TW518638B - Device and process for liquid treatment of wafer-shaped articles - Google Patents
Device and process for liquid treatment of wafer-shaped articles Download PDFInfo
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- 239000007788 liquid Substances 0.000 title claims abstract description 49
- 238000000034 method Methods 0.000 title claims abstract description 22
- 239000013078 crystal Substances 0.000 claims description 5
- 230000002093 peripheral effect Effects 0.000 claims description 5
- 239000007921 spray Substances 0.000 claims description 3
- 230000007717 exclusion Effects 0.000 claims 1
- 238000009736 wetting Methods 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 76
- 239000007789 gas Substances 0.000 description 74
- 125000006850 spacer group Chemical group 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000002079 cooperative effect Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- 241000218691 Cupressaceae Species 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68735—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge profile or support profile
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Weting (AREA)
- Cleaning In General (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Photographic Processing Devices Using Wet Methods (AREA)
Description
518638
經濟部智慧財產局員工消費合作社印製
本發明係有關於一種晶圓狀物品的限定部份,尤其是 晶圓的靠近邊緣部份之液體處理的裝置及方法。 處理一晶圓狀物品,尤其是一晶圓靠近邊緣的限定部 伤之理由’將說明如後。 一晶圓,例如一矽晶圓,乃會具有例如二氧化矽塗層 於各面。為了後續的製程(假使有一層金或一層聚石夕(複晶 矽)要被覆設其上),其將需要由該晶圓主表面的至少邊緣 區域除掉既有的塗層,但亦可選擇在其邊緣表面及/或第 二主表面的區域來除去塗層。此係藉蝕刻方法來完成,其 主要可區分為乾蝕刻法及溼蝕刻法。 另種狀況即為晶圓的清潔。其乃需要清潔至少晶圓的 主表面之邊緣區域,但亦可選擇在其邊緣表面及/或第二 主表面區域,來除去微粒及/或其它污染物。此係以溼清 >糸法來完成。 本發明係針對溼蝕刻法及溼清潔法(統稱為液體處理) 。當進行該等操作時,要處理的晶圓表面區域會被以處理 液溼化,而要被除去的膜層或污物等將被除掉。 一種供執行此液體處理的裝置係揭述於例如第4 903 717號美國專利案中。在該專利中,該晶圓狀物品(晶圓) 係被固設在一轉盤上。該處理液,例如一蝕刻液,會被施 加於要被處理的晶圓表面上,由於晶圓旋轉的結果,該液 體會佈散於其整個表面,並被側向地拋用至該晶圓的邊緣 上。 為了防止該處理液被以一不能控制的方式濺灑到不铲
