TW456157B - Carrier - Google Patents

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TW456157B
TW456157B TW088104116A TW88104116A TW456157B TW 456157 B TW456157 B TW 456157B TW 088104116 A TW088104116 A TW 088104116A TW 88104116 A TW88104116 A TW 88104116A TW 456157 B TW456157 B TW 456157B
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Taiwan
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heat transfer
transfer layer
planar heat
planar
bearing device
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TW088104116A
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Tsuneaki Ohashi
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Ngk Insulators Ltd
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B3/00Ohmic-resistance heating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67103Apparatus for thermal treatment mainly by conduction
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
    • H01L21/6833Details of electrostatic chucks
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
    • H02N13/00Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Resistance Heating (AREA)
  • Surface Heating Bodies (AREA)
  • Physical Vapour Deposition (AREA)

Description

4561 57 五、發明說明〇) 發明所屬技術領域 本發明係關於用以支播並加熱半導體晶圓、液晶面 板、太電池用之梦早晶晶圓等之承载^r置。 習知技術 在習知之用以支撐並加熱半導體晶圓、液晶面板、矽 單晶晶圓等之承載裝置,提議在承载裝置中埋入發献元 後將承載裝置收藏於細κ支料或支㈣或㈣管 型戎。 , 發明要解決之課題 最近’增大用以得到丰導體开朱 此一、:」牛争體兀件之晶圓之直徑或將液 晶面板大型化之要求高漲,因此要求承载裝^^ :,要求將承載产置之面狀傳熱層之直徑設為例如直徑必 mra以上。可是,若面狀傳熱層之直徑變大,保 傳熱層之加熱面之溫度之均句性變得 來難狀 之問題。因為,在面狀傳熱層之加熱面 :=決 發生:良品之緣I尤其,為了將:不 :’在面狀傳熱層安裝多支例如3支 承載置大型 時,這種加熱面之溫度之不均句變成特別牙大棒或保濩管 本發明之課題係在具有面狀傳熱層 之支撲管等之承載|置,使得在面狀傳教=面^專熱層 度分布變小。 ·'、、層之加熱面之溫 解決課題之手段 本發明之特徵在於包括:面狀傳熱, 物加熱之加熱面和背面; ^ ^ ,、有將被加熱 叉得仵自S亥者面側支撐該面狀 456157 五、發明說明(2) 傳熱層;第一遮熱部,設於該面狀傳熱層之該背面和該支 撐件之間並限制自該面狀傳熱層流向該支撐件之熱流;以 及第二遮熱部,設於該第一遮熱部和該支撐件之間並限制 自該第一遮熱部往該支撑件之熱流。 本發明者檢討了在將承載裝置大型化時或在面狀傳熱 層設置多支支撐管、支撐棒之情況加熱面之溫度偏差變大 之理由。一般,為了使承載裝置之加熱面之溫度均句,將 面狀傳熱層内之發熱體之平面圖型設計成最佳。可是,通 過支撐棒或支撐管等向承載裝置外逃掉之熱量隨周圍溫 度、使用條件以及目標之溫度區域顯著變動。因而,如例 如在某溫度區域或某條件下可將加熱面之溫度分布辱、佳化 乾發_熱_體之平面圖型’在已製造了之情況,也有使用 條件、使用溫度變化時加熱面之溫度分布顯著惡化之傾 向。 本發明者想到了在面狀傳熱層之背面和支撐件之間設 置第一遮熱部和第二遮熱部,利用第一遮熱部限制面狀傳 熱層之背面往支撐件之熱流,利用第二遮熱部限制自第一 遮熱部往支撐件之熱流。於是,藉著以2階段設置熱遮蔽 層’面狀傳熱層之加熱面之溫度之均勻性改善,在比習知 $寬之溫度範圍或使用條件,可實現規定範圍内之良好之 溫度分布。尤其’在增大面狀傳熱層之直徑之情況,或在 面狀傳熱層安裝了多支支撐件之情況,顯著改善加熱面之 溫度分布。 本發明對於大型承載裝置特別適合,尤其適合面狀傳
第5頁 456157 五、發明說明〔3) 熱層之直徑300mm以上之承載裝琶。7 ▲ 等支撐件之個數也無限制載在裝支置撐二’产撐棒、支樓管 個以上,以下之情況特別在有支效撐件而係在^^^ 下之情況特別有用。 而在4個以上、20個以 是,線燈等外部熱源將面狀傳熱層加熱。可 c置之周圍之空氣保護面狀傳熱層中之發熱元 件 發熱7L件之壽命變長。 # M j更適〇之形癌,在基體設置在背面側開口之槽,在 該槽中埋入發熱元件。 你 田面狀傳熱層之基體、支撐件、後述之背面板之各材質 取好係如下的。 (1) 氮化鋁、氧化鋁、耐火矽酸鉛等陶磁。 (2) 鋁合金、不銹鋼、科瓦鐵鎳鉻合 膨脹合金(例如Fe-42Nl)、超合金、Fe_Cr_A1^;熱合低 金、Ni-Cr系耐熱合金等合金類。 (3) U)之各陶磁和(2)之各合金之複合材料。 其中’陶磁和金屬之複合材料包含陶磁基複合材料、 金屬基複合材料雙方。例如有令熔化之金屬滲透到陶磁製 預製达的、用粉末冶金方法(粉末成形+烘烤)製成的。金 屬對陶磁製預製坯之滲透有在加壓下進行之情況和使用助 參透劑在無加壓或常壓下進行之情況。在採用粉末冶金方 法之情況’可令粉末成形體中含有助燒結劑。
第6頁 4 B 6 1 5 7 五、發明說明(4) 說明特別適 或銘合金可參透 氮化鋁最好。 要製造預製 溶劑分散後,和 混合,用大型球 後,利用防爆型 m之球狀造粒粉( 後,使用油壓機 製造預製坯。 此外’替代 喷霧令乙醇等和 地加壓成形,也 在令銘或銘 透法、加壓渗透 最好第一遮 面狀傳熱層之傳 該背面板限制來 將面狀傳熱 化之方法無特別 傳熱層、背面板 後,利用螺栓可 將承載裝置 構成之接合層接 利用有機黏合劑製 陶磁粒子混合後之 可製造預製坯。 合金滲透到預製坯 法、真空滲透法。 熱部具有背面板, 熱係數之1/2以下( 自面狀傳熱層之背 層、支撐件以及視 限制,但是銅焊、 、支撐件等各構件 固定各構件。 之各構件銅烊或錫 合之情況’藉著減 合之複合材料。構成預製枉之陶磁只要紹 ,未限定,但是鋁系陶磁較好,氧化鋁、 链係,例如令指定之陶磁粒子在異丙醇等 液態壓克力共聚合物黏合劑等有機黏合劑 磨機攪拌混合2〜40小時後,形成泥漿。然 喷霧式乾燥機將泥漿造粒成粒徑30〜100 # 接著,將造粒粉末充填於指定之模具 等以200〜7000kgf/cm2之壓力加壓成形, 造泥漿,藉著得到利用 粉末後將其和上述一樣 時,例如可採用自動滲 該背面板之傳熱係數係 最好係1/8以下),利用 面侧之熱流。 需要連背面板彼此一體 錫焊較好《又,在面狀 之間插入金屬密封件 焊後,利用由這些金屬 少該接合層之面積,可
