WO2009148070A1 - アライメント機能付きステージ及びこのアライメント機能付きステージを備えた処理装置並びに基板アライメント方法 - Google Patents
アライメント機能付きステージ及びこのアライメント機能付きステージを備えた処理装置並びに基板アライメント方法 Download PDFInfo
- Publication number
- WO2009148070A1 WO2009148070A1 PCT/JP2009/060118 JP2009060118W WO2009148070A1 WO 2009148070 A1 WO2009148070 A1 WO 2009148070A1 JP 2009060118 W JP2009060118 W JP 2009060118W WO 2009148070 A1 WO2009148070 A1 WO 2009148070A1
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- Prior art keywords
- stage
- substrate
- alignment function
- movement mechanism
- alignment
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/063—Transporting devices for sheet glass
- B65G49/064—Transporting devices for sheet glass in a horizontal position
- B65G49/065—Transporting devices for sheet glass in a horizontal position supported partially or completely on fluid cushions, e.g. a gas cushion
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/067—Sheet handling, means, e.g. manipulators, devices for turning or tilting sheet glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2249/00—Aspects relating to conveying systems for the manufacture of fragile sheets
- B65G2249/04—Arrangements of vacuum systems or suction cups
- B65G2249/045—Details of suction cups suction cups
Definitions
- the present invention relates to a stage with an alignment function, a processing apparatus including the stage with an alignment function, and a substrate alignment method, and in particular, is used in an ink jet coating apparatus including a coating head that is movably disposed along one axis.
- an ink jet coating apparatus including a coating head that is movably disposed along one axis.
- coating apparatus In order to directly form a fine conductive pattern or the like on a substrate without going through a photolithography process, it is known to use an ink jet coating apparatus (hereinafter referred to as “coating apparatus”). It is also used to form high-definition source / drain electrode patterns of several ⁇ m in the substrate manufacturing process, and to form color filters, alignment films and spacers for flat panel displays.
- Patent Document 1 an apparatus having the following configuration is known from Patent Document 1. That is, the device described in Patent Document 1 is composed of a stage and an ink jet unit that can hold a substrate to be processed by opening its processing surface. The stage is movable along the X-axis guide by a feed screw having a motor. On the other hand, the ink jet means is arranged in a gate-type support means provided so as to straddle the stage on the moving path of the stage, and is movable on the support means in the Y-axis direction, and applies predetermined ink to the substrate. And at least one coating head.
- the present invention includes a low-cost stage with an alignment function and a stage with this alignment function that can perform alignment in the ⁇ direction with high accuracy and easily even when the weight of a processing object is large. It is an object of the present invention to provide a processing apparatus and a substrate alignment method.
- the invention according to claim 1 is a stage with an alignment function including a stage main body that holds a processing object by opening the processing surface, and the processing surface of the processing object.
- An adsorption means that can be adsorbed on the other side facing away from the surface, a gas supply means that supplies gas to an area other than the adsorption location of the adsorption means, and the object to be processed within the same plane with the adsorption means as a rotation center.
- the processing object is placed on the stage with its processing surface opened, and the suction means is adsorbed on the other surface of the processing object facing away from the processing surface. And gas is supplied to the said other surface except the area
- the driving unit rotates the suction unit by a predetermined angle within the same plane with the rotation unit as the rotation center
- the processing object can rotate integrally with the suction unit by a predetermined angle.
- alignment can be performed by rotating the substrate in the ⁇ direction.
- the portion excluding the region is levitated (in this case, at least the frictional resistance between the portion and the upper surface of the stage is reduced).
- a rotating mechanism such as a large bearing is used. Is not necessary, and the enlargement of the apparatus itself can be avoided.
- the object to be processed can be rotated with a small thrust, alignment can be performed with high accuracy without using a high-performance motor, which contributes to cost reduction.
- the alignment in the ⁇ direction can be performed without moving the processing means such as the ink jet means arranged to face the processing object held on the stage, the control thereof is also easy.
- the invention described in claim 2 includes a holding tray that holds a processing object with its processing surface opened, and a stage body that rotatably supports the holding tray.
- a stage with an alignment function the gas supply means for supplying gas to the other surface of the holding tray facing away from the processing surface of the processing object, and the holding tray so as to rotate the holding tray in the same plane
- a driving means for rotationally driving the motor.
- the object to be processed is held in the state of being held by the holding tray and is driven in a state where the holding tray is floated (similar to the above, at least the frictional resistance between the holding tray and the upper surface of the stage is reduced).
