WO2014148872A1 - 양방향 스위칭 특성을 갖는 2-단자 스위칭 소자 및 이를 포함하는 저항성 메모리 소자 크로스-포인트 어레이, 및 이들의 제조방법 - Google Patents
양방향 스위칭 특성을 갖는 2-단자 스위칭 소자 및 이를 포함하는 저항성 메모리 소자 크로스-포인트 어레이, 및 이들의 제조방법 Download PDFInfo
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
- H10B63/80—Arrangements comprising multiple bistable or multi-stable switching components of the same type on a plane parallel to the substrate, e.g. cross-point arrays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10B61/10—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having two electrodes, e.g. diodes or MIM elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
- H10B63/20—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices comprising selection components having two electrodes, e.g. diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/01—Manufacture or treatment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Magnetic active materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/011—Manufacture or treatment of multistable switching devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/20—Multistable switching devices, e.g. memristors
- H10N70/24—Multistable switching devices, e.g. memristors based on migration or redistribution of ionic species, e.g. anions, vacancies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/821—Device geometry
- H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/841—Electrodes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/881—Switching materials
- H10N70/882—Compounds of sulfur, selenium or tellurium, e.g. chalcogenides
- H10N70/8825—Selenides, e.g. GeSe
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/881—Switching materials
- H10N70/883—Oxides or nitrides
- H10N70/8833—Binary metal oxides, e.g. TaOx
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/881—Switching materials
- H10N70/883—Oxides or nitrides
- H10N70/8836—Complex metal oxides, e.g. perovskites, spinels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
Definitions
- the present invention relates to a switching device, and more particularly to a two-terminal switching device having a bidirectional switching characteristic.
- Flash memory which is currently commercially available as a resistance change memory, uses a change in threshold voltage due to storing or removing charges in the charge storage layer.
- the charge storage layer may be a floating gate that is a polysilicon layer or a charge trap layer that is a silicon nitride layer.
- next-generation resistive memory devices having low power consumption and high integration compared to the flash memory devices have been studied. Examples of the next generation resistive memory devices include a phase change memory device (PRAM), a magnetoresistive random access memory (MRAM), and a resistance change memory device (ReRAM).
- PRAM phase change memory device
- MRAM magnetoresistive random access memory
- ReRAM resistance change memory device
- the resistive memory element In order to implement the resistive memory element as an array, it is common to have a resistive element exhibiting memory characteristics and a selection element electrically connected to the resistive element.
- the selection device may be a transistor or a diode.
- transistors are limited in device size reduction due to short channel effects such as punch through.
- a general diode since a general diode only flows current in one direction, there is a disadvantage that it is not suitable for a bipolar device that exhibits resistance change characteristics at both polarities, such as a resistive device.
- the transistor is not suitable for high integration since the gate electrode, the source / drain regions, and the source / drain electrodes must be formed.
- Korean Patent Laid-Open Publication No. 2011-0074354 discloses a memory device in which a pair of PN diodes are formed at both ends of a bipolar memory element.
- the characteristics of the PN diode formed at the bottom of the bipolar memory and the characteristics of the PN diode formed at the top of the bipolar memory may be difficult to be symmetrical with each other.
- a forward electric field is applied to one of the two PN diodes
- a reverse electric field is applied to the other, so that normal memory operation may be difficult because the forward current density is reduced by the reverse current density.
- An object of the present invention is to provide a resistive memory device cross-point array having an improved degree of integration, including a two-terminal switching element having a bidirectional switching characteristic and a symmetrical device operating characteristic and one two-terminal switching element in a unit cell; And to provide a method for their preparation.
- the two-terminal switching element includes a first electrode and a second electrode.
- a pair of first conductivity type metal oxide semiconductor layers electrically connected to the first electrode and the second electrode are disposed.
- a second conductive metal oxide semiconductor layer is disposed between the first conductive metal oxide semiconductor layers.
- the first conductivity type metal oxide semiconductor layers may be the same material layers.
- One of the first conductive type and the second conductive type may be a P type, and the other may be an N type.
- the P-type metal oxide semiconductor layers may have a band gap of 3 eV or less.
- the P-type metal oxide semiconductor layer may be 30% to 50% larger than the case where the atomic ratio of oxygen satisfies the stoichiometric ratio.
- the P-type metal oxide semiconductor layer may be CuO x (1.1 ⁇ x ⁇ 1.5) or CoO x (1.1 ⁇ x ⁇ 1.5).
- the N-type metal oxide semiconductor layer is ZnO, SnO 2 , In 2 O 3 , Ga 2 O 3 , InSnO, GaInO, ZnInO, ZnSnO, InGaZnO, TiO 2 , CeO 2 , Al 2 O 3 , Ta 2 O 5 , LaO 2, NbO 2, LiNbO 3, BaSrTiO 3, SrTiO 3, ZrO 2, SrZrO 3, Nb -doped SrTiO 3, Cr-doped SrTiO 3, and Cr in a metal oxide selected from the group consisting of doped SrZrO 3 can makil have.
- the resistive memory element cross-point array has a first end electrode and a second end electrode.
- a switching layer is disposed between the first end electrode and the second end electrode.
- the switching layer includes a pair of first conductivity type metal oxide semiconductor layers and a second conductivity type metal oxide semiconductor layer disposed between the first conductivity type metal oxide semiconductor layers.