45 6 1 5 7 五、發明說明(5) 限制在第一遮熱部、第二遮熱部之熱流。 在此情況,最好第一遮熱部具有背面板和將該背面板 與面狀傳熱層接合之第1接合層,將第1接合層之面積設為 1時,面狀傳熱層之背面之面積係3〜300。 最好利用第2接合層將背面板和支撐件直接或經由絕 熱件接合,將第2接合層之面積設為1時,背面板之支撐件 侧之面積係2〇〜1 0000。 5亥絕熱件係如下的之一。 (1)絕熱件之傳熱係數係背面板之傳熱係數之丨/2以 下。 (2 )因在絕熱件之中央部設置空洞或貫穿孔,或在絕 熱件之表面設置槽’在絕熱件傳導之熱流減少。 在本發明適合之形態,面狀傳熱層由導電材料構成, 利用電介質層被覆至少面狀傳熱層之該加熱面,如藉著在 該面狀傳熱層和該被加熱物之間施加直流電壓對該面狀傳 熱層可吸住該被加熱物般構成。藉此,可提供 別大(例如700平方公分以上)之加熱面之大型之靜有電面炎積特 具0 麓- = Ϊ 狀傳熱層、該第-遮熱部、該 第-遮熱相及該支料具有導 此’不必另外設置接地線。 又刼件接地。耩 在將承載裝置之各構件 定’但是在於i素系腐蝕性 料、金合金焊料、銅合金焊 彼此銅焊時,焊料未特別限 氣體之财蚀性上,銘合金焊 料較好。尤其,在構件使用鋁
第8頁 456157
五、發明說明(6) /金屬複合材料之情況,鋁合金焊料較好。 在鋁合金焊料,最好在鋁合金之中添加了自由鎂、 =、锆及姶構成之群所選擇之—種以上之活性金屬,由鋁 含量70mol%以上之鋁合金構成。 最好該鋁合金含有lmol%以上、1〇m〇1%以下之自由 鎂、鈦、锆及铪構成之群所選擇之一種以上之活性金 (最好係鎮)。 藉著將活性金屬之比例設為lmol%以上,和基材中之 金屬成分或強化材料之親和性提高。藉著將活性^屬之比 例設為1 0mo 1 %以下’抑制成為脆化之原因之金屬間化合物 等之局部產生。 σ 此外’關於合金焊料中之鋁之含量,在將金屬之總含 量設為1 0Omo 1 %之情況’係自1 0Omo 1 %減去活性金屬成分之 含量及後述第3成分之總含量之值。 在合金焊料中,可令含有第3成分。在第3成分上,使 用矽或硼,因對鋁無影響而較好。這種第3成分之作用係 嫁點下降。在同一溫度’也因添加第3成分,焊料之流動 性變佳。若第3成分之含有比例設為1· 5〜l〇m〇l%,更好。 此外,構成焊料之合金含有鎮l-6mol%、石夕1.5〜1〇 mol%的較好。 在鋼焊前’利用濺鍍、蒸鍍、摩擦壓接、電鍍等方法 可在各構件之接合面設置自由鎂、鈦、結及給構成之群所 選擇之一種以上之活性金屬構成之膜。又,在各構件之各 接合面之間可令介入金屬箔,該金屬箔由自由鎂、鈦、錯 45 615 7 五、發明說明(7) 及鈴構成之群所選擇之一種以上之活性金屬構成 夺之熱處理之前’藉著用酸性溶液或驗性 ΙίΓΐ 接合面,除去各接合面上之氧化膜和 虱化腠之至少一方較好。 f 發熱元件如下的較好。 ⑴將線狀或絲帶狀之石夕化_、錦鉻合金、錄鉻紹合 金作為發熱體’在該發熱體之表面塗抹陶磁黏結 齊K包含梦酸鹽膠黏劑、氧化紹膠黏劑)類後令固化的1 發熱體之表面也可進行陶質粉末或金屬烷 凝膠塗層。 合膠 M )』在充填了氧化鎂、氮化鋁等絕緣性陶磁粒子之不 銹鋼管等之中央空洞埋設了右门、所.+、 不 護套加熱器)。 了在⑴所返之發熱體的(所謂的 係一i熱元件之平面圖型係一區或是二區都可,但是最好 被覆面狀傳熱層、背面板、支撐件等之被膜 好係氮化鋁、氧化鋁、耐火石夕酸鉛、炭 ^ 厌化删、氟化鋁、稀 土類及/或鹼土類金屬疋素之氟化物、釔 等釔氧-氧化鋁系陶磁質材料以及將這些各人’ 複合材料。在形成被臈之方法上,粉末'寊複3化之 鼾沐_ BE 1^ 物末之塗抹及燒著、熔 射法、冷膠嘁膠法。又,在承載裝置之構件 就化銘/銘、铭/炭化石夕等銘合金基複合材料之情況,二】 對構件進行氧化處理,可令在構件之表 2者 由承載裝置之耐熱循環性之觀點’承载裝置之構件和
第10頁 4 5 6 15 7 五、發明說明(8) 其被膜之間之熱膨脹係數之差設為1 X 1 〇 -6 /。〇以下較好。 圖1係概略表示一實施形態之承載裝置1A之縱向剖面 圖’圖2(a)係背面板8之平面圖,圖2(b)係背面板8之剖面 圖,圖3係支撐管12之縱向剖面圖,圖4(a)係表示基體4之 背面4b侧之接合層之圖型之平面圖,圖4(b)係放大基體4 之槽之周邊之形態後表示之要部剖面圖。 承載裝置1A由面狀傳熱層3A、第一遮熱部7A、第二遮 熱部25A以及支撐件12構成。在面狀傳熱層3A,利用被膜 6A被覆平板形狀之基體4之加熱面4a和側面。在加熱面4a 上設置被加熱物2。在基體4内形成圖4(a)所示之平面圖型 之槽15,槽15在背面4b側開口。在槽15内收藏發熱元件 5 °4c係用以插穿供電電鏡線或熱電麵等之貫穿孔4C。 在面狀傳熱層3A之背面4b侧利用第1接合層9接合背面 板8。第1接合層9未介於背面板8及背面之整個面,按照 圖4(a)所示平面圖型設置。1〇係基體4和背面板8之間之空 隙。結果’第1接合層9之面積設為!時,背面4b之面積係 3〜300。如圖4(b)所示,在槽15,在發熱元件5之下侧收藏 間隔物16A ’間隔物16A接觸背面板8之表面8a。因而,在 承載裝置使用中’發熱元件5不會直接接觸背面板8,可防 止所引起之加熱面之溫度之均勻性之惡化ό此外,在圖 1 ’省略圖2〜圖4所示各構件之細部圖示。 =圖2(a)、(b)所示’在背面板8之中央部-之背面8b側 設置突起8c ’在突起8c之位置之表面8a和背面8b之間設置 貫穿孔8d °利用被膜6A被覆背面板8之背面8b及侧面。
第11頁 45 6 彳 5 7 五、發明說明(9) 如圖3所示’支撐管12包括本體12a、設於本體12a之 一方之端部之凸緣部1 2b以及設於本體之反侧之端部之凸 緣部12c。如直徑自本體1 2a往凸緣部12b逐漸變大般設置 擴徑部12d。 用被膜6A被覆支撐管12之表面。支撐管12之凸緣部 12b利用第2接合層11和背面板8之突起8c接合。第2接合層 也和凸緣部12b未全面接合’在無第2接合層之區域發生間 隙1 0。支撐管1 2之中空部和背面板8之貫穿孔相連通, 在其中插入圖上未示之發熱元件之供電電纜或視需要插入 熱電耦等之其他電氣配線。 圖5係表示其他實施形態之承載裝置1 b之縱向剖面 圖’圖6(a)係表示絕熱件16A及16B之平面圖,圖6(b)係表 示絕熱件2 0之平面圖,圖7係放、本槽23之周邊後表示之要 部剖面圖。承載裝置1B由第一遮熱部7B、第二遮熱部25B 、以及支撐管12構成。在面狀傳熱層3B,用被膜6A被覆平板 形狀之基體4之加熱面4 a和側面。在加熱面4 a上設置被加 熱物2。在基體4内形成例如圖4(a)所示之平面圖型之槽 23,如圖7所示,槽23在背面4b侧開口(在圖5上未表示 槽)。在槽23内收藏發熱元件5,在發熱元件5之下側收藏 間隔物16B,間隔物16B和背面板8之表面8a接觸。 在面狀傳熱層3A之背面4b側經由絕熱件16A、16B和背 面板8接合。在此,絕熱件1 6 A、1 6 B如圖6 (a )所示,形成 近似長方形框,如包圍絕熱件1 6B般設置絕熱件1 6A。絕熱 件1 6A和1 6B各自利用接合層9和背面板8之表面8a及面狀傳
第12頁 A B 6 1 5 7___ 五、發明說明(10) 熱層之背面4b接合,在無絕熱件1 6A和1 6B之區域形成間隙 18。結果,第1接合層9之面積設為1時,背面4b之面積係 3〜3 00。背面板8之形態如上述。 如圖5所示,支撐管12包括本體12a、設於本體12a之 一方之端部之凸緣部1 2b以及設於本體之反侧之端部之凸 緣部12c。也可設置如上述之擴徑部i2d。用被膜6A被覆支 撐管12之表面。 支 6(b)所 和背面 1 2之中 相連 視需要 此 將加熱 和加熱 又 分插入 作。又 能。 實 撐管1 2之凸緣部1 2 b和背面板8之突起8 c之間插入圖 不之環形之絕熱件2 0,絕熱件2 〇利用第2接合層11 板8之突起8c及支撐管12之凸緣部12b接合。支撐管 =部和絕熱件20之貫穿孔20a以及背面板8之貫穿孔 5 ί其中插入圖上未不之發熱元件之供電電纜或 插入熱電耦等之其他電氣配線。 :和:以5管1圖27電之氣承上裝置’因利用遮熱部冗、2冗 面侧連接’可令作為靜電夾爪動J屬電』或金屬杯 ,在圖1〜4之承载裝署 斗斗 乍 絕緣器進行電氣絕緣處理右糟二在支樓管之安裝部 ’照這樣做’也可賦鱼可令作為靜電爽爪動 〃作為两頻產生用電極之功 施例 之實施例 其次說明特別適合 實施例1 ,令平均 製造圖1至圖4所 不之承載装置1A 具體而言
