WO2020213659A1 - ペリクル、ペリクル付露光原版、半導体装置の製造方法、液晶表示板の製造方法、露光原版の再生方法及び剥離残渣低減方法 - Google Patents
ペリクル、ペリクル付露光原版、半導体装置の製造方法、液晶表示板の製造方法、露光原版の再生方法及び剥離残渣低減方法 Download PDFInfo
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- WO2020213659A1 WO2020213659A1 PCT/JP2020/016624 JP2020016624W WO2020213659A1 WO 2020213659 A1 WO2020213659 A1 WO 2020213659A1 JP 2020016624 W JP2020016624 W JP 2020016624W WO 2020213659 A1 WO2020213659 A1 WO 2020213659A1
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- pellicle
- original plate
- exposure original
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/38—Pressure-sensitive adhesives [PSA]
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
- G03F1/64—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F220/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
- C08F220/02—Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
- C08F220/10—Esters
- C08F220/26—Esters containing oxygen in addition to the carboxy oxygen
- C08F220/28—Esters containing oxygen in addition to the carboxy oxygen containing no aromatic rings in the alcohol moiety
- C08F220/281—Esters containing oxygen in addition to the carboxy oxygen containing no aromatic rings in the alcohol moiety and containing only one oxygen, e.g. furfuryl (meth)acrylate or 2-methoxyethyl (meth)acrylate
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/08—Macromolecular additives
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J129/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Adhesives based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Adhesives based on derivatives of such polymers
- C09J129/10—Homopolymers or copolymers of unsaturated ethers
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/04—Homopolymers or copolymers of esters
- C09J133/14—Homopolymers or copolymers of esters of esters containing halogen, nitrogen, sulfur or oxygen atoms in addition to the carboxy oxygen
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/26—Phase shift masks [PSM]; PSM blanks; Preparation thereof
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/66—Containers specially adapted for masks, mask blanks or pellicles; Preparation thereof
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70983—Optical system protection, e.g. pellicles or removable covers for protection of mask
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
Definitions
- the present invention relates to a pellicle, an exposure original plate with a pellicle, a method for manufacturing a semiconductor device, a method for manufacturing a liquid crystal display plate, a method for regenerating an exposure original plate, and a method for reducing peeling residue.
- the "exposure original plate” is a general term for a mask for lithography and a reticle.
- the basic structure of the pellicle consists of a pellicle frame and a pellicle membrane stretched on the pellicle frame.
- the pellicle film is made of nitrocellulose, cellulose acetate, a fluorine-based polymer, or the like that well transmits light used for exposure (g-line, i-line, 248 nm, 193 nm, 157 nm, etc.).
- the pellicle frame is made of an aluminum alloy such as A7075, A6061, A5052, which has been subjected to black alumite treatment or the like, stainless steel, polyethylene, or the like.
- a good solvent for the pellicle film is applied to the upper part of the pellicle frame, and the pellicle film is air-dried and adhered, or adhered with an adhesive such as acrylic resin, epoxy resin, or fluororesin. Further, since the exposure original plate is mounted on the lower part of the pellicle frame, it is used for protection for the purpose of protecting the pressure-sensitive adhesive layer obtained from polybutene resin, polyvinyl acetate resin, acrylic resin, silicone resin, etc., and the pressure-sensitive adhesive layer. Provide a liner.
- the pellicle is installed so as to surround the pattern area formed on the surface of the exposure original plate. Since the pellicle is provided to prevent dust from adhering to the exposure original plate, the pattern region and the outside of the pellicle are separated from each other so that dust outside the pellicle does not adhere to the pattern surface.
- phase shift film As the mask substrate film used in recent years, a phase shift film has come to be generally adopted in order to cope with the miniaturization of design rules.
- the phase shift film is very delicate, and mask cleaning under excessive conditions may damage the phase shift film such as corrosion and scraping. Therefore, in recent years, the chemical solution used for mask cleaning has been reexamined. Or tend to weaken the cleaning conditions.
- the mask pattern of advanced products has changed from the positive type mask pattern, which has been the mainstream until now, to the negative type mask pattern, and along with this, there is no light-shielding layer in the part where the pellicle is attached. There are many. Without the light-shielding layer, the pellicle adhesive may be exposed to light through the mask substrate. Then, when the pellicle is peeled off, more residue of the adhesive layer may remain on the mask substrate.
- repelicle When the pellicle is used by attaching it to the mask, if foreign matter or haze is generated or the pellicle film is damaged, it is necessary to peel off the pellicle, re-clean the mask, and replace it with a new pellicle. (Hereafter referred to as "repellicle"). The most important thing in the repelicle is to re-clean the mask so that it is in a highly clean state, but in order to re-clean the mask under weak cleaning conditions in recent years, when the pellicle is peeled off, It is important how to reduce the residue remaining on the mask substrate.
- Fuctional water is generally an aqueous solution that has been given reproducible and useful functions by artificial treatment, and the scientific basis for treatment and function has been clarified, and is about to be clarified. It is defined as what is. Specific examples include fine bubble water such as ozone water, hydrogen water, microbubble water, and nanobubble water, electrolyzed water, supercritical water, and subcritical water. Ozone water and hydrogen are used to clean the photomask. A lot of water is used. In addition, the detergency can be improved by adding a small amount of ammonia.
- a lithographic pellicle in which a pellicle film is attached to the upper end surface of the pellicle frame via an adhesive layer for attaching a pellicle film, and an adhesive layer for attaching a mask is provided on the other end surface, such as an ArF excimer laser (193 nm).
- Patent Document 1 and Patent Document 2 As a technique for reducing the residue, attempts have been made to add a surface modifier or the like to the pressure-sensitive adhesive (Patent Document 1 and Patent Document 2). Further, as a technique for reducing the residue, a large pellicle having an adhesive layer having a cohesive breaking strength of 20 g / mm 2 or more (Patent Document 3), and a ratio of peel strength to tensile strength of 0.10 or more is 0. A pellicle having a pellicle adhesive of 33 or less is disclosed (Patent Document 4).
- the present invention has been made in view of such a situation, and when the pellicle is peeled off from the exposure original plate after using lithography, particularly after using ArF lithography, the pellicle that can reduce the residue sticking to the exposure original plate can be reduced. It is an object of the present invention to provide an exposure original plate with a pellicle, a method for regenerating an exposure original plate, and a method for reducing peeling residue. It is an object of the present invention to provide a method for manufacturing a semiconductor device and a liquid crystal display board capable of improving production efficiency.
- a pellicle in which the amount of peeling residue of the pressure-sensitive adhesive layer remaining on the substrate when peeled is 0.5 mg or less.
- the pressure-sensitive adhesive forming the pressure-sensitive adhesive layer is an acrylic polymer as a base material.
- the acrylic polymer contains a (meth) acrylic acid ester having an ether bond as a monomer component.
- the (meth) acrylic acid ester having an ether bond is a (meth) acrylic acid ester having an alkylene oxide group.
