TWI428436B - 拋光組合物及使用經胺基矽烷處理之研磨顆粒的方法 - Google Patents
拋光組合物及使用經胺基矽烷處理之研磨顆粒的方法 Download PDFInfo
- Publication number
- TWI428436B TWI428436B TW097136354A TW97136354A TWI428436B TW I428436 B TWI428436 B TW I428436B TW 097136354 A TW097136354 A TW 097136354A TW 97136354 A TW97136354 A TW 97136354A TW I428436 B TWI428436 B TW I428436B
- Authority
- TW
- Taiwan
- Prior art keywords
- polishing composition
- ppm
- polishing
- substrate
- cerium oxide
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1436—Composite particles, e.g. coated particles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/06—Planarisation of inorganic insulating materials
- H10P95/062—Planarisation of inorganic insulating materials involving a dielectric removal step
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Composite Materials (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US97434007P | 2007-09-21 | 2007-09-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200918658A TW200918658A (en) | 2009-05-01 |
| TWI428436B true TWI428436B (zh) | 2014-03-01 |
Family
ID=40472131
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097136354A TWI428436B (zh) | 2007-09-21 | 2008-09-22 | 拋光組合物及使用經胺基矽烷處理之研磨顆粒的方法 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US7994057B2 (enExample) |
| EP (1) | EP2197972B1 (enExample) |
| JP (1) | JP5519507B2 (enExample) |
| KR (1) | KR101232585B1 (enExample) |
| CN (1) | CN101802125B (enExample) |
| IL (1) | IL203477A (enExample) |
| MY (1) | MY147729A (enExample) |
| TW (1) | TWI428436B (enExample) |
| WO (1) | WO2009042072A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI760494B (zh) * | 2017-06-16 | 2022-04-11 | 美商羅門哈斯電子材料Cmp控股公司 | 用於淺溝槽隔離的水性二氧化矽漿料組合物及其使用方法 |
Families Citing this family (60)
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|---|---|---|---|---|
| EP2188344B1 (en) * | 2007-09-21 | 2016-04-27 | Cabot Microelectronics Corporation | Polishing composition and method utilizing abrasive particles treated with an aminosilane |
| JP5209284B2 (ja) * | 2007-11-28 | 2013-06-12 | 日本ミクロコーティング株式会社 | 研磨シートおよび研磨シートの製造方法 |
| JP5441362B2 (ja) * | 2008-05-30 | 2014-03-12 | 富士フイルム株式会社 | 研磨液及び研磨方法 |
| CN102361940B (zh) | 2009-01-20 | 2016-03-02 | 卡博特公司 | 包含硅烷改性金属氧化物的组合物 |
| JP5601922B2 (ja) * | 2010-07-29 | 2014-10-08 | 富士フイルム株式会社 | 研磨液及び研磨方法 |
| JP5925454B2 (ja) | 2010-12-16 | 2016-05-25 | 花王株式会社 | 磁気ディスク基板用研磨液組成物 |
| CA2829861C (en) * | 2011-03-25 | 2019-05-14 | Akzo Nobel Chemicals International B.V. | Alkyd-based coating composition |
| US8808573B2 (en) * | 2011-04-15 | 2014-08-19 | Cabot Microelectronics Corporation | Compositions and methods for selective polishing of silicon nitride materials |
| US8778212B2 (en) * | 2012-05-22 | 2014-07-15 | Cabot Microelectronics Corporation | CMP composition containing zirconia particles and method of use |
| JP6272842B2 (ja) * | 2012-06-11 | 2018-01-31 | キャボット マイクロエレクトロニクス コーポレイション | モリブデン研磨のための組成物および方法 |
| US8778211B2 (en) * | 2012-07-17 | 2014-07-15 | Cabot Microelectronics Corporation | GST CMP slurries |
| EP3048152A4 (en) * | 2013-09-20 | 2016-10-19 | Fujimi Inc | POLISHING COMPOSITION |
| CN104745083B (zh) * | 2013-12-25 | 2018-09-14 | 安集微电子(上海)有限公司 | 一种化学机械抛光液以及抛光方法 |
| US9238754B2 (en) * | 2014-03-11 | 2016-01-19 | Cabot Microelectronics Corporation | Composition for tungsten CMP |
| US9303188B2 (en) * | 2014-03-11 | 2016-04-05 | Cabot Microelectronics Corporation | Composition for tungsten CMP |
| US9303189B2 (en) * | 2014-03-11 | 2016-04-05 | Cabot Microelectronics Corporation | Composition for tungsten CMP |