- the rotation mechanism such as a large bearing or a high-performance motor is unnecessary and contributes to cost reduction. .
- the processing means such as a coating head disposed above the guiding means.
- a vacuum pump is formed in which a suction groove is formed on a contact surface of the stage main body or the holding tray with the object to be processed, and the suction groove is evacuated while the substrate is placed on the stage or the holding tray. If the structure provided with this is adopted, for example, when the stage main body is moved along the guide means, the processing object may be reliably held by the stage main body or the holding tray.
- the driving means is composed of a fine movement mechanism for rotating the suction means within a predetermined minute angle range and a coarse movement mechanism for rotating the suction means within an angle range larger than the fine movement mechanism, the driving means is rough. After the processing object is rotationally driven at high speed to the vicinity of the target position by the moving mechanism, high-accuracy positioning can be performed by the fine moving mechanism. Thereby, highly accurate and short-time alignment is realizable.
- the coarse movement mechanism is connected to the suction means, and the fine movement mechanism includes an arm and a drive source that swings the arm.
- the coarse movement mechanism If the fine movement mechanism and the coarse movement mechanism are connected so that the suction means is rotationally driven, the rotation shaft for rotationally driving the suction means can be made common, and the configuration of the drive means becomes complicated. Can be avoided.
- the arm of the fine movement mechanism has a length that extends at least to one side of the stage main body, and an arm necessary for moving a predetermined minute angle is adopted if a configuration in which the tip is connected to the drive source is adopted.
- the amount of displacement at the tip is increased, and the resolution of the detecting means such as an encoder for detecting the amount of displacement can be increased to realize a more accurate alignment.
- the processing apparatus of this invention opposes the stage with an alignment function of any one of Claim 1 thru
- the substrate alignment method of the present invention is such that a substrate to be processed is placed on a stage with its processing surface opened, and suction means is sucked on the other surface opposite to the processing surface. Gas is supplied to the other surface excluding the region adsorbed by the adsorption means, and the substrate is rotated by a predetermined angle within the same plane with the adsorption means as a rotation center, thereby aligning the processing object. It is characterized by.
- the step of aligning the processing object may be performed by rotating the suction means within an angle range larger than a predetermined minute angle and further rotating the suction means within the minute angle range. High-precision and short-time alignment can be realized.
- a substrate S such as glass on which a fine conductive pattern or the like is directly formed is used as a processing target, and the stage with an alignment function of the embodiment of the present invention that holds the substrate S is an inkjet type processing apparatus.
- a case where the present invention is applied to a coating apparatus will be described as an example.
- the ink jet apparatus includes a platform 1, and a rectangular parallelepiped base plate 2 is disposed on the platform 1.
- the base plate 2 is formed of granite or the like so that the smoothness of the upper surface can be ensured.
- a pair of left and right rail members (guide means) 3R extending horizontally in the axial direction over the entire length thereof, 3L is provided with a predetermined interval (see FIG. 2).
- a stage 4 with an alignment function is disposed on the rail members 3R and 3L so as to be reciprocally movable.
- the stage 4 includes a plate-like stage main body 4a, and sliders 5 that are slidably engaged with the rail members 3R and 3L are attached to four corners of the lower surface of the stage main body 4a.
- a nut member (not shown) is also provided on the lower surface of the stage body 4a. The nut member is provided between the two rail members 3R and 3L along the rail members 3R and 3L. Are screwed together.
- the stage 4 When the feed screw is rotated by driving a motor (not shown) connected to one end of the feed screw, the stage 4 reciprocates on the rail members 3R and 3L (hereinafter, this reciprocating direction is referred to as the X-axis direction).
- the feed screw and the motor constitute the moving means of the present embodiment.
- the moving means is not limited to this.
- a linear motor composed of a magnetically levitated movable element and a stator may be used.
- a transfer robot provided with an articulated arm having a known structure.
- the substrate S is transferred to the stage main body 4a by R.
- a plurality of support rods 6a erected so as to penetrate the base plate 2 in the vertical direction of the base plate 2, and an air cylinder (not shown) for raising and lowering each support rod 6a,
- the lift means 6 is provided so that the substrate S can be pushed up and supported at a predetermined height position from the upper surface of the stage body 4a (see FIG. 1).
- the stage body 4a is appropriately reciprocated in the X-axis direction to perform predetermined processing. Is to be done.
- the ink jet means 7 serving as the processing means is disposed at a substantially central portion of the rail members 3R and 3L.