- a bipolar variable resistor layer is disposed between the switching layer and the second end electrode.
- the variable resistor layer may be a magnetic tunnel junction (MTJ) structure or a resistance change memory layer.
- MTJ magnetic tunnel junction
- An intermediate electrode may be positioned between the switching layer and the variable resistor layer.
- the first end electrode and the intermediate electrode may be the same material layer.
- Another aspect of the present invention to achieve the above object provides a method of manufacturing a two-terminal switching device.
- a first conductivity type lower metal oxide semiconductor layer is formed on the first electrode.
- a second conductivity type metal oxide semiconductor layer is formed on the first conductivity type lower metal oxide semiconductor layer.
- a first conductive upper metal oxide semiconductor layer is formed on the second conductive metal oxide semiconductor layer.
- a second electrode is formed on the first conductive upper metal oxide semiconductor layer.
- the resultant on which the second electrode is formed may be annealed.
- the annealing may comprise heat treatment or UV treatment.
- the first conductivity type metal oxide semiconductor layers may be the same material layers.
- One of the first conductive type and the second conductive type may be a P type, and the other may be an N type.
- the P-type metal oxide semiconductor layers may have a band gap of 3 eV or less.
- the P-type metal oxide semiconductor layer may be 30% to 50% larger than the case where the atomic ratio of oxygen satisfies the stoichiometric ratio.
- the P-type metal oxide semiconductor layer may be CuO x (1.1 ⁇ x ⁇ 1.5) or CoO x (1.1 ⁇ x ⁇ 1.5).
- the N-type metal oxide semiconductor layer is ZnO, SnO 2 , In 2 O 3 , Ga 2 O 3 , InSnO, GaInO, ZnInO, ZnSnO, InGaZnO, TiO 2 , CeO 2 , Al 2 O 3 , Ta 2 O 5 , LaO 2, NbO 2, LiNbO 3, BaSrTiO 3, SrTiO 3, ZrO 2, SrZrO 3, Nb -doped SrTiO 3, Cr-doped SrTiO 3, and Cr in a metal oxide selected from the group consisting of doped SrZrO 3 can makil have.
- a switching layer including a first conductivity type lower metal oxide semiconductor layer, a second conductivity type metal oxide semiconductor layer, and a first conductivity type upper metal oxide semiconductor layer is formed on the first end electrode.
- a second end electrode is formed on the switching layer.
- a variable resistance layer is formed on the first end electrode before forming the switching layer or on the switching layer before forming the second end electrode.
- the resulting product with the switching layer can be annealed.
- the annealing may comprise heat treatment or UV treatment.
- variable resistor layer may be a bipolar variable resistor layer, for example, a magnetic tunnel junction (MTJ) structure or a resistance change memory layer.
- MTJ magnetic tunnel junction
- An intermediate electrode may be formed between the switching layer and the variable resistor layer.
- the first or second end electrode adjacent to the switching layer and the intermediate electrode may be the same material layer.
- the two-terminal switching device comprises a pair of first conductivity type metal oxide semiconductor layers and a second conductivity type metal oxide semiconductor layer disposed between the first conductivity type metal oxide semiconductor layers, It can exhibit bidirectional switching characteristics that are symmetrical to each other.
- the two-terminal switching device can be used to improve the degree of integration of the resistive memory device cross-point array.
- FIG. 1 is a cross-sectional view showing a two-terminal switching device according to an embodiment of the present invention.
- FIG. 2 is a cross-sectional view illustrating a unit cell of a resistive memory device cross-point array according to an exemplary embodiment of the present invention.
- FIG 3 is a cross-sectional view illustrating a unit cell of a resistive memory device cross-point array according to another exemplary embodiment of the present invention.
- 4A and 4B are schematic diagrams for describing a method of writing a resistive memory device cross-point array according to an exemplary embodiment of the present invention.
- FIG. 5 is a graph showing a Rutherford Backscattering Spectroscopy (RBS) peak for a CoO x film obtained during Preparation of Preparation Example 1.
- RBS Rutherford Backscattering Spectroscopy
- 6A and 6B are graphs showing current-voltage characteristics of P-N-P switching devices manufactured through Preparation Examples 1 to 4;
- FIG. 8 is a graph showing the current-voltage characteristics of the variable resistance device manufactured through Preparation Example 6.
- 9A and 9B are graphs showing current-voltage characteristics of a device including a P-N-P switching device and a variable resistance device connected in series.
- a layer is referred to herein as being “on" another layer or substrate, it may be formed directly on the other layer or substrate, or a third layer may be interposed therebetween.
- the directional expression of the upper side, the upper side, and the upper side may be understood as the meaning of the lower side, the lower side, the lower side, or the side, the side, the side, and the like.
- the expression of the spatial direction should be understood in the relative direction and not limitedly as it means the absolute direction.
- the "first” or “second” is not intended to limit any of the components herein, but should be understood as a term for distinguishing the components.
- FIG. 1 is a cross-sectional view showing a two-terminal switching device according to an embodiment of the present invention.
- a two-terminal switching element is a pair of electrical connections electrically connected to a first electrode 100, a second electrode 300, the first electrode 100, and the second electrode 300, respectively.
- the first conductive type and the second conductive type may be opposite types to each other, and one P type and the other may be N type. Therefore, the two-terminal switching device may have a structure of P-N-P or N-P-N.