- a method for manufacturing a liquid crystal display board comprising a step of exposing with an exposure original plate with a pellicle according to any one of [18] to [24].
- the exposed original plate is regenerated by peeling the pellicle from the exposed original plate with pellicle according to any one of [18] to [24] and washing the adhesive residue remaining on the exposed original plate with functional water. How to reproduce the exposed original plate.
- a method for reducing peeling residue using the pellicle described in any one of them [29] An application of the pellicle having a pellicle film, a pellicle frame having the pellicle film provided on one end face, and an adhesive layer provided on the other end face of the pellicle frame, wherein the pressure-sensitive adhesive is used. Application of pellicle where the layer is exposed to exposed light. [30] An application of the pellicle having a pellicle film, a pellicle frame having the pellicle film provided on one end face, and an adhesive layer provided on the other end face of the pellicle frame, wherein the phase shift. Application of pellicle attached to photomask.
- a peeling residue reducing pellicle characterized in that the amount of peeling residue of the pressure-sensitive adhesive layer remaining on the substrate when peeled is 0.5 mg or less.
- a method for reducing the peeling residue of the pressure-sensitive adhesive layer of the pellicle remaining on the exposure original plate when the pellicle is peeled off from the exposure original plate to which the pellicle is attached A method characterized by using the pellicle according to any one of [40].
- a method for selecting a peeling residue-reducing pellicle which is a step of attaching an adhesive layer of a pellicle, which is a candidate for selection, to a quartz photomask substrate, and a portion where the adhesive layer of the pellicle is attached from the back surface of the substrate.
- the peeling residue-reducing pellicle is obtained by removing the peeling residue of the pressure-sensitive adhesive layer remaining on the substrate by 0.5 mg or less.
- the pellicle and the pellicle that can reduce the peeling residue of the adhesive layer of the pellicle remaining on the exposure original plate are attached. It is possible to provide an exposure original plate, a method for regenerating an exposure original plate, and a method for reducing peeling residue. In the method for regenerating the pellicle, the exposure original plate with the pellicle, the exposure original plate, and the peeling residue reduction method of the present invention, even if the exposure light is irradiated through the exposure original plate, the peeling residue of the adhesive is generated when the pellicle is peeled from the exposure original plate.
- the pellicle 10 of the present invention has a pellicle film 12 stretched on the upper end surface of the pellicle frame 11 via an adhesive layer 13 for attaching the pellicle film.
- the pellicle 10 is attached.
- An adhesive layer 14 for adhering to the exposure original plate (mask substrate or reticle) 1 is usually formed on the lower end surface of the pellicle frame 11, and a liner (not shown) is detachably attached to the lower end surface of the adhesive layer 14. It is made up of.
- the pellicle frame 11 may be provided with an air pressure adjusting hole (vent) 15, and a dust removing filter 16 may be provided for the purpose of removing particles.
- the size of these pellicle components is the same as that of a normal pellicle, for example, a pellicle for semiconductor lithography, a pellicle for a large liquid crystal display board manufacturing lithography process, etc., and the material thereof is also a known material as described above. can do.
- the type of the pellicle film 12 is not particularly limited, and for example, an amorphous fluoropolymer or the like conventionally used for an excimer laser is used.
- the amorphous fluoropolymer include Cytop (trade name manufactured by Asahi Glass Co., Ltd.), Teflon (registered trademark) AF (trade name manufactured by DuPont) and the like. These polymers may be dissolved in a solvent and used when the pellicle film is produced, and can be appropriately dissolved in, for example, a fluorine-based solvent.
- the base material of the pellicle frame 11 for example, a conventionally used aluminum alloy material, preferably JIS A7075, JIS A6061, JIS A5052 material or the like is used, but when an aluminum alloy material is used, the pellicle frame is used. There is no particular limitation as long as the strength of is secured.
- the surface of the pellicle frame is preferably roughened by sandblasting or chemical polishing, and a polymer film may be provided after the roughening.
- a conventionally known method can be adopted as the method for roughening the frame surface.
- a method is preferable in which the surface of the aluminum alloy material is blasted with stainless steel, carborundum, glass beads or the like, and further chemically polished with NaOH or the like to roughen the surface.
- the pressure-sensitive adhesive used to form the pressure-sensitive adhesive layer 14 various pressure-sensitive adhesives described later can be appropriately selected, but an acrylic pressure-sensitive adhesive is preferable. Further, the shape of these adhesives is preferably flattened with little deformation when the pellicle is attached, in order to reduce the influence of distortion or the like on the mask substrate to be attached and to suppress the residual stress due to the pellicle attachment.
- the thickness of the pressure-sensitive adhesive layer 14 is usually preferably 150 to 500 ⁇ m, more preferably 180 to 350 ⁇ m, and particularly preferably 200 to 300 ⁇ m. Further, the width of the pressure-sensitive adhesive layer 14 may be appropriately determined according to the width of the pellicle frame 11. Normally, the adhesive layer is provided over the entire circumference of the lower end surface of the pellicle frame 11 in the circumferential direction with a width equal to the width of the pellicle frame.
- the portion to which the pressure-sensitive adhesive layer of the pellicle is attached is irradiated with ultraviolet rays of 193 nm at 10 J / cm 2 from the back surface of the substrate.
- the peeling residue-reducing pellicle is characterized in that the amount of peeling residue of the pressure-sensitive adhesive layer remaining on the substrate when the pellicle is peeled off after the irradiation is 0.5 mg or less.
- the peeling residue reducing pellicle is a lithography pellicle capable of reducing the peeling residue of the adhesive layer remaining on the surface of the exposure original plate when the pellicle is peeled from the exposure original plate after using lithography, that is, the peeling residue.
- the pellicle of the present invention is basically of a size that can be attached to a quartz mask 6025 size, and specifically, the outer diameter is usually in the range of 150 to 145 mm ⁇ 124 to 100 mm.
- the width of the pellicle frame constituting the pellicle of the present invention is usually in the range of 1.7 to 2.1 mm, preferably 1.8 to 2.0 mm, and the thickness of the pellicle frame is usually 2.0 to 2.0 mm. It is in the range of 6.2 mm, preferably 2.5 to 6.0 mm.
- the application load is 10 to 250 N, preferably 40 to 100 N, and the load time is 15 to 120 seconds, preferably 20 to 60 seconds. Then, after the adhesive layer of the pellicle is attached to the quartz mask substrate, the adhesive layer is left at room temperature (20 ⁇ 3 ° C.) for 12 to 24 hours, and then the adhesive layer is attached from the back surface of the mask substrate. Is irradiated with ultraviolet rays of the above wavelength at 10 J / cm 2 so as to be exposed to ultraviolet rays.
- the reason why the irradiation amount is set to 10 J / cm 2 is that it is assumed that 1% of the irradiation amount of 1000 J on the mask (about 10000 J on the wafer) is irradiated to the mask adhesive as stray light. is there.