本紙張尺度適财國^準(CNS)A4規格⑽χ撕公爱)
518638
五、發明說明(2 受處理的表面,在第4 903 717號美國專利案中,乃推薦 -種夾盤’其會以-種氣體冲噴面對該夾盤的表面,即該 不要受處理的表面。如此進行時,該氣體會存在於晶圓邊 緣與夾盤之間。 第09-181026A號日本專利案乃揭述一種半導體晶圓 的夾盤,其在一環狀噴嘴的外部具有一特殊造型,例如一 下凹至該外部的環狀階部,或其邊緣之_斜削部。此外, 一吸孔亦被提供。該吸入開孔的造型係被設計成會影響( 減少)在邊緣區域的流速。此乃用來使由上頭淋下的處理 液,能流過該晶圓的邊緣而至面對夾盤的一面,以處理該 等邊緣區域。 不管是否係使用如第4 903 717號美國專利案,或第 09-181026A號曰本專利案所請求之裝置(夾盤)來固持該晶 圓狀物品,大部份在面向夾盤的主表面上之15mm的邊緣 區域(由該晶圓的外側邊緣算起)皆可被處理。然後該液體 會沿該晶圓邊緣的方向流回,並被該裝置所甩掉。 本务明之目的係為驗證一種可能性,來以液體處理在 一晶圓狀物品的一表面上之一限定的側邊區域,且亦可能 處理大於2mm的邊緣區域(由該晶圓的外側邊緣算起)者。 爰是,本發明於其概括實施例中,乃提供一種裝置可 供液體處理一晶圓狀物品,尤其是一晶圓在靠近邊緣之一 限定部份’其係以一裝置來固持該晶圓狀物品,並以一氣 體饋供裝置來對該晶圓狀物品面向該裝置的表面進行至少 部份的氣體噴冲,其中在周緣邊側設有一氣體導引裝 本紙張尺度賴目家標準(CNS)A4規格(210 X 297公爱) 1111 t i I (請先閱讀背面之注意事項再填寫本頁) 訂: -線· 經濟部智慧財產局員工消費合作社印製 518638 A7 R7
五、發明說明(3 ) °將大。卩伤在戎晶圓狀物品邊緣區域之噴冲氣體導離該物 經濟部智慧財產局員工消費合作社印製 δ亥固持裝置(夾盤)係為此目的而用來固持該晶圓。該 固持係可利用一真空或使晶圓懸浮在一氣墊上來完成,並 可藉側邊的導件來防止側向滑脫。 該晶圓亦可被氣體所固持,其會流過晶圓底部而造成 負壓(亦稱為柏努力作用),藉此該晶圓會朝夾盤的方向承 又一力。該晶圓會被該夾盤之一高凸部份觸抵而納持於該 氣體饋供裝置中,藉此該晶圓會被阻止側向滑脫。 經由氣體饋送管線,該氣體可被導至晶圓狀物品(晶 圓)的底面(面向夾盤的表面),故能阻止液體達到該底面 而進行非所要的處理。用於此目的之氣體應要對其所冲流 的表面不會起反應,例如,氮或極純的空氣乃可適用。 5亥氣體饋供裝置可包含一個或多個喷嘴,或一環狀喷 嘴。該等噴嘴應對該夾盤中心呈對稱地設置,俾可在整個 周緣得到均勻的氣體流。 5玄氣體導引裝置係用來導送氣體,而使該氣體能由夾 盤的中央部份朝該晶圓邊緣的方向流動離開該邊緣區域。 流經該氣體導引裝置側邊的氣體會面向該晶圓狀物品而離 開。該邊緣區域愈大’則該氣體導引裝置會被設在愈遠的 内側(朝向卡盤中心)。 由於在該晶圓靠近邊緣的底面部份,基本上氣體並不 會流至此外側部份,故在以液體處理時,該液體會繞過晶 圓邊緣而流至底部,因此可濕化該晶圓底部靠近邊緣的部 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 6 (請先閱讀背面之注意事項再填寫本頁) -ώ------- —訂--- _1 I ϋ.I n 1· ϋ I 1 i_i I mfj ϋ ϋ I ·ϋ I ϋ ϋ I ϋ 1 1 I ϋ Α7
經濟部智慧財產局員工消費合作社印製
本㈣優於習知技術之處係在於,該靠近邊緣部份的 j乃%藉著適當選擇氣體導引裝置,而可為任何所需 的尺寸。 、广、&該氣體導引裝置與晶圓之間隙中的氣體流,可藉 適田地成型該氧體導道,而在該間隙中造成-負壓,藉該 負壓加諸於該邊緣區域’氣體會由晶圓邊緣附近流向内部 。因此’當在液體處理時,該液體會被吸人邊緣區域。 _在-實施例中,該氣體導引裝置乃呈環狀。使用例如 三個或更多的間隔物,該環可被固裝於夾盤的座體上。但 亦可利用銑削加工來製造成該座體。 在一貝施例中該環具有一内徑,乃小於該晶圓狀物品 的外徑;及-外徑至少與該晶圓狀物品的外徑相等。 利用此方式,流過該晶圓狀物品圓周邊緣(繞過晶圓 邊緣)的液體,乃能被該環所承接而被送至内側。 