- a depletion layer may be formed on the entirety of the second conductivity type metal oxide semiconductor layer 220.
- a current may also be conducted to a portion of the second conductive metal oxide semiconductor layer 220 that is subjected to reverse bias among both surfaces of the second conductive metal oxide semiconductor layer 220 that are in contact with the first conductive metal oxide semiconductor layers 210 and 230.
- the two-terminal switching element may be turned on, and may have both a positive threshold voltage and a negative threshold voltage, thereby implementing bidirectional switching.
- the second conductivity type metal oxide semiconductor layer 220 may have a thickness thinner than that of each of the first conductivity type metal oxide semiconductor layers 210 and 230. In this case, the absolute value of the threshold voltage can be lowered.
- Each of the first conductivity type metal oxide semiconductor layers 210 and 230 may have a thickness of about 10 nm to about 100 nm, preferably about 30 nm or less.
- the second conductivity type metal oxide semiconductor layer 220 may have a thickness of about 1 nm to about 20 nm, preferably about 5 nm or less.
- the first conductivity type metal oxide semiconductor layers 210 and 230 may be a lower metal oxide semiconductor layer 210 having a first conductivity type and an upper metal oxide semiconductor layer 230 having a first conductivity type.
- the upper and lower metal oxide semiconductor layers 210 and 230 may be the same material layer and have substantially the same thickness. In this case, the symmetry of the two-terminal switching device can be improved.
- the present invention is not limited thereto, and the lower metal oxide semiconductor layer 210 having the first conductivity type and the upper metal oxide semiconductor layer 230 having the first conductivity type may be different materials as long as the conductivity type is the same.
- the lower metal oxide semiconductor layer 210 having the first conductivity type and the upper metal oxide semiconductor layer 230 having the first conductivity type may have different thicknesses.
- the second conductive metal oxide semiconductor layer 220 may be an N-type metal oxide semiconductor layer.
- the second conductivity type metal oxide semiconductor layer 220 may be a P type metal oxide semiconductor layer.
- the P-type metal oxide semiconductor layers are, for example, NiO x (1.1 ⁇ x ⁇ 1.5), FeO x (1.1 ⁇ x ⁇ 1.5), CoO x (1.1 ⁇ x ⁇ 1.5), PdO x (1.1 ⁇ x ⁇ 1.5), CuAlO x (1.8 ⁇ x ⁇ 3), CuGaO x (1.8 ⁇ x ⁇ 3), SrCu 2 O x (1 ⁇ x ⁇ 1.8), RhO x (1.1 ⁇ x ⁇ 1.5), CrO x (1.1 ⁇ x ⁇ 1.5), CuO x (1.1 ⁇ x ⁇ 1.5), Cu x O (1.5 ⁇ x ⁇ 2), SnO x (1.1 ⁇ x ⁇ 1.5), Ag x O (1.5 ⁇ x ⁇ 2), LaMnO x (2.5 ⁇ x ⁇ 3 ), YBaCu 2 O x (3.5 ⁇ x ⁇ 4 ), PCMO (PrCaMnO 3 ), LCMO (LaCaMnO 3 ), LSMO (
- the N-type metal oxide semiconductor layers include ZnO, SnO 2 , In 2 O 3 , Ga 2 O 3 , InSnO, GaInO, ZnInO, ZnSnO, InGaZnO, TiO 2 , CeO 2 , Al 2 O 3 , Ta 2 O 5 , LaO 2, NbO 2, LiNbO 3 , BaSrTiO 3, SrTiO 3, ZrO 2, SrZrO 3, Nb -doped SrTiO 3, Cr-doped SrTiO 3, and Cr in a metal oxide makil selected from the group consisting of doped SrZrO 3 Can be.
- the P-type metal oxide semiconductor layer may have a bandgap of 3 eV or less, for example, 2 eV or less. In this case, the current density of the P-type metal oxide semiconductor layer can be greatly improved.
- the P-type metal oxide semiconductor layer may have a bandgap of 1 eV or more. P-type metal oxide semiconductor layer that satisfies this is an example, CuO x (1.1 ⁇ x ⁇ 1.5, band gap is 1.2 to 1.4 eV) or CoO x (1.1 ⁇ x ⁇ 1.5, band gap is 1.4 to 1.6 eV) Can be.
- the P-type metal oxide semiconductor layer may be 10% to 50%, specifically 30% to 50% larger than the case where the atomic ratio of oxygen to metal satisfies the stoichiometric ratio.
- the P-type metal oxide semiconductor layer satisfying this may also be CuO x (1.1 ⁇ x ⁇ 1.5) or CoO x (1.1 ⁇ x ⁇ 1.5).
- the first electrode 100 and the second electrode 300 may be formed of a material capable of making ohmic contact with the first conductive metal oxide semiconductor layers 210 and 230, which are in contact with the first electrode 100 and the second electrode 300, respectively.
- the first electrode 100 and the second electrode 300 may be Al, W, Pt, Ti, TiN, TaN, WN, or Cu.
- Method of manufacturing a two-terminal switching device comprises the steps of forming a first conductivity type lower metal oxide semiconductor layer 210 on the first electrode (100); Forming a second conductivity type metal oxide semiconductor layer (220) on the first conductivity type lower metal oxide semiconductor layer (210); Forming a first conductivity type upper metal oxide semiconductor layer (230) on the second conductivity type metal oxide semiconductor layer (220); And forming a second electrode 300 on the first conductivity type upper metal oxide semiconductor layer 230.