- the ink jet means 7 applies ink to a gate-shaped support member 7a provided on the base plate 2 so as to straddle the stage main body 4a in a direction orthogonal to the X-axis direction and the substrate S installed on the stage main body 4a.
- a plurality of coating heads 7b are examples of coating heads 7b.
- Each coating head 7b is held by a holder 7d so that the tip of the nozzle 7c is positioned on the same horizontal plane and equidistant from each other.
- the holder 7d is disposed at the processing position side (left side in FIG. 1). It is attached to the upper horizontal portion of the support member 7a as shown in FIG. In this case, the holder 7d is screwed into a feed screw with a motor (not shown) housed in the upper horizontal portion of the support means 7a.
- a motor not shown
- each coating head 3 is rotated. However, they reciprocate integrally in a direction orthogonal to the X-axis direction (hereinafter, this reciprocating direction is referred to as the Y-axis direction).
- Each coating head 7b has a known structure, and drives the piezo element provided in the ink chamber as appropriate to drop the ink stored in the ink tank 5.
- the ink stored in the ink tank 5 is appropriately selected according to what is to be formed on the surface of the substrate S. For example, if the ink is used for forming a spacer for a flat panel display, spacer particles, a binder, An ink made of a solvent is used.
- the substrate S when the substrate S is transferred to the stage main body 4a by the transfer robot R as described above, the substrate S may be displaced with respect to the stage main body 4a. For this reason, it is necessary to perform alignment (alignment) of the substrate S with respect to the application head 7b prior to application of ink.
- the substrate S in addition to the X-axis direction and the Y-axis direction, the substrate S may be rotated in the same plane to adjust the inclination (rotation angle ⁇ ) of the substrate S with respect to each coating head 7b (hereinafter, this rotation).
- the direction is referred to as the ⁇ direction: see FIG.
- an adsorption unit 8 that can be adsorbed to the center region of the back surface of the substrate S, and a gas supply unit 9 that supplies gas to the back surface region of the substrate S other than the adsorbed portion of the adsorption unit 8.
- a drive means 10 for applying a rotational force to the suction means 8 so that the substrate S is rotated in the ⁇ direction within the same plane with the suction means 8 as a rotation center that is, a drive means 10 for rotationally driving the suction means 8. (See FIG. 3).
- the suction means 8 includes a chuck plate 11 accommodated in a concave portion 4b having a rectangular shape in plan view provided at the center of the stage body 4a.
- the chuck plate 11 is made of, for example, a suction pad having a known structure or a disk having a porous structure, and is connected to a vacuum pump via an exhaust pipe (not shown). When the vacuum pump is activated, the chuck plate 11 is attracted to the back surface of the substrate S over the entire surface. Further, a through hole 4c communicating with the recess 4b is formed concentrically in the center of the back side of the stage body 4a.
- a sleeve member 12 and a ball bearing 13 are provided in the through hole 4c, and the pressing member 14 is supported by the ball bearing 13. ing.
- the pressing member 14 and the inner race 13a of the ball bearing 13 are, for example, key connection using a parallel key or spline connection (see FIG. 4).
- the pressing member 14 is connected to a drive rod 15a of a linear motion actuator 15 having a known structure disposed below the pressing member 14.
- a linear motion actuator 15 having a known structure disposed below the pressing member 14.
- an air cylinder can be used instead of the direct acting actuator.
- the air cylinder is operated using the gas supplied from the gas supply means 9. May be adopted to simplify the apparatus.
- the actuator 15 When the actuator 15 is actuated, the chuck plate 11 is positioned between a raised position where the upper surface of the chuck plate 11 protrudes upward from the upper surface of the stage body 4a and a lowered position where the upper surface of the chuck plate 11 is at least flush with the upper surface of the stage body. It can move up and down freely.
- the pressing member 14 is driven to rotate, and the chuck plate 11 and eventually the substrate S are rotated about the pressing member 14 that is the rotation axis of the suction means 8 as a rotation center. It is rotated in the ⁇ direction.
- the gas supply means 9 includes a plurality of concave grooves 16 formed over substantially the entire length in the X direction on the upper surface of the stage body 4a, and a porous air pad 17 disposed in each concave groove 16 at a predetermined interval.
- the gas pipe 18 supplies gas such as compressed air to the air pads 17 from a compressor or the like (not shown) (see FIGS. 2 and 4). In this case, the number of grooves 16 formed and the number of air pads 17 are appropriately set according to the weight of the substrate S supported by the stage body 4a.