該氣體導引裝置亦可由一環狀溝槽所形成,該溝槽係 與該裝置的周邊同圓心,並可將氣體排放至所述的外側。 糟著在該卡盤座體中由該溝槽的底部導向該外側的簡單小 孔,即可確保完成該操作。 在另一實施例中,該氣體導引裝置於其内周緣具有一 銳緣(邊緣角度小於60。)。藉此方式幾乎所有在邊緣區域 的氣體皆可被導離該晶圓。 在一貫施例中,該裝置位於該氣體饋供裝置與氣體導 引裝置之間的部份(座體),係位於比該氣體導引裝置對該 7 --------------裝--------訂---------線 ί請先閱讀背面之注意事項再填寫本頁} 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 518638 A7 B7 五、發明說明(5) (請先閱讀背面之注意事項再填寫本頁) 晶圓狀物品(晶圓)更遠距離之處。於此方式中,可有比流 經5玄晶圓與氣體導引裝置之間更多的氣體,流經該晶圓與 該部份(座體)之間。因此大部份在該氣體導引裝置側邊而 面向該晶圓離開的氣體,皆會流過此裝置。 最好是該氣體導引裝置係被設成,若有一晶圓狀物品 (晶圓)在該夾盤上,則該氣體導引裝置不會接觸該晶圓狀 物品(晶圓),而有一間隙會保持於該晶圓與環之間。 在一實施例中,該氣體導引裝置與晶圓狀物品的間隙 係為0.05至lmm,最好為〇1至〇 5mm。於此方式中,在晶 圓與氣體導引裝.置之間會形成一種毛細現象,藉此乃可使 繞流過晶圓邊緣的液體會被抽吸。面對該氣體導引裝置之 表面,即被該液體所濕化的表面之内徑,係小於該氣體導 引裝置之環狀表面的内徑。 假使该氣體導引裝置面向該晶圓狀物品的表面平行於 該晶圓狀物品之主表面,則乃是較佳的。在該晶圓狀物品 (晶圓)與氣體導引裝置之間的間隙,因而能在整個邊緣區 域中皆為相同的大小。 經濟部智慧財產局員工消費合作社印製 有一實施例係需要該夾盤能被帶動旋轉。即使其並非 必要,但仍是較佳的,因為該等處理液乃可由該夾盤及晶 圓的邊緣被甩掉。若在液體處理時該夾盤並不轉動,則液 體會被氣體流所帶走或吹掉。 本發明的另一部份係為一種方法,乃可液體處理一晶 圓狀物品之一限定區域,尤其是一晶圓靠近邊緣的部份。 在此方法中,該液體係被施淋於面對該液體來源的第一表
518638 經濟部智慧財產局J工消費合作社印製 A7 ^^^—__Β7___ —_ 五、發明說明(6 ) 面。基本上該液體會徑向地流至該晶圓狀物品之圓周邊緣 (晶圓邊緣)的外侧,並繞過該邊緣而至背向於液體來源的 第二表面。該液體會溼化該第二表面上靠近邊緣之一限定 部份,並由該晶圓狀物品上被排除。 其超過習知技術的優點係,在此方法中達到該第一表 面靠近邊緣部份的液流,亦會以一預定方向(由該邊緣(晶 圓邊緣)朝晶圓中央的方向)流經該第二表面上,且不須再 流回至該邊緣。因此液體會由靠近邊緣部份的内部邊緣處 被排除。此乃可例如使用本發明所請求的裝置來造成。 在該方法之一實施例中,該邊緣區域係被選為大於 2mm 〇 在該方法之另一實施例中,該晶圓狀物品於液體處理 時會繞其軸心旋轉,藉此該等處理液體將可被由該晶圓狀 物品或晶圓的邊緣甩除。 最好該旋轉速度係至少為l〇〇/min,俾可有效地甩除 液體。 本务明之其它的細節、特徵與優點等,將由圖式所示 之本發明的實施例來說明於下。 圖式之簡單說明: 第1圖乃不意地不出一設有一晶圓之該裝置(夾盤丨)的 轴向截面。 第2與3圖乃示意地示出該夾盤邊緣區域的軸向截面。 且第3圖更示出在處理時液體的作動方向。 該失盤1主要含有三個部份(2, 3, 4),即座體3、蓋2 本紙張尺度綱帽國家標準(CNS)A4規格(210 χ_297公爱) 9 Μ--------^---------^ (請先閱讀背面之注意事項再填寫本頁) 518638 消 A7 B7 五、發明說明(7 ) 氣體導引裝置4。該座體3係呈環狀並連接於一中空軸(未 示出),該軸一方面可使該夾盤旋轉(如箭號尺所示),且另 一方面能以氣體G供應該氣體饋供裝置(5, 6)。 該蓋2係被嵌入座體中並與之連結(未示出),而使該 蓋2與座體3之間形成-環狀氣體通道5,丨頂端(面向晶圓z 的一側)會排入一環狀隙縫,即該環狀噴嘴6中。該環狀噴 嘴ό的直徑係小於該氣體導引裝置4的内徑。 、 該夾盤係依據“柏努力原理,,來運作。在該環狀噴嘴6 的外侧(即區域7中)乃形成—氣墊,其上則懸浮著該晶圓 。