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45615T 五、發明說明(π) 粒徑1 6 // m之氮化鋁粒子分散於異丙醇溶劑中,添加液態 壓克力共聚合物黏合劑,用大型球磨機令攪拌混合4小時 後’得到泥漿。利用防爆型喷霧式乾燥機將該泥漿造粒, 得到粒徑約1 5 0 # m之球狀造粒粉。將該造粒粉充填於指定 之模具後’使用油壓機以20 〇kg f/cm2之壓力一軸加壓成 形,製造直徑380、厚度30 mm之大型預製坯。 令該預製述充分乾燥、脫脂後,在氮氣-1%氫氣之空 氣中、1.5個大氣壓下,以9〇〇它接觸鋁合金(鋁 92. 6mol %、鎂5. 5 mol%、矽1. 9 mol%)之溶液24 小時,利 用非金屬浸透法令鋁滲透後,自溶液將預製坯拉起,得到 鋁基複合材料。氮化鋁之重量比係7〇%,複合材料之熱膨 脹率係8. 7 X 10_6 / °c、傳熱係數係i7〇f/Mk、電阻係數係5 X10 -5 Ω · cm。 自該複合材料製作面狀傳熱層之基體4、背面板8以及 支樓管12。基體4之外形尺寸設為4〇〇mnix500_X X 2 5mm,槽15之寬設為13mm,最大深度設為15mm。背面板8 之尺寸設為400mm X500mm X7. 8mm。突起8c之自背面板8開 始之尚度設為4.2mm ’突起8 c部分之厚度設為12mm,突起 8c之直徑設為50mm。支撐管之本體i2a之厚度設為 2. 5mm〜3.5mm ’外形設為35mm。凸緣部12b之外徑設為 50mm ’厚度设為4πιιη。凸緣部12c之外徑設為50ιπιη,厚度設 為 8mm ° 在大氣中以1 050 °C保持以上各構件5小時,在各表面 產生氧化鋁膜。其次’藉著對基體4之背面4b、背面板8之
第14頁 456157 五、發明說明(12) 研磨 表面8a及突起8C之表面、支樓管之凸緣部之表面進行 加工或樾光加工,令複合材料之新的表面露出。 在用不銹鋼管覆蓋之護套加熱器中充填氧化鎮板子 後’將錄鉻合金線插入其内部,用作發熱元件。將發熱 件埋入槽中後,將1 2個鋁合金製塊作為間隔物配置於^ 70 元件下。在鎳製電力饋線穿過中空軸後,在應接合"熱 。[丨分 插入了厚度0.11111〇之八1-103卜2“製薄片。在各接合部分 先鍍鎳。在這些組立體上放6 kg之重量後,在真空中進行 銅焊,將各構件接合。 (實施例2) 製作了圖5〜圖5所示承載裝置。具體而言,和實施例】 一樣準備了基體4、背面板8、支撐管1 2。框形之絕熱件 16A、16B之材質設為純度95%以上之氧化鋁。各絕熱件之 厚度都是5mm,寬度是l〇mm。外侧之絕熱件16A之外形尺寸 係400_\50〇111111,内侧絕熱件168之尺寸係200_\ 200mm。又’環形絕熱件20之材質設為純度98%以上之氧化 铭’设外徑為50mm、内控為40mm、厚度為5mm。任一絕熱 件都利用濺鍍法形成鎳膜。
準備和實施例1 一樣之發熱元件,埋設於槽中。將1 2 個銘合金製塊作為間隔物安裝,在鎳製電力饋線穿過中空 軸。在第1接合層9、第2接合層11之各材質上使用了厚度 0.1 mm之A l-10Si-2 Mg合金焊料。在這些組立體上放6 kg之 重量後’在真空中進行銅焊,將各構件接合。接著,利用 熔射法,在面狀傳熱層之加熱面形成了厚度約1〇〇#m之氧