- the pellicle When peeling the pellicle after the irradiation, the pellicle is grasped from the mask substrate by a peeling device or the like at room temperature, and the pellicle is gripped upward (90) with respect to the mask surface at a speed of 0.1 mm / sec. Pull up in the ° direction) and completely peel off. After peeling, the mass difference of the mask substrate before and after peeling is measured, and the pellicle having this mass difference (peeling residue amount) of 0.5 mg or less, preferably 0.2 mg or less is the pellicle of the present invention. Since the amount of peeling residue is small, re-cleaning of the exposed original plate becomes extremely easy.
- the pellicle frame has two long sides, and it is preferable that two holes are provided for each long side.
- the two holes are preferably provided so that the distance from one end of the long side to one hole is the same as the distance from the other end of the long side to the other hole.
- the diameter of the hole is preferably about 1.6 mm in diameter and 1.0 mm or more and less than 1.8 mm in depth.
- the peeling can be easily performed by inserting the four pins of the peeling device into these four holes and pulling them up. This pulling speed can be changed in the range of 0.1 mm / sec or less depending on the peel strength. Also, when pulling up, instead of pulling up the two long sides at the same time, pulling up from one long side can reduce the peeling force applied to the left and right.
- the pressure-sensitive adhesive layer in the present invention has a certain amount of peeling residue remaining on the substrate. This can be obtained, for example, by the design guidelines listed in (1) to (5) below.
- (1) Increase the hydrophilicity of the adhesive.
- (2) When the base material contained in the pressure-sensitive adhesive is an acrylic copolymer, an ether bond is introduced into the side chain thereof.
- (3) When the base material contained in the pressure-sensitive adhesive is a chain-like polymer, the degradability of the side chain by irradiation with the exposure light is made higher than the degradability of the main chain.
- the base material contained in the pressure-sensitive adhesive is a chain-like polymer, the side chains thereof are selectively deteriorated by irradiation with exposure light. (5) Increase the cohesive force of the entire adhesive.
- hydrophilicity can be controlled using the SP value (solubility parameter).
- SP value solubility parameter
- an acrylic polymer is used as the base material of the pressure-sensitive adhesive, it is preferable to control the SP value to about 10.0 or more and 12.0 or less.
- This SP value can be obtained by referring to the Feedors calculation method ["Polymer Engineering and Science", Vol. 14, No. 2 (1974), pp. 148 to 154] and calculating by the following formula 1.
- the unit of the solubility parameter is (cal / mol) 1/2 .
- Table 1 shows the eigenvalues of ⁇ ei and ⁇ vi given to the main atoms or atomic groups with respect to the above formula 1.
- the SP value (solubility parameter) of the acrylic polymer is preferably 10.0 to 12.0, and more preferably 10.0 to 11.0.
- the SP value of the acrylic polymer can be controlled, for example, by changing the concentration of polar groups in the acrylic polymer. For example, when a relatively highly polar bond such as an ether bond is introduced into the side chain, the SP value tends to increase. On the other hand, when a relatively low-polarity bond such as a long-chain alkylene bond is introduced into the side chain, the SP value tends to decrease.
- the ether bond introduced into the side chain is preferably an alkylene oxide group, and particularly preferably an ethylene oxide group.
- the cohesive force of the pressure-sensitive adhesive may, for example, adjust the crosslink density of the polymer or resin used for the base material, or may have different physical properties such as a polyvinyl ether compound in addition to the base material of the pressure-sensitive adhesive. It can be controlled by including a compound having the substance.
- Examples of the pressure-sensitive adhesive used for forming the pressure-sensitive adhesive layer 14 include pressure-sensitive adhesives containing an acrylic polymer, a silicone resin, a thermoplastic elastomer, and the like. Since various monomer components can be selected for the acrylic polymer, it is easy to design the acrylic polymer according to the required adhesive properties. Silicone resin has an excellent balance of light resistance, adhesive properties, peeling properties, and the like. Thermoplastic elastomers are cost-competitive. Acrylic adhesives are preferred.
- the acrylic polymer is, for example, a polymer containing a (meth) acrylic acid ester as a monomer component, and if necessary, copolymerizes a monomer component copolymerizable with the (meth) acrylic acid ester. be able to.
- the (meth) acrylic acid ester include a (meth) acrylic acid ester having an ether bond, a (meth) acrylic acid alkyl ester, an unsaturated monomer having a carboxyl group or a hydroxyl group, and the like.
- Examples of the (meth) acrylic acid ester having an ether bond (component (A)) include a (meth) acrylic acid ester having an alkylene oxide group such as an ethylene oxide group, a propylene oxide group, and a butylene oxide group.
- (meth) acrylic acid ester having an ethylene oxide group (also referred to as ethylene oxide group-containing (meth) acrylate) is preferable, and for example, 2-methoxyethyl (meth) acrylate, 2-ethoxyethyl (meth) acrylate, 2 -Butoxyethyl (meth) acrylate, phenoxyethylene glycol (meth) acrylate, methoxypolyethylene glycol (meth) acrylate such as methoxydiethylene glycol (meth) acrylate, ethoxypolyethylene glycol (meth) acrylate such as ethoxydiethylene glycol (meth) acrylate, butoxydiethylene glycol Examples thereof include butoxypolyethylene glycol (meth) acrylate such as (meth) acrylate and phenoxypolyethylene glycol (meth) acrylate such as phenoxydiethylene glycol (meth) acrylate. These may be used alone or in combination of two or
- Examples of the (meth) acrylic acid alkyl ester (component (B)) include a (meth) acrylic acid alkyl ester having an alkyl group having 1 to 14 carbon atoms. Specifically, methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, n-butyl (meth) acrylate, isobutyl (meth) acrylate, isoamyl (meth) acrylate, hexyl (meth) acrylate, 2 -Ethylhexyl (meth) acrylate, n-octyl (meth) acrylate, isooctyl (meth) acrylate, isononyl (meth) acrylate, lauryl (meth) acrylate and the like can be mentioned. Among these, (meth) acrylic acid alkyl esters having an alkyl group having 4 or 8 carbon atoms are preferable from the
- Examples of the unsaturated monomer (component (C)) having a carboxyl group or a hydroxyl group include ⁇ , ⁇ -unsaturated carboxylic acids such as (meth) acrylic acid, maleic acid, crotonic acid, itaconic acid, and fumaric acid, and 2 Examples thereof include hydroxyl group-containing methacrylates such as -hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, and 2-hydroxybutyl (meth) acrylate. These may be used alone or in combination of two or more.
- the ratio of the component (A) to be used is preferably 30% by mass or more, more preferably 35% by mass or more, and 35 to 98% by mass in the total monomer components. It is particularly preferable that the amount is 40 to 95% by mass, and it is extremely preferable that the content is 40 to 95% by mass.
- the ratio of the component (B) used is preferably 0 to 70% by mass, more preferably 3 to 55% by mass, based on all the monomer components. By setting the ratio of the component (B) to the above range, the adhesiveness can be easily controlled.
