US7177716B2 - Methods and apparatus for material control system interface - Google Patents

Methods and apparatus for material control system interface Download PDF

Info

Publication number
US7177716B2
US7177716B2 US11/067,311 US6731105A US7177716B2 US 7177716 B2 US7177716 B2 US 7177716B2 US 6731105 A US6731105 A US 6731105A US 7177716 B2 US7177716 B2 US 7177716B2
Authority
US
United States
Prior art keywords
storage locations
carrier storage
reserved
priority lots
lots
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
US11/067,311
Other languages
English (en)
Other versions
US20050273190A1 (en
Inventor
David C. Duffin
Daniel R. Jessop
Michael Teferra
Amitabh Puri
Glade L. Warner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Priority to US11/067,311 priority Critical patent/US7177716B2/en
Assigned to APPLIED MATERIALS, INC. reassignment APPLIED MATERIALS, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: DUFFIN, DAVID C., JESSOP, DANIEL R., WARNER, GLADE L., PURI, AMITABH, TEFERRA, MICHAEL
Publication of US20050273190A1 publication Critical patent/US20050273190A1/en
Priority to US11/626,509 priority patent/US7603196B2/en
Application granted granted Critical
Publication of US7177716B2 publication Critical patent/US7177716B2/en
Priority to US11/838,284 priority patent/US7522969B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B26HAND CUTTING TOOLS; CUTTING; SEVERING
    • B26DCUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
    • B26D1/00Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor
    • B26D1/0006Cutting members therefor
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/418Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4189Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by the transport system
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06QINFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00Administration; Management
    • G06Q10/06Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B26HAND CUTTING TOOLS; CUTTING; SEVERING
    • B26DCUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
    • B26D1/00Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor
    • B26D1/0006Cutting members therefor
    • B26D2001/0053Cutting members therefor having a special cutting edge section or blade section
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B26HAND CUTTING TOOLS; CUTTING; SEVERING
    • B26DCUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
    • B26D1/00Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor
    • B26D1/0006Cutting members therefor
    • B26D2001/006Cutting members therefor the cutting blade having a special shape, e.g. a special outline, serrations
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/31From computer integrated manufacturing till monitoring
    • G05B2219/31002Computer controlled agv conveys workpieces between buffer and cell
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/32Operator till task planning
    • G05B2219/32266Priority orders
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/32Operator till task planning
    • G05B2219/32277Agv schedule integrated into cell schedule
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/45Nc applications
    • G05B2219/45031Manufacturing semiconductor wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67276Production flow monitoring, e.g. for increasing throughput
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67769Storage means
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Definitions