| US9309442B2 (en) * | 2014-03-21 | 2016-04-12 | Cabot Microelectronics Corporation | Composition for tungsten buffing |
| US9127187B1 (en) * | 2014-03-24 | 2015-09-08 | Cabot Microelectronics Corporation | Mixed abrasive tungsten CMP composition |
| US9303190B2 (en) | 2014-03-24 | 2016-04-05 | Cabot Microelectronics Corporation | Mixed abrasive tungsten CMP composition |
| US9583359B2 (en) | 2014-04-04 | 2017-02-28 | Fujifilm Planar Solutions, LLC | Polishing compositions and methods for selectively polishing silicon nitride over silicon oxide films |
| TWI561620B (en) * | 2014-06-20 | 2016-12-11 | Cabot Microelectronics Corp | Cmp slurry compositions and methods for aluminum polishing |
| SG11201610332PA (en) | 2014-06-25 | 2017-02-27 | Cabot Microelectronics Corp | Copper barrier chemical-mechanical polishing composition |
| KR102501107B1 (ko) | 2014-06-25 | 2023-02-17 | 씨엠씨 머티리얼즈, 인코포레이티드 | 콜로이드성 실리카 화학적-기계적 연마 조성물 |
| WO2015200679A1 (en) | 2014-06-25 | 2015-12-30 | Cabot Microelectronics Corporation | Tungsten chemical-mechanical polishing composition |
| CN105802508B (zh) * | 2014-12-29 | 2020-03-13 | 安集微电子(上海)有限公司 | 一种氮唑类化合物在提高化学机械抛光液稳定性中的应用 |
| CN105802510A (zh) * | 2014-12-29 | 2016-07-27 | 安集微电子(上海)有限公司 | 一种化学机械抛光液及其应用 |
| JP6719452B2 (ja) * | 2015-03-30 | 2020-07-08 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
| US9597768B1 (en) * | 2015-09-09 | 2017-03-21 | Cabot Microelectronics Corporation | Selective nitride slurries with improved stability and improved polishing characteristics |
| US9771496B2 (en) | 2015-10-28 | 2017-09-26 | Cabot Microelectronics Corporation | Tungsten-processing slurry with cationic surfactant and cyclodextrin |
| US9631122B1 (en) * | 2015-10-28 | 2017-04-25 | Cabot Microelectronics Corporation | Tungsten-processing slurry with cationic surfactant |
| KR102545804B1 (ko) * | 2015-12-04 | 2023-06-20 | 솔브레인 주식회사 | 식각용 조성물 및 이를 이용한 반도체 소자의 제조방법 |
| TWI738743B (zh) | 2016-03-23 | 2021-09-11 | 美商道康寧公司 | 金屬-聚有機矽氧烷 |
| WO2017169602A1 (ja) * | 2016-03-30 | 2017-10-05 | 株式会社フジミインコーポレーテッド | カチオン変性シリカ原料分散液 |
| US10792785B2 (en) * | 2016-06-07 | 2020-10-06 | Cabot Microelectronics Corporation | Chemical-mechanical processing slurry and methods for processing a nickel substrate surface |
| US9783702B1 (en) * | 2016-10-19 | 2017-10-10 | Rohm And Haas Electronic Materials Cmp Holdings Inc. | Aqueous compositions of low abrasive silica particles |
| US10294399B2 (en) * | 2017-01-05 | 2019-05-21 | Cabot Microelectronics Corporation | Composition and method for polishing silicon carbide |
| WO2019055749A1 (en) | 2017-09-15 | 2019-03-21 | Cabot Microelectronics Corporation | COMPOSITION FOR THE CHEMICAL MECHANICAL POLISHING (CMP) OF TUNGSTEN |
| US10508221B2 (en) * | 2017-09-28 | 2019-12-17 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Aqueous low abrasive silica slurry and amine carboxylic acid compositions for use in shallow trench isolation and methods of making and using them |
| US10711158B2 (en) * | 2017-09-28 | 2020-07-14 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Aqueous silica slurry and amine carboxylic acid compositions for use in shallow trench isolation and methods of using them |
| US10428241B2 (en) | 2017-10-05 | 2019-10-01 | Fujifilm Electronic Materials U.S.A., Inc. | Polishing compositions containing charged abrasive |
| US20190185713A1 (en) * | 2017-12-14 | 2019-06-20 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Cmp slurry compositions containing silica with trimethylsulfoxonium cations |
| JP7028120B2 (ja) * | 2018-09-20 | 2022-03-02 | Jsr株式会社 | 化学機械研磨用水系分散体及びその製造方法、並びに化学機械研磨方法 |
| US10968366B2 (en) | 2018-12-04 | 2021-04-06 | Cmc Materials, Inc. | Composition and method for metal CMP |
| US12227673B2 (en) * | 2018-12-04 | 2025-02-18 | Cmc Materials Llc | Composition and method for silicon nitride CMP |
| US10676647B1 (en) | 2018-12-31 | 2020-06-09 | Cabot Microelectronics Corporation | Composition for tungsten CMP |
| US10781343B2 (en) * | 2019-01-24 | 2020-09-22 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Acid polishing composition and method of polishing a substrate having enhanced defect inhibition |
| JP7285113B2 (ja) * | 2019-03-29 | 2023-06-01 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
| JP7234008B2 (ja) * | 2019-03-29 | 2023-03-07 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
| KR102859110B1 (ko) | 2020-01-07 | 2025-09-12 | 씨엠씨 머티리얼즈 엘엘씨 | 유도체화된 폴리아미노산 |
| WO2021144940A1 (ja) * | 2020-01-16 | 2021-07-22 | 昭和電工マテリアルズ株式会社 | 研磨剤、研磨剤用貯蔵液及び研磨方法 |
| KR20210095465A (ko) | 2020-01-23 | 2021-08-02 | 삼성에스디아이 주식회사 | 텅스텐 패턴 웨이퍼 연마용 cmp 슬러리 조성물 및 이를 이용한 텅스텐 패턴 웨이퍼의 연마 방법 |
| US12234383B2 (en) * | 2020-05-29 | 2025-02-25 | Versum Materials Us, Llc | Low dishing oxide CMP polishing compositions for shallow trench isolation applications and methods of making thereof |
| KR102678848B1 (ko) * | 2020-10-14 | 2024-06-26 | 삼성에스디아이 주식회사 | 텅스텐 패턴 웨이퍼 연마용 cmp 슬러리 조성물 및 이를 이용한 텅스텐 패턴 웨이퍼의 연마 방법 |
| JP2024508243A (ja) * | 2021-02-04 | 2024-02-26 | シーエムシー マテリアルズ リミティド ライアビリティ カンパニー | 炭窒化ケイ素研磨組成物及び方法 |
| EP4341315A4 (en) | 2021-05-20 | 2025-04-16 | Versum Materials US, LLC | IMIDAZOLIUM-BASED POLY(IONIC LIQUID(S)) AND ASSOCIATED USE |
| KR102638622B1 (ko) * | 2021-07-22 | 2024-02-19 | 에스케이엔펄스 주식회사 | 반도체 공정용 연마 조성물 및 연마 조성물을 적용한 반도체 소자의 제조 방법 |
| US12497540B2 (en) | 2021-09-30 | 2025-12-16 | Fujimi Incorporated | Polishing composition and polishing method using the same |
| TW202334371A (zh) | 2021-09-30 | 2023-09-01 | 日商福吉米股份有限公司 | 拋光組成物及使用彼之拋光方法 |
| KR102771385B1 (ko) * | 2021-12-23 | 2025-02-26 | 주식회사 케이씨텍 | 연마 슬러리 조성물 |
| WO2026015805A1 (en) * | 2024-07-12 | 2026-01-15 | Entegris, Inc. | Cmp composition including aminosilane modified silica coated ceria particles |
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-
2008
- 2008-09-19 EP EP08834266.2A patent/EP2197972B1/en active Active
- 2008-09-19 CN CN2008801073426A patent/CN101802125B/zh active Active
- 2008-09-19 JP JP2010525837A patent/JP5519507B2/ja active Active
- 2008-09-19 MY MYPI2010001235A patent/MY147729A/en unknown
- 2008-09-19 WO PCT/US2008/010896 patent/WO2009042072A2/en not_active Ceased
- 2008-09-19 US US12/234,173 patent/US7994057B2/en active Active
- 2008-09-19 KR KR1020107008621A patent/KR101232585B1/ko active Active
- 2008-09-22 TW TW097136354A patent/TWI428436B/zh active
-
2010
- 2010-01-20 IL IL203477A patent/IL203477A/en active IP Right Grant
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI760494B (zh) * | 2017-06-16 | 2022-04-11 | 美商羅門哈斯電子材料Cmp控股公司 | 用於淺溝槽隔離的水性二氧化矽漿料組合物及其使用方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| IL203477A (en) | 2013-03-24 |
| CN101802125B (zh) | 2013-11-06 |
| US7994057B2 (en) | 2011-08-09 |
| CN101802125A (zh) | 2010-08-11 |
| JP5519507B2 (ja) | 2014-06-11 |
| MY147729A (en) | 2013-01-15 |
| WO2009042072A3 (en) | 2009-06-18 |
| US20090081871A1 (en) | 2009-03-26 |
| WO2009042072A2 (en) | 2009-04-02 |
| KR101232585B1 (ko) | 2013-02-12 |
| EP2197972B1 (en) | 2020-04-01 |
| EP2197972A2 (en) | 2010-06-23 |
| JP2010541203A (ja) | 2010-12-24 |
| KR20100074207A (ko) | 2010-07-01 |
| EP2197972A4 (en) | 2011-06-01 |
| TW200918658A (en) | 2009-05-01 |
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