TW335548B - Voltage detection circuit, power on, of reset circuit and transistor device - Google Patents

Voltage detection circuit, power on, of reset circuit and transistor device

Info

Publication number
TW335548B
TW335548B TW085110097A TW85110097A TW335548B TW 335548 B TW335548 B TW 335548B TW 085110097 A TW085110097 A TW 085110097A TW 85110097 A TW85110097 A TW 85110097A TW 335548 B TW335548 B TW 335548B
Authority
TW
Taiwan
Prior art keywords
node
power
voltage detection
transistor device
circuit
Prior art date
Application number
TW085110097A
Other languages
English (en)
Inventor
Hiroshige Hirano
Yasuji Asari
Tatsumi Tsuno
Original Assignee
Matsushita Electron Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electron Co Ltd filed Critical Matsushita Electron Co Ltd
Application granted granted Critical
Publication of TW335548B publication Critical patent/TW335548B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
    • H03K17/223—Modifications for ensuring a predetermined initial state when the supply voltage has been applied in field-effect transistor switches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145—Indicating the presence of current or voltage
    • G01R19/155—Indicating the presence of voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Electronic Switches (AREA)
  • Dram (AREA)
  • Measurement Of Current Or Voltage (AREA)
TW085110097A 1995-08-21 1996-08-19 Voltage detection circuit, power on, of reset circuit and transistor device TW335548B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21194295 1995-08-21

Publications (1)

Publication Number Publication Date
TW335548B true TW335548B (en) 1998-07-01

Family

ID=16614251

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085110097A TW335548B (en) 1995-08-21 1996-08-19 Voltage detection circuit, power on, of reset circuit and transistor device

Country Status (6)

Country Link
US (5) US5864247A (zh)
EP (1) EP0787993A4 (zh)
KR (1) KR100421523B1 (zh)
CN (1) CN1092335C (zh)
TW (1) TW335548B (zh)
WO (1) WO1997007408A1 (zh)