  • the present invention relates generally to electronic device fabrication systems, and is more particularly concerned with transferring substrate carriers between transport systems and processing tools within a fabrication facility.
  • Manufacturing of electronic devices typically involves performing a sequence of procedures with respect to a substrate such as a silicon substrate, a glass plate, etc. (Such substrates may also be referred to as wafers, whether patterned or unpatterned.) These steps may include polishing, deposition, etching, photolithography, heat treatment, and so forth. Usually a number of different processing steps may be performed in a single processing system or “tool” which includes a plurality of processing chambers. However, it is generally the case that other processes are required to be performed at other processing locations within a fabrication facility, and it is accordingly necessary that substrates be transported within the fabrication facility from one processing location to another. Depending upon the type of electronic device to be manufactured, there may be a relatively large number of processing steps required to be performed at many different processing locations within the fabrication facility.
  • substrate carriers such as sealed pods, cassettes, containers and so forth. It is also conventional to employ automated substrate carrier transport devices, such as automatic guided vehicles, overhead transport systems, substrate carrier handling robots, etc., to move substrate carriers from location to location within the fabrication facility or to transfer substrate carriers from or to a substrate carrier transport device.
  • automated substrate carrier transport devices such as automatic guided vehicles, overhead transport systems, substrate carrier handling robots, etc.
  • the total fabrication process from formation or receipt of the virgin substrate to cutting of semiconductor devices from the finished substrate, may require an elapsed time that is measured in weeks or months.
  • a large number of substrates may accordingly be present at any given time as “work in progress” (WIP).
  • WIP work in progress
  • the substrates present in the fabrication facility as WIP may represent a very large investment of working capital, which tends to increase the per substrate manufacturing cost. It may therefore be desirable to reduce the amount of WIP for a given substrate throughput for the fabrication facility. To do so, the total elapsed time for processing each substrate should be reduced.
  • a method in which the number of priority lots to be processed is determined, an equivalent number of carrier storage locations are reserved at a substrate loading station of a processing tool, the number of reserved carrier storage locations are made available, and priority lots are transferred to the reserved carrier storage locations.
  • a substrate loading station including a controller and a memory including instructions to be executed by the controller is adapted to determine a number of priority lots to be processed, reserve an equivalent number of carrier storage locations at a substrate loading station of a processing tool, make the number of reserved carrier storage locations available, and transfer priority lots to the reserved carrier storage locations.
  • a system in a third aspect of the invention, includes a first substrate loading station having a first processing tool and a plurality of carrier storage locations, a second substrate loading station having a second processing tool and a plurality of carrier storage locations, a transport system for moving carriers between the first and second loading stations, and a manufacturing execution system.
  • the manufacturing execution system is operative to determine a number of priority lots to be processed, reserve a number of carrier storage locations at each of the first and second substrate loading stations wherein the number of carrier storage locations is based on the number of priority lots, make the number of reserved carrier storage locations available at each of the first and second substrate loading stations, and transfer priority lots to the reserved carrier storage locations at the first substrate loading station.
  • FIG. 1 is a block diagram depicting an example of a control system for an electronic device manufacturing facility according to some embodiments of the present invention.
  • FIG. 2 is a schematic diagram depicting an example of an electronic device manufacturing facility according to some embodiments of the present invention.
  • FIG. 3 is a front elevational view depicting an example of a carrier handler according to some embodiments of the present invention.
  • FIG. 4 is a flowchart depicting an example process for managing priority lots in a transport system according to some embodiments of the present invention.
  • FIG. 5 is a schematic diagram depicting example operation of an electronic device manufacturing facility according to some embodiments of the present invention.
  • the present invention provides methods and apparatus for expediting processing of substrate lots identified as priority lots.
  • the features of the present invention are particularly advantageous with the use of single or small lot size substrate carriers.
  • the term “small lot size” substrate carrier or “small lot” carrier may refer to a carrier that is adapted to hold fewer substrates than a conventional “large lot size” carrier which typically holds thirteen or twenty-five substrates.
  • a small lot size carrier may be adapted to hold five or less substrates.
  • other small lot size carriers may be employed (e.g., small lot size carriers that hold one, two, three, four or more than five substrates, but less than that of a large lot size carrier).
  • each small lot size carrier may hold too few substrates for human transport of carriers to be viable within an electronic device or other manufacturing facility.
  • a substrate loading station that serves a processing tool may include internal carrier storage locations proximate to a port of the processing tool. In operation it may be desirable to have the next lot of substrates to be processed either in carriers held in internal carrier storage locations or in a carrier ready to be transferred directly from the transport system to the port. In a system operating at near maximum capacity, the availability of internal carrier storage locations within a substrate loading station may be limited. The present invention provides methods and apparatus wherein internal carrier storage locations may be reserved for carriers containing priority lots.
  • Carriers containing non-priority lots may be removed from the reserved locations either by transferring the non-priority lots to alternate storage locations or by processing the non-priority lots and moving the processed non-priority lots to non-reserved storage locations in a substrate loading station at a next processing tool. As the reserved internal storage locations become available, carriers containing priority substrate lots may be transferred into the reserved internal storage locations.
  • An electronic device manufacturing or fabrication facility may use an overhead transport system (OHT system) that includes a plurality of carrier supports or “cradles” coupled to a continuously moving conveyor system adapted to transfer one or more substrate carriers about the facility. More specifically, the moving conveyor system may include a band and a plurality of drive motors coupled thereto, which are adapted to move the band.
  • OHT system overhead transport system
  • the moving conveyor system may include a band and a plurality of drive motors coupled thereto, which are adapted to move the band.
  • Such a facility may include tools or composite tools adapted to process a substrate during electronic device manufacturing.
  • Each processing tool may be coupled to a respective substrate loading station including a carrier handler adapted to transfer a substrate carrier between the tool and the moving conveyor system. More specifically, each processing tool may be coupled to a respective carrier handler adapted to transfer a substrate carrier between a load port of the processing tool and a carrier support coupled to the band of the continuously moving conveyor system. In this manner, a substrate carrier may be transferred about the facility.
  • a transport system may include a control system adapted to communicate with and control operation of the moving conveyor system and a plurality of carrier handlers such that substrate carriers may be moved to where they are needed.
  • a control system 100 may include a host or material control system (MCS) 102 that is in two-way communication with loading station software (LSS) 104 a–f executing on each of the controllers of each of the plurality of carrier handlers housed in and/or under the control of substrate loading stations.
  • the host may include a manufacturing execution system (MES) that directs the operations of the MCS.
  • MES manufacturing execution system
  • the MCS 102 may also be in two-way communication with a transport system controller (TSC) 106 that maintains the operation of the transport system including drive motors and the conveyor.
  • TSC transport system controller
  • each of the LSS 104 a–f nodes may communicate with the TSC 106 to directly exchange information regarding the status of the transport system.
  • FIG. 2 a schematic diagram is provided depicting an example embodiment of a physical arrangement of an example Fab 201 that is especially well suited for using small lot size substrate carriers, such as substrate carriers that hold a single substrate or fewer than twenty-five substrates.
  • the depicted Fab 201 includes a high-speed transport system with several features that make it particularly suitable for using small lot carriers including: a high-speed, low maintenance, constantly moving conveyor system; a carrier loading/unloading function that does not require stopping or slowing the conveyor; a conveyor that is able to physically support many carriers at one time; a flexible conveyor that may be readily customized to a desired transport path; and control software adapted to efficiently manage transport and transfers between process tools.
  • Previously incorporated U.S. patent application Ser. No. 10/650,310, filed Aug. 28, 2003 and titled “System For Transporting Substrate Carriers”, discloses a substrate carrier transport system or similar delivery system that includes a conveyor for substrate carriers that is intended to be constantly in motion during operation of the Fab which it serves.
  • the constantly moving conveyor is intended to facilitate transportation of substrates within the Fab so as to reduce the total “dwell” time of each substrate in the Fab.
  • a substrate loading station 300 equipped with a carrier handler 302 may include a controller 304 , a horizontal guide 306 that is moveable vertically along a frame 307 or rails, and an end effector 308 that is moveable horizontally along the horizontal guide 306 .
  • Other configurations e.g., a robot that can move in more than two dimensions
  • a carrier handler 302 /substrate loading station 300 may further include internal storage locations 310 or shelves/hangars for temporarily storing substrate carriers 312 .
  • ports 314 for loading substrates into process tools may be accessible to the carrier handler 302 or be part of a substrate loading station 300 housing a carrier handler 302 .
  • the controller 304 may be implemented using a field programmable gate array (FPGA) or other similar device. In some embodiments, discrete components may be used to implement the controller 304 .
  • the controller 304 may be adapted to control and/or monitor the operation of the substrate loading station 300 and one or more of various electrical and mechanical components and systems of the substrate loading station 300 which are described herein.
  • the controller 304 may be adapted to execute loading station software as indicated above.
  • the controller 304 may be any suitable computer or computer system, or may include any number of computers or computer systems.
  • the controller 304 may be or may include any components or devices which are typically used by, or used in connection with, a computer or computer system. Although not explicitly pictured in FIG. 3 , the controller 304 may include one or more central processing units, read only memory (ROM) devices and/or a random access memory (RAM) devices. The controller 304 may also include input devices such as a keyboard and/or a mouse or other pointing device, and output devices such as a printer or other device via which data and/or information may be obtained, and/or a display device such as a monitor for displaying information to a user or operator.
  • ROM read only memory
  • RAM random access memory
  • the controller 304 may also include a transmitter and/or a receiver such as a LAN adapter or communications port for facilitating communication with other system components and/or in a network environment, one or more databases for storing any appropriate data and/or information, one or more programs or sets of instructions for executing methods of the present invention, and/or any other computer components or systems, including any peripheral devices.
  • a transmitter and/or a receiver such as a LAN adapter or communications port for facilitating communication with other system components and/or in a network environment, one or more databases for storing any appropriate data and/or information, one or more programs or sets of instructions for executing methods of the present invention, and/or any other computer components or systems, including any peripheral devices.
  • instructions of a program may be read into a memory of the controller 304 from another medium, such as from a ROM device to a RAM device or from a LAN adapter to a RAM device. Execution of sequences of the instructions in the program may cause the controller 304 to perform one or more of the process steps described herein.
  • hard-wired circuitry or integrated circuits may be used in place of, or in combination with, software instructions for implementation of the processes of the present invention.
  • embodiments of the present invention are not limited to any specific combination of hardware, firmware, and/or software.
  • the memory may store the software for the controller which may be adapted to execute the software program, and thereby operate in accordance with the present invention, and particularly in accordance with the methods described in detail below.
  • Portions of the present invention may be embodied as a program developed using an object oriented language that allows the modeling of complex systems with modular objects to create abstractions that are representative of real world, physical objects and their interrelationships.
  • object oriented language that allows the modeling of complex systems with modular objects to create abstractions that are representative of real world, physical objects and their interrelationships.
  • the invention as described herein can be implemented in many different ways using a wide range of programming techniques as well as general purpose hardware sub-systems or dedicated controllers.
  • the program may be stored in a compressed, uncompiled and/or encrypted format.
  • the program furthermore may include program elements that may be generally useful, such as an operating system, a database management system and device drivers for allowing the controller to interface with computer peripheral devices and other equipment/components.
  • Appropriate general purpose program elements are known to those skilled in the art, and need not be described in detail herein.
  • the controller 304 may generate, receive, and/or store databases including data related to carrier locations, command queues, actual and/or estimated command execution times, and/or internal storage locations.
  • databases including data related to carrier locations, command queues, actual and/or estimated command execution times, and/or internal storage locations.
  • the end effector 308 is moved horizontally at a velocity that substantially matches the velocity of the substrate carrier 312 as it is being transported by the substrate carrier conveyor 316 (e.g., by substantially matching substrate carrier speed in a horizontal direction).
  • the end effector 308 may be maintained in a position adjacent the substrate carrier 312 as the substrate carrier 312 is being transported. The end effector 308 thus may substantially match a position of the substrate carrier 312 while substantially matching a velocity of the substrate carrier 312 .
  • conveyor position and/or velocity may be substantially matched.
  • the end effector 308 While the end effector 308 substantially matches the substrate carrier's velocity (and/or position), the end effector 308 is raised so that the end effector 308 contacts the substrate carrier 312 and disengages the substrate carrier 312 from the substrate carrier conveyor 316 .
  • a substrate carrier 312 similarly may be loaded onto the moving substrate carrier conveyor 316 by substantially matching end effector 308 and conveyor velocities (and/or positions) during loading. In at least one embodiment, such substrate carrier handoffs between the end effector 308 and substrate carrier conveyor 316 are performed at a substantially zero velocity and/or acceleration difference between the end effector 308 and the substrate carrier conveyor 316 .
  • Previously incorporated U.S. patent application Ser. No. 10/764,982, filed Jan. 26, 2004 and titled “Methods and Apparatus for Transporting Substrate Carriers”, describes a conveyor system that may be employed with the above-described substrate carrier transport system 316 and/or carrier handler 302 for transporting substrate carriers between one or more processing tools of a electronic device manufacturing facility.
  • the conveyor system may include a ribbon (or “band”) that forms a closed loop within at least a portion of the electronic device manufacturing facility and that transports substrate carriers therein.
  • the ribbon or band may be formed from stainless steel, polycarbonate, composite materials (e.g., carbon graphite, fiberglass, etc.), steel or otherwise reinforced polyurethane, epoxy laminates, plastic or polymer materials that include stainless steel, fabric (e.g., carbon fiber, fiberglass, Kevlar® available from Dupont, polyethylene, steel mesh, etc.) or another stiffening material, etc.
  • the ribbon By orienting the ribbon so that a thick portion of the ribbon resides within a vertical plane and a thin portion of the ribbon resides within a horizontal plane, the ribbon is flexible in the horizontal plane and rigid in the vertical plane. Such a configuration allows the conveyor to be constructed and implemented inexpensively.
  • the ribbon requires little material to construct, is easy to fabricate and, due to its vertical rigidity/strength, can support the weight of numerous substrate carriers without supplemental support structure (such as rollers or other similar mechanisms used in conventional, horizontally-oriented belt-type conveyor systems).
  • supplemental support structure such as rollers or other similar mechanisms used in conventional, horizontally-oriented belt-type conveyor systems.
  • the conveyor system is highly customizable because the ribbon may be bent, bowed or otherwise shaped into numerous configurations due to its lateral flexibility.
  • the example Fab 201 includes a ribbon or band 203 that forms a simple loop 205 within the Fab 201 .
  • the ribbon 203 may comprise, for example, one of the ribbons described in previously incorporated U.S. patent application Ser. No. 10/764,982.
  • the ribbon 203 transports substrate carriers (not shown) between processing tools 209 , and comprises straight portions 211 and curved portions 213 to form the (closed) loop 205 .
  • Other number of processing tools 209 and/or loop configurations may be employed.
  • Each processing tool 209 may include a substrate carrier handler at a substrate loading station or “loading station” 215 of the processing tool 209 for unloading a substrate carrier from or for loading a substrate carrier onto the moving ribbon 203 of the conveyor system 207 as the ribbon 203 passes by the loading station 215 (as described in previously incorporated U.S. patent application Ser. No. 10/650,480).
  • an end effector 308 ( FIG. 3 ) of a loading station 215 may be moved horizontally at a velocity that substantially matches the velocity of the substrate carrier as it is being transported by the ribbon 203 , maintained in a position adjacent the substrate carrier as the substrate carrier is being transported and raised so that the end effector contacts the substrate carrier and disengages the substrate carrier from the conveyor system 207 .
  • a substrate carrier similarly may be loaded onto the moving ribbon 203 by substantially matching end effector 308 ( FIG. 3 ) and ribbon velocities (and/or positions) during loading.
  • Each loading station 215 may include one or more ports (e.g., load ports) or similar locations where substrates or substrate carriers are placed for transfer to and/or from a processing tool 209 (e.g., one or more docking stations, although transfer locations that do not employ docking/undocking movement may be employed).
  • a processing tool 209 e.g., one or more docking stations, although transfer locations that do not employ docking/undocking movement may be employed.
  • Various substrate carrier storage locations or shelves also may be provided at each loading station 215 for substrate carrier buffering at a processing tool 209 .
  • the conveyor system 207 may include a transport system controller (TSC) 217 for controlling operation of the ribbon 203 .
  • TSC transport system controller
  • the TSC 217 may control/monitor the speed and/or status of the ribbon 203 , allocate carrier supports of the ribbon 203 that are used to support/transport substrate carriers, monitor the status of such carrier supports, provide such information to each loading station 215 or the like.
  • each loading station 215 may include LSS 219 for controlling carrier handler operation (e.g., loading or unloading of substrate carriers to/from the conveyor system 207 , transporting of substrate carriers to/from load ports or storage locations of the loading station 215 and/or processing tool 209 serviced by the loading station 215 , etc.).
  • a MCS 221 communicates with the transport system controller 217 and the loading station software 219 of each substrate loading station 215 for affecting operation of the same.
  • the TSC 217 , each LSS 219 and/or the MCS 221 may include a scheduler (not shown) for controlling scheduling of the operations performed by the TSC 217 , LSS 219 and/or the MCS 221 .
  • the system discussed above including the hardware and software components, are useful to perform the methods of the invention. However, it should be understood that not all of the above described components are necessary to perform any of the present invention's methods. In fact, in some embodiments, none of the above described system is required to practice the present invention's methods.
  • the system described above is an example of a system that would be useful in practicing the invention's methods and is especially well suited for transferring small lot size substrate carriers, such as substrate carriers that hold a single substrate or substantially fewer than twenty-five substrates.
  • a lot is moved to a stocker that services a bay.
  • the manufacturing execution system is notified with a “move in request” (MIR) message (e.g., a message from a tool controller, for example, that indicates that the tool load port is available).
  • MIR move in request
  • the MES selects the next lot for processing in the tool.
  • the lot is moved to the tool where processing begins.
  • the MES is notified with a “move out request” (MOR) message once processing of the lot is complete (e.g., a message that indicates that the contents of a substrate carrier have been processed within the tool).
  • MOR move out request
  • the MES may determine the next processing tool to which the small lot carrier is to be sent, as opposed to conventional large lot operation wherein the carrier would be sent to a buffer stocker to await being requested by the next processing tool. This is because in embodiments of the present invention, the MES is aware that the substrate loading station is equipped with internal storage locations and able to stage lots for the associated processing tool.
  • buffer stockers may be used by the MCS and/or substrate loading station as an alternate storage location.
  • the MCS may include a list of alternate storage locations.
  • the list of alternate storage locations may be configurable by an operator.
  • an algorithm implemented as a program may be used to select a preferred storage location from the list based upon a location's available storage capacity and/or proximity to the substrate loading station that requested the carrier be moved to an alternate storage location.
  • carriers stored in alternate storage locations may be moved automatically by the MCS to the substrate loading station that requested the carrier be moved to an alternate storage location as internal storage becomes available. Such carriers may be moved in an order based upon a priority of the individual carriers that reflects how soon the substrate loading station can use the carriers.
  • FIG. 4 a flowchart is depicted that represents some specific example embodiments of the present invention that may be performed using the systems described above. It must be understood that the particular arrangement of elements in the flowchart of FIG. 4 , as well as the number and order of example steps of various methods discussed herein, is not meant to imply a fixed order, sequence, quantity, and/or timing to the steps; embodiments of the present invention can be practiced in any order, sequence, and/or timing that is practicable.
  • the MCS 221 is responsible for delivery and storage of carriers in a bay, by sending commands to various equipment, which include substrate loading stations/carrier handlers and transfer stations (equipment that may perform conveyor band to band transfers, not shown herein).
  • various equipment include substrate loading stations/carrier handlers and transfer stations (equipment that may perform conveyor band to band transfers, not shown herein).
  • certain aspects of the carrier handler may me implemented in conformance with an industry standard entitled the SEMI E88-1103 standard “Specification for AMHS Storage SEM (Stocker SEM)”, which in particular details standardized commands and protocols for control of compliant devices.
  • a transport system controller (TSC) 117 which is responsible for controlling conveyor operation, may be implemented in conformance with the SEMI E82-0703 standard “Specification for Interbay/Intrabay AMHS SEM (IBSEM)”.
  • step 404 the number of priority lots to be processed is determined.
  • an operator may specify to the MES the number of priority lots that are to receive expedited processing.
  • the MES may indicate to the MCS that the specified number of carriers containing the priority lots are to be processed as soon as possible and delivered to substrate loading stations before non-priority lots.
  • priority lots may be expedited individually (e.g., a single carrier may contain the priority lot) and step 404 may not be required.
  • the MCS may activate a priority lot processing mode and direct each substrate loading station associated with a processing tool that is to process the priority lot, to reserve the appropriate number of internal carrier storage locations within the respective substrate loading station.
  • the MCS may thus include logic (e.g., an algorithm implemented as a program) to identify and select specific internal storage locations within a substrate loading station that, for example, are storing carriers with substrates that can be processed quickly (e.g., relative to other carrier's substrates) and/or substrates that will not be processed for a long time (e.g., relative to other carrier's substrates).
  • the individual substrate loading stations may make the selection of storage locations to reserve for storage of the priority lots.
  • the number of internal carrier storage locations that are reserved may be based on the number of priority lots and/or the number of priority lots that are anticipated to be present in a substrate loading station at one time. In other words, the number of reserved locations may be equal to or less than the number of priority lots moving through the system. For example, if there are fifteen priority lots, it may be that only ten carrier storage locations may need to be reserved because, e.g., by the time ten priority lot carriers have been moved into the substrate loading station's storage locations, five priority lots may have already been processed and removed from the substrate loading station. In some embodiments, the number of reserved locations may be greater than the number of priority lots. For example, lots may be assigned different levels of priority relative to each other and some substrate loading stations may reserve a fixed number of storage locations for higher priority lots. In some embodiments, one or more ports for a processing tool within a substrate loading station may be reserved for use with priority lots.
  • the MCS and/or each of the relevant substrate loading stations may make the respective number of reserved internal carrier storage locations available for use with the priority lots.
  • non-priority lots occupying reserved locations may be transferred to alternate storage locations, for example, at other substrate loading stations or stockers associated with the transport system.
  • non-priority lots occupying reserved locations may be processed by the tool served by the substrate loading station and then transferred to a non-reserved storage location within a next substrate loading station serving a next processing tool. Carriers containing non-priority lots that continue to arrive at the substrate loading station are prevented from being stored in the reserved storage locations.
  • Non-priority lots are either stored in any available non-reserved storage locations or transferred to alternative storage locations in other substrate loading stations or buffer stockers.
  • lot selection scheduling by the MES may be modified from a conventional scheduling algorithm.
  • the MES may store information about the total capacity of each substrate loading station and the number of carriers currently stored at each substrate loading station. From this information, the MES may determine which lots need to be moved or processed on the particular tool requiring internal storage locations to be made available. In some embodiments, priority lots may be stored temporarily in alternate storage locations awaiting the availability of reserved locations and then be automatically moved to the reserved locations as non-priority lots are removed.
  • the carriers containing the priority lots may be transferred to the reserved internal carrier storage locations within the substrate loading station serving the processing tool to which such carriers are destined.
  • the priority lots may be transferred into the reserved storage locations as soon as each reserved storage location becomes available. At this point, any newly arriving non-priority lots may only be transferred into the substrate loading station if a non-reserved internal storage location becomes available.
  • the process 400 completes.
  • the reserved storage locations may be made available for storing non-priority lots, either from the alternate storage locations or newly arriving.
  • the number of reserved storage locations may be incrementally decreased.
  • FIG. 5 depicts a moment of operation of an embodiment of the present invention, operating without the use of priority lots. More specifically, operation of a transport'system 500 including a MES 502 and three substrate loading stations 504 , 506 , 508 serving associated processing tools PT 1 , PT 2 , PT 3 , respectively under a heavy throughput condition is depicted.
  • the MES 502 determines the next best process tool for the lot. In the example, processing tool PT 3 was selected. Solid squares represent lots waiting to be processed, empty squares represent empty storage locations, and striped squares represent lots that are (or were) in alternate storage locations.
  • the MES 502 may have sent a transfer command to an MCS 510 to move the lot processed at processing tool PT 1 to processing tool PT 3 .
  • the MCS 510 may have determined that internal storage was not available in processing tool PT 3 , so the lot was stored in alternate storage in processing tool PT 2 .
  • Processing tool PT 2 may have been chosen because processing tool PT 2 was the first device in an alternate storage list of processing tool PT 3 that had storage capacity at the time.
  • FIG. 5 shows a storage space 512 that has become available in processing tool PT 3 and a lot 514 designated for processing tool PT 3 (previously stored in an alternate location in processing tool PT 2 ) being automatically moved on the transport system 500 under the direction of the MCS 510 to the available storage location 512 in processing tool PT 3 . Because in this example, all lots have the same priority, there are no conflicts and needed lots will be in processing tool PT 3 when “move in requests” for the lots are issued.