- an upper metal oxide semiconductor having a first electrode 100, a lower metal oxide semiconductor layer 210 having a first conductivity type, a second conductive metal oxide semiconductor layer 220, and a first conductivity type
- the layer 230 and the second electrode 300 are sequentially formed to form a two-terminal switching element.
- the first conductive type and the second conductive type may be opposite types to each other, one P type and the other N type.
- the two-terminal switching element may have a structure of P-N-P or N-P-N.
- the first electrode 100, the lower metal oxide semiconductor layer 210 having a first conductivity type, the second conductive metal oxide semiconductor layer 220, and the upper metal oxide semiconductor layer having a first conductivity type ( 230, and the second electrode 300 may be formed using a sputtering method using a suitable target.
- sputtering may be performed in a mixed atmosphere of inert gas and oxygen.
- metal vacancy can be formed in the P-type metal oxide semiconductor layer, and the current density of the P-type metal oxide semiconductor layer can be improved.
- PVD physical vapor deposition
- PLD Pulsed Laser Deposition
- MBE Molecular Beam Epitaxy
- CVD Chemical Vapor Deposition
- annealing such as heat treatment, UV treatment, or a plurality of combinations thereof may be performed.
- the on current density and the on / off ratio of the two-terminal selection device can be improved and the threshold voltage (turn-on voltage) can be lowered.
- the heat treatment may be heat treatment using Rapid Thermal Annealing (RTA) or furnace.
- the UV treatment may be annealing using a UV lamp and may be performed using UV-C (UV in the wavelength range of 100-280 nm).
- FIG. 2 is a cross-sectional view illustrating a resistive memory device cross-point array according to an exemplary embodiment of the present invention, and is illustrated in a unit cell.
- the resistive memory device cross-point array includes a first end electrode 150 and a second end electrode 350 crossing the top of the first end electrode 150.
- the switching layer 200 and the variable resistor layer 500 which are sequentially stacked at the intersections of the end electrodes 150 and 350 are disposed.
- the present invention is not limited thereto, and the switching layer 200 may be stacked on the variable resistor layer 500.
- the intermediate electrode 400 may be disposed between the switching layer 200 and the variable resistor layer 500.
- the first end electrode 150, the switching layer 200, and the intermediate electrode 400 may constitute a two-terminal switching element SD.
- the intermediate electrode 400 and the variable resistor layer ( 500 and the second end electrode 350 may constitute a variable resistance element RM.
- the first end electrode 150 may serve as a word line or an additional word line may be connected to the first end electrode 150.
- the second end electrode 350 may serve as a bit line or an additional bit line may be connected to the second end electrode 350.
- annealing may be performed.
- Annealing may be heat treatment, UV treatment, or a composite treatment in which a plurality of them are applied. In this case, the on current density and the on / off ratio of the two-terminal selection device SD can be improved and the threshold voltage can be lowered.
- the heat treatment may be heat treatment using Rapid Thermal Annealing (RTA) or furnace.
- RTA Rapid Thermal Annealing
- the UV treatment may be annealing using a UV lamp and may be performed using UV-C (UV in the wavelength range of 100-280 nm).
- Each of the end electrodes 150 and 350 and the intermediate electrode 400 may be an Al, W, Pt, Ti, TiN, TaN, WN, or Cu layer.
- the end electrode and the middle electrode provided on both sides of the switching layer 200 may be made of the same material layer. In this case, the symmetry of the switching device SD may be improved. However, it is not limited to this.
- the switching layer 200 is a second conductivity type metal oxide disposed between the pair of first conductivity type metal oxide semiconductor layers 210 and 230 and the first conductivity type metal oxide semiconductor layers 210 and 230.
- the semiconductor layer 220 is included.
- One of the first conductivity type metal oxide semiconductor layers 210 and 230 is electrically connected to one of the end electrodes 150 and 350.
- the first conductivity type metal oxide semiconductor layers 210 and 230 may be a lower metal oxide semiconductor layer 210 having a first conductivity type and an upper metal oxide semiconductor layer 230 having a first conductivity type.
- the lower metal oxide semiconductor layer 210 is connected to the first end electrode 150.
- the intermediate electrode 400 is disposed, the upper metal oxide semiconductor layer 230 may be connected to the intermediate electrode 400.
- the first conductive metal oxide semiconductor layers 210 and 230 and the second conductive metal oxide semiconductor layer 220 will be described with reference to the embodiment described with reference to FIG. 1.
- the variable resistor layer 500 may be electrically connected to the upper metal oxide semiconductor layer 230. When the intermediate electrode 400 is disposed, the variable resistor layer 500 may be connected to the intermediate electrode 400.
- the variable resistor layer 500 may be a bipolar variable resistor layer.
- the variable resistance element RM including the variable resistor layer 500 may be a magnetoresistive random access memory (MRAM), specifically, a spin transfer torque type magnetoresistive memory element (Spin Transfer Torque MRAM).
- MRAM magnetoresistive random access memory
- Spin Transfer Torque MRAM spin Transfer Torque MRAM
- the variable resistor layer 500 includes a magnetic tunnel junction (MTJ) structure, wherein the MTJ structure is a ferromagnetic pinned layer (510), a tunnel barrier layer, 520 and a ferromagnetic free layer 530.
