
US5257092A (en) * 1990-06-27 1993-10-26 Asahi Kogaku Kogyo Kabushiki Kaisha Apparatus for measuring polarization and birefringence
JPH063594A (ja) * 1992-06-18 1994-01-14 Nikon Corp コンフォーカルレーザ走査微分干渉顕微鏡
US5457536A (en) * 1994-04-04 1995-10-10 California Institute Of Technology Polarization modulation laser scanning microscopy
JPH08160305A (ja) * 1994-12-08 1996-06-21 Nikon Corp レーザー走査顕微鏡
US5764363A (en) * 1995-06-30 1998-06-09 Nikon Corporation Apparatus for observing a surface using polarized light
DE19680643T1 (de) * 1995-06-30 1997-07-24 Furukawa Electric Co Ltd Verfahren und Vorrichtung zur Messung und Bestimmung des Polarisationszustands, der Polarisationseigenschaften und der Polarisationsmodendispersion
WO1998013676A1 (fr) * 1996-09-24 1998-04-02 Laboratory Of Molecular Biophotonics Procede et dispositif pour mesurer la polarisation
FR2755254B1 (fr) * 1996-10-25 1999-01-15 Centre Nat Rech Scient Composant optique de modulation, polarimetre et ellipsometre de mueller comprenant un tel composant optique, procede de calibrage de cet ellipsometre et procede de mesure ellipsometrique
US6134011A (en) * 1997-09-22 2000-10-17 Hdi Instrumentation Optical measurement system using polarized light
JPH1195114A (ja) * 1997-09-24 1999-04-09 Olympus Optical Co Ltd 走査型光学顕微鏡装置
US6097488A (en) * 1998-06-22 2000-08-01 Princeton University Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light
EP1218707A1 (en) * 1999-07-27 2002-07-03 Colorado School Of Mines Parallel detecting, spectroscopic ellipsometers/polarimeters
US6356036B1 (en) * 2000-12-01 2002-03-12 Laser Diagnostic Technologies, Inc. System and method for determining birefringence of anterior segment of a patient's eye

Also Published As

Publication number Publication date
EP1334339A1 (en) 2003-08-13
DE60130356D1 (de) 2007-10-18
US20030058442A1 (en) 2003-03-27
US6856391B2 (en) 2005-02-15
EP1334339B1 (en) 2007-09-05
WO2002040953A1 (en) 2002-05-23
DE60130356T2 (de) 2008-05-08
JP2004514129A (ja) 2004-05-13
HU0004571D0 (hu) 2001-02-28
HU226937B1 (en) 2010-03-29
ATE372507T1 (de) 2007-09-15
EP1334339B8 (en) 2007-12-26

Similar Documents

Publication Publication Date Title
HUP0004571A2 (hu) Eljárás és berendezés anyagok által emittált, reflektált vagy áteresztett fény polarizációs tulajdonságainak vizsgálatára lézersugár-pásztázó mikroszkóppal
AU2002357016A1 (en) Scanning microscopy, fluorescence detection, and laser beam positioning
AU2002221206A1 (en) An apparatus for light beam guided biopsy
AU3996299A (en) Diode laser based measurement apparatus
AU2000247788A1 (en) Laser beam applying probe
AU3872699A (en) Eye examination apparatus employing polarized light probe
AU2002331063A1 (en) Method and apparatus for optical beam alignment detection and control
AU2001238490A1 (en) Optical device and method for multi-angle laser light scatter
AU2002218409A1 (en) Method and apparatus for interrogating fiber optic sensors
WO2005088242A3 (de) Verfahren und abtastanordnung zum berührungslosen abtasten dreidimensionaler objekte und haltervorrichtung für objekte
EP1192688A4 (en) APPARATUS FOR GENERATING LINEAR OR ORTHOGONIC POLARIZED LIGHT BEAMS
AU2001265416A1 (en) Method and apparatus for beam forming
AU2003295766A1 (en) Method and apparatus for scanning an optical beam using an optical conduit
AU2001260481A1 (en) Apparatus for interrogating an optical signal
AU2002330380A1 (en) Laser beam irradiation device
WO2001023289A3 (de) Vorrichtung und verfahren zur erfassung von papierbögen
AU2001270935A1 (en) Method and apparatus for measuring the optical characteristics of light sources
DE60120538D1 (de) Optisches System zum Lichtabtasten und Bilderzeugungsvorrichtung unter Verwendung desselben
GB0113360D0 (en) Method,apparatus and scanning microscope with means for stabilizing the temperature of optical components
GB0113359D0 (en) Scanning microscope having an optical circulator
AU2001249191A1 (en) Optical sensor arrangement for start of scan detection and improved vertical beam alignment range
GB2381690B (en) Device for beam shut-off in a laser scanning microscope
AU2001228963A1 (en) Device and method for scanning a beam of light over an object
AU2001264542A1 (en) Edfl multiple wavelength laser source
AU2001248326A1 (en) Laser beam welding device and method for laser beam welding

Legal Events

Date Code Title Description
GB9A Succession in title

Owner name: MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI K, HU

Free format text: FORMER OWNER(S): MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI KOEZPONT, HU; CARL ZEISS JENA GMBH., DE

QB4A Exploitation contract

Name of requester: CARL ZEISS JENA GMBH, DE

MM4A Lapse of definitive patent protection due to non-payment of fees