DE10333821A1 - Flexible Bildgebungseinrichtung und digitales Bildgebungsverfahren - Google Patents
Flexible Bildgebungseinrichtung und digitales Bildgebungsverfahren Download PDFInfo
- Publication number
- DE10333821A1 DE10333821A1 DE10333821A DE10333821A DE10333821A1 DE 10333821 A1 DE10333821 A1 DE 10333821A1 DE 10333821 A DE10333821 A DE 10333821A DE 10333821 A DE10333821 A DE 10333821A DE 10333821 A1 DE10333821 A1 DE 10333821A1
- Authority
- DE
- Germany
- Prior art keywords
- flexible
- imaging device
- digital imaging
- subject
- photosensors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 199
- 230000005855 radiation Effects 0.000 claims abstract description 68
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- 235000012239 silicon dioxide Nutrition 0.000 description 2
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
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- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- MCVAAHQLXUXWLC-UHFFFAOYSA-N [O-2].[O-2].[S-2].[Gd+3].[Gd+3] Chemical compound [O-2].[O-2].[S-2].[Gd+3].[Gd+3] MCVAAHQLXUXWLC-UHFFFAOYSA-N 0.000 description 1
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- JAONJTDQXUSBGG-UHFFFAOYSA-N dialuminum;dizinc;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Al+3].[Al+3].[Zn+2].[Zn+2] JAONJTDQXUSBGG-UHFFFAOYSA-N 0.000 description 1
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- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 1
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- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 1
- 229910003451 terbium oxide Inorganic materials 0.000 description 1
- SCRZPWWVSXWCMC-UHFFFAOYSA-N terbium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[Tb+3].[Tb+3] SCRZPWWVSXWCMC-UHFFFAOYSA-N 0.000 description 1
- IFLREYGFSNHWGE-UHFFFAOYSA-N tetracene Chemical compound C1=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C21 IFLREYGFSNHWGE-UHFFFAOYSA-N 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
- 230000005676 thermoelectric effect Effects 0.000 description 1
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- 239000002699 waste material Substances 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Radiography Using Non-Light Waves (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/064549 | 2002-07-25 | ||
| US10/064,549 US7078702B2 (en) | 2002-07-25 | 2002-07-25 | Imager |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE10333821A1 true DE10333821A1 (de) | 2004-02-12 |
Family
ID=30442217
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE10333821A Withdrawn DE10333821A1 (de) | 2002-07-25 | 2003-07-24 | Flexible Bildgebungseinrichtung und digitales Bildgebungsverfahren |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7078702B2 (https=) |
| JP (1) | JP4524082B2 (https=) |
| DE (1) | DE10333821A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12025757B2 (en) | 2017-08-03 | 2024-07-02 | The Research Foundation For The State University Of New York | Dual-screen digital radiography with asymmetric reflective screens |
Families Citing this family (121)
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|---|---|---|---|---|
| US7057256B2 (en) | 2001-05-25 | 2006-06-06 | President & Fellows Of Harvard College | Silicon-based visible and near-infrared optoelectric devices |
| US7442629B2 (en) | 2004-09-24 | 2008-10-28 | President & Fellows Of Harvard College | Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate |
| DE10136756C2 (de) * | 2001-07-27 | 2003-07-31 | Siemens Ag | Röntgendiagnostikeinrichtung mit einem flexiblen Festkörper-Röntgendetektor |
| US7235790B2 (en) * | 2004-02-17 | 2007-06-26 | Ge Medical Systems Global Technology Company, Llc | Methods and apparatus for radiation detection |
| US7112877B2 (en) * | 2004-06-28 | 2006-09-26 | General Electric Company | High density package with wrap around interconnect |
| JP4534673B2 (ja) * | 2004-08-31 | 2010-09-01 | 日産自動車株式会社 | 機能性薄膜素子、機能性薄膜素子の製造方法及び機能性薄膜素子を用いた物品 |
| JP4817636B2 (ja) * | 2004-10-04 | 2011-11-16 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
| US7453065B2 (en) * | 2004-11-10 | 2008-11-18 | Canon Kabushiki Kaisha | Sensor and image pickup device |
| KR100669802B1 (ko) * | 2004-12-04 | 2007-01-16 | 삼성에스디아이 주식회사 | 박막 트랜지스터, 이의 제조 방법 및 상기 박막트랜지스터를 구비한 평판 표시 장치 |