- the ratio of the component (C) used is preferably 0 to 10% by mass, more preferably 2 to 8% by mass, based on all the monomer components.
- the acrylic polymer can be produced by appropriately selecting a known production method such as solution polymerization, bulk polymerization, emulsion polymerization, or radical polymerization. Further, the obtained acrylic polymer may be any of a random copolymer, a block copolymer, a graft copolymer and the like.
- the molecular weight of the acrylic polymer is in the range of 700,000 to 2.5 million as the weight average molecular weight, the cohesive force and adhesive force of the pressure-sensitive adhesive layer become appropriate, and it is difficult for adhesive to remain and is sufficient. It is preferable because it is an adhesive having adhesive strength and load resistance.
- the above weight average molecular weight is a value measured by gel permeation chromatography (GPC) analysis and means a standard polystyrene equivalent value.
- GPC analysis can be performed using tetrahydrofuran (THF) as the solution.
- the pressure-sensitive adhesive in the pressure-sensitive adhesive layer preferably contains a reaction product of an acrylic polymer and a curing agent, but in consideration of softness, an acrylic weight that does not react with the curing agent. It may include coalescence.
- the curing agent is not particularly limited as long as it is a curing material used as an ordinary pressure-sensitive adhesive, and for example, a metal salt, a metal alkoxide, an aldehyde compound, a non-amino resin amino compound, a urea compound, an isocyanate compound, etc.
- a metal salt e.g., a metal salt, a metal alkoxide, an aldehyde compound, a non-amino resin amino compound, a urea compound, an isocyanate compound, etc.
- examples thereof include polyfunctional epoxy compounds, metal chelate compounds, melamine compounds, and isocyanate compounds.
- isocyanate compounds and epoxy compounds are preferable from the viewpoint of reactivity with a carboxyl group or a hydroxyl group.
- isocyanate-based compounds include xylylene diisocyanate, hexamethylene diisocyanate, tolylene diisocyanate, multimers, derivatives, and polymers thereof. These may be used alone or in combination of two or more.
- Examples of the epoxy compound include compounds having two or more epoxy groups in the molecule, and specific examples thereof include ethylene glycol diglycidyl ether, polyethylene glycol diglycidyl ether, glycerin diglycidyl ether, and glycerin triglycidyl ether. 1,6-Hexanediol diglycidyl ether, trimethylpropan triglycidyl ether, diglycidyl aniline, diamine glycidyl amine, N, N, N', N'-tetraglycidyl-m-xylylene diamine, 1,3-bis ( N, N'-diamine glycidyl aminomethyl) and the like. These may be used alone or in combination of two or more.
- a silicone resin known as an adhesive can be preferably used.
- an organopolysiloxane having silanol groups at both ends of the molecular chain is represented by R 3 SiO 0.5 (where R indicates a substituted or unsubstituted monovalent hydrocarbon group) in the molecule.
- R indicates a substituted or unsubstituted monovalent hydrocarbon group
- examples thereof include those obtained by partially dehydrating and condensing an organopolysiloxane having a triorganosiloxane unit and a SiO 2 unit.
- These are available as silicone-based adhesives KR-101-10, KR-120, KR-130, and X-40-3068 (all of which are trade names manufactured by Shin-Etsu Chemical Co., Ltd.).
- thermoplastic elastomer examples include styrene-based thermoplastic elastomers, (meth) acrylic acid ester-based thermoplastic elastomers, and olefin-based thermoplastic elastomers. More specifically, the thermoplastic elastomer described in Japanese Patent No. 5513616 can be used. Among these high molecular weight components, an acrylic polymer is preferable because it is easy to control the mixing property with the polyvinyl ether compound. These high molecular weight components may be used alone or in combination of two or more.
- the "adhesive using an acrylic polymer as a base material” is a pressure-sensitive adhesive containing the acrylic polymer itself or a pressure-sensitive adhesive containing a reaction product of the acrylic polymer and a curing agent or the like. Means an agent.
- the content of the acrylic polymer in the total mass of the pressure-sensitive adhesive forming the pressure-sensitive adhesive layer 14 is usually 90 to 99% by mass, preferably 92 to 98% by mass, particularly preferably from the viewpoint of reducing the peeling residue. It is 94 to 96% by mass.
- the pressure-sensitive adhesive forming the pressure-sensitive adhesive layer 14 preferably further contains a polyvinyl ether compound in addition to the base material such as the acrylic polymer.
- a polyvinyl ether compound used as a pressure-sensitive adhesive is used in combination, it is more effective in reducing the amount of peeling residue.
- the polyvinyl ether compound include copolymers of vinyl ethers such as methyl vinyl ether, ethyl vinyl ether, butyl vinyl ether, isobutyl vinyl ether, and (2-methoxyethyl) vinyl ether, and two or more kinds of vinyl ethers. Examples thereof include copolymers of the above, copolymers of these vinyl ethers and other monomers, and the like.
- a polyvinyl ether compound containing methyl vinyl ether as a raw material monomer is preferable from the viewpoint of controlling the peeling residue.
- the blending ratio of the base material such as the acrylic polymer and the polyvinyl ether compound is 90:10 to 99: 1, preferably 90:10 to 99: 1 on a mass basis from the viewpoint of reducing the peeling residue. It is 92: 8 to 98: 2, particularly preferably 94: 6 to 96: 4.
- the pressure-sensitive adhesive forming the pressure-sensitive adhesive layer of the pellicle includes a cross-linking agent, a pressure-sensitive adhesive, a plasticizer, a stabilizer, a viscosity modifier, and an antistatic agent as long as the characteristics of the present invention are not impaired.
- Other ingredients may be blended.
- a liquid or paste-like pressure-sensitive adhesive in an uncured state is applied to the lower end surface of the pellicle frame 11 and then cured to form a pressure-sensitive adhesive layer.
- the pressure-sensitive adhesive may be applied once, or may be applied several times in order to obtain a predetermined thickness of the pressure-sensitive adhesive layer. In this case, it is preferable to allow the adhesive to stand as appropriate between each round until the shape of the adhesive after application is stable.
- the adhesive may be appropriately diluted with an organic solvent, alcohol, water or the like to reduce the viscosity of the adhesive before application.
- the adhesive can be applied by, for example, a dip, a spray, a brush coating, a coating device using a dispenser, or the like, but the coating using the coating device using a dispenser has stability, workability, yield, and the like. It is preferable from the point of view.
- the pressure-sensitive adhesive layer 14 is applied and formed first, and then the pellicle film 12 is stretched, but the order may be reversed.
- the pellicle film 12 is stretched, for example, by applying an adhesive to the upper end surface of the pellicle frame 11, then heating the pellicle frame 11 to cure the adhesive, and finally applying the adhesive to an aluminum frame larger than the pellicle frame 11.