Landscapes

  • Engineering & Computer Science (AREA)
  • Business, Economics & Management (AREA)
  • Economics (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Strategic Management (AREA)
  • Human Resources & Organizations (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Development Economics (AREA)
  • Theoretical Computer Science (AREA)
  • General Business, Economics & Management (AREA)
  • Tourism & Hospitality (AREA)
  • Game Theory and Decision Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Educational Administration (AREA)
  • Marketing (AREA)
  • Automation & Control Theory (AREA)
  • Forests & Forestry (AREA)
  • Mechanical Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
US11/067,311 2004-02-28 2005-02-25 Methods and apparatus for material control system interface Expired - Fee Related US7177716B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US11/067,311 US7177716B2 (en) 2004-02-28 2005-02-25 Methods and apparatus for material control system interface
US11/626,509 US7603196B2 (en) 2004-02-28 2007-01-24 Methods and apparatus for material control system interface
US11/838,284 US7522969B2 (en) 2004-02-28 2007-08-14 Methods and apparatus for material control system interface

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US54858804P 2004-02-28 2004-02-28
US11/067,311 US7177716B2 (en) 2004-02-28 2005-02-25 Methods and apparatus for material control system interface

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/626,509 Continuation US7603196B2 (en) 2004-02-28 2007-01-24 Methods and apparatus for material control system interface

Publications (2)

Publication Number Publication Date
US20050273190A1 US20050273190A1 (en) 2005-12-08
US7177716B2 true US7177716B2 (en) 2007-02-13

Family

ID=35067599

Family Applications (3)

Application Number Title Priority Date Filing Date
US11/067,311 Expired - Fee Related US7177716B2 (en) 2004-02-28 2005-02-25 Methods and apparatus for material control system interface
US11/626,509 Expired - Fee Related US7603196B2 (en) 2004-02-28 2007-01-24 Methods and apparatus for material control system interface
US11/838,284 Expired - Fee Related US7522969B2 (en) 2004-02-28 2007-08-14 Methods and apparatus for material control system interface

Family Applications After (2)

Application Number Title Priority Date Filing Date
US11/626,509 Expired - Fee Related US7603196B2 (en) 2004-02-28 2007-01-24 Methods and apparatus for material control system interface
US11/838,284 Expired - Fee Related US7522969B2 (en) 2004-02-28 2007-08-14 Methods and apparatus for material control system interface

Country Status (4)

Country Link
US (3) US7177716B2 (zh)
KR (1) KR20060043261A (zh)
CN (1) CN100426452C (zh)
TW (1) TWI316044B (zh)