- MTJ magnetic tunnel junction
- the MTJ structure may further include a pinning layer (not shown) below the pinned layer 510.
- the pinned layer 510 is a layer in which magnetization reversal does not occur and may be a CoFeB or FePt layer.
- the tunnel barrier layer 520 may be an aluminum oxide film or a magnesium oxide film.
- the free layer 530 may be a CoFeB or FePt layer in which magnetization reversal occurs above a critical current density.
- the free layer 530 may have a magnetization direction opposite to the fixed layer above a positive threshold current density and may have a magnetization direction opposite to the fixed layer below a negative threshold current density. Therefore, the spin transfer torque magnetoresistive memory element can operate as a bipolar element.
- a first conductive type lower metal oxide semiconductor layer 210 and a second conductive type metal oxide semiconductor layer are formed on a first end electrode 150.
- the first end electrode 150 is formed.
- the first end electrode 150 may be formed to extend in one direction.
- the switching layer 200 may be formed on the first end electrode 150.
- the variable resistor layer 500 may be formed on the switching layer 200.
- a second end electrode 350 may be formed on the variable resistor layer 500 to cross the first end electrode 150.
- the present invention is not limited thereto, and the variable resistor layer 500 may be formed on the first end electrode 150 before the switching layer 200 is formed. As a result, a stack structure of the switching layer 200 and the variable resistor layer 500 may be disposed at the intersections of the end electrodes 150 and 350.
- An intermediate electrode 400 may be formed between the switching layer 200 and the variable resistor layer 500.
- the first end electrode 150, the switching layer 200, and the intermediate electrode 400 may constitute a two-terminal switching element SD, and the intermediate electrode 400 may be variable.
- the resistor layer 500 and the second end electrode 350 may constitute a variable resistance element RM.
- the first end electrode 150 may serve as a word line or an additional word line may be connected to the first end electrode 150.
- the second end electrode 350 may serve as a bit line or an additional bit line may be connected to the second end electrode 350.
- annealing may be performed.
- Annealing may be heat treatment, UV treatment, or a composite treatment in which a plurality of them are applied. In this case, the on current density and the on / off ratio of the two-terminal selection device SD can be improved and the threshold voltage can be lowered.
- the heat treatment may be heat treatment using Rapid Thermal Annealing (RTA) or furnace.
- RTA Rapid Thermal Annealing
- the UV treatment may be annealing using a UV lamp and may be performed using UV-C (UV in the wavelength range of 100-280 nm).
- FIG. 3 is a cross-sectional view illustrating a resistive memory device cross-point array according to another exemplary embodiment of the present invention, and is limited to a unit cell.
- the resistive memory element cross-point array according to the present embodiment is similar to the cross-point array described with reference to FIG. 2 except as described below.
- the variable resistance element RM including the variable resistor layer 600 may be a resistance change memory device RRAM.
- the variable resistor layer 600 is a bipolar variable resistor layer, specifically, a resistance change memory layer having bipolar characteristics.
- the variable resistor layer 600 may include a transition metal oxide layer, It may be a chalcogenide film, a perovskite film, or a metal doped solid electrolyte film.
- the metal oxide film may be SiO 2 , Al 2 O 3 , or a transition metal oxide film.
- the transition metal oxide film is HfO 2-x , MnO 2-x , ZrO 2-x , Y 2 O 3-x , TiO 2-x , NiO 1-y , Nb 2 O 5-x , Ta 2 O 5-x , CuO 1-y , Fe 2 O 3-x (eg, 0 ⁇ x ⁇ 1.5, 0 ⁇ y ⁇ 0.5) or a lanthanoids oxide layer.
- the lanthanoid may be La (Lanthanum), Ce (Cerium), Pr (Praseodymium), Nd (Neodymium), Sm (Samarium), Gd (Gadolinium), or Dy (Dysprosium).
- the chalcogenide film GeSbTe film, GeTeO may be in the perovskite film SrTiO 3, Cr or Nb-doped SrZrO 3 film, PCMO (Pr 1-X Ca X MnO 3 , 0 ⁇ X ⁇ 1), or LCMO (La 1-X Ca X MnO 3 , 0 ⁇ X ⁇ 1, for example, X is 0.3).
- the metal doped solid electrolyte layer may be a Ag doped layer, that is, an AgGeSe layer in GeSe.
- oxygen ions in the resistance change memory layer 600 may move to the second end electrode 350 to be stored in the second end electrode 350. Can be. At this time, the resistance change memory layer 600 is rich in oxygen vacancy may be changed to a low resistance.
- oxygen ions that have moved to the second end electrode 350 may return to the resistance change memory layer 600, and in this case, the resistance change memory layer 600.
- the second end electrode 350 may be TiN or WN with little resistance change even after oxygen storage.
- each of the first end electrode 150 and the intermediate electrode 400 may be an Al, W, Pt, Ti, TaN, WN, or Cu layer.
- FIG. 4A is a schematic diagram illustrating a method of forward writing a resistive memory device cross-point array according to an exemplary embodiment of the present invention.
- a plurality of first data lines that is, word lines W n , W n + 1 , W n + 2 , and W n + 3 , and a plurality of second data lines intersecting therewith, Bit lines B m , B m + 1 , B m + 2 and B m + 3 are arranged.
- the two-terminal switching element SD and the variable resistance element RM connected to each other in series at the intersection of each word line and each bit line are disposed.
- the present invention is not limited thereto, and the two-terminal switching element SD and the variable are not limited thereto.
- the positions of the resistance elements RM may be interchanged.
- V write may have a value greater than or equal to the threshold voltage of the two-terminal switching element SD and more than or equal to the set voltage of the variable resistance element RM, and 1/2 V write is less than or equal to the set voltage of the resistive memory element RM. Can have Therefore, in the selected unit cell, only the resistive memory device RM may be selectively changed to the low resistance state LRS. On the other hand, in the unit cell that is not selected, the state of the resistive memory element RM may remain in the previous state without changing.
- FIG. 4B is a schematic diagram illustrating a reverse writing method of a resistive memory device cross-point array according to an exemplary embodiment of the present invention.
- the write method according to the present embodiment is similar to the forward write method described with reference to FIG. 4A except for the following.
- bit lines B m , B m + 2 and B m + 3 that are not selected to have -1/2 V write to the selected bit line B m + 1 among the bit lines.
- -V write is applied to the selected unit cell located at the intersection of the selected bit line B m + 1 and the selected word line W n + 1 , and OV, 1/2 V write to the remaining unselected unit cells. Or -1/2 V write may be applied.
- ⁇ V write may have a value less than or equal to the reverse threshold voltage of the two-terminal switching element SD and less than or equal to the reset voltage of the resistive memory element RM. Therefore, in the selected unit cell, only the resistive memory device RM may be selectively changed to the high resistance state HRS. On the other hand, in the unit cell that is not selected, the state of the resistive memory element RM may remain in the previous state without changing.
- a 30 nm Ti layer was formed on the SiO 2 layer of a Si substrate including a 200 nm SiO 2 layer by using a magnetron sputtering method of Ti in a pure argon atmosphere, and then a magnetron targeted to Pt in the same atmosphere.
- a 100 nm Pt layer was formed using the sputtering method.
- a P-type metal oxide semiconductor film of 30 nm CoO x was formed on the Pt layer by using a magnetron sputtering method targeting CoO in a mixed atmosphere of 1.1 sccm of oxygen and 10 sccm of argon.
- IGZO InGaZnO
- a Pt pattern of 100 was formed on the CoO x film by using a magnetron sputtering method targeting Pt in a pure argon atmosphere and using a metal shadow mask.
- a UV treatment was performed in which a high vacuum of 10 ⁇ 6 Torr or less was exposed to ultraviolet light of UV-C (wavelength of 100-280 nm region) for 20 minutes or more.
- a switching device was manufactured in the same manner as in Example 1, except that the IGZO film was formed at 10 nm.
- a switching device was manufactured in the same manner as in Example 1, except that the IGZO film was formed at 20 nm.
- a switching device was manufactured in the same manner as in Example 1, except that the IGZO film was formed at 50 nm.
- a switching device was manufactured in the same manner as in Preparation Example 1, except that the UV treatment was not performed.
- FIG. 5 is a graph showing a Rutherford Backscattering Spectroscopy (RBS) peak of a CoOx film obtained during Preparation of Preparation Example 1.
- RBS Rutherford Backscattering Spectroscopy
- the atomic ratio of Co and O in the CoO x film was 1: 1.4, that is, x was 1.4.
- 6A and 6B are graphs showing current-voltage characteristics of P-N-P switching devices manufactured through Preparation Examples 1 to 4;
- the turn-on voltage of the PNP switching element is about 2V
- the on current (@ 4V) has a very good value of about 10 ⁇ 2 .
- This improvement in on current is believed to be due to the improvement in current density of the CoO x film, which is a P-type metal oxide semiconductor film.
- the current density improvement of the CoO x film may be due to the increase of the metal pore content with increasing x value.
- the turn-on voltage is slightly reduced and the on-current is improved as compared with the case of performing the UV treatment (Production Example 1) but not the UV treatment (Production Example 7). It can be estimated from this that UV treatment improves the interfacial properties between the metal oxide semiconductor layers and / or between the metal oxide semiconductor layer and the metal layer.
- a 30 nm Ti layer was formed on the SiO 2 layer of a Si substrate including a 200 nm SiO 2 layer by using a magnetron sputtering method of Ti in a pure argon atmosphere, and then a magnetron targeted to Pt in the same atmosphere.
- a 100 nm Pt layer was formed using the sputtering method.
- a TiN pattern of 100 nm was formed on the TiO x film by using a magnetron sputtering method targeting Ti in a mixed atmosphere of 1.5 sccm nitrogen and 8 sccm argon and using a metal shadow mask.
- FIG. 8 is a graph showing the current-voltage characteristics of the variable resistance device manufactured through Preparation Example 6.
- variable resistance device manufactured through Preparation Example 6 exhibits bipolarity such as a set voltage of about 2V and a reset voltage of about ⁇ 2V.
- FIGS. 9A and 9B are graphs showing current-voltage characteristics of a device including a P-N-P switching device and a variable resistance device connected in series. Specifically, Pt, the upper electrode of the P-N-P switching device manufactured in Preparation Example 1, and Pt, the lower electrode of the variable resistance device manufactured in Preparation Example 6, were connected through wire bonding.
- the forward threshold voltage Vth_1 of the switching device is about 1V and the reverse threshold voltage Vth_2 is about ⁇ 1V.
- the set voltage of the variable resistance element is about 4V and the reset voltage is about -4V.
- V write described with reference to FIGS. 4A and 4B may be set to about 4V, which is a set voltage
- ⁇ V write may be set to about ⁇ 4V, which is a reset voltage.
- the ratio of the on current to the off current may be about 4.
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Abstract
Description
Claims (39)
- 제1 전극;제2 전극;상기 제1 전극과 상기 제2 전극에 각각 전기적으로 접속하는 한 쌍의 제1 도전형 금속 산화물 반도체층들; 및상기 제1 도전형 금속 산화물 반도체층들 사이에 배치된 제2 도전형 금속 산화물 반도체층을 포함하는 2-단자 스위칭 소자.
- 제1항에 있어서,상기 제1 도전형 금속 산화물 반도체층들은 서로 같은 물질층들인 2-단자 스위칭 소자.
- 제1항에 있어서,상기 제1 도전형과 제2 도전형 중 어느 하나는 P형이고 나머지 하나는 N형인 2-단자 스위칭 소자.
- 제3항에 있어서,상기 P형 금속 산화물 반도체층들은 3eV 이하의 밴드갭을 갖는 2-단자 스위칭 소자.
- 제3항에 있어서,상기 P형 금속 산화물 반도체층은 산소의 원자비가 화학양론비를 만족하는 경우에 비해 30% 내지 50% 큰 2-단자 스위칭 소자.
- 제3항에 있어서,상기 각 P형 금속 산화물 반도체층은 CuOx(1.1<x≤1.5) 또는 CoOx(1.1<x≤1.5)인 2-단자 스위칭 소자.
- 제3항에 있어서,상기 N형 금속 산화물 반도체층은 ZnO, SnO2, In2O3, Ga2O3, InSnO, GaInO, ZnInO, ZnSnO, InGaZnO, TiO2, CeO2, Al2O3, Ta2O5, LaO2, NbO2, LiNbO3, BaSrTiO3, SrTiO3, ZrO2, SrZrO3, Nb 도핑된 SrTiO3, Cr 도핑된 SrTiO3, 및 Cr 도핑된 SrZrO3로 이루어진 군에서 선택되는 하나의 금속 산화물막인 2-단자 스위칭 소자.
- 제1 단부 전극;제2 단부 전극;상기 제1 단부 전극과 상기 제2 단부 전극 사이에 배치되고, 한 쌍의 제1 도전형 금속 산화물 반도체층들과 상기 제1 도전형 금속 산화물 반도체층들 사이에 배치된 제2 도전형 금속 산화물 반도체층을 포함하는 스위칭층; 및상기 스위칭층과 상기 제2 단부 전극 사이에 배치된 양극성 가변 저항체층을 포함하는 저항성 메모리 소자 크로스-포인트 어레이.
- 제8항에 있어서,상기 가변 저항체층은 자기터널접합(Magnetic Tunnel Junction; MTJ) 구조체 또는 저항 변화 메모리층인 저항성 메모리 소자 크로스-포인트 어레이.
- 제8항에 있어서,상기 스위칭층과 상기 가변 저항체층 사이에 위치하는 중간 전극을 더 포함하는 저항성 메모리 소자 크로스-포인트 어레이.
- 제10항에 있어서,상기 제1 단부 전극과 상기 중간 전극은 서로 같은 물질층인 저항성 메모리 소자 크로스-포인트 어레이.
- 제8항에 있어서,상기 제1 도전형 금속 산화물 반도체층들은 서로 같은 물질층들인 저항성 메모리 소자 크로스-포인트 어레이.
- 제8항에 있어서,상기 제1 도전형과 제2 도전형 중 어느 하나는 P형이고 나머지 하나는 N형인 저항성 메모리 소자 크로스-포인트 어레이.
- 제13항에 있어서,상기 P형 금속 산화물 반도체층들은 3eV 이하의 밴드갭을 갖는 저항성 메모리 소자 크로스-포인트 어레이.
- 제13항에 있어서,상기 P형 금속 산화물 반도체층은 산소의 원자비가 화학양론비를 만족하는 경우에 비해 30% 내지 50% 큰 저항성 메모리 소자 크로스-포인트 어레이.
- 제13항에 있어서,상기 각 P형 금속 산화물 반도체층은 CuOx(1.1<x≤1.5) 또는 CoOx(1.1<x≤1.5)인 저항성 메모리 소자 크로스-포인트 어레이.
- 제13항에 있어서,상기 N형 금속 산화물 반도체층은 ZnO, SnO2, In2O3, Ga2O3, InSnO, GaInO, ZnInO, ZnSnO, InGaZnO, TiO2, CeO2, Al2O3, Ta2O5, LaO2, NbO2, LiNbO3, BaSrTiO3, SrTiO3, ZrO2, SrZrO3, Nb 도핑된 SrTiO3, Cr 도핑된 SrTiO3, 및 Cr 도핑된 SrZrO3로 이루어진 군에서 선택되는 하나의 금속 산화물막인 저항성 메모리 소자 크로스-포인트 어레이.