- the upper end surface of the pellicle frame 11 on which the adhesive layer 13 for attaching the pellicle film is formed is attached to the pellicle film, and the excess protruding outside the pellicle frame 11 of the pellicle film is removed to complete the pellicle.
- the pellicle of the present invention By using the pellicle of the present invention having the structure described above, it is possible to reduce the amount of adhesive residue when the pellicle is peeled off from the exposure original plate after using lithography. Further, according to the present invention, there is provided a method for reducing the peeling residue of the pressure-sensitive adhesive layer of the pellicle by using the pellicle of the present invention. Therefore, the pellicle of the present invention is useful as a phase shift photomask having the above-mentioned delicate phase shift film or a pellicle to be attached to a surface containing silicon oxide as a main component such as quartz.
- exposure light adheres to a negative type exposure original plate, an exposure original plate having a non-light-shielded area or a semi-transparent light-shielding area on the adhesive sticking portion, an exposure original plate having a transparent region on the adhesive sticking portion, and the like. It is also useful as a pellicle applied to an exposure original plate that irradiates the agent layer.
- the pressure-sensitive adhesive layer of the pellicle used for such an exposure original plate is exposed to an exposure ray through the exposure original plate from a surface opposite to the surface on which the pellicle of the exposure original plate is provided.
- the pellicle of the present invention is used not only as a protective member for suppressing foreign matter from adhering to the exposure master plate in the exposure apparatus, but also for protecting the exposure master plate during storage of the exposure master plate and transportation of the exposure master plate. It may be used as a protective member.
- an exposure original plate such as a photomask
- an exposure original plate with a pellicle can be manufactured.
- the method for manufacturing a semiconductor device or a liquid crystal display plate according to the present embodiment includes a step of exposing a substrate (semiconductor wafer or liquid crystal original plate) with the above-mentioned exposure original plate with a pellicle.
- a substrate semiconductor wafer or liquid crystal original plate
- the above exposure master plate with a pellicle is installed on a stepper in order to form a photoresist pattern corresponding to an integrated circuit or the like on a substrate. To expose.
- the yield in the lithography process can be improved by using the exposure original plate with a pellicle.
- the pellicle may be peeled off from the exposure original plate to perform regenerative cleaning of the exposure original plate.
- Example 1 After precision cleaning of an aluminum alloy pellicle frame (external size: 149 mm x 115 mm x 3 mm, wall thickness 2 mm, flatness on the end face side coated with adhesive for mask attachment: 15 um), the end face on the 15 um side is manufactured by Soken Kagaku Co., Ltd.
- Acrylic adhesive (Product name: SK Dyne SN-70A, containing an acrylic polymer in which 95% by mass of the monomer component is an ethylene oxide group-containing (meth) acrylate as a base material, and 30% by mass of the acrylic polymer
- a polyvinyl ether compound (containing 2% by mass (solid content) with respect to% (solid content)) was applied over the entire circumference of the end face in the circumferential direction with the same width as the width of the pellicle frame, and allowed to stand at room temperature for 60 minutes. Then, a separator was placed on an aluminum plate having a flatness of 5 um, and a pellicle frame coated with the adhesive was placed so that the adhesive was facing downward.
- the pressure-sensitive adhesive was brought into contact with the flat separator and flattened.
- the pellicle on the aluminum plate was placed in an oven at 60 ° C. for 60 minutes to cure the pressure-sensitive adhesive to form a pressure-sensitive adhesive layer having a thickness of 240 um. Then, after taking out the pellicle together with the aluminum plate, the separator was peeled off.
- an adhesive product name: Cytop CTX-A manufactured by Asahi Glass Co., Ltd. was applied to the end face on the opposite side of the adhesive application. Then, the pellicle frame was heated at 130 ° C. to cure the adhesive. Finally, the adhesive-coated end face side of the pellicle frame was attached to a pellicle film formed on an aluminum frame larger than the pellicle frame, and the portion outside the pellicle frame was removed to complete the pellicle.
- the mass of the 6025 mask substrate was measured and recorded.
- the mask substrate whose mass was measured and the pellicle prepared earlier were set in the pasting device, and the pellicle was pasted on the mask substrate by pressurizing with a sticking load of 50 N and a load time of 30 seconds.
- Example 2 Acrylic polymer manufactured by Soken Kagaku Co., Ltd. (product name: SN-25B, 40% by mass of monomer component is ethylene oxide group-containing (meth) acrylate is used as the base material for the adhesive for sticking to the mask.
- Example 2 Similar to Example 1, after the mask substrate to which the pellicle is attached is left at room temperature for 24 hours, ultraviolet rays of 10 J are emitted from the back surface of the mask using an ArF laser of 193 nm so that a light beam hits the portion to which the adhesive layer is attached. / Cm 2 irradiation was performed. After being left at room temperature for 1 hour after irradiation with ultraviolet rays, the pellicle was slowly peeled upward from the mask substrate at a speed of 0.1 mm / sec. When the mask substrate after peeling was visually observed, a slightly thin streak was observed in the contour portion to which the pellicle was attached. When the mass of the substrate after peeling was measured and compared with the measured value before pasting, the difference in mass was +0.09 mg.
- Example 3 Acrylic polymer manufactured by Soken Kagaku Co., Ltd. (product name: SN-24C, 90% by mass of monomer component is ethylene oxide group-containing (meth) acrylate is used as the base material for the adhesive for sticking to the mask.
- Example 2 Similar to Example 1, after the mask substrate to which the pellicle is attached is left at room temperature for 24 hours, ultraviolet rays of 10 J are emitted from the back surface of the mask using an ArF laser of 193 nm so that a light beam hits the portion to which the adhesive layer is attached. / Cm 2 irradiation was performed. After being left at room temperature for 1 hour after irradiation with ultraviolet rays, the pellicle was slowly peeled upward from the mask substrate at a speed of 0.1 mm / sec. When the mask substrate after peeling was visually observed, a slightly thin streak was observed in the contour portion to which the pellicle was attached. When the mass of the substrate after peeling was measured and compared with the measured value before pasting, the difference in mass was +0.08 mg.
- Example 2 Similar to Example 1, after the mask substrate to which the pellicle is attached is left at room temperature for 24 hours, ultraviolet rays of 10 J are emitted from the back surface of the mask using an ArF laser of 193 nm so that a light beam hits the portion to which the adhesive layer is attached. / Cm 2 irradiation was performed. After being left at room temperature for 1 hour after irradiation with ultraviolet rays, the pellicle was slowly peeled upward from the mask substrate at a speed of 0.1 mm / sec. When the mask substrate after peeling was visually observed, a thin adhesive residue was observed in the portion where the pellicle was attached. When the mass of the substrate after peeling was measured and compared with the measured value before pasting, the difference in mass was +0.58 mg.
- Comparative Example 2 A pellicle completed in the same procedure as in Example 1 except that a silicone adhesive (product name: X40-3122) manufactured by Shin-Etsu Chemical Co., Ltd. was used as the adhesive for sticking to the mask was applied to the same 6025 mask substrate as in Example 1. I pasted it.