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050192703A1 (en) * 2004-01-23 2005-09-01 Takashi Yamagishi Transportation state notification system and method, program, and information storage medium
US20050209721A1 (en) * 2003-11-06 2005-09-22 Applied Materials, Inc. Methods and apparatus for enhanced operation of substrate carrier handlers
US20060190118A1 (en) * 2003-11-06 2006-08-24 Michael Teferra Methods and apparatus for enhanced operation of substrate carrier handlers
US20070061034A1 (en) * 2003-11-06 2007-03-15 Applied Materials, Inc. Methods and apparatus for integrating large and small lot electronic device fabrication facilities
US20070124010A1 (en) * 2004-02-28 2007-05-31 Applied Materials, Inc. Methods and apparatus for material control system interface
US7356378B1 (en) * 2007-04-03 2008-04-08 Taiwan Semiconductor Manufacturing Company Method and system for smart vehicle route selection
US20080125900A1 (en) * 2006-09-15 2008-05-29 Maxim Carmen A Method and apparatus for scheduling material transport in a semiconductor manufacturing facility
US20090026039A1 (en) * 2004-02-28 2009-01-29 Applied Materials, Inc. Methods and apparatus for transferring a substrate carrier within an electronic device manufacturing facility
US20090089772A1 (en) * 2007-09-28 2009-04-02 International Business Machines Corporation Arrangement for scheduling jobs with rules and events
US20090319074A1 (en) * 2008-06-23 2009-12-24 International Business Machines Corporation Method for compensating for tool processing variation in the routing of wafers/lots
US20090314607A1 (en) * 2006-07-27 2009-12-24 Advantest Corporation Electronic device conveying method and electronic device handling apparatus
US20100023160A1 (en) * 2008-07-25 2010-01-28 Inotera Memories, Inc. Cross-fab material control system and control method thereof
US20100162954A1 (en) * 2008-12-31 2010-07-01 Lawrence Chung-Lai Lei Integrated facility and process chamber for substrate processing
US20100162955A1 (en) * 2008-12-31 2010-07-01 Lawrence Chung-Lai Lei Systems and methods for substrate processing
US20100173439A1 (en) * 2009-01-03 2010-07-08 Lawrence Chung-Lai Lei Methods and systems of transferring a substrate to minimize heat loss
US20110151119A1 (en) * 2008-12-31 2011-06-23 Lawrence Chung-Lai Lei Methods and Systems of Transferring, Docking and Processing Substrates
US20110217469A1 (en) * 2008-12-31 2011-09-08 Lawrence Chung-Lai Lei Methods and Systems of Transferring, Docking and Processing Substrates
US8095230B2 (en) 2008-06-24 2012-01-10 International Business Machines Corporation Method for optimizing the routing of wafers/lots based on yield
US20150198942A1 (en) * 2014-01-10 2015-07-16 Inotera Memories, Inc. Carrier arrangement system and method of arranging carriers

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3975360B2 (ja) * 2003-10-31 2007-09-12 セイコーエプソン株式会社 供給制御システムおよび方法、プログラム並びに情報記憶媒体
CN1640797A (zh) * 2003-11-13 2005-07-20 应用材料有限公司 具有剪切构件的动态销和使用该动态销的衬底载体
US7831459B2 (en) * 2004-03-26 2010-11-09 Taiwan Semiconductor Manufacturing Co., Ltd. System and method for balancing production capacity
US7477958B2 (en) * 2005-05-11 2009-01-13 International Business Machines Corporation Method of release and product flow management for a manufacturing facility
US8573097B2 (en) * 2005-12-14 2013-11-05 Siemens Product Lifecycle Management Software Inc. System and method for automatic local return for lathe NC-machining cycle interruption
KR100929944B1 (ko) * 2006-02-07 2009-12-04 도쿄엘렉트론가부시키가이샤 기판 처리 장치의 제어 장치 및 기판 처리 장치의 제어 프로그램을 기록한 기억 매체
US7623936B1 (en) * 2006-02-16 2009-11-24 Advanced Micro Devices, Inc. Determining scheduling priority using queue time optimization
US7672748B2 (en) * 2006-04-17 2010-03-02 Chartered Semiconductor Manufacturing, Ltd. Automated manufacturing systems and methods
CN101443247B (zh) * 2006-05-12 2011-06-15 村田机械株式会社 搬送系统和搬送方法
US8160736B2 (en) * 2007-01-31 2012-04-17 Globalfoundries Singapore Pte. Ltd. Methods and apparatus for white space reduction in a production facility
WO2008097588A1 (en) * 2007-02-05 2008-08-14 Applied Materials, Inc. Small lot loadport configurations
US20080294282A1 (en) * 2007-05-24 2008-11-27 Applied Materials, Inc. Use of logical lots in semiconductor substrate processing
DE102007025339A1 (de) * 2007-05-31 2008-12-04 Advanced Micro Devices, Inc., Sunnyvale Verfahren und System zum Entfernen leerer Trägerbehälter von Prozessanlagen durch Steuern einer Zuordnung zwischen Steuerungsaufgaben und Trägerbehälter
US8483866B2 (en) * 2009-04-30 2013-07-09 Taiwan Semiconductor Manufacturing Co., Ltd. Automated materials handling system having multiple categories of overhead buffers
JP5445006B2 (ja) * 2009-10-05 2014-03-19 東京エレクトロン株式会社 基板処理装置、基板処理方法及び記憶媒体
JP5392190B2 (ja) * 2010-06-01 2014-01-22 東京エレクトロン株式会社 基板処理システム及び基板処理方法
US9576834B2 (en) * 2015-03-16 2017-02-21 Taiwan Semiconductor Manufacturing Co., Ltd. Stocker and method for dispatching wafer carrier in stocker
US10146439B2 (en) * 2016-04-13 2018-12-04 Samsung Electronics Co., Ltd. System and method for high performance lockless scalable target
CN112309887B (zh) * 2019-07-29 2023-03-21 华润微电子(重庆)有限公司 晶圆制造的预派工方法、电子装置、计算机设备和系统
CN111276429B (zh) * 2020-01-19 2021-07-20 长江存储科技有限责任公司 半导体机台控制方法、装置及存储介质

Citations (66)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3845286A (en) 1973-02-05 1974-10-29 Ibm Manufacturing control system for processing workpieces
US3952388A (en) * 1973-07-24 1976-04-27 Toyoda Koki Kabushiki Kaisha Machine tool apparatus
US4027246A (en) 1976-03-26 1977-05-31 International Business Machines Corporation Automated integrated circuit manufacturing system
US4166527A (en) 1977-08-01 1979-09-04 Stelron Cam Company Device for picking up and placing articles on movable conveyors and assembly lines and to an endless construction and to an article pickup and deposit device therefor
JPS5591839A (en) 1978-12-29 1980-07-11 Seiko Epson Corp Production of electronic parts
JPS5828860A (ja) 1981-08-12 1983-02-19 Nec Corp 半導体装置及びその製造方法
JPS6049623A (ja) 1983-08-29 1985-03-18 Nec Kansai Ltd 半導体装置の製造方法
JPS63234511A (ja) 1987-03-24 1988-09-29 Nec Kyushu Ltd 半導体基板処理装置
JPH01181156A (ja) 1988-01-13 1989-07-19 Nec Corp 部品管理方式
JPH01257549A (ja) 1988-04-05 1989-10-13 Hitachi Seiki Co Ltd 生産ライン情報管理方法
JPH0215647A (ja) 1988-07-01 1990-01-19 Mitsubishi Electric Corp 半導体製造装置
EP0365589B1 (en) 1987-05-21 1992-09-23 Hine Design Inc. Method and apparatus for aligning silicon wafers
US5183378A (en) 1990-03-20 1993-02-02 Tokyo Electron Sagami Limited Wafer counter having device for aligning wafers
JPH05128131A (ja) 1991-10-31 1993-05-25 Nec Corp 外注管理システム
US5256204A (en) 1991-12-13 1993-10-26 United Microelectronics Corporation Single semiconductor water transfer method and manufacturing system
JPH05290053A (ja) 1992-04-07 1993-11-05 Toshiba Corp 多品種少量生産管理システムにおける流し化情報の提供方法
JPH06132696A (ja) 1992-10-20 1994-05-13 Tokico Ltd 基板搬送装置
JPH06260545A (ja) 1993-03-03 1994-09-16 Mitsubishi Materials Shilicon Corp 半導体ウェーハの生産管理システム
US5382127A (en) 1992-08-04 1995-01-17 International Business Machines Corporation Pressurized interface apparatus for transferring a semiconductor wafer between a pressurized sealable transportable container and a processing equipment
US5388945A (en) 1992-08-04 1995-02-14 International Business Machines Corporation Fully automated and computerized conveyor based manufacturing line architectures adapted to pressurized sealable transportable containers
US5390785A (en) 1992-08-04 1995-02-21 International Business Machines Corporation Pressurized sealable transportable containers for storing a semiconductor wafer in a protective gaseous environment
US5411358A (en) 1992-08-04 1995-05-02 International Business Machines Corporation Dispatching apparatus with a gas supply distribution system for handling and storing pressurized sealable transportable containers
EP0663686A1 (en) 1994-01-14 1995-07-19 International Business Machines Corporation Automatic assembler/disassembler apparatus adapted to pressurized sealable transportable container
US5544350A (en) 1994-07-05 1996-08-06 Taiwan Semiconductor Manufacturing Co. Ratio of running work in progress
JPH08249044A (ja) 1995-03-10 1996-09-27 Nippondenso Co Ltd 生産制御装置
US5612886A (en) 1995-05-12 1997-03-18 Taiwan Semiconductor Manufacturing Company Ltd. Method and system for dynamic dispatching in semiconductor manufacturing plants
JPH09115817A (ja) 1995-10-13 1997-05-02 Nikon Corp 露光方法及び装置
US5668056A (en) 1990-12-17 1997-09-16 United Microelectronics Corporation Single semiconductor wafer transfer method and manufacturing system
US5696689A (en) * 1994-11-25 1997-12-09 Nippondenso Co., Ltd. Dispatch and conveyer control system for a production control system of a semiconductor substrate
JPH10135096A (ja) 1996-10-30 1998-05-22 Nittetsu Semiconductor Kk 半導体製造におけるスケジューリング方法
EP0850720A1 (en) 1996-12-24 1998-07-01 Datalogic S.P.A. Manufacturing process for an article
US5811211A (en) 1995-08-04 1998-09-22 Nikon Corporation Peripheral edge exposure method
US5818716A (en) 1996-10-18 1998-10-06 Taiwan Semiconductor Manufacturing Company Ltd. Dynamic lot dispatching required turn rate factory control system and method of operation thereof
US5825650A (en) 1997-03-11 1998-10-20 Taiwan Semiconductor Manufacturing Co., Ltd. Method for determining standard cycle time of a stage dynamically
DE19715974A1 (de) 1997-04-17 1998-10-22 Merck Patent Gmbh Versorgungssystem für Chemikalien und dessen Verwendung
US5884392A (en) 1994-12-23 1999-03-23 International Business Machines Corporation Automatic assembler/disassembler apparatus adapted to pressurized sealable transportable containers
US5888042A (en) 1996-10-03 1999-03-30 Nidek Co., Ltd. Semiconductor wafer transporter
JPH11176717A (ja) 1997-12-15 1999-07-02 Sony Corp 半導体装置の生産方法および半導体装置の生産管理方法とその装置
US5957648A (en) 1996-12-11 1999-09-28 Applied Materials, Inc. Factory automation apparatus and method for handling, moving and storing semiconductor wafer carriers
US5971585A (en) 1997-09-09 1999-10-26 International Business Machines Corporation Best can do matching of assets with demand in microelectronics manufacturing
JPH11296208A (ja) 1998-04-09 1999-10-29 Oki Electric Ind Co Ltd 生産管理情報出力装置
JP2000012646A (ja) 1998-06-08 2000-01-14 Incam Solutions キャリヤポッド用のアダプタ装置
US6048259A (en) 1998-01-19 2000-04-11 Speedfam Company, Limited Wafer loading and unloading mechanism for loading robot
US6050768A (en) 1997-08-08 2000-04-18 Mitsubishi Denki Kabushiki Kaisha Automatic carrier control method in semiconductor wafer cassette transportation apparatus
US6053688A (en) 1997-08-25 2000-04-25 Cheng; David Method and apparatus for loading and unloading wafers from a wafer carrier
US6082948A (en) 1992-11-06 2000-07-04 Applied Materials, Inc. Controlled environment enclosure and mechanical interface
US6128588A (en) 1997-10-01 2000-10-03 Sony Corporation Integrated wafer fab time standard (machine tact) database
US6196001B1 (en) 1999-10-12 2001-03-06 Alliedsignal Inc. Environment controlled WIP cart
US6240335B1 (en) 1998-12-14 2001-05-29 Palo Alto Technologies, Inc. Distributed control system architecture and method for a material transport system
EP1128246A2 (en) 2000-02-28 2001-08-29 Canon Kabushiki Kaisha Push-type scheduling for semiconductor fabrication
US6415260B1 (en) 1999-04-21 2002-07-02 Taiwan Semiconductor Manufacturing Co., Ltd Dynamic capacity demand forecast system
US20020094588A1 (en) 2001-01-16 2002-07-18 United Microelectronics Corp. Method of control management of production line
US6431814B1 (en) 2000-02-02 2002-08-13 Advanced Micro Devices, Inc. Integrated wafer stocker and sorter with integrity verification system
US20020116086A1 (en) 1999-05-19 2002-08-22 Ronald Huber Installation for processing wafers
US20020144654A1 (en) 1999-10-29 2002-10-10 Jurgen Elger Installation for processing wafers
JP2003007584A (ja) 2001-06-20 2003-01-10 Hitachi Ltd 半導体デバイスの製造方法およびそのシステム
US6540466B2 (en) 1996-12-11 2003-04-01 Applied Materials, Inc. Compact apparatus and method for storing and loading semiconductor wafer carriers
US20030108407A1 (en) 2001-10-18 2003-06-12 Mitsubishi Denki Kabushiki Kaisha Interbay transportation system and method of interbay transportation
US6587744B1 (en) 1999-06-22 2003-07-01 Brooks Automation, Inc. Run-to-run controller for use in microelectronic fabrication
US6662076B1 (en) 1999-02-10 2003-12-09 Advanced Micro Devices, Inc. Management of move requests from a factory system to an automated material handling system
US6673638B1 (en) 2001-11-14 2004-01-06 Kla-Tencor Corporation Method and apparatus for the production of process sensitive lithographic features
US6684124B2 (en) 2001-04-27 2004-01-27 Infineon Technologies Ag Method for controlling a processing device for a sequential processing of semiconductor wafers
US20040049398A1 (en) 2002-09-10 2004-03-11 International Business Machines Corporation Method, system, and storage medium for resolving transport errors relating to automated material handling system transactions
US20040062633A1 (en) 2002-08-31 2004-04-01 Applied Materials, Inc. System for transporting substrate carriers
US20040187342A1 (en) 2003-03-25 2004-09-30 Dainippon Screen Mfg. Co., Ltd. Substrate treating method and apparatus
US6839603B2 (en) * 2000-05-09 2005-01-04 Tokyo Electron Limited Semiconductor manufacturing system and control method thereof

Family Cites Families (59)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4049123A (en) 1976-06-01 1977-09-20 Western Electric Company, Inc. Methods of and apparatus for sorting articles in accordance with their resistivity and thickness
US4722659A (en) 1986-05-16 1988-02-02 Thermco Systems, Inc. Semiconductor wafer carrier transport apparatus
US4852717A (en) 1986-11-12 1989-08-01 Fmc Corporation Computer controlled light contact feeder
US4974166A (en) 1987-05-18 1990-11-27 Asyst Technologies, Inc. Processing systems with intelligent article tracking
KR0133681B1 (ko) 1987-10-12 1998-04-23 후쿠다 켄조오 웨이퍼 캐리어 반송용 처크
US5064337A (en) 1988-07-19 1991-11-12 Tokyo Electron Limited Handling apparatus for transferring carriers and a method of transferring carriers
US5442561A (en) * 1992-05-12 1995-08-15 Nippon Telegraph And Telephone Corporation Production management system and its application method
KR100221983B1 (ko) 1993-04-13 1999-09-15 히가시 데쓰로 처리장치
US5570990A (en) 1993-11-05 1996-11-05 Asyst Technologies, Inc. Human guided mobile loader stocker
US5751581A (en) 1995-11-13 1998-05-12 Advanced Micro Devices Material movement server
JP2702466B2 (ja) * 1995-11-24 1998-01-21 山形日本電気株式会社 半導体ウェーハの生産方法及びその生産装置
US5928389A (en) 1996-10-21 1999-07-27 Applied Materials, Inc. Method and apparatus for priority based scheduling of wafer processing within a multiple chamber semiconductor wafer processing tool
US6009890A (en) 1997-01-21 2000-01-04 Tokyo Electron Limited Substrate transporting and processing system
US5980183A (en) 1997-04-14 1999-11-09 Asyst Technologies, Inc. Integrated intrabay buffer, delivery, and stocker system
JPH10326729A (ja) 1997-05-26 1998-12-08 Toshiba Corp 製造システム
US6579052B1 (en) 1997-07-11 2003-06-17 Asyst Technologies, Inc. SMIF pod storage, delivery and retrieval system
US6183186B1 (en) 1997-08-29 2001-02-06 Daitron, Inc. Wafer handling system and method
JPH11121582A (ja) 1997-10-15 1999-04-30 Mitsubishi Electric Corp 半導体ウェハ製造設備制御方法および半導体ウェハ製造設備
US5974465A (en) * 1998-01-21 1999-10-26 3Com Corporation Method and apparatus for prioritizing the enqueueing of outbound data packets in a network device
US6039316A (en) 1998-03-02 2000-03-21 Xerox Corporation Multi-hierarchical control system for controlling object motion with smart matter
US6256550B1 (en) 1998-08-07 2001-07-03 Taiwan Semiconductor Manufacturing Company Overall equipment effectiveness on-line categories system and method
US6411859B1 (en) * 1998-08-28 2002-06-25 Advanced Micro Devices, Inc. Flow control in a semiconductor fabrication facility
KR100646906B1 (ko) * 1998-09-22 2006-11-17 동경 엘렉트론 주식회사 기판처리장치 및 기판처리방법
US7039495B1 (en) 1998-12-08 2006-05-02 Advance Micro Devices, Inc. Management of multiple types of empty carriers in automated material handling systems
US6745093B1 (en) 1999-03-17 2004-06-01 Hitachi, Ltd. Vacuum process apparatus and method of operating the same
US6873963B1 (en) 1999-11-30 2005-03-29 Daimlerchrysler Corporation Shipment tracking analysis and reporting system (STARS)
JP2001189363A (ja) 2000-01-04 2001-07-10 Mitsubishi Electric Corp 半導体装置製造設備およびその制御方法
KR100823237B1 (ko) 2000-01-17 2008-04-18 가부시키가이샤 에바라 세이사꾸쇼 기판반송제어장치 및 기판반송방법
ATE248761T1 (de) * 2000-03-17 2003-09-15 Witron Logistik & Inf Gmbh System zum kommissionieren von in regallagern befindlichen artikeln
US6641350B2 (en) 2000-04-17 2003-11-04 Hitachi Kokusai Electric Inc. Dual loading port semiconductor processing equipment
JP2001345241A (ja) 2000-05-31 2001-12-14 Tokyo Electron Ltd 基板処理システム及び基板処理方法
JP2001351848A (ja) 2000-06-07 2001-12-21 Tokyo Electron Ltd 基板処理システム及び基板処理方法
JP4915033B2 (ja) 2000-06-15 2012-04-11 株式会社ニコン 露光装置、基板処理装置及びリソグラフィシステム、並びにデバイス製造方法
JP4180787B2 (ja) 2000-12-27 2008-11-12 東京エレクトロン株式会社 基板処理装置および基板処理方法
US20020147960A1 (en) * 2001-01-26 2002-10-10 Applied Materials, Inc. Method and apparatus for determining scheduling for wafer processing in cluster tools with integrated metrology and defect control
US6854583B1 (en) 2001-02-06 2005-02-15 Middlesex General Industries, Inc. Conveyorized storage and transportation system
KR100410991B1 (ko) 2001-02-22 2003-12-18 삼성전자주식회사 반도체 제조장치의 로드포트
JP2002313880A (ja) 2001-04-19 2002-10-25 Hitachi Ltd 半導体集積回路装置の製造方法
US6681350B2 (en) * 2001-05-05 2004-01-20 Cadence Design Systems, Inc. Method and apparatus for testing memory cells for data retention faults
US6675066B2 (en) 2001-05-25 2004-01-06 George Koch Sons, Llc Conveyor line process control system and method
US6580967B2 (en) 2001-06-26 2003-06-17 Applied Materials, Inc. Method for providing distributed material management and flow control in an integrated circuit factory
JP2003045901A (ja) 2001-08-01 2003-02-14 Sony Corp 素子の転写方法及びこれを用いた素子の配列方法、画像表示装置の製造方法
JP2003142547A (ja) 2001-08-24 2003-05-16 Hirata Corp ワーク搬送装置
AUPR866401A0 (en) 2001-11-02 2001-11-29 MacKinlay, Robert Method and system for conveyor belt monitoring
KR100577622B1 (ko) 2001-12-04 2006-05-10 로제 가부시키가이샤 용기의 일시적 반입, 유치, 반출용 장치
CN1449011A (zh) * 2002-03-28 2003-10-15 华邦电子股份有限公司 集成电路制造的推拉双向式派工方法
US6716651B2 (en) 2002-04-25 2004-04-06 Taiwan Semiconductor Manufacturing Co., Ltd Method and apparatus for identifying a wafer cassette
US8170899B2 (en) * 2002-05-29 2012-05-01 Oracle International Corporation Supply chain reservation
US6640148B1 (en) 2002-06-03 2003-10-28 Advanced Micro Devices, Inc. Method and apparatus for scheduled controller execution based upon impending lot arrival at a processing tool in an APC framework
US7243003B2 (en) 2002-08-31 2007-07-10 Applied Materials, Inc. Substrate carrier handler that unloads substrate carriers directly from a moving conveyor
US6715602B1 (en) 2002-11-15 2004-04-06 The Goodyear Tire & Rubber Company Sensor system for conveyor belt
US7077264B2 (en) 2003-01-27 2006-07-18 Applied Material, Inc. Methods and apparatus for transporting substrate carriers
US7221993B2 (en) * 2003-01-27 2007-05-22 Applied Materials, Inc. Systems and methods for transferring small lot size substrate carriers between processing tools
US20050096775A1 (en) * 2003-10-31 2005-05-05 Yu-Chih Wang Method and system of automatic carrier transfer
US20070276531A1 (en) 2003-11-06 2007-11-29 Applied Materials, Inc. Methods and apparatus for enhanced operation of substrate carrier handlers
US20050209721A1 (en) 2003-11-06 2005-09-22 Applied Materials, Inc. Methods and apparatus for enhanced operation of substrate carrier handlers
TWI348450B (en) 2003-11-13 2011-09-11 Applied Materials Inc Break-away positioning conveyor mount for accommodating conveyor belt bends
US7051870B2 (en) 2003-11-26 2006-05-30 Applied Materials, Inc. Suspension track belt
TWI316044B (en) 2004-02-28 2009-10-21 Applied Materials Inc Methods and apparatus for material control system interface