| GB0504415D0 (en) * | 2005-03-03 | 2005-04-06 | E2V Tech Uk Ltd | Non-planar x-ray sensor |
| JP5095114B2 (ja) * | 2005-03-25 | 2012-12-12 | 富士フイルム株式会社 | 固体撮像装置の製造方法 |
| WO2006101270A1 (en) * | 2005-03-25 | 2006-09-28 | Fujifilm Corporation | Solid state imaging device and manufacturing method thereof |
| JP5095113B2 (ja) * | 2005-03-25 | 2012-12-12 | 富士フイルム株式会社 | 固体撮像装置の製造方法、及び固体撮像装置 |
| US20090053850A1 (en) * | 2005-03-25 | 2009-02-26 | Fujifilm Corporation | Method of manufacturing solid state imaging device |
| US7563026B2 (en) * | 2005-09-08 | 2009-07-21 | Schick Technologies, Inc. | Flexible intra-oral x-ray imaging device |
| JP2007101256A (ja) * | 2005-09-30 | 2007-04-19 | Fujifilm Corp | Ｘ線撮像装置及びｘ線ｃｔ装置 |
| JP5129473B2 (ja) * | 2005-11-15 | 2013-01-30 | 富士フイルム株式会社 | 放射線検出器 |
| GB2432722A (en) * | 2005-11-25 | 2007-05-30 | Seiko Epson Corp | Electrochemical cell and method of manufacture |
| GB2432723B (en) * | 2005-11-25 | 2010-12-08 | Seiko Epson Corp | Electrochemical cell and method of manufacture |
| GB2432721B (en) * | 2005-11-25 | 2011-06-22 | Seiko Epson Corp | Electrochemical cell structure and method of fabrication |
| JP2007180844A (ja) * | 2005-12-27 | 2007-07-12 | Canon Inc | 画像読取装置および画像形成装置 |
| FR2901609B1 (fr) * | 2006-05-24 | 2009-01-16 | Airbus France Sas | Dispositif de controle non destructif d'une piece par analyse de dissipation de rayonnement |
| JP4650433B2 (ja) * | 2007-01-25 | 2011-03-16 | コニカミノルタエムジー株式会社 | 放射線画像変換パネルの読み取りシステム及び放射線画像変換パネル |
| US7708968B2 (en) | 2007-03-26 | 2010-05-04 | General Electric Company | Nano-scale metal oxide, oxyhalide and oxysulfide scintillation materials and methods for making same |
| US7608829B2 (en) * | 2007-03-26 | 2009-10-27 | General Electric Company | Polymeric composite scintillators and method for making same |
| US7625502B2 (en) * | 2007-03-26 | 2009-12-01 | General Electric Company | Nano-scale metal halide scintillation materials and methods for making same |
| WO2008148225A1 (de) * | 2007-06-07 | 2008-12-11 | Hafner, Georg | Vorrichtung und verfahren zur zerstörungsfreien prüfung von gegenständen |
| US8309952B2 (en) * | 2007-08-28 | 2012-11-13 | Toppan Printing Co., Ltd. | Thin film transistor and method for manufacturing the same |
| KR101393633B1 (ko) * | 2007-10-31 | 2014-05-09 | 삼성디스플레이 주식회사 | 엑스레이 검출 패널, 엑스레이 검출기 및 엑스레이검출기의 구동 방법 |
| JP5142943B2 (ja) | 2007-11-05 | 2013-02-13 | キヤノン株式会社 | 放射線検出装置の製造方法、放射線検出装置及び放射線撮像システム |
| JP2009130209A (ja) * | 2007-11-26 | 2009-06-11 | Fujifilm Corp | 放射線撮像素子 |
| US7824949B2 (en) * | 2007-12-21 | 2010-11-02 | Palo Alto Research Center Incorporated | Structure and method for flexible sensor array |
| DE102007062708A1 (de) * | 2007-12-27 | 2009-07-02 | Robert Bosch Gmbh | Bildaufnehmer, sowie Verfahren und Verwendung |
| US8077235B2 (en) * | 2008-01-22 | 2011-12-13 | Palo Alto Research Center Incorporated | Addressing of a three-dimensional, curved sensor or display back plane |
| US7935932B2 (en) * | 2008-01-31 | 2011-05-03 | Fujifilm Corporation | Radiation detection apparatus |
| US7973311B2 (en) * | 2008-05-30 | 2011-07-05 | Palo Alto Research Center Incorporated | Isolated sensor structures such as for flexible substrates |
| US7649205B2 (en) * | 2008-05-30 | 2010-01-19 | Palo Alto Research Center Incorporated | Self-aligned thin-film transistor and method of forming same |
| JP5137763B2 (ja) * | 2008-09-26 | 2013-02-06 | 富士フイルム株式会社 | 放射線検出装置及び放射線画像撮影システム |
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| JP2010085266A (ja) * | 2008-09-30 | 2010-04-15 | Fujifilm Corp | 放射線検出装置及び放射線撮影システム |
| JP2010085259A (ja) * | 2008-09-30 | 2010-04-15 | Fujifilm Corp | 放射線検出装置及び放射線撮影システム |
| US9991311B2 (en) * | 2008-12-02 | 2018-06-05 | Arizona Board Of Regents On Behalf Of Arizona State University | Dual active layer semiconductor device and method of manufacturing the same |
| WO2010085478A1 (en) * | 2009-01-22 | 2010-07-29 | Bae Systems Information And Electronic Systems Inc. | Corner cube enhanced photocathode |
| US20100210930A1 (en) * | 2009-02-13 | 2010-08-19 | Saylor Stephen D | Physiological Blood Gas Detection Apparatus and Method |
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| JP2004064087A (ja) | 2004-02-26 |
| US7078702B2 (en) | 2006-07-18 |
| JP4524082B2 (ja) | 2010-08-11 |
| US20040016886A1 (en) | 2004-01-29 |
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