- a silicone adhesive product name: X40-3122 manufactured by Shin-Etsu Chemical Co., Ltd. was used as the adhesive for sticking to the mask was applied to the same 6025 mask substrate as in Example 1. I pasted it.
- Example 2 Similar to Example 1, after the mask substrate to which the pellicle is attached is left at room temperature for 24 hours, ultraviolet rays of 10 J are emitted from the back surface of the mask using an ArF laser of 193 nm so that a light beam hits the portion to which the adhesive layer is attached. / cm 2 was irradiated. After being left at room temperature for 1 hour after irradiation with ultraviolet rays, the pellicle was slowly peeled upward from the mask substrate at a speed of 0.1 mm / sec. When the mask substrate after peeling was visually observed, adhesive residue was observed in the entire part where the pellicle was attached. When the mass of the substrate after peeling was measured and compared with the measured value before pasting, the difference in mass was +3.50 mg.
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Abstract
Description
この場合、ゴミは露光原版の表面上には直接付着せず、ペリクル膜上に付着するため、リソグラフィ時に焦点を露光原版のパターン上に合わせておけば、ペリクル膜上のゴミは転写に無関係となる。
この再生洗浄は一般的に硫酸過水、アンモニア過水等の薬剤による洗浄や、ブラシ、スポンジ等の物理的な洗浄が使用されている。しかしながら、フォトマスクへのダメージや硫酸イオンのフォトマスクへの残存を抑制するために、機能水による再生洗浄が検討されている。
[1]ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有するペリクルであって、
石英製マスク基板に前記ペリクルの粘着剤層を貼り付けた後、前記基板の裏面より前記ペリクルの粘着剤層の貼り付け部分に193nmの紫外線を10J/cm2照射し、その照射後に前記ペリクルを剥離した際、前記基板に残る前記粘着剤層の剥離残渣量が0.5mg以下であるペリクル。
[2]粘着剤層を形成する粘着剤は、アクリル系重合体を母材とする前記[1]記載のペリクル。
[3]アクリル系重合体が、エーテル結合を有する(メタ)アクリル酸エステルを単量体成分とする前記[2]記載のペリクル。
[4]エーテル結合を有する(メタ)アクリル酸エステルが、アルキレンオキサイド基を有する(メタ)アクリル酸エステルである前記[3]記載のペリクル。
[5]アルキレンオキサイド基が、エチレンオキサイド基である前記[4]記載のペリクル。
[6]アクリル系重合体が、エーテル結合を含む側鎖を有する前記[2]記載のペリクル。
[7]エーテル結合を含む側鎖が、アルキレンオキサイド基を有する前記[6]記載のペリクル。
[8]アルキレンオキサイド基が、エチレンオキサイド基である前記[7]記載のペリクル。
[9]粘着剤層を形成する粘着剤は、ポリビニルエーテル化合物を含有してなる前記[1]~[8]のいずれかに記載のペリクル。
[10]粘着剤層が露光光線に照射される前記[1]~[9]のいずれかに記載のペリクル。
[11]位相シフトフォトマスクに貼り付けられる前記[1]~[9]のいずれかに記載のペリクル。
[12]ネガタイプの露光原版に貼り付けられる前記[1]~[9]のいずれかに記載のペリクル。
[13]露光原版における粘着剤層の貼り付け部分に遮光されていない領域又は半透明遮光領域を有する露光原版に貼り付けられる前記[1]~[9]のいずれかに記載のペリクル。
[14]露光原版における粘着剤層の貼り付け部分に透明領域を有する露光原版に貼り付けられる前記[1]~[9]のいずれかに記載のペリクル。
[15]酸化ケイ素を主成分とする面に貼り付けられる前記[1]~[9]のいずれかに記載のペリクル。
[16]酸化ケイ素を主成分とする面が石英面である前記[15]記載のペリクル。
[17]機能水による再生洗浄に対応した前記[1]~[9]のいずれかに記載のペリクル。
[18]露光原版に前記[1]~[10]のいずれかに記載のペリクルが装着されているペリクル付露光原版。
[19]露光原版が位相シフトフォトマスクである前記[18]記載のペリクル付露光原版。
[20]露光原版がネガタイプである前記[18]記載のペリクル付露光原版。
[21]露光原版の粘着剤層の貼り付け部分が遮光されていない領域又は半透明遮光領域を有する前記[18]記載のペリクル付露光原版。
[22]露光原版の粘着剤層の貼り付け部分が透明領域を有する前記[18]記載のペリクル付露光原版。
[23]露光原版が酸化ケイ素を主成分とする前記[18]記載のペリクル付露光原版。
[24]露光原版が石英基板である前記[18]記載のペリクル付露光原版。
[25]前記[18]~[24]のいずれかに記載のペリクル付露光原版によって露光する工程を備える半導体装置の製造方法。
[26]前記[18]~[24]のいずれかに記載のペリクル付露光原版によって露光する工程を備える液晶表示板の製造方法。
[27]前記[18]~[24]のいずれかに記載のペリクル付露光原版からペリクルを剥離し、機能水により露光原版に残った粘着剤の残渣を洗浄することにより露光原版を再生する、露光原版の再生方法。
[28]ペリクルを貼り付けた露光原版からペリクルを剥離した際の、露光原版上に残る前記ペリクルの粘着剤層の剥離残渣低減方法であって、前記ペリクルとして前記[1]~[17]のいずれかに記載のペリクルを用いる、剥離残渣低減方法。
[29]ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有する前記ペリクルの応用であって、粘着剤層が露光光線に照射されるペリクルの応用。
[30]ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有する前記ペリクルの応用であって、位相シフトフォトマスクに貼り付けられるペリクルの応用。
[31]ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有する前記ペリクルの応用であって、ネガタイプの露光原版に貼り付けられるペリクルの応用。