Patent Citations (69)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3845286A (en) 1973-02-05 1974-10-29 Ibm Manufacturing control system for processing workpieces
US3952388A (en) * 1973-07-24 1976-04-27 Toyoda Koki Kabushiki Kaisha Machine tool apparatus
US4027246A (en) 1976-03-26 1977-05-31 International Business Machines Corporation Automated integrated circuit manufacturing system
US4166527A (en) 1977-08-01 1979-09-04 Stelron Cam Company Device for picking up and placing articles on movable conveyors and assembly lines and to an endless construction and to an article pickup and deposit device therefor
JPS5591839A (en) 1978-12-29 1980-07-11 Seiko Epson Corp Production of electronic parts
JPS5828860A (ja) 1981-08-12 1983-02-19 Nec Corp 半導体装置及びその製造方法
JPS6049623A (ja) 1983-08-29 1985-03-18 Nec Kansai Ltd 半導体装置の製造方法
JPS63234511A (ja) 1987-03-24 1988-09-29 Nec Kyushu Ltd 半導体基板処理装置
EP0365589B1 (en) 1987-05-21 1992-09-23 Hine Design Inc. Method and apparatus for aligning silicon wafers
JPH01181156A (ja) 1988-01-13 1989-07-19 Nec Corp 部品管理方式
JPH01257549A (ja) 1988-04-05 1989-10-13 Hitachi Seiki Co Ltd 生産ライン情報管理方法
JPH0215647A (ja) 1988-07-01 1990-01-19 Mitsubishi Electric Corp 半導体製造装置
US5183378A (en) 1990-03-20 1993-02-02 Tokyo Electron Sagami Limited Wafer counter having device for aligning wafers
US5976199A (en) 1990-12-17 1999-11-02 United Microelectronics Corp. Single semiconductor wafer transfer method and manufacturing system
US5668056A (en) 1990-12-17 1997-09-16 United Microelectronics Corporation Single semiconductor wafer transfer method and manufacturing system
JPH05128131A (ja) 1991-10-31 1993-05-25 Nec Corp 外注管理システム
US5256204A (en) 1991-12-13 1993-10-26 United Microelectronics Corporation Single semiconductor water transfer method and manufacturing system
US5372471A (en) 1991-12-13 1994-12-13 United Microelectronics Corporation Single semiconductor wafer transfer method and manufacturing system
JPH05290053A (ja) 1992-04-07 1993-11-05 Toshiba Corp 多品種少量生産管理システムにおける流し化情報の提供方法
US5388945A (en) 1992-08-04 1995-02-14 International Business Machines Corporation Fully automated and computerized conveyor based manufacturing line architectures adapted to pressurized sealable transportable containers
US5390785A (en) 1992-08-04 1995-02-21 International Business Machines Corporation Pressurized sealable transportable containers for storing a semiconductor wafer in a protective gaseous environment
US5411358A (en) 1992-08-04 1995-05-02 International Business Machines Corporation Dispatching apparatus with a gas supply distribution system for handling and storing pressurized sealable transportable containers
US5382127A (en) 1992-08-04 1995-01-17 International Business Machines Corporation Pressurized interface apparatus for transferring a semiconductor wafer between a pressurized sealable transportable container and a processing equipment
JPH06132696A (ja) 1992-10-20 1994-05-13 Tokico Ltd 基板搬送装置
US6082948A (en) 1992-11-06 2000-07-04 Applied Materials, Inc. Controlled environment enclosure and mechanical interface
JPH06260545A (ja) 1993-03-03 1994-09-16 Mitsubishi Materials Shilicon Corp 半導体ウェーハの生産管理システム
EP0663686A1 (en) 1994-01-14 1995-07-19 International Business Machines Corporation Automatic assembler/disassembler apparatus adapted to pressurized sealable transportable container
US6026561A (en) 1994-01-14 2000-02-22 International Business Machines Corporation Automatic assembler/disassembler apparatus adapted to pressurized sealable transportable containers
US5544350A (en) 1994-07-05 1996-08-06 Taiwan Semiconductor Manufacturing Co. Ratio of running work in progress
US5696689A (en) * 1994-11-25 1997-12-09 Nippondenso Co., Ltd. Dispatch and conveyer control system for a production control system of a semiconductor substrate
US5884392A (en) 1994-12-23 1999-03-23 International Business Machines Corporation Automatic assembler/disassembler apparatus adapted to pressurized sealable transportable containers
JPH08249044A (ja) 1995-03-10 1996-09-27 Nippondenso Co Ltd 生産制御装置
US5612886A (en) 1995-05-12 1997-03-18 Taiwan Semiconductor Manufacturing Company Ltd. Method and system for dynamic dispatching in semiconductor manufacturing plants
US5811211A (en) 1995-08-04 1998-09-22 Nikon Corporation Peripheral edge exposure method
JPH09115817A (ja) 1995-10-13 1997-05-02 Nikon Corp 露光方法及び装置
US5888042A (en) 1996-10-03 1999-03-30 Nidek Co., Ltd. Semiconductor wafer transporter
US5818716A (en) 1996-10-18 1998-10-06 Taiwan Semiconductor Manufacturing Company Ltd. Dynamic lot dispatching required turn rate factory control system and method of operation thereof
JPH10135096A (ja) 1996-10-30 1998-05-22 Nittetsu Semiconductor Kk 半導体製造におけるスケジューリング方法
US6540466B2 (en) 1996-12-11 2003-04-01 Applied Materials, Inc. Compact apparatus and method for storing and loading semiconductor wafer carriers
US5957648A (en) 1996-12-11 1999-09-28 Applied Materials, Inc. Factory automation apparatus and method for handling, moving and storing semiconductor wafer carriers
EP0850720A1 (en) 1996-12-24 1998-07-01 Datalogic S.P.A. Manufacturing process for an article
US5825650A (en) 1997-03-11 1998-10-20 Taiwan Semiconductor Manufacturing Co., Ltd. Method for determining standard cycle time of a stage dynamically
DE19715974A1 (de) 1997-04-17 1998-10-22 Merck Patent Gmbh Versorgungssystem für Chemikalien und dessen Verwendung
US6050768A (en) 1997-08-08 2000-04-18 Mitsubishi Denki Kabushiki Kaisha Automatic carrier control method in semiconductor wafer cassette transportation apparatus
US6053688A (en) 1997-08-25 2000-04-25 Cheng; David Method and apparatus for loading and unloading wafers from a wafer carrier
US5971585A (en) 1997-09-09 1999-10-26 International Business Machines Corporation Best can do matching of assets with demand in microelectronics manufacturing
US6128588A (en) 1997-10-01 2000-10-03 Sony Corporation Integrated wafer fab time standard (machine tact) database
JPH11176717A (ja) 1997-12-15 1999-07-02 Sony Corp 半導体装置の生産方法および半導体装置の生産管理方法とその装置
US6048259A (en) 1998-01-19 2000-04-11 Speedfam Company, Limited Wafer loading and unloading mechanism for loading robot
JPH11296208A (ja) 1998-04-09 1999-10-29 Oki Electric Ind Co Ltd 生産管理情報出力装置
JP2000012646A (ja) 1998-06-08 2000-01-14 Incam Solutions キャリヤポッド用のアダプタ装置
US6240335B1 (en) 1998-12-14 2001-05-29 Palo Alto Technologies, Inc. Distributed control system architecture and method for a material transport system
US6662076B1 (en) 1999-02-10 2003-12-09 Advanced Micro Devices, Inc. Management of move requests from a factory system to an automated material handling system
US6415260B1 (en) 1999-04-21 2002-07-02 Taiwan Semiconductor Manufacturing Co., Ltd Dynamic capacity demand forecast system
US20020116086A1 (en) 1999-05-19 2002-08-22 Ronald Huber Installation for processing wafers
US6587744B1 (en) 1999-06-22 2003-07-01 Brooks Automation, Inc. Run-to-run controller for use in microelectronic fabrication
US6196001B1 (en) 1999-10-12 2001-03-06 Alliedsignal Inc. Environment controlled WIP cart
US20020144654A1 (en) 1999-10-29 2002-10-10 Jurgen Elger Installation for processing wafers
US6431814B1 (en) 2000-02-02 2002-08-13 Advanced Micro Devices, Inc. Integrated wafer stocker and sorter with integrity verification system
EP1128246A2 (en) 2000-02-28 2001-08-29 Canon Kabushiki Kaisha Push-type scheduling for semiconductor fabrication
US6839603B2 (en) * 2000-05-09 2005-01-04 Tokyo Electron Limited Semiconductor manufacturing system and control method thereof
US20020094588A1 (en) 2001-01-16 2002-07-18 United Microelectronics Corp. Method of control management of production line
US6684124B2 (en) 2001-04-27 2004-01-27 Infineon Technologies Ag Method for controlling a processing device for a sequential processing of semiconductor wafers
JP2003007584A (ja) 2001-06-20 2003-01-10 Hitachi Ltd 半導体デバイスの製造方法およびそのシステム
US20030108407A1 (en) 2001-10-18 2003-06-12 Mitsubishi Denki Kabushiki Kaisha Interbay transportation system and method of interbay transportation
US6673638B1 (en) 2001-11-14 2004-01-06 Kla-Tencor Corporation Method and apparatus for the production of process sensitive lithographic features
US20040062633A1 (en) 2002-08-31 2004-04-01 Applied Materials, Inc. System for transporting substrate carriers
US20040049398A1 (en) 2002-09-10 2004-03-11 International Business Machines Corporation Method, system, and storage medium for resolving transport errors relating to automated material handling system transactions
US20040187342A1 (en) 2003-03-25 2004-09-30 Dainippon Screen Mfg. Co., Ltd. Substrate treating method and apparatus

Non-Patent Citations (48)

* Cited by examiner, † Cited by third party
Title
"300mm single-wafer handling", Apr. 2000, Solid State Technology, Product News, <www.sold-state.com>, p. 99.
"300mm single-wafer transport", Jul. 1999, Solid State Technology - semiconductor manufacturing and wafer fabrication, Semicon West '99 Product Spotlight, p. 5.
"Improved wafer isolation and additional flexibility", Jan. 3, 2002, Incam Solutions Company SWIF technology, pp. 1-2.
"SEMI standards compliance" and "Related SEMI standards", Jan. 3, 2002, Incam Solutions Related standards, p. 1.
"Single Wafer Lots Solution", Jan. 3, 2002, Incam Solutions References, p. 1.
"The Leading Company in Micro environment", Jan. 3, 2002, Incam Solutions Company, pp. 1-2.
Anon, "Coming of fab-wide automation", May 1998, European Semiconductor Design Production Assembly, vol. 20 No. 5, p. 21-22.
Anon, "Wafer level automation", Jan. 1995, European Semiconductor, vol. 17 No. 1, p. 2.
Berg, R. et al., "The formula: world class manufacturing for hybrid thin-film component production", 1992, IEEE/SEMI International Semiconductor Manufacturing Science Symposium, pp. 53-60.
Chen, J. C. et al., "Capacity planning for a twin fab", 1999, 1999 IEEE International Symposium on Semiconductor Manufacturing Confernece Proceedings, p. 317-20.
Collins, D. W. et al., "Implementation of Minimum Inventory Variability Scheduling 1-Step Ahead Policy(R) in a large semiconductor manufacturing facility", 1997, 1997 IEEE 6th International Conference on Emerging Technologies and Factory Automation Proceedings, pp. 497-504.
Collins, D. W. et al., "Investigation of minimum inventory variability scheduling policies in a large semiconductor manufacturing facility", 1997, Proceedings of the 1997 American Control Conference, vol. 3, p. 1924-8.
Dudde, R. et al., "Flexible data registration and automation in semiconductor production", 1997, Proceedings of the SPIE - The International Society for Optical Engineering, p. 171-81.
Ehteshami, B. et al., "Trade-offs in cycle time management: hot lots", May 1992, IEEE Transactions on Semiconductor Manufacturing, vol. 5, No. 2, p. 101-6.
Fuller, L. F. et al., "Improving manufacturing performance at the Rochester Institute of Technology integrated circuit factory", 1995, IEEE/SEMI 1995 Advanced Semiconductor Manufacturing Conference and Workshop. Theme - Semiconductor Manufacturing: Economic Solutions for the 21st Century. ASMC '95 Proceedings, p. 350-5.
Garlid, Scott C., "From philosophy to reality. Interpreting the rules of JIT for IC manufacturing", 1989, SME Technical Paper (Series) MS. Publ by SME, p. 797.
Griessing, Juergen et al., "Assessing the feasibility of a 300-mm test and monitor wafer handeling and logistics system", Jul. 2000, Micro: The 300-mm Imperative, pp. 1-19.
Houmin, Yan et al., "Testing the robustness of two-boundary control policies in semiconductor manufacturing", May 1996, IEEE Transactions on Semiconductor Manfacturing, vol. 9, No. 2, p. 285-8.
Hughlett, E., "Incremental levels of automation in the compound semiconductor fab", Aug. 2001, Compound Semiconductor, vol. 7, No. 7, p. 69-73.
Iriuchijima, K. et al., "WIP allocation planning for semiconductor factories", 1998, Proceedings of the 37th IEEE Conference on Decision and Control, vol. 3, p. 2716-21.
Juba, R. C. et al., "Production improvements using a forward scheduler", 1996, Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium 'Manufacturing Technologies - Present and Future', p. 205-9.
Labanowski, L., "Improving overall fabricator performance using the continuous improvement methodology", 1997, 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. Theme - The Quest for Semiconductor Manufacturing Excellence: Leading the Charge into the 21st Century. ASMC Proceedings, p. 405-9.
Leonovich, G. A. et al., "Integrated cost and productivity learning in CMOS semiconductor manufacturing", Jan.-Mar. 1995, IBM Journal of Research and Development, vol. 39, No. 1-2, p. 201-13.
Leonovich, G., "An approach for optimizing WIP/cycle time/output in a semiconductor fabricator", 1994, Sixteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Low-Cost Manufacturing Technologies for Tomorrow's Global Economoy'. Proceedings 1994 IEMT Symposium, vol. 1, p. 108-11.
Lopez, M. J. et al., "Performance models of systems of multiple cluster tools", 1996, Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. Proceedings 1996 IEMT Symposium, pp. 57-65.
Lou, S. et al., "Using simulation to test the robustness of various existing production control policies", 1991, 1991 Winter Simulation Conference Proceedings, IEEE, p. 261-9.
Lovell, A. M. et al., "Cell automation: integrating manufacturing with robotics", Dec. 1990, Solid State Technology, vol. 33 No. 12, p. 37-9.
Marcoux, P. et al., "Determining capacity loss from operational and technical deployment practices in a semiconductor manufacturing line", 1999, 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings, p. 3-5.
Martin, D. P., "Capacity and cycle time-throughput understanding system (CAC-TUS) an analysis tool to determine the components of capacity and cycle time in a semiconductor manufacturing line", 1999, 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings, p. 127-31.
Martin, D. P., "Total operational efficiency (TOE): the determination of two capacity and cycle time components and their relationship to productivity improvements in a semiconductor manufacturing line", 1999, 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings, pp. 37-41.
Nagesh, Sukhi et al., "Intelligent second-generation MES solutions for 300mm fabs", 2000, Solid State Technology, vol. 43 No. 6, pp. 133-134, 136, 138.
Naguib, H., "The implementation of total quality management in a semiconductor manufacturing operation", 1992, IEEE/SEMI International Semiconductor Manufacturing Science Symposium, p. 63-7.
Narayanan, S. et al., "Object-oriented simulation to support operator decision making in semiconductor manufacturing", 1992, 1992 IEEE International Conference on Systems, Man and Cybernetics, vol. 2, p. 1510-15.
Padillo, J. M. et al., "A strategic domain: IE in the semiconductor industry", Mar. 1998, IIE Solutions, pp. 36-40, 42.
Pierce, Neal G. et al., "Dynamic dispatch and graphical monitoring system", 1999 IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings 1999, p. 65-68.
Prasad, K., "A generic computer simulation model to characterize photolithography manufacturing area in an IC FAB facility", Sep. 1991, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 14 No. 3, p. 483-7.
Przewlocki, H. et al., "DIASTEMOS-computerized system of IC manufacturing control and diagnostics", 1990, Elektronika, vol. 31 No. 11-12, pp. 38-40, Polish Language, (Abstract only).
Rose, D., "Productivity enhancement", 1992, IEEE/SEMI International Semiconductor Manufacturing Science Symposium, p. 68.
Rose, O., "WIP evolution of a semiconductor factory after a bottleneck workcenter breakdown", 1998 Winter Simulation Conference. Proceedings, vol. 2, pp. 997-1003.
Saito, K. et al., "A simulation study on periodical priority dispatching of WIP for product-mix fabrication", 2002, 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing, ASMC 2002, p. 33-7.
Sarin, S. C. et al., "Reduction of average cycle time at a wafer fabrication facility", 2001, 2001 GaAs Mantech Conference. Digest of Papers, p. 241-6.
Schomig, A. K. et al., "Performance modelling of pull manufacturing systems with batch servers", 1995, Proceedings 1995 INRIA/IEEE Symposium on Emerging Technologies and Factory Automation. ETFA '95, vol. 3, p. 175-83.
Van Antwerp, K. et al., "Improving work-in-progress visibility with active product tags YASIC manufacture", Oct. 1999, Micro, vol. 17 No. 9, pp. 67-69, 72-73.
Wang, J. et al., "The improvement of atuomated material handling system traffic control", 2002, 2002 Semiconductor Manufacturing Technology Workshop, p. 271-4.
Wei Jie Lee, "Optimize WIP scale through simulation approach with WIP, turn-over rate and cycle time regression analysis in semiconductor fabrication", 2002, 2002 Semiconductor Manufacturing Technology Workshop, p. 299-301.
Wei Jun-Hu et al., "Optimization methodology in simulation-based scheduling for semiconductor manufacturing", Oct. 2000, Information and Control, vol. 29, No. 5, p. 425-30, Chinese language. (Abstract only).
Weiss, M., "New twists on 300 mm fab design and layout", Jul. 1999, Semiconductor International, vol. 22 No. 8, pp. 103-4, 106, 108.
Young Hoon Lee et al., "Push-pull production planning of the re-entrant process", 2002, International Journal of Advanced Manufacturing Technology, vol. 22, No. 11-12, p. 922-31.