第15頁 4S61 57 五、發明說明(lG ---- 化鋁層。 發明之欵$ 知,在具有面狀傳熱層和支樓面狀傳熱層之 分布變小。 裝置,可使在面狀傳熱層之加熱面之溫度 圖式之簡單說明 圖1係概略表示承載裝置1Α之縱向剖面圖。 圖2 ( a )係表示背面板8之平面圖,圖2 (b )係表示背面 板8之縱向剖面圖。 圖3係表示支撐管1 2之縱向剖靣圖。 圖4 (a)係表示自背面側看到面狀傳熱層之基體4之平 面圖’斜線表示存在接合層之區域。圖4(b)係放大槽15之 周邊後表示之要部剖面圖。 圖5係概略表示其他實施例之承载裝置1 b之縱向剖面 圖。 圖6(a)係表示框形之絕熱件IgA、16B之平面圖,圖 6(b)係表示環形之絕熱件2〇之平面圖。 圖7係放大槽23之周邊後表示之要部剖面圖。 符號說明 ΙΑ、1B~承載裝置;2〜被加熱物;3A、3B~面狀傳熱層 B ; 4〜基體;4a〜面狀傳熱層(基體)之加熱面;4b〜面狀傳 熱層(基體)之背面4b ; 5〜發熱元件;6A、6B、60被膜; 7A、7B〜第一遮熱部;t背面板;8a〜背面板8之表面;8b〜 背面板8之背面;8c〜背面板;8〜之突起(台座部分);9〜第
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Claims (1)

  1. 456157 六 申請專利範目 " — 1. 一種承載裝置,包括: 面狀傳熱層,具有將被加熱物加熱之加熱面和背面; 支撐件,自該背面側支撐該面狀傳熱層; 第一遮熱部,設於該面狀傳熱層之該背面和該支撐件 之間並限制自該面狀傳熱層流向該支撐件之熱流;以及 第二遮熱部,設於該第一遮熱部和該支撐件之間並限 制自該第一遮熱部往該支撐件之熱流。 2. 如申請專利範圍第丨項之承載裝置,其中該面狀傳 熱層由氮化鋁和鋁之複合材料構成。 3. 如申請專利範圍第丨或2項之承載裝置,其中該面狀 傳熱層包括基體和設於基體.内之發熱元件。 4. 如申請專利範圍第3項之承載裝置,其中在該基體 設置在該背面侧開口之槽,在該槽内埋入該發熱元件。 5+如申請專利範圍第1項之承載裝置,其中該第一遮 ^部具有背面i,該t面板之傳熱係數係豸自狀傳熱層之 傳熱係數之1 / 2以下。 6.如申請專利範圍第丨項之承載裝置,其中該第一遮 ϊίΐ有冑面板和將肖背面板和肖面狀傳熱層#合之第1 兮:f ’將該第1接合層之面積設為1時’該面狀傳熱層之 該背面之面積係3〜300。 ^ 2接I展如脸申請專利範圍第5或6項之承載裝置,其中利用第 將ϊ ίI面板和該支撐件直接或經由絕熱件接合, 接合層之面積設為1時,該背面板之該支樓件侧之 面積係2 (M 0 0 0 〇。 τ叫之
    第18頁 A5 6157 六、申請專利範圍 8. 如申請專利範圍第1或2項之承載裝置,其中該面狀 傳熱層由導電材料構成,利用電介質層被覆至少面狀傳熱 層之該加熱面,如藉著在該面狀傳熱層和該被加熱物之間 施加直流電壓對該面狀傳熱層可吸住該被加熱物般構成。 9. 如申請專利範圍第1或2項之承載裝置,其中該面狀 傳熱層、該第一遮熱部、該第二遮熱部以及該支撐件具有 導電性,該支撐件接地。
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TWI469678B (en) * 2009-01-05 2015-01-11 Flexible heating device
TWI471054B (zh) * 2007-11-19 2015-01-21 Tokyo Electron Ltd 平面狀加熱器

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US6214121B1 (en) 1999-07-07 2001-04-10 Applied Materials, Inc. Pedestal with a thermally controlled platen
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KR19990088384A (ko) 1999-12-27

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