TWI392153B - 電性連接裝置 - Google Patents

電性連接裝置 Download PDF

Info

Publication number
TWI392153B
TWI392153B TW098132310A TW98132310A TWI392153B TW I392153 B TWI392153 B TW I392153B TW 098132310 A TW098132310 A TW 098132310A TW 98132310 A TW98132310 A TW 98132310A TW I392153 B TWI392153 B TW I392153B
Authority
TW
Taiwan
Prior art keywords
elastic member
contact
base member
joint
slit
Prior art date
Application number
TW098132310A
Other languages
English (en)
Chinese (zh)
Other versions
TW201019546A (en
Inventor
Yuji Nakamura
Eiji Kobori
Katsumi Suzuki
Takeyuki Suzuki
Original Assignee
Yamaichi Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamaichi Electronics Co Ltd filed Critical Yamaichi Electronics Co Ltd
Publication of TW201019546A publication Critical patent/TW201019546A/zh
Application granted granted Critical
Publication of TWI392153B publication Critical patent/TWI392153B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/82—Coupling devices connected with low or zero insertion force
    • H01R12/85—Coupling devices connected with low or zero insertion force contact pressure producing means, contacts activated after insertion of printed circuits or like structures

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
TW098132310A 2008-11-12 2009-09-24 電性連接裝置 TWI392153B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008289872A JP5029969B2 (ja) 2008-11-12 2008-11-12 電気接続装置

Publications (2)

Publication Number Publication Date
TW201019546A TW201019546A (en) 2010-05-16
TWI392153B true TWI392153B (zh) 2013-04-01

Family

ID=42165616

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098132310A TWI392153B (zh) 2008-11-12 2009-09-24 電性連接裝置

Country Status (4)

Country Link
US (1) US7914295B2 (enExample)
JP (1) JP5029969B2 (enExample)
TW (1) TWI392153B (enExample)
WO (1) WO2010055712A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012520461A (ja) * 2009-03-10 2012-09-06 ジョンステック インターナショナル コーポレーション マイクロ回路テスタ用の導電ピン
US20130002285A1 (en) 2010-03-10 2013-01-03 Johnstech International Corporation Electrically Conductive Pins For Microcircuit Tester
TWI534432B (zh) 2010-09-07 2016-05-21 瓊斯科技國際公司 用於微電路測試器之電氣傳導針腳
US9007082B2 (en) 2010-09-07 2015-04-14 Johnstech International Corporation Electrically conductive pins for microcircuit tester
JP5836113B2 (ja) * 2011-12-28 2015-12-24 株式会社エンプラス 電気部品用ソケット
WO2014073368A1 (ja) 2012-11-07 2014-05-15 オムロン株式会社 接続端子およびこれを用いた導通検査器具
US9274141B1 (en) * 2013-01-22 2016-03-01 Johnstech International Corporation Low resistance low wear test pin for test contactor
US9425529B2 (en) * 2014-06-20 2016-08-23 Xcerra Corporation Integrated circuit chip tester with an anti-rotation link
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
JP2019046643A (ja) * 2017-09-01 2019-03-22 モレックス エルエルシー コネクタ、コネクタ組立体、及びコネクタの製造方法
EP3499653B1 (en) * 2017-12-12 2021-08-18 Rasco GmbH Contactor spring and contactor socket
KR102566041B1 (ko) * 2019-11-05 2023-08-16 주식회사 프로웰 반도체 소자 테스트 장치
KR20240104127A (ko) 2021-11-03 2024-07-04 존스테크 인터내셔널 코포레이션 수직 백스톱을 갖는 하우징
USD1075695S1 (en) 2022-04-05 2025-05-20 Johnstech International Corporation Contact pin for integrated circuit testing
USD1042345S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
USD1042346S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW352481B (en) * 1996-07-02 1999-02-11 Johnstech Int Corp Electrical interconnect contact system
TW578335B (en) * 2001-08-31 2004-03-01 Johnstech Int Corp Electrical contact for improved wiping action
TWI291271B (en) * 2003-04-23 2007-12-11 Johnstech Int Corp Improved integrated circuit contact to test apparatus