[32]ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有する前記ペリクルの応用であって、露光原版における粘着剤層の貼り付け部分に遮光されていない領域又は半透明遮光領域を有する露光原版に貼り付けられるペリクルの応用。
[33]ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有する前記ペリクルの応用であって、露光原版における粘着剤層の貼り付け部分に透明領域を有する露光原版に貼り付けられるペリクルの応用。
[34]ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有する前記ペリクルの応用であって、酸化ケイ素を主成分とする面(特に石英面)に貼り付けられるペリクルの応用。
[35]ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有する前記ペリクルの応用であって、機能水による再生洗浄に対応したペリクルの応用。
[36]少なくともペリクル膜と、該ペリクル膜が一方の端面に貼り付けられたペリクルフレームと、該ペリクルフレームの他方の端面にペリクルを露光原版に貼り付けるための粘着剤層とを有する剥離残渣低減ペリクルであって、
石英製マスク基板に前記ペリクルの粘着剤層を貼り付けた後、前記基板の裏面より前記ペリクルの粘着剤層の貼り付け部分に193nmの紫外線を10J/cm2照射し、その照射後に前記ペリクルを剥離した際、前記基板に残る前記粘着剤層の剥離残渣量が0.5mg以下であることを特徴とする剥離残渣低減ペリクル。
[37]前記粘着剤層がアクリル系重合体を含む粘着剤からなる、前記[36]に記載の剥離残渣低減ペリクル。
[38]前記アクリル系重合体を構成する全単量体成分の51質量%以上がエチレンオキサイド基含有(メタ)アクリレート単量体である、前記[37]に記載の剥離残渣低減ペリクル。
[39] 前記粘着剤が、さらにポリビニルエーテル化合物を含む、前記[37]又は[38]に記載の剥離残渣低減ペリクル。
[40]前記剥離残渣低減ペリクルが、ArFリソグラフィ用の剥離残渣低減ペリクルである前記[36]~[39]のいずれかに記載の剥離残渣低減ペリクル。
[41]ペリクルを貼り付けた露光原版から該ペリクルを剥離した際に、露光原版上に残る前記ペリクルの粘着剤層の剥離残渣を低減する方法であって、前記ペリクルとして、前記[36]~[40]のいずれかに記載のペリクルを用いることを特徴とする方法。
[42]剥離残渣低減ペリクルの選定方法であって、選定候補であるペリクルの粘着剤層を石英製フォトマスク基板に貼り付ける工程と、前記基板の裏面より前記ペリクルの粘着剤層の貼り付け部分に193nmの紫外線を10J/cm2照射する工程と、その照射後に該ペリクルを剥離した際、前記基板に残る前記粘着剤層の剥離残渣量が0.5mg以下であるペリクルを、剥離残渣低減ペリクルとして選定する工程とを含むことを特徴とする、方法。
図1に示したように、本発明のペリクル10は、ペリクルフレーム11の上端面にペリクル膜貼り付け用接着剤層13を介してペリクル膜12を張設したもので、この場合、ペリクル10を露光原版(マスク基板又はレチクル)1に粘着させるための粘着剤層14が通常ペリクルフレーム11の下端面に形成され、該粘着剤層14の下端面にライナー(不図示)を剥離可能に貼着してなるものである。また、ペリクルフレーム11に気圧調整用穴(通気口)15が設置されていてもよく、さらにパーティクル除去の目的で除塵用フィルター16が設けられていてもよい。
(1)粘着剤の親水性を高くする。
(2)粘着剤に含有される母材がアクリル系共重合体の場合に、その側鎖にエーテル結合を導入する。
(3)粘着剤に含有される母材が鎖状の重合体である場合に、その側鎖の露光光線の照射による分解性を主鎖の分解性よりも高くする。
(4)粘着剤に含有される母材が鎖状の重合体である場合に、露光光線の照射によりその側鎖が選択的に劣化するようにする。
(5)粘着剤全体の凝集力を高める。
アクリル系重合体のSP値は、例えば、アクリル系重合体中の極性基濃度を変化させることによって制御することができる。例えば、エーテル結合のような比較的に極性の高い結合を側鎖に導入するとSP値は高くなる方向に進む。一方、長鎖のアルキレン結合のような比較的に極性の低い結合を側鎖に導入するとSP値は低くなる方向に進む。
これらの高分子量成分の中でもアクリル系重合体がポリビニルエーテル化合物との混合性を制御しやすいため好ましい。これらの高分子量成分は単独で用いてもよいし、2種以上を組み合わせて用いてもよい。
なお、本発明において、「アクリル系重合体を母材とする粘着剤」とは、アクリル系重合体それ自体を含む粘着剤、又はアクリル系重合体と硬化剤等との反応生成物を含む粘着剤を意味する。
したがって、本発明のペリクルは、前述したデリケートな位相シフト膜を有する位相シフトフォトマスクや、石英等の酸化ケイ素を主成分とする面に貼り付けられるペリクルとして有用である。
また、本発明のペリクルを用いることにより、粘着剤層の剥離残渣が低減されることから機能水による洗浄が適用容易となり、位相シフトフォトマスクなどのデリケートな露光原版に対する洗浄性を向上することができる。また、機能水洗浄による環境負荷の低減に貢献できる。
アルミニウム合金製のペリクルフレーム(外形サイズ:149mm×115mm×3mm、肉厚2mm、マスク貼り付け用粘着剤塗布端面側の平坦度:15um)を精密洗浄後、15um側の端面に綜研化学株式会社製のアクリル系粘着剤(製品名:SKダイン SN-70A、単量体成分の95質量%がエチレンオキサイド基含有(メタ)アクリレートであるアクリル系重合体を母材として含み、アクリル系重合体30質量%(固形分)に対してポリビニルエーテル化合物を2質量%(固形分)含む)を前記端面の周方向全周にわたり、ペリクルフレームの幅と同じ幅で塗布し、60分室温で静置した。その後、平坦度が5umのアルミ板上にセパレータを置き、前記粘着剤を塗布したペリクルフレームを該粘着剤が下向きになるように置いた。これにより前記粘着剤は平坦なセパレータに接触して平坦加工された。
次に、アルミ板上のペリクルを60℃のオーブンに60分入れて粘着剤を硬化させ、厚さ240umの粘着剤層を形成した。
そして、ペリクルをアルミ板ごと取り出した後、セパレータを剥離した。
最後に、上記ペリクルフレームよりも大きなアルミニウム枠にとったペリクル膜に上記ペリクルフレームの接着剤塗布端面側を貼り付け、ペリクルフレームよりも外側の部分を除去し、ペリクルを完成させた。
紫外線照射後1時間室温で放置した後、ペリクルをマスク基板から0.1mm/秒のスピードで上方にゆっくり剥離した。
マスク用貼り付け粘着剤に綜研化学社製のアクリル系粘着剤(製品名:SN-25B、単量体成分の40質量%がエチレンオキサイド基含有(メタ)アクリレートであるアクリル系重合体を母材として含む)を使用した以外は実施例1と同じ手順で完成させたペリクルを実施例1と同様の6025マスク基板に貼り付けた。
紫外線照射後1時間室温で放置した後、ペリクルをマスク基板から0.1mm/秒のスピードで上方にゆっくり剥離した。
剥離後のマスク基板を目視で観察したところ、ペリクルが貼り付いていた輪郭部分に僅かに薄い筋が見られたた。剥離後の基板の質量を測定し、貼り付け前の測定値と比較したところ、質量の差は+0.09mgであった。
