AU2000274441A1 - Optical measurement apparatus and method for optical measurement - Google Patents
Optical measurement apparatus and method for optical measurementInfo
- Publication number
- AU2000274441A1 AU2000274441A1 AU2000274441A AU7444100A AU2000274441A1 AU 2000274441 A1 AU2000274441 A1 AU 2000274441A1 AU 2000274441 A AU2000274441 A AU 2000274441A AU 7444100 A AU7444100 A AU 7444100A AU 2000274441 A1 AU2000274441 A1 AU 2000274441A1
- Authority
- AU
- Australia
- Prior art keywords
- optical measurement
- measurement apparatus
- optical
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000005259 measurement Methods 0.000 title 2
- 230000003287 optical effect Effects 0.000 title 2
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4413—Type
- G01J2001/442—Single-photon detection or photon counting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4413—Type
- G01J2001/4433—Peak sensing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/444—Compensating; Calibrating, e.g. dark current, temperature drift, noise reduction or baseline correction; Adjusting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/446—Photodiode
- G01J2001/4466—Avalanche
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2000/006562 WO2002027284A1 (en) | 2000-09-25 | 2000-09-25 | Optical measurement apparatus and method for optical measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2000274441A1 true AU2000274441A1 (en) | 2002-04-08 |
Family
ID=11736511
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2000274441A Abandoned AU2000274441A1 (en) | 2000-09-25 | 2000-09-25 | Optical measurement apparatus and method for optical measurement |
Country Status (4)
Country | Link |
---|---|
US (1) | US6940589B1 (en) |
EP (1) | EP1329700A4 (en) |
AU (1) | AU2000274441A1 (en) |
WO (1) | WO2002027284A1 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2398118B (en) * | 2003-02-07 | 2006-03-15 | Imp College Innovations Ltd | Photon arrival time detection |
US7858917B2 (en) * | 2003-05-02 | 2010-12-28 | Massachusetts Institute Of Technology | Digital photon-counting geiger-mode avalanche photodiode solid-state monolithic intensity imaging focal-plane with scalable readout circuitry |
ITUD20050119A1 (en) * | 2005-07-18 | 2007-01-19 | Neuricam Spa | PHOTOSENSITIVE ELEMENT FOR ELECTRO-OPTICAL SENSORS |
WO2008054883A2 (en) * | 2006-06-07 | 2008-05-08 | Xrf Corporation | Devices and methods for detecting and analyzing radiation |
JP5138701B2 (en) | 2006-12-22 | 2013-02-06 | ワシントン・ユニバーシティ | High performance imaging system for diffuse optical tomography and associated methods of use |
US9480425B2 (en) | 2008-04-17 | 2016-11-01 | Washington University | Task-less optical mapping of dynamic brain function using resting state functional connectivity |
JP5494063B2 (en) * | 2010-03-17 | 2014-05-14 | コニカミノルタ株式会社 | Control device and image forming apparatus |
CN106052861B (en) * | 2016-07-27 | 2017-08-29 | 武汉京邦科技有限公司 | A kind of silicon photoelectric multiplier test system and method for testing |
FR3058230B1 (en) * | 2016-10-27 | 2019-03-15 | Detection Technology Sas | SPECTROMETRY DEVICE |
CN106949979A (en) * | 2017-02-09 | 2017-07-14 | 北京建筑大学 | A kind of light velocity measurement method based on LC oscillating circuits |
US10852399B2 (en) * | 2018-03-30 | 2020-12-01 | Tower Semiconductor Ltd. | Active quenching for single-photon avalanche diode using one- shot circuit |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63184073A (en) * | 1986-07-23 | 1988-07-29 | Shimadzu Corp | Peak value detecting circuit |
JP3413241B2 (en) | 1993-05-07 | 2003-06-03 | 浜松ホトニクス株式会社 | Electron tube |
US5349193A (en) * | 1993-05-20 | 1994-09-20 | Princeton Gamma Tech, Inc. | Highly sensitive nuclear spectrometer apparatus and method |
JPH08148113A (en) * | 1994-11-24 | 1996-06-07 | Hamamatsu Photonics Kk | Photomultiplier |
FR2738919B1 (en) * | 1995-09-15 | 1997-10-17 | Commissariat Energie Atomique | METHOD AND DEVICE FOR THE CORRECTION OF SPECTROMETRIC MEASUREMENT IN THE FIELD OF GAMMA PHOTON DETECTION |
JPH09196752A (en) * | 1995-11-15 | 1997-07-31 | Bunshi Bio Photonics Kenkyusho:Kk | Light measuring apparatus |
JPH09189604A (en) * | 1996-01-11 | 1997-07-22 | Hamamatsu Photonics Kk | Method for determining counting prohibited time, and photon counter |
JPH09297055A (en) | 1996-05-02 | 1997-11-18 | Hamamatsu Photonics Kk | Electron tube |
JPH09312145A (en) | 1996-05-23 | 1997-12-02 | Hamamatsu Photonics Kk | Electron tube |
JPH10300573A (en) * | 1997-04-30 | 1998-11-13 | Asahi Optical Co Ltd | Quantity of light measuring apparatus |
JP3742491B2 (en) * | 1997-07-22 | 2006-02-01 | 浜松ホトニクス株式会社 | Optical waveform measuring device |
JP3742490B2 (en) | 1997-07-22 | 2006-02-01 | 浜松ホトニクス株式会社 | Optical waveform measuring device |
US6189221B1 (en) * | 1998-12-31 | 2001-02-20 | The Rival Company | Can opener appliance having a side-cutting mechanism |
JP2000275101A (en) * | 1999-03-26 | 2000-10-06 | Hamamatsu Photonics Kk | Apparatus and method for measuring light |
-
2000
- 2000-09-25 AU AU2000274441A patent/AU2000274441A1/en not_active Abandoned
- 2000-09-25 EP EP00962814A patent/EP1329700A4/en not_active Withdrawn
- 2000-09-25 WO PCT/JP2000/006562 patent/WO2002027284A1/en active Application Filing
- 2000-09-25 US US10/381,370 patent/US6940589B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1329700A1 (en) | 2003-07-23 |
US6940589B1 (en) | 2005-09-06 |
EP1329700A4 (en) | 2011-03-23 |
WO2002027284A1 (en) | 2002-04-04 |
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