- the driving means 10 includes a plate-like arm 19. One end of the arm 19 is pin-coupled to the inner race 13a on the center line. The other end of the arm 19 extends to the side surface of the stage main body and is connected to a drive source 20 provided on the side surface.
- the drive source 20 includes a frame 20a, and a feed screw 20b having a motor M is arranged in the X-axis direction in the frame 20a.
- a movable member 20c having a screw hole is screwed to the feed screw 20b, and a slider portion 20d is formed on the upper portion of the movable member 20c. The slider portion 20d is attached in parallel to the feed screw 20b on the inner surface of the frame 20a.
- the rail member 20e is slidably engaged with the rail member 20e. Accordingly, when the motor M is operated to rotate the feed screw 20b, the movable member 20c can reciprocate in the X-axis direction according to the rotation direction of the motor M (see FIGS. 2 and 5).
- a rail portion 20f extending in the Y-axis direction is formed on the lower surface of the movable member 20c, and a support member 20g is slidably engaged with the rail portion 20f.
- the other end of the arm 19 is connected to the lower end of the support member 20g through a bearing 20h.
- the arm 19 is swung within the range of the reciprocating stroke of the movable member 20c, and the pressing member 14 and thus the suction means 9 are rotated within a predetermined minute angle range (for example, within 1 degree).
- a predetermined minute angle range for example, within 1 degree.
- the fine movement mechanism as the driving means is indicated by reference numeral 10).
- the minute angle range of the present invention can be appropriately set according to the accuracy required when the alignment of the substrate S is performed, and the minute angle range can be adjusted by changing the stroke of the reciprocating motion of the movable member 20c.
- the drive source 20 is provided with detection means such as a photoelectric linear encoder (not shown) so that the displacement amount of the movable member 20c can be detected.
- the displacement amount of the movable member 20c when the arm 19 is moved to move a predetermined minute angle is determined by providing a detection means such as a rotary encoder on the pressing member 14, for example. It becomes larger compared with the case of detecting. As a result, the resolution of the detection means for detecting the amount of displacement can be increased to achieve a more accurate alignment.
- a plurality of suction grooves 21 communicating with the vacuum pump are formed on the upper surface of the stage body 4a so as to extend in the X-axis direction and the Y-axis direction (see FIG. 2).
- the suction groove 21 is evacuated to suck and hold the substrate S over substantially the entire surface.
- the substrate S by the stage 4 with an alignment function of the present embodiment will be described.
- the substrate S is transported by the transport robot R and installed so that the substrate S is supported by the tips of the support rods 6a ( (See FIG. 1).
- the support rods 6a are lowered to place the substrate S on the stage body 4a.
- the substrate S to which the ink is applied has at least a mark R of a predetermined shape (having several tens of ⁇ m to 0.1 mm) at a position that becomes the starting point of the scanning surface when the ink is applied by the ink jet means 7. One is attached (see FIG. 2).
- the suction groove 21 is evacuated, and the substrate S is sucked onto the stage main body 4a over substantially the entire surface.
- a feed screw (not shown) is rotated to move the stage body 4a to the processing position.
- the substrate S is imaged by an imaging means such as a CCD camera attached to the support member 7a of the ink jet means 7, and the captured image is analyzed by an image analysis means having a known structure.
- the obtained data is output to a control means (not shown) such as a microcomputer for controlling the operation of the ink jet coating apparatus.
- displacement amounts (correction values) in the X-axis direction, Y-axis direction, and ⁇ -direction for aligning the substrate position are calculated using the mark R on the substrate S as a reference.
- the feed screw motor for moving the stage body 4 and the motor for moving the holder 7d of the ink jet means are controlled accordingly, and the X axis direction and the Y axis direction with respect to the coating head 7a are controlled.
- alignment is performed. Then, the operation of the vacuum pump is stopped, and the adsorption of the substrate S is released.
- the substrate is pushed up from the upper surface of the stage body 4a.
- the vacuum pump and the gas supply means 9 communicating with the chuck plate 11 are operated, and the substrate S is adsorbed at the contact portion between the chuck plate 11 and the substrate S and is ejected from each air pad 18 of the gas supply means 9.
- a portion (a peripheral portion of the substrate) excluding the region adsorbed by the chuck plate 11 by the gas is levitated.
- the alignment in the ⁇ direction can also be performed in a state where the frictional resistance with the upper surface of the stage body 4a is substantially reduced. For example, when the substrate is bent, it is advantageous for accurate alignment.
- the floating confirmation of the substrate S is performed by, for example, scanning the substrate surface directly from the flow rate change amount of the air flow sensor connected to the gas pipe 18 leading to each air pad 18 or using a laser displacement meter or the like from the upper surface of the substrate. This can be done by detecting a change in height. Then, after confirming the rising, alignment in the ⁇ direction is performed to prevent contact between the back surface of the substrate S and the stage main body 4a, and alignment can be performed without scratching the back surface of the substrate S. Even if the substrate S is rotated at the lowered position of the chuck plate 11, it is possible to prevent the back surface of the substrate S from being damaged by the air layer supplied from the gas supply means 9.
- the state in which the portion excluding the adsorption region is levitated by the gas ejected from the air pad 18, or at least the frictional resistance between the portion excluding the adsorption region and the upper surface of the stage body 4a is substantially reduced. Since the configuration in which only the substrate S is rotated in the state to perform the alignment in the ⁇ direction is adopted, even when the weight of the substrate S is large, a rotating mechanism such as a large bearing is unnecessary, and an increase in the size of the apparatus itself can be avoided. In addition, since the substrate S can be rotated with a small thrust, alignment can be performed with high accuracy without using a high-performance motor, which contributes to cost reduction. In addition, during the alignment in the ⁇ direction, there is no need to move the position of the ink jet means 7 and thus the coating head 7b, so that no special control is required at the time of substrate alignment.
- the substrate S is moved in the X axis direction, the Y axis direction, and the ⁇ direction in accordance with the displacement amount (correction value) calculated for aligning the substrate position. That is, the operation of the gas supply means 9 is stopped and the actuator 15 is operated to lower the chuck plate 11 to stop the operation of the vacuum pump leading to the chuck plate 11. Then, the suction groove 21 is evacuated and the substrate S is sucked over the entire surface of the stage body 4a. In this state, similarly to the above, the substrate S is imaged by an imaging unit such as a CCD camera, the captured image is analyzed by the image analysis unit, and the analyzed data is output to the control unit. Thereby, the confirmation is performed with reference to the mark R of the substrate S.
- an imaging unit such as a CCD camera
- the confirmation is performed in a state where the substrate S is again adsorbed to the stage main body 4a after the alignment is completed, it occurs between the case where the substrate S exists on the stage main body 4a and the case where the substrate S floats.
- the above confirmation can be performed without being affected by the displacement.
- each coating head is appropriately reciprocated in the X-axis direction and each coating head 7a is reciprocated appropriately in the Y-axis direction.
- 7b is moved along the scanning surface of the substrate, and ink is applied to the substrate S in a predetermined pattern.
- the center of the substrate S is lifted upward, and the ink can be applied in a state where the peripheral portion of the substrate S is floated by the gas ejected from the air pad 18.
- the substrate S is placed on the stage body 4 a again. Then, the suction groove 21 may be evacuated, and the ink may be applied in a state where the substrate S is sucked over the entire surface of the stage body 4a.
- the substrate S is floated only by the gas ejected from the air pad 18, but in order to stably float the substrate, the suction groove 21 is evacuated and ejected from the air pad 18.
- the substrate S may be floated while maintaining a balance with the pressure of the gas.
- the air pad 18 may be configured so as to be able to perform both gas ejection and evacuation at the same time.
- the stage 30 with an alignment function according to the first modified example reciprocates between a pair of left and right rail members 3R and 3L provided on the upper surface of the base plate 2 as described above. Arranged freely.
- the stage 30 includes a plate-shaped stage main body 31, and sliders 32 that are slidably engaged with the rail members 3 ⁇ / b> R and 3 ⁇ / b> L are attached to four corners on the lower surface of the stage main body 31.
- a feed screw not shown
- the stage body 31 is provided with a plate-like holding tray 33 that can hold the substrate S by suction.
- a plurality of concave recess spaces 33b are formed so that rib portions 33a that maintain the strength of the holding tray 33 and ensure its surface smoothness are formed.
- a rotating shaft 33 c is formed at the center of the back surface of the holding tray 33, and the rotating shaft 33 c is supported by a ball bearing 35 provided via a sleeve member 34 in a through hole formed at the center of the stage main body 31.
- the rotary shaft 33c and the inner race 35a of the ball bearing 35 are, for example, a key connection or a spline connection using a parallel key.