该晶圓係藉固設在周緣上的導件(銷桿25)等來避免滑掉 ,而在該夾盤繞該軸心Α旋轉時’該晶圓會被它們所夾帶 。該等梢桿可被移動貼抵於該晶圓邊緣(類似於第4 9〇3 717號美國專利案)。 忒氣體導引裝置4係呈環狀,而利用多個間隔物2 1固 裨在該座體3的頂部(面向晶圓的一面),該等間隔物以乃 規則地佈設在周緣上。該環4具有一内徑小於晶圓w的外 徑,及一外徑大於晶圓W的外徑。 該氣體導引裝置面向晶圓W的表面14係為平直的環狀 表面,而平行於該晶圓的主表面。在該平面14與晶圓面向 夾盤的表面之間,當該晶圓放在該夾盤上時,會形成一環 狀間隙10。4間隙的深度C(見第3圖)乃對應於晶圓W的外 半徑與該氣體導引裝置4的时徑之差。其寬^(見第 係由。亥表面14至面向5亥夾盤的晶圓表面之間的距離所形成 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公髮)
518638
經濟部智慧財產局J工消費合作社印製 五、發明說明(8 ) 在該氣體導引裝置4與座體3之間乃形成一環狀的氣體 沒放通道8,氣體會被該氣體導引裝置4排入其中。該間隙 10的總截面積係遠小於該氣體洩放通道8的總截面積,因 此該通道乃可排放大部份的氣體。 在該晶圓W與座體3之間,或該環狀噴嘴6與氣體導引 裝置4之間的區域7,該氣體會直接沿著面向夾盤的晶圓表 面流動。此區域中截面最窄的部份係位於該表面13(座體3 面對晶圓的表面)與該晶圓之間,而在第2圖中係以b示出 。該座體3至晶圓的距離b,係大於該氣體導引裝置至該晶 圓的距離a。該蓋2面向晶圓的表面12,係大致位於與該座 體的表面13相同之平面上。 若該晶圓被置於夾盤上,其會被區域7中的氣墊所懸 持,而既不接觸該蓋2亦不接觸氣體導引裝置4。由環狀喷 嘴6逸出的氣體(氣流G1)會經由該氣體洩放通道8(氣體G2) 排出。有一小量的氣體可經由間隙1〇逸出,但該氣體G2 將會產生一負壓,因此在附近的氣體會被由該間隙1〇吸入 ,而被該氣流G2所帶走。 在液體處理時,該液體會被施淋於背向夾盤1的表面 ’嗣該液體會朝晶圓邊緣的方向(液流F)流動,並繞過該 晶圓邊緣E。當該晶圓旋轉時,一些液體可被直接由晶圓 邊緣(未示出)甩掉。然後該液流會分成二支流F1與F2。而 液流F1會由該晶圓流掉。 該液流F2會流入間隙10中,並濕化該晶圓底部。F2 會濕化該底面的邊緣區域,而比該氣體導引裝置更要向内 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 11 --I--— II-----裝 —11 訂------II ·線 (請先閱讀背面之注意事項再填寫本頁) 518638 A7 B7 五、發明說明(9 ) 延伸稍遠一些。因此該濕化區域d會比該間隙的深度c稍微 較大一些。於此該液流F2會被圍繞著氣體導引裝置内緣 的氣流G2所轉向,而使該液流F2與氣流G2經由氣體、;戈放 通道一起離開該夾盤, 0 元件標號對照 1 ···夾盤 8…氣體洩放通道 2…蓋 10…間隙 3…座體 12…蓋之表面 4···氣體導引裝置(環) 13…座體表面 5···環狀氣體通道 14…環狀表面 6···環狀喷嘴 21 ···間隔物 7···氣塾區域 25···導件(銷桿) (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 '^--------t___________________ 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 12
Claims (1)
- 51860«A8 B8 C8 D8 申請專利範圍 第089107599號專利申請案申請專利範圍修正本 修正日期:90年11月 1· 種可供一晶圓狀物件之一限定部份的液體處理之裝 置’尤其疋一晶圓之靠近邊緣處,其具有一構件以固持 該晶圓狀物件,及一氣體饋供構件以對著面向該構件之 晶圓狀物件的表面至少局部地冲喷氣體,其特徵在於有 氣體導引裝置設在周圍邊緣,而可將在該蟲圓狀物件 邊緣區域中之大部份的噴冲氣體導離該晶圓狀物件。 2·如申請專利範圍第1項之裝置,其中該氣體導引裝置係 具有一環狀的造型。 3·如申請專利範圍第2項之裝置,其中該環具有一内徑小 於該晶圓狀物件的外徑,及一外徑至少相等於該晶圓狀 物件的外徑。 