Family Cites Families (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5049084A (en) * 1989-12-05 1991-09-17 Rogers Corporation Electrical circuit board interconnect
US5207584A (en) 1991-01-09 1993-05-04 Johnson David A Electrical interconnect contact system
US5634801A (en) 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
US5069629A (en) 1991-01-09 1991-12-03 Johnson David A Electrical interconnect contact system
US5749738A (en) 1991-01-09 1998-05-12 Johnstech International Corporation Electrical interconnect contact system
US5388996A (en) 1991-01-09 1995-02-14 Johnson; David A. Electrical interconnect contact system
US5254834A (en) 1992-06-02 1993-10-19 Johnstech International Corporation Method of forming closely-spaced, generally parallel slots through a thin wall and product formed thereby
JP2807171B2 (ja) 1993-05-03 1998-10-08 デビット エー．ジョンソン 電気的相互接続コンタクト装置
US5336094A (en) 1993-06-30 1994-08-09 Johnstech International Corporation Apparatus for interconnecting electrical contacts
US5360348A (en) 1993-08-16 1994-11-01 Johnstech International Corporation Integrated circuit device test socket
US5639247A (en) 1994-05-09 1997-06-17 Johnstech International Corporation Contacting system for electrical devices
US5645433A (en) 1994-05-09 1997-07-08 Johnstech International Corporation Contacting system for electrical devices
JP2857838B2 (ja) * 1994-12-01 1999-02-17 日本航空電子工業株式会社 パッケージ用ソケットコネクタ
CA2180578A1 (en) * 1995-07-07 1997-01-08 David A. Johnson Impedance controlled interconnection device
JP3340294B2 (ja) * 1995-11-17 2002-11-05 株式会社テセック 電子部品用コネクタ
US5899755A (en) 1996-03-14 1999-05-04 Johnstech International Corporation Integrated circuit test socket with enhanced noise imminity
JP2849070B2 (ja) 1996-08-02 1999-01-20 山一電機株式会社 Ｉｃソケット
US6019612A (en) 1997-02-10 2000-02-01 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus for electrically connecting a device to be tested
US5888075A (en) 1997-02-10 1999-03-30 Kabushiki Kaisha Nihon Micronics Auxiliary apparatus for testing device
JP3379897B2 (ja) 1997-02-10 2003-02-24 株式会社日本マイクロニクス 被検査体試験用補助装置
US5938451A (en) 1997-05-06 1999-08-17 Gryphics, Inc. Electrical connector with multiple modes of compliance
US6409521B1 (en) 1997-05-06 2002-06-25 Gryphics, Inc. Multi-mode compliant connector and replaceable chip module utilizing the same
WO1998050985A1 (en) * 1997-05-06 1998-11-12 Gryphics, Inc. Multi-mode compliant connector and replaceable chip module utilizing the same
US5913687A (en) 1997-05-06 1999-06-22 Gryphics, Inc. Replacement chip module
JPH10326653A (ja) * 1997-05-26 1998-12-08 Japan Aviation Electron Ind Ltd コネクタ
US6570393B2 (en) 1997-09-17 2003-05-27 Johnstech International Corporation Test apparatus improved test connector
US6529025B1 (en) 1997-09-18 2003-03-04 Johnstech International Corporation Electrical continuity enhancement for sockets/contactors
JPH11102764A (ja) 1997-09-25 1999-04-13 Sony Corp アダプターボード
JP3577416B2 (ja) 1997-11-25 2004-10-13 株式会社日本マイクロニクス 電気的接続装置
JPH11242974A (ja) 1998-02-25 1999-09-07 Sony Corp 半導体装置用測定ソケット
JP4404987B2 (ja) 1998-05-27 2010-01-27 株式会社日本マイクロニクス プローブカード
AU2637400A (en) 1999-02-02 2000-08-25 Gryphics, Inc. Low or zero insertion force connector for printed circuit boards and electrical devices
JP2001035619A (ja) 1999-07-27 2001-02-09 Sony Corp ソケット装置
JP2001135441A (ja) 1999-11-02 2001-05-18 Sony Corp ソケット装置
JP2001237037A (ja) 2000-02-22 2001-08-31 Sony Corp Ｉｃソケット
JP2001235510A (ja) 2000-02-25 2001-08-31 Sony Corp Ｉｃソケット
JP2001257049A (ja) 2000-03-13 2001-09-21 Sony Corp Ｉｃソケット
JP2001305184A (ja) 2000-04-25 2001-10-31 Sony Corp 電気コネクタ
JP2001319749A (ja) 2000-05-02 2001-11-16 Sony Corp Ｉｃソケット
JP3498040B2 (ja) 2000-05-18 2004-02-16 株式会社日本マイクロニクス 電気的接続装置
JP2002181881A (ja) 2000-12-08 2002-06-26 Sony Corp 電子回路装置の測定装置および測定方法
JP2002246128A (ja) 2001-02-19 2002-08-30 Micronics Japan Co Ltd 電気的接続装置
JP3854811B2 (ja) * 2001-03-19 2006-12-06 株式会社日本マイクロニクス 電気的接続装置
JP2002328149A (ja) 2001-04-27 2002-11-15 Sony Corp Ｉｃソケット
JP2003045593A (ja) 2001-07-30 2003-02-14 Micronics Japan Co Ltd 電気的接続装置
JP3822539B2 (ja) 2001-08-09 2006-09-20 山一電機株式会社 Ｉｃソケット
JP2003086313A (ja) 2001-09-07 2003-03-20 Yamaichi Electronics Co Ltd Ｉｃソケット
JP2003123874A (ja) 2001-10-16 2003-04-25 Micronics Japan Co Ltd 接触子及びその製造方法並びに電気的接続装置
JP2003217777A (ja) * 2002-01-25 2003-07-31 Micronics Japan Co Ltd 電気的接続装置
JP4102571B2 (ja) 2002-02-13 2008-06-18 株式会社日本マイクロニクス 接触子及び電気的接続装置
US6854981B2 (en) 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US6861667B2 (en) 2002-07-15 2005-03-01 Johnstech International Corporation Grounding inserts
JP4195588B2 (ja) 2002-07-31 2008-12-10 株式会社日本マイクロニクス 接触子の製造方法及び接触子
JP2004247194A (ja) 2003-02-14 2004-09-02 Sony Corp 半導体装置用ソケット及び同ソケットを備えた検査装置
US7040902B2 (en) * 2003-03-24 2006-05-09 Che-Yu Li & Company, Llc Electrical contact
WO2005011060A2 (en) 2003-07-16 2005-02-03 Gryphics, Inc. Electrical interconnect assembly with interlocking contact system
US7537461B2 (en) 2003-07-16 2009-05-26 Gryphics, Inc. Fine pitch electrical interconnect assembly
US7297003B2 (en) 2003-07-16 2007-11-20 Gryphics, Inc. Fine pitch electrical interconnect assembly
JP4388932B2 (ja) 2004-01-13 2009-12-24 株式会社日本マイクロニクス 電気的接続装置
EP1753100A4 (en) 2004-06-03 2008-05-07 Nihon Micronics Kk CONTACTOR AND ELECTRICAL CONNECTOR
WO2006006248A1 (ja) 2004-07-12 2006-01-19 Kabushiki Kaisha Nihon Micronics 電気的接続装置
JP2008527649A (ja) 2005-01-04 2008-07-24 グリフィクス インコーポレーティッド ファインピッチの電気相互接続組立品
JP4505342B2 (ja) 2005-02-04 2010-07-21 株式会社日本マイクロニクス 電気的接続装置
WO2006085388A1 (ja) 2005-02-08 2006-08-17 Kabushiki Kaisha Nihon Micronics 電気的接続装置
JP2006351474A (ja) 2005-06-20 2006-12-28 Micronics Japan Co Ltd 電気的接続装置
JP2007017189A (ja) 2005-07-05 2007-01-25 Micronics Japan Co Ltd 電気的接続装置
US7445465B2 (en) 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
JP2007225599A (ja) 2006-01-17 2007-09-06 Johnstech Internatl Corp 信号および電力接点のアレイを有するパッケージを備えた集積回路を試験するための試験接点システム
US7639026B2 (en) 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
US7737708B2 (en) 2006-05-11 2010-06-15 Johnstech International Corporation Contact for use in testing integrated circuits
JP5134803B2 (ja) 2006-10-05 2013-01-30 株式会社日本マイクロニクス 電気的接続装置
JP5134805B2 (ja) 2006-10-12 2013-01-30 株式会社日本マイクロニクス 電気的接続装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW352481B (en) * 1996-07-02 1999-02-11 Johnstech Int Corp Electrical interconnect contact system
US5947749A (en) * 1996-07-02 1999-09-07 Johnstech International Corporation Electrical interconnect contact system
TW578335B (en) * 2001-08-31 2004-03-01 Johnstech Int Corp Electrical contact for improved wiping action
TWI291271B (en) * 2003-04-23 2007-12-11 Johnstech Int Corp Improved integrated circuit contact to test apparatus