Cited By (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7720557B2 (en) 2003-11-06 2010-05-18 Applied Materials, Inc. Methods and apparatus for enhanced operation of substrate carrier handlers
US20050209721A1 (en) * 2003-11-06 2005-09-22 Applied Materials, Inc. Methods and apparatus for enhanced operation of substrate carrier handlers
US20060190118A1 (en) * 2003-11-06 2006-08-24 Michael Teferra Methods and apparatus for enhanced operation of substrate carrier handlers
US20070061034A1 (en) * 2003-11-06 2007-03-15 Applied Materials, Inc. Methods and apparatus for integrating large and small lot electronic device fabrication facilities
US7603195B2 (en) 2003-11-06 2009-10-13 Applied Materials, Inc. Methods and apparatus for integrating large and small lot electronic device fabrication facilities
US8204617B2 (en) 2003-11-06 2012-06-19 Applied Materials, Inc. Methods and apparatus for enhanced operation of substrate carrier handlers
US20070276532A1 (en) * 2003-11-06 2007-11-29 Applied Materials, Inc. Methods and apparatus for enhanced operation of substrate carrier handlers
US20080021594A1 (en) * 2004-01-23 2008-01-24 Takashi Yamagishi Transportation state notification system and method, program, and information storage medium
US20050192703A1 (en) * 2004-01-23 2005-09-01 Takashi Yamagishi Transportation state notification system and method, program, and information storage medium
US7277774B2 (en) * 2004-01-23 2007-10-02 Seiko Epson Corporation Transportation state notification system and method, and information storage medium
US7809468B2 (en) 2004-01-23 2010-10-05 Seiko Epson Corporation Transportation state notification system and method, program, and information storage medium
US20070276530A1 (en) * 2004-02-28 2007-11-29 Applied Materials, Inc. Methods and apparatus for material control system interface
US20090026039A1 (en) * 2004-02-28 2009-01-29 Applied Materials, Inc. Methods and apparatus for transferring a substrate carrier within an electronic device manufacturing facility
US7522969B2 (en) * 2004-02-28 2009-04-21 Applied Materials, Inc Methods and apparatus for material control system interface
US7603196B2 (en) * 2004-02-28 2009-10-13 Applied Materials, Inc. Methods and apparatus for material control system interface
US20070124010A1 (en) * 2004-02-28 2007-05-31 Applied Materials, Inc. Methods and apparatus for material control system interface
US8024065B2 (en) 2004-02-28 2011-09-20 Applied Materials, Inc. Methods and apparatus for transferring a substrate carrier within an electronic device manufacturing facility
US20090314607A1 (en) * 2006-07-27 2009-12-24 Advantest Corporation Electronic device conveying method and electronic device handling apparatus
US20080125900A1 (en) * 2006-09-15 2008-05-29 Maxim Carmen A Method and apparatus for scheduling material transport in a semiconductor manufacturing facility
US7356378B1 (en) * 2007-04-03 2008-04-08 Taiwan Semiconductor Manufacturing Company Method and system for smart vehicle route selection
CN101281404B (zh) * 2007-04-03 2010-06-02 台湾积体电路制造股份有限公司 工厂自动化系统以及相关方法
US20090089772A1 (en) * 2007-09-28 2009-04-02 International Business Machines Corporation Arrangement for scheduling jobs with rules and events
US20090319074A1 (en) * 2008-06-23 2009-12-24 International Business Machines Corporation Method for compensating for tool processing variation in the routing of wafers/lots
US8369976B2 (en) 2008-06-23 2013-02-05 International Business Machines Corporation Method for compensating for tool processing variation in the routing of wafers/lots
US8095230B2 (en) 2008-06-24 2012-01-10 International Business Machines Corporation Method for optimizing the routing of wafers/lots based on yield
US20100023160A1 (en) * 2008-07-25 2010-01-28 Inotera Memories, Inc. Cross-fab material control system and control method thereof
US20110217469A1 (en) * 2008-12-31 2011-09-08 Lawrence Chung-Lai Lei Methods and Systems of Transferring, Docking and Processing Substrates
US20110151119A1 (en) * 2008-12-31 2011-06-23 Lawrence Chung-Lai Lei Methods and Systems of Transferring, Docking and Processing Substrates
US20100162955A1 (en) * 2008-12-31 2010-07-01 Lawrence Chung-Lai Lei Systems and methods for substrate processing
US8268734B2 (en) 2008-12-31 2012-09-18 Archers Inc. Methods and systems of transferring, docking and processing substrates
US8367565B2 (en) 2008-12-31 2013-02-05 Archers Inc. Methods and systems of transferring, docking and processing substrates
US20100162954A1 (en) * 2008-12-31 2010-07-01 Lawrence Chung-Lai Lei Integrated facility and process chamber for substrate processing
US20100173439A1 (en) * 2009-01-03 2010-07-08 Lawrence Chung-Lai Lei Methods and systems of transferring a substrate to minimize heat loss
US8110511B2 (en) * 2009-01-03 2012-02-07 Archers Inc. Methods and systems of transferring a substrate to minimize heat loss
CN101767718B (zh) * 2009-01-03 2012-09-05 英属开曼群岛商精曜有限公司 传送一个或多个基板于工艺模块之间或装卸站之间的方法
US20150198942A1 (en) * 2014-01-10 2015-07-16 Inotera Memories, Inc. Carrier arrangement system and method of arranging carriers
US9618921B2 (en) * 2014-01-10 2017-04-11 Inotera Memories, Inc. Object carrier transport system and method of transporting object carriers

Also Published As

Publication number Publication date
US7522969B2 (en) 2009-04-21
US7603196B2 (en) 2009-10-13
TWI316044B (en) 2009-10-21
US20070276530A1 (en) 2007-11-29
TW200535078A (en) 2005-11-01
US20050273190A1 (en) 2005-12-08
KR20060043261A (ko) 2006-05-15
US20070124010A1 (en) 2007-05-31
CN100426452C (zh) 2008-10-15
CN1681083A (zh) 2005-10-12

Similar Documents

Publication Publication Date Title
US7177716B2 (en) Methods and apparatus for material control system interface
US7720557B2 (en) Methods and apparatus for enhanced operation of substrate carrier handlers
US7221993B2 (en) Systems and methods for transferring small lot size substrate carriers between processing tools
US7603195B2 (en) Methods and apparatus for integrating large and small lot electronic device fabrication facilities
US20050209721A1 (en) Methods and apparatus for enhanced operation of substrate carrier handlers
US6662076B1 (en) Management of move requests from a factory system to an automated material handling system
US7778721B2 (en) Small lot size lithography bays
US8024065B2 (en) Methods and apparatus for transferring a substrate carrier within an electronic device manufacturing facility
US20070276531A1 (en) Methods and apparatus for enhanced operation of substrate carrier handlers
US7966090B2 (en) Automated material handling system and method
TW201532118A (zh) 用於控制多批工件處理的方法、儲存媒體及系統
US9250623B2 (en) Methods and systems for fabricating integrated circuits utilizing universal and local processing management
WO2006081519A2 (en) Methods and apparatus for operation of substrate carrier handlers
EP1569262A2 (en) Methods and apparatus for enhanced operation of substrate carrier handlers

Legal Events

Date Code Title Description
AS Assignment

Owner name: APPLIED MATERIALS, INC., CALIFORNIA

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:DUFFIN, DAVID C.;JESSOP, DANIEL R.;TEFERRA, MICHAEL;AND OTHERS;REEL/FRAME:016648/0010;SIGNING DATES FROM 20050428 TO 20050501

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAY Fee payment

Year of fee payment: 4

FPAY Fee payment

Year of fee payment: 8

FEPP Fee payment procedure

Free format text: MAINTENANCE FEE REMINDER MAILED (ORIGINAL EVENT CODE: REM.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

LAPS Lapse for failure to pay maintenance fees

Free format text: PATENT EXPIRED FOR FAILURE TO PAY MAINTENANCE FEES (ORIGINAL EVENT CODE: EXP.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

STCH Information on status: patent discontinuation

Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362

FP Lapsed due to failure to pay maintenance fee

Effective date: 20190213