4·如申請專利範圍第1項之裝置,其中該氣體導引裝置 由一環狀溝槽所形成,該溝槽係與該構件的周緣同心 而可由該溝槽將氣體排出外部。 5·如申請專利範圍第1項之裝置,其中該氣體導引裝置 其内周緣上具有一銳緣。 6·如申凊專利範圍第1項之裝置,其中位於該氣體饋供構 件與該氣體導引裝置(座體)之間的部份構件,乃被設成 使其至该晶圓狀物件(晶圓)的距離,大於該氣體導引 置至該晶圓狀物件的距離。 7·如申請專利範圍第6項之裝置,其中該氣體導引裝置 不接觸該晶圓狀物件。 係 在 裝 並 (請先閲讀背面之注意事項再填寫本頁) 13 申請專利範圍 8·如申請專利範,圍第7項之裝置,其中該氣體導引裝置與 曰曰圓狀物件的間距係為〇. 〇 5至1 mm ° 9·如申請專利範圍第8項之裝置,其中該氣體導引裝置與 晶圓狀物件的間距係為〇. 1至0.5 mm ° 10.如申請專利範圍第7項之裝置,其中該氣體導引裝置面 向該晶圓狀物件的表面係平行於該晶圓狀物件的主表 面0 11 ·如申請專利範圍第1項之裝置,具有至少二個導件可界 定該晶圓狀物件在該周緣上的位置,且係垂直於該等構 件。 12·如申請專利範圍第^項之裝置,其中該氣體饋供構件會 形成一氣墊,而使該晶圓狀物件懸浮。 13·如申請專利範圍第1項之裝置,其中在氡體饋供構件内 的部份構件會接觸該晶圓狀物件。 14.如申請專利範圍第13項之裝置,其中在氣體饋供構件内 的部份構件乃提供以一真空。 15·如申請專利範圍第1項之裝置,其中該構件可被驅動旋 轉。 16. —種可供一晶圓狀物件之一限定部份的液體處理之方 法’尤其是一晶圓之靠近邊緣處,其中該液體係施加於 一第一表面,而大致徑向地流向外側至該晶圓狀物件的 周圍邊緣’並繞過該邊緣再至第二表面上,藉由一種毛 細現象可使該液體被抽除,其中該液體會濕化該第二表 面上靠近邊緣的限定部份,並隨即由該晶圓狀物件上被 ^1〇638 A8 B8 C8 D8 申請專利範圍 排除 7·如申切專利範圍第16項之方法,其中該邊緣區域係大於 mm 18·如申凊專利範圍第16項之方法,其中當在液體處理時, 該晶圓狀物件會繞其軸心旋轉。 19·如申印專利範圍第is項之方法,其中該旋轉速度係至少 為100/min (請先閲讀背面之注意事項再填寫本頁} ,、一-T— 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 15 -
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US6435200B1 (en) | 2002-08-20 |
JP2009142818A (ja) | 2009-07-02 |
JP4884493B2 (ja) | 2012-02-29 |
JP4346207B2 (ja) | 2009-10-21 |
US20080066865A1 (en) | 2008-03-20 |
EP1052682B1 (de) | 2002-01-09 |
US7007702B2 (en) | 2006-03-07 |
ATE211855T1 (de) | 2002-01-15 |
US20060144429A1 (en) | 2006-07-06 |
US7267129B2 (en) | 2007-09-11 |
DE59900743D1 (de) | 2002-02-28 |
KR20010014780A (ko) | 2001-02-26 |
US7726323B2 (en) | 2010-06-01 |
JP4884494B2 (ja) | 2012-02-29 |
US20020148489A1 (en) | 2002-10-17 |
EP1052682A1 (de) | 2000-11-15 |
US6858092B2 (en) | 2005-02-22 |
JP2000343054A (ja) | 2000-12-12 |
SG98382A1 (en) | 2003-09-19 |
US20040020427A1 (en) | 2004-02-05 |
KR100675260B1 (ko) | 2007-01-29 |
JP2009142817A (ja) | 2009-07-02 |
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