Also Published As

Publication number Publication date
WO2010055712A1 (ja) 2010-05-20
TW201019546A (en) 2010-05-16
JP5029969B2 (ja) 2012-09-19
US7914295B2 (en) 2011-03-29
US20100120265A1 (en) 2010-05-13
JP2010118220A (ja) 2010-05-27

Similar Documents

Publication Publication Date Title
TWI392153B (zh) 電性連接裝置
JP7569879B2 (ja) 電気コネクタ
CN103384036B (zh) 电连接器组装体、插塞式连接器以及插座式连接器
JP5498883B2 (ja) 電気コネクタ
CN103427184B (zh) 电连接器
US20080305659A1 (en) Electrical connector
TWI697156B (zh) 連接器以及連接器組件
JP5809463B2 (ja) フローティング型コネクタ
TWI525939B (zh) 連接器
JP2012226951A (ja) 回路基板用電気コネクタ
CN101449431A (zh) 带有用于执行机构和/或传感器的接口的模块
JP5809606B2 (ja) 電気コネクタ
TW201902041A (zh) 連接器以及連接器組件
KR20230059639A (ko) 반도체 칩 테스트 소켓
CN116544689A (zh) 电路基板用电连接器
KR101886205B1 (ko) 반도체 패키지 테스트용 원터치 체결형 소켓 어셈블리
JP2009295323A (ja) 電気コネクタ
JP4800404B2 (ja) 電気コネクタ
JP2015118918A (ja) コネクタ及びこれを備えるコネクタ装置
CN101336056B (zh) 扩展坞的连接器的固定结构及其固定方法
JP2015079568A (ja) 電気コネクタ
JP4427501B2 (ja) Ｉｃソケット
JP6387440B1 (ja) 接触端子及びカードエッジコネクタ
CN1972020A (zh) 连接器
JP6774283B2 (ja) コネクタ装置

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees