AU2001270935A1 - Method and apparatus for measuring the optical characteristics of light sources - Google Patents

Method and apparatus for measuring the optical characteristics of light sources

Info

Publication number
AU2001270935A1
AU2001270935A1 AU2001270935A AU7093501A AU2001270935A1 AU 2001270935 A1 AU2001270935 A1 AU 2001270935A1 AU 2001270935 A AU2001270935 A AU 2001270935A AU 7093501 A AU7093501 A AU 7093501A AU 2001270935 A1 AU2001270935 A1 AU 2001270935A1
Authority
AU
Australia
Prior art keywords
measuring
light sources
optical characteristics
optical
sources
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001270935A
Inventor
David N. Beaudry
Christopher N. Durrell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Labsphere Inc
Original Assignee
Labsphere Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Labsphere Inc filed Critical Labsphere Inc
Publication of AU2001270935A1 publication Critical patent/AU2001270935A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
AU2001270935A 2000-07-28 2001-07-20 Method and apparatus for measuring the optical characteristics of light sources Abandoned AU2001270935A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09628093 2000-07-28
US09/628,093 US6597195B1 (en) 2000-07-28 2000-07-28 Method of and cassette structure for burn-in and life testing of multiple LEDs and the like
PCT/IB2001/001298 WO2002010697A2 (en) 2000-07-28 2001-07-20 Method and apparatus for measuring the optical characteristics of light sources

Publications (1)

Publication Number Publication Date
AU2001270935A1 true AU2001270935A1 (en) 2002-02-13

Family

ID=24517434

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001270935A Abandoned AU2001270935A1 (en) 2000-07-28 2001-07-20 Method and apparatus for measuring the optical characteristics of light sources

Country Status (3)

Country Link
US (1) US6597195B1 (en)
AU (1) AU2001270935A1 (en)
WO (1) WO2002010697A2 (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6873172B2 (en) * 2001-05-14 2005-03-29 Bandwidth9, Inc. Automated laser diode test system
US20030222672A1 (en) * 2002-05-31 2003-12-04 Paul Winer Testing optical displays
US20040135595A1 (en) * 2002-10-30 2004-07-15 Finisar Corporation Methods, systems, and devices for burn-in testing of optoelectronic devices
US20060226848A1 (en) * 2005-03-30 2006-10-12 Youngtek Electronics Corporation Mass-production LED test device for mass production
CN100476389C (en) * 2006-11-30 2009-04-08 复旦大学 Luminous flux measurement device using standard light source in narrow beam for LED, and testing method
KR100978246B1 (en) * 2008-10-01 2010-08-26 한국표준과학연구원 Instrument and method for measuring total luminous flux of luminous elements
US7733114B2 (en) * 2008-10-21 2010-06-08 Asm Assembly Automation Ltd. Test handler including gripper-type test contactor
JP5327489B2 (en) * 2009-02-20 2013-10-30 キューエムシー カンパニー リミテッド LL chip test equipment
TWI431291B (en) * 2011-07-14 2014-03-21 Chroma Ate Inc Testing apparatus for light emitting diodes
CN102590763B (en) * 2012-03-05 2014-10-08 常州市产品质量监督检验所 LED (light emitting diode) service life test system and test method thereof
CN102654558A (en) * 2012-05-03 2012-09-05 威力盟电子(苏州)有限公司 Light-emitting diode (LED) testing device
CN103487670A (en) * 2012-06-08 2014-01-01 旺矽科技股份有限公司 Photoelectric component detection method and detection equipment implementing same
CN103424718B (en) * 2013-08-08 2015-10-07 广州市光机电技术研究院 The on-line automatic integrated test system of many light fixtures and method
US9874597B2 (en) * 2014-04-30 2018-01-23 Kla-Tenor Corporation Light-emitting device test systems
CN104297663B (en) * 2014-11-06 2017-01-18 浙江中博光电科技有限公司 LED light source contrast detection method
TWI746292B (en) * 2020-11-27 2021-11-11 茂達電子股份有限公司 Circuit measuring device and method

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4611116A (en) * 1984-02-21 1986-09-09 Batt James E Light emitting diode intensity tester
US4489477A (en) * 1984-02-23 1984-12-25 Northern Telecom Limited Method for screening laser diodes
US4808815A (en) * 1987-03-23 1989-02-28 Genrad, Inc. Apparatus for testing light-emitting devices using probe means having a preselected pattern arrangement
US4897672A (en) * 1987-07-02 1990-01-30 Fujitsu Limited Method and apparatus for detecting and compensating light emission from an LED array
US4926545A (en) * 1989-05-17 1990-05-22 At&T Bell Laboratories Method of manufacturing optical assemblies
US5389953A (en) * 1991-01-02 1995-02-14 Eastman Kodak Company Non-impact printer module with improved burn-in testing capability and method using same
AU644518B2 (en) 1991-04-29 1993-12-09 Labsphere, Inc. Integrating sphere for diffuse reflectance and transmittance measurements and the like
JP3014216B2 (en) * 1992-05-15 2000-02-28 松下電器産業株式会社 Spectral radiation flux measuring device and total luminous flux measuring device
US5381103A (en) * 1992-10-13 1995-01-10 Cree Research, Inc. System and method for accelerated degradation testing of semiconductor devices
JP3117565B2 (en) * 1992-11-27 2000-12-18 松下電器産業株式会社 Luminometer
US5699103A (en) * 1994-12-20 1997-12-16 Eastman Kodak Company Method for producing a calibrated array of light-emitting diodes and apparatus including the calibrated array
DE19515865A1 (en) * 1995-04-29 1996-10-31 Schoeniger Karl Heinz Light power output testing and comparison arrangement for LED's
US5793220A (en) * 1996-08-12 1998-08-11 Micron Electronics, Inc. Fixture for testing and prepping light-emitting diodes
GB9717858D0 (en) * 1997-08-23 1997-10-29 Electrode Company Ltd The Electrode Company Ltd
US6222172B1 (en) * 1998-02-04 2001-04-24 Photobit Corporation Pulse-controlled light emitting diode source

Also Published As

Publication number Publication date
WO2002010697A3 (en) 2002-06-13
US6597195B1 (en) 2003-07-22
WO2002010697A2 (en) 2002-02-07

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