- 제1 전극 상에 제1 도전형 하부 금속 산화물 반도체층을 형성하는 단계;상기 제1 도전형 하부 금속 산화물 반도체층 상에 제2 도전형 금속 산화물 반도체층을 형성하는 단계;상기 제2 도전형 금속 산화물 반도체층 상에 제1 도전형 상부 금속 산화물 반도체층을 형성하는 단계; 및상기 제1 도전형 상부 금속 산화물 반도체층 상에 제2 전극을 형성하는 단계를 포함하는 2-단자 스위칭 소자 제조방법.
- 제18항에 있어서,상기 제2 전극이 형성된 결과물을 어닐링 하는 단계를 더 포함하는 2-단자 스위칭 소자 제조방법.
- 제19항에 있어서,상기 어닐링은 열처리 또는 UV 처리를 포함하는 2-단자 스위칭 소자 제조방법.
- 제18항에 있어서,상기 제1 도전형 금속 산화물 반도체층들은 서로 같은 물질층들인 2-단자 스위칭 소자 제조방법.
- 제18항에 있어서,상기 제1 도전형과 제2 도전형 중 어느 하나는 P형이고 나머지 하나는 N형인 2-단자 스위칭 소자 제조방법.
- 제22항에 있어서,상기 P형 금속 산화물 반도체층은 3eV 이하의 밴드갭을 갖는 2-단자 스위칭 소자 제조방법.
- 제22항에 있어서,상기 P형 금속 산화물 반도체층은 산소의 원자비가 화학양론비를 만족하는 경우에 비해 30% 내지 50% 큰 2-단자 스위칭 소자 제조방법.
- 제22항에 있어서,상기 P형 금속 산화물 반도체층은 CuOx(1.1<x≤1.5) 또는 CoOx(1.1<x≤1.5)인 2-단자 스위칭 소자 제조방법.
- 제22항에 있어서,상기 N형 금속 산화물 반도체층은 ZnO, SnO2, In2O3, Ga2O3, InSnO, GaInO, ZnInO, ZnSnO, InGaZnO, TiO2, CeO2, Al2O3, Ta2O5, LaO2, NbO2, LiNbO3, BaSrTiO3, SrTiO3, ZrO2, SrZrO3, Nb 도핑된 SrTiO3, Cr 도핑된 SrTiO3, 및 Cr 도핑된 SrZrO3로 이루어진 군에서 선택되는 하나의 금속 산화물막인 2-단자 스위칭 소자 제조방법.
- 제1 단부 전극 상에 제1 도전형 하부 금속 산화물 반도체층, 제2 도전형 금속 산화물 반도체층, 및 제1 도전형 상부 금속 산화물 반도체층을 포함하는 스위칭층을 형성하는 단계;상기 스위칭층 상에 제2 단부 전극을 형성하는 단계; 및상기 스위칭층을 형성하기 전 상기 제1 단부 전극 상에, 또는 상기 제2 단부 전극을 형성하기 전 상기 스위칭층 상에 가변 저항층을 형성하는 단계를 포함하는 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제27항에 있어서,상기 스위칭층이 형성된 결과물을 어닐링하는 단계를 더 포함하는 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제28항에 있어서,상기 어닐링은 열처리 또는 UV 처리를 포함하는 메모리 소자 크로스-포인트 어레이 제조방법.
- 제27항에 있어서,상기 가변 저항체층은 양극성 가변 저항체층인 메모리 소자 크로스-포인트 어레이 제조방법.
- 제30항에 있어서,상기 양극성 가변 저항체층은 자기터널접합(Magnetic Tunnel Junction; MTJ) 구조체 또는 저항 변화 메모리층인 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제27항에 있어서,상기 스위칭층과 상기 가변 저항체층 사이에 중간 전극을 형성하는 단계를 더 포함하는 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제32항에 있어서,상기 스위칭층에 인접한 제1 또는 제2 단부 전극과 상기 중간 전극은 서로 같은 물질층인 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제27항에 있어서,상기 제1 도전형 금속 산화물 반도체층들은 서로 같은 물질층들인 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제27항에 있어서,상기 제1 도전형과 제2 도전형 중 어느 하나는 P형이고 나머지 하나는 N형인 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제35항에 있어서,상기 P형 금속 산화물 반도체층은 3eV 이하의 밴드갭을 갖는 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제35항에 있어서,상기 P형 금속 산화물 반도체층은 산소의 원자비가 화학양론비를 만족하는 경우에 비해 30% 내지 50% 큰 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제35항에 있어서,상기 P형 금속 산화물 반도체층은 CuOx(1.1<x≤1.5) 또는 CoOx(1.1<x≤1.5)인 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
- 제35항에 있어서,상기 N형 금속 산화물 반도체층은 ZnO, SnO2, In2O3, Ga2O3, InSnO, GaInO, ZnInO, ZnSnO, InGaZnO, TiO2, CeO2, Al2O3, Ta2O5, LaO2, NbO2, LiNbO3, BaSrTiO3, SrTiO3, ZrO2, SrZrO3, Nb 도핑된 SrTiO3, Cr 도핑된 SrTiO3, 및 Cr 도핑된 SrZrO3로 이루어진 군에서 선택되는 하나의 금속 산화물막인 저항성 메모리 소자 크로스-포인트 어레이 제조방법.
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US20190148455A1 (en) | 2019-05-16 |
CN105144383A (zh) | 2015-12-09 |
US11043536B2 (en) | 2021-06-22 |
US20160043142A1 (en) | 2016-02-11 |
CN105144383B (zh) | 2019-11-19 |
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