- the lower surface of the portion 33a is in surface contact with the upper surface of the stage main body 31 (see FIG. 7).
- the stage main body 31 includes a gas supply means 36 for supplying gas to the hollow space 33 of the holding tray 33 and a fine movement mechanism for rotating the holding tray 33 so that the holding tray 33 holding the substrate S is rotated in the same plane. 37.
- the gas supply means 36 includes a circular concave hole 36a formed in a predetermined position on the upper surface of the stage body 31, a porous air pad 36b accommodated in the concave hole 36a, and compressed air or the like in each air pad 36b. It is comprised from the gas pipe
- the fine movement mechanism 37 as a driving means includes a frame 37a attached to one side surface of the stage body 31, and a feed screw 37b having a motor M is provided in the X-axis direction on the frame 37a.
- a movable member 37c having a screw hole is screwed to the feed screw 37b, a slider 37d is formed at the lower portion of the movable member 37c, and the slider portion 37d is attached in parallel to the feed screw 37b on the lower surface inside the frame 37a.
- the rail member 37e is slidably engaged.
- a rail portion 37f extending in the Y-axis direction is formed on the upper surface of the movable member 37c, and a support member 37g is slidably engaged with the rail portion 37f.
- An arm 37 i is attached to the upper end of the support member 37 g via a bearing 37 h, and the arm 37 i is connected to the side surface of the holding tray 33. Then, when the feed screw 37b is rotated and the movable member 37c is moved along the rail member 37e, the support member 37g is rotated along the rail portion 37f while a rotational force is applied to the holding tray 33. .
- the arm 37i swings within the range of the reciprocating stroke of the movable member 37c, and the holding tray 33 is rotationally driven within a predetermined minute angle range (for example, within 1 degree).
- a spline guide 37j that allows the arm 37i to move up and down relative to the support member 37g may be interposed between the support member 37g and the arm 37i.
- a suction groove 38 communicating with the vacuum pump is appropriately formed extending in the X-axis direction and the Y-axis direction.
- maintain is employ
- the motor M of the fine movement mechanism 37 is driven, and the feed screw 37b is appropriately rotated according to the correction value in the control means as described above.
- the holding tray 33 is rotationally driven via the arm 37i, and the holding tray 33 holding the substrate S with respect to the upper surface of the stage main body 31 rotates about the rotation shaft 33c by a predetermined angle in the ⁇ direction.
- the holding tray 33 that holds the substrate S is configured to rotate.
- the hollow space 33b is formed on the back surface of the holding tray 33 to reduce the weight, and the air pad 36b.
- the rotating mechanism such as a large bearing is coupled with the fact that the portion excluding the portion connected to the rotating shaft 33c is floated by supplying gas from Is not necessary, the size of the apparatus itself can be avoided, and the substrate S can be rotated with a small thrust, so that high-precision alignment can be performed without using a high-performance motor.
- the substrate S or the holding tray 33 holding the substrate S is rotated in the ⁇ direction.
- the stage itself is further assembled with, for example, a driving device including a motor-equipped feed screw. Further, it may be configured to be movable in the X-axis direction and the Y-axis direction so that alignment in these directions can be performed.
- the driving mechanism including the fine movement mechanism 10 has been described.
- the present invention is not limited to this.
- the driving unit rotates the suction unit 8 in a larger angle range than the fine movement mechanism, and in some cases, rotates the substrate S by 90 degrees or 180 degrees. It may be composed of a coarse movement mechanism capable of As a second modification having such a coarse movement mechanism, as shown in FIG.
- a coarse motion mechanism 100 is constituted by a worm 102 supported by a housing fixed to an omitted frame and driven to rotate by a motor (not shown).
- the coarse movement mechanism 100 is not limited to the above, and other known ones such as a DD motor can be used.
- a fine movement mechanism 10 including an arm 19 and a drive source 20 and a coarse movement mechanism 100 including a worm wheel 101 and a worm 102 are provided.
- the driving means may be configured.
- the worm wheel 101 of the coarse movement mechanism 100 is connected to the inner race 13a, and one end of the arm 19 is fixed to the lower surface of the housing 103 that rotatably supports the worm 102 meshing with the worm wheel 101.
- the worm 102 is swung together with the housing 103 fixed to the arm 19, and the worm wheel 101 is rotated accordingly, whereby the pressing member 14 and the chuck plate 11 are rotated and the substrate S is rotated at a predetermined minute angle. It is rotated in the ⁇ direction.
- a rotational force can be applied to the pressing member 14 serving as a common rotation axis from the fine movement mechanism 10 and the coarse movement mechanism 100 in order to rotationally drive the suction means 8.
- switching from the rotational drive by the coarse movement mechanism 100 to the rotational drive by the fine movement mechanism 10 can be performed smoothly.
- the mark R is When there is a deviation beyond the imaging range, or when the calculated correction value exceeds a minute angle range that can be aligned by the fine movement mechanism, first, the vicinity of the target position by the coarse movement mechanism 100 (that is, fine movement).
- the substrate S is rotationally driven at a high speed up to an angular range in which the alignment can be performed by the mechanism 10, and in some cases, the substrate S is imaged again by the imaging means, and a correction value is calculated with reference to the mark R of the substrate S.
- the fine movement mechanism 10 can perform highly accurate positioning. Thereby, highly accurate and short-time alignment is realizable.
- the rotational force from each mechanism 10, 100 is input to the pressing member 14, but this It is not limited to.
- another hollow rotating shaft 201 is provided concentrically with the pressing member 14 via a fine movement driving bearing 201 a, and the lower surface of the hollow rotating shaft 201 is attached to the worm wheel 101.
- it may be configured to be connected to the upper surface of the housing 202 that houses the worm 102. According to this, when the worm 102 of the coarse movement mechanism 100 is driven to rotate, the pressing member 14 is rotated without transmitting the rotational force to the arm 19.
- the drive source 20 is driven, the arm 19 swings around the actuator 15, and the hollow rotary shaft 201 connected to the arm 19 via the housing 202 rotates. Accordingly, the worm wheel 101 is rotated.
- the pressing member 14 is rotated via
- the hollow rotary shaft 201 when the hollow rotary shaft 201 is disposed concentrically with the pressing member 14, the rotational force from the fine movement mechanism 10 may be transmitted only to the hollow rotary shaft 201. it can.
- the hollow rotary shaft 201 is also provided with an actuator (not shown) that moves the hollow rotary shaft 201 up and down, and only the pressing member 14 is rotated when the substrate S is rotated from the coarse movement mechanism 100 via the pressing member 14.
- the chuck plate 11 is pushed up to raise the chuck plate 11.
- the substrate S is rotated from the fine movement mechanism 10 via the hollow rotary shaft 201, only the hollow rotary shaft 201 is raised to push up the chuck plate 11. Also good.
- a rotary shaft (pressing member) to which a rotational force is applied from the fine movement mechanism 10 and a rotary shaft (hollow rotation) to which a rotational force is applied from the coarse movement mechanism 100 are provided. It is not necessary that the axis is concentrically arranged.
- the present invention is not limited to this.
- a wafer processing object placed on a stage that is movably provided with a cutting tool (processing means) from a side opposite to the wafer (processing object)
- the present invention can be applied to align the processing object with respect to the cutting tool.
- FIG. 3 is a partial cross-sectional view of an ink jet coating apparatus that explains the configuration of the stage body.
- the fragmentary sectional view which expanded the IV section of FIG. The fragmentary sectional view which expanded the V section of FIG.
- the fragmentary sectional view which expanded the VIII part of FIG. The top view of the stage shown in FIG.
- the fragmentary sectional view explaining the 2nd modification of the stage with an alignment function of the present invention The fragmentary sectional view explaining the 3rd modification of the stage with an alignment function of the present invention.
- the perspective view explaining the drive means of the stage with an alignment function which concerns on a 3rd modification partially expanded.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
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- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Coating Apparatus (AREA)
Abstract
Description
4、30 ステージ
4a、31 ステージ本体
8 吸着手段
9 気体供給手段
10 微動機構(駆動手段)
100 粗動機構(駆動手段)
21 吸着溝
33 保持トレー
S 基板(処理対象物)
Claims (10)
- 処理対象物をその処理面を開放して保持するステージ本体を備えたアライメント機能付きステージであって、
前記処理対象物の前記処理面に背向する他面に吸着自在な吸着手段と、前記吸着手段での吸着箇所以外の領域に気体を供給する気体供給手段と、前記吸着手段を回転中心として前記処理対象物が同一平面内で回転されるように前記吸着手段を回転駆動する駆動手段とを備えたことを特徴とするアライメント機能付きステージ。 - 処理対象物をその処理面を開放して保持する保持トレーと、前記保持トレーを回転自在に支持するステージ本体とを備えたアライメント機能付きステージであって、
前記保持トレーのうち処理対象物の処理面に背向する他面に気体を供給する気体供給手段と、前記保持トレーを同一平面内で回転させるように前記保持トレーを回転駆動する駆動手段とを備えたことを特徴とするアライメント機能付きステージ。 - 案内手段と、前記案内手段に沿って前記ステージ本体を移動させる移動手段とを更に備えることを特徴とする請求項1または請求項2記載のアライメント機能付きステージ。
- 前記ステージ本体または保持トレーの前記処理対象物との接触面に吸着溝が形成され、前記処理対象物をステージまたは保持トレーに基板を載置した状態で前記吸着溝を真空引きする真空ポンプを備えたことを特徴とする請求項1乃至請求項3のいずれか1項に記載のアライメント機能付きステージ。
- 前記駆動手段は、前記吸着手段を所定の微小角度範囲内で回転させる微動機構と、前記吸着手段を微動機構より大きな角度範囲で回転させる粗動機構とから構成されていることを特徴とする請求項1乃至請求項4のいずれか1項に記載のアライメント機能付きステージ。
- 前記粗動機構が前記吸着手段に連結され、前記微動機構がアームとこのアームを揺動する駆動源とを備え、この駆動源によりアームを揺動させると、粗動機構を介して前記吸着手段が回転駆動されるように、前記微動機構と前記粗動機構とが連結されていることを特徴とする請求項5記載のアライメント機能付きステージ。
- 前記微動機構のアームは、少なくともステージ本体一側までのびる長さを有し、その先端で前記駆動源に接続されていることを特徴とする請求項5または請求項6記載のアライメント機能付きステージ。
- 請求項1乃至請求項7のいずれか1項に記載のアライメント機能付きステージと、前記ステージで保持された処理対象物に対向配置され、処理対象物に対して所定の処理を施す処理手段とを備えたことを特徴とする処理装置。
- 処理すべき基板をその処理面を開放してステージに載置する工程と、
前記基板の前記処理面と背向する他面に前記ステージに設けられた吸着手段を吸着させる工程と、
前記吸着手段で吸着された領域を除く前記他面に気体を供給する工程と、
前記吸着手段を回転中心として前記基板を同一平面内で所定角度回転させて前記処理対象物の位置合わせを行う工程とを含むことを特徴とする基板アライメント方法。 - 前記処理対象物の位置合わせを行う工程は、所定の微小角度より大きな角度範囲で吸着手段を回転させた後、更に前記微小角度範囲内で吸着手段を回転させて行うことを特徴とする請求項9記載の基板アライメント方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112009001317T DE112009001317T5 (de) | 2008-06-03 | 2009-06-03 | Bühne, ausgestattet mit einer Ausrichtfunktion, Bearbeitungsvorrichtung mit der mit Ausrichtfunktion ausgestatteten Bühne und Verfahren zum Ausrichten eines Substrats |
JP2010515885A JP5102358B2 (ja) | 2008-06-03 | 2009-06-03 | アライメント機能付きステージ及びこのアライメント機能付きステージを備えた処理装置 |
CN200980120845.1A CN102057477B (zh) | 2008-06-03 | 2009-06-03 | 具有定位功能的载物台、包括该具有定位功能的载物台的处理装置和基板定位方法 |
US12/991,993 US20110062641A1 (en) | 2008-06-03 | 2009-06-03 | Stage equipped with alignment function, processing apparatus having the stage equipped with alignment function, and method of aligning substrate |
Applications Claiming Priority (4)
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JP2008-145585 | 2008-06-03 | ||
JP2008145585 | 2008-06-03 | ||
JP2008241474 | 2008-09-19 | ||
JP2008-241474 | 2008-09-19 |
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US (1) | US20110062641A1 (ja) |
JP (2) | JP5102358B2 (ja) |
KR (1) | KR20110025769A (ja) |
CN (1) | CN102057477B (ja) |
DE (1) | DE112009001317T5 (ja) |
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CN102057477B (zh) | 2014-08-13 |
TW201003339A (en) | 2010-01-16 |
JP2013012754A (ja) | 2013-01-17 |
JPWO2009148070A1 (ja) | 2011-11-04 |
DE112009001317T5 (de) | 2011-04-14 |
US20110062641A1 (en) | 2011-03-17 |
JP5102358B2 (ja) | 2012-12-19 |
KR20110025769A (ko) | 2011-03-11 |
CN102057477A (zh) | 2011-05-11 |
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