マスク用貼り付け粘着剤に綜研化学社製のアクリル系粘着剤(製品名:SN-24C、単量体成分の90質量%がエチレンオキサイド基含有(メタ)アクリレートであるアクリル系重合体を母材として含む)を使用した以外は実施例1と同じ手順で完成させたペリクルを実施例1と同様の6025マスク基板に貼り付けた。
紫外線照射後1時間室温で放置した後、ペリクルをマスク基板から0.1mm/秒のスピードで上方にゆっくり剥離した。
剥離後のマスク基板を目視で観察したところ、ペリクルが貼り付いていた輪郭部分に僅かに薄い筋が見られた。剥離後の基板の質量を測定し、貼り付け前の測定値と比較したところ、質量の差は+0.08mgであった。
マスク用貼り付け粘着剤に綜研化学社製のアクリル系粘着剤(製品名:SKダイン SK-1425S、エチレンオキサイド基含有(メタ)アクリレート単量体0質量%、その他(メタ)アクリレート単量体100質量%)を使用した以外は実施例1と同じ手順で完成させたペリクルを実施例1と同様の6025マスク基板に貼り付けた。
紫外線照射後1時間室温で放置した後、ペリクルをマスク基板から0.1mm/秒のスピードで上方にゆっくり剥離した。
剥離後のマスク基板を目視で観察したところ、ペリクルが貼り付いていた部分に薄い粘着剤残渣が見られた。剥離後の基板の質量を測定し、貼り付け前の測定値と比較したところ、質量の差は+0.58mgであった。
マスク用貼り付け粘着剤に信越化学社製のシリコーン粘着剤(製品名:X40-3122)を使用した以外は実施例1と同じ手順で完成させたペリクルを実施例1と同様の6025マスク基板に貼り付けた。
紫外線照射後1時間室温で放置した後、ペリクルをマスク基板から0.1mm/秒のスピードで上方にゆっくり剥離した。
剥離後のマスク基板を目視で観察したところ、ペリクルが貼り付いていた部分全体に粘着剤残渣が見られた。剥離後の基板の質量を測定し、貼り付け前の測定値と比較したところ、質量の差は+3.50mgであった。
10 ペリクル
11 ペリクルフレーム
12 ペリクル膜
13 ペリクル膜貼り付け用接着剤層
14 粘着剤層
15 気圧調整用穴(通気口)
16 除塵用フィルター
Claims (28)
- ペリクル膜と、該ペリクル膜が一方の端面に設けられたペリクルフレームと、該ペリクルフレームの他方の端面に設けられた粘着剤層と、を有するペリクルであって、
石英製マスク基板に前記ペリクルの粘着剤層を貼り付けた後、前記基板の裏面より前記ペリクルの粘着剤層の貼り付け部分に193nmの紫外線を10J/cm2照射し、その照射後に前記ペリクルを剥離した際、前記基板に残る前記粘着剤層の剥離残渣量が0.5mg以下であるペリクル。 - 粘着剤層を形成する粘着剤は、アクリル系重合体を母材とする請求項1記載のペリクル。
- アクリル系重合体が、エーテル結合を有する(メタ)アクリル酸エステルを単量体成分とする請求項2記載のペリクル。
- エーテル結合を有する(メタ)アクリル酸エステルが、アルキレンオキサイド基を有する(メタ)アクリル酸エステルである請求項3記載のペリクル。
- アルキレンオキサイド基が、エチレンオキサイド基である請求項4記載のペリクル。
- アクリル系重合体が、エーテル結合を含む側鎖を有する請求項2記載のペリクル。
- エーテル結合を含む側鎖が、アルキレンオキサイド基を有する請求項6記載のペリクル。
- アルキレンオキサイド基が、エチレンオキサイド基である請求項7記載のペリクル。
- 粘着剤層を形成する粘着剤は、ポリビニルエーテル化合物を含有してなる請求項1~8いずれか一項記載のペリクル。
- 粘着剤層が露光光線に照射される請求項1~9いずれか一項記載のペリクル。
- 位相シフトフォトマスクに貼り付けられる請求項1~9いずれか一項記載のペリクル。
- ネガタイプの露光原版に貼り付けられる請求項1~9いずれか一項記載のペリクル。
- 露光原版における粘着剤層の貼り付け部分に遮光されていない領域又は半透明遮光領域を有する露光原版に貼り付けられる請求項1~9いずれか一項記載のペリクル。
- 露光原版における粘着剤層の貼り付け部分に透明領域を有する露光原版に貼り付けられる請求項1~9いずれか一項記載のペリクル。
- 酸化ケイ素を主成分とする面に貼り付けられる請求項1~9いずれか一項記載のペリクル。
- 酸化ケイ素を主成分とする面が石英面である請求項15記載のペリクル。
- 機能水による再生洗浄に対応した請求項1~9いずれか一項記載のペリクル。
- 露光原版に請求項1~10いずれか一項記載のペリクルが装着されているペリクル付露光原版。
- 露光原版が位相シフトフォトマスクである請求項18記載のペリクル付露光原版。
- 露光原版がネガタイプである請求項18記載のペリクル付露光原版。
- 露光原版の粘着剤層の貼り付け部分が遮光されていない領域又は半透明遮光領域を有する請求項18記載のペリクル付露光原版。
- 露光原版の粘着剤層の貼り付け部分が透明領域を有する請求項18記載のペリクル付露光原版。
- 露光原版が酸化ケイ素を主成分とする請求項18記載のペリクル付露光原版。
- 露光原版が石英基板である請求項18記載のペリクル付露光原版。
- 請求項18~24いずれか一項記載のペリクル付露光原版によって露光する工程を備える半導体装置の製造方法。
- 請求項18~24いずれか一項記載のペリクル付露光原版によって露光する工程を備える液晶表示板の製造方法。
- 請求項18~24いずれか一項記載のペリクル付露光原版からペリクルを剥離し、機能水により露光原版に残った粘着剤の残渣を洗浄することにより露光原版を再生する、露光原版の再生方法。
- ペリクルを貼り付けた露光原版からペリクルを剥離した際の、露光原版上に残る前記ペリクルの粘着剤層の剥離残渣低減方法であって、前記ペリクルとして請求項1~17いずれか一項記載のペリクルを用いる、剥離残渣低減方法。
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JP2021147466A (ja) * | 2020-03-18 | 2021-09-27 | 綜研化学株式会社 | 粘着剤組成物、粘着剤層および粘着シート |
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TWI842368B (zh) | 2022-02-04 | 2024-05-11 | 日商三井化學股份有限公司 | 護膜、曝光原版、及曝光裝置、以及護膜之製作方法、及遮罩用黏著劑層之試驗方法 |
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KR20220005014A (ko) * | 2019-04-16 | 2022-01-12 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 펠리클용 점착제, 펠리클, 펠리클 부착 노광 원판, 반도체 장치의 제조 방법, 액정 표시판의 제조 방법, 노광 원판의 재생 방법 및 박리 잔사 저감 방법 |
WO2023149343A1 (ja) * | 2022-02-04 | 2023-08-10 | 三井化学株式会社 | ペリクル、露光原版、及び露光装置、並びにペリクルの作製方法、及びマスク用粘着剤層の試験方法 |
WO2023149347A1 (ja) * | 2022-02-04 | 2023-08-10 | 三井化学株式会社 | ペリクル、露光原版、及び露光装置、並びにペリクルの作製方法、及びマスク用粘着剤層の試験方法 |
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