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WO1997007408A1 (fr) * 1995-08-21 1997-02-27 Matsushita Electronics Corporation Systeme de detection de tension, circuit de remise a zero/remise en service d'un circuit et dispositif semi-conducteur
JP3288249B2 (ja) * 1997-03-31 2002-06-04 東芝マイクロエレクトロニクス株式会社 パワーオンリセット回路
US5881013A (en) * 1997-06-27 1999-03-09 Siemens Aktiengesellschaft Apparatus for controlling circuit response during power-up
US7102421B1 (en) * 1998-04-20 2006-09-05 Vanguard International Semiconductor Corporation Dynamically adjustable on-chip supply voltage generation
JP3935266B2 (ja) * 1998-05-08 2007-06-20 松下電器産業株式会社 電圧検知回路
US6208542B1 (en) * 1998-06-30 2001-03-27 Sandisk Corporation Techniques for storing digital data in an analog or multilevel memory
US6084454A (en) * 1998-08-26 2000-07-04 Advanced Micro Devices, Inc. Start-up circuit for write selects and equilibrates
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US6236250B1 (en) * 1999-11-10 2001-05-22 Intel Corporation Circuit for independent power-up sequencing of a multi-voltage chip
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JP4095778B2 (ja) * 2001-08-24 2008-06-04 株式会社東芝 半導体装置および電源電圧制御方法
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US6812751B2 (en) * 2002-10-15 2004-11-02 Hpl Technologies, Inc. Low standby current power-on reset circuit
US6956409B2 (en) * 2003-08-28 2005-10-18 Infineon Technologies Ag Reference voltage detector for power-on sequence in a memory
US7208987B2 (en) * 2003-12-18 2007-04-24 Stmicroelectronics, Inc. Reset initialization
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KR100605574B1 (ko) * 2003-12-30 2006-07-28 주식회사 하이닉스반도체 반도체 메모리 소자의 파워업 회로
US7015732B1 (en) 2004-01-05 2006-03-21 National Semiconductor Corporation Power-on reset circuit with low standby current and self-adaptive reset pulse width
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US7378886B2 (en) * 2004-10-14 2008-05-27 Fairchild Semiconductor Voltage detection circuit with hysteresis for low power, portable products
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TWI306334B (en) * 2006-01-24 2009-02-11 Holtek Semiconductor Inc Improved circuit and method for generating a power on reset signal
US7439796B2 (en) * 2006-06-05 2008-10-21 Texas Instruments Incorporated Current mirror with circuitry that allows for over voltage stress testing
US8035426B1 (en) * 2007-09-06 2011-10-11 Marvell Israel (M.I.S.L.) Ltd. Power-on-reset generator using a voltage-shaping inverter chain
US7969235B2 (en) * 2008-06-09 2011-06-28 Sandisk Corporation Self-adaptive multi-stage charge pump
CN101730349B (zh) * 2008-10-29 2013-10-02 原景科技股份有限公司 背光模块的短路检测电路
CN101751097B (zh) * 2008-12-02 2011-12-14 盛群半导体股份有限公司 电源开启重置控制电路及其操作方法
CN101839937B (zh) * 2009-03-18 2012-12-05 智原科技股份有限公司 供电检测装置
US8106688B2 (en) * 2009-11-18 2012-01-31 Smartech Worldwide Limited Power-on-reset circuit with brown-out reset for multiple power supplies
US20110133820A1 (en) * 2009-12-09 2011-06-09 Feng Pan Multi-Stage Charge Pump with Variable Number of Boosting Stages
US20110148509A1 (en) * 2009-12-17 2011-06-23 Feng Pan Techniques to Reduce Charge Pump Overshoot
CN102298951A (zh) * 2010-06-25 2011-12-28 鸿富锦精密工业（深圳）有限公司 控制装置及具有控制装置的电子设备
JP5734615B2 (ja) * 2010-10-14 2015-06-17 ラピスセミコンダクタ株式会社 検査装置及び方法
CN102394612B (zh) * 2011-09-30 2013-08-28 广州中大数码科技有限公司 基于低压检测功能的复位电路
US9972364B2 (en) * 2011-10-14 2018-05-15 Texas Instruments Incorporated Method to maintain power supply voltage during brownout
JP5953803B2 (ja) 2012-02-21 2016-07-20 富士通セミコンダクター株式会社 アクティブ信号生成回路及び半導体記憶装置
CN103840639B (zh) * 2014-03-20 2016-08-17 绍兴光大芯业微电子有限公司 实现线电压检测控制的电路结构
CN106571796B (zh) * 2015-10-09 2019-07-02 中芯国际集成电路制造(上海)有限公司 上电复位电路和方法
CN105811941B (zh) * 2016-04-08 2017-05-17 厦门新页微电子技术有限公司 一种上电复位电路
CN105891734B (zh) * 2016-04-11 2019-04-16 芯海科技（深圳）股份有限公司 一种超低功耗电源检测电路
US9698771B1 (en) * 2016-07-06 2017-07-04 Stmicroelectronics International N.V. Testing of power on reset (POR) and unmaskable voltage monitors
US10620267B2 (en) * 2017-09-20 2020-04-14 Stmicroelectronics International N.V. Circuitry for testing non-maskable voltage monitor for power management block
US10250251B1 (en) * 2018-02-07 2019-04-02 Infineon Technologies Ag RF sensor in stacked transistors
US10215795B1 (en) * 2018-04-13 2019-02-26 Infineon Technologies Ag Three level gate monitoring
CN112073050B (zh) * 2020-11-12 2021-02-09 杭州晶华微电子有限公司 用于半导体集成电路的电源上电复位电路
KR102668968B1 (ko) 2021-07-12 2024-05-27 윤여표 유아용 기립보조의자
CN116430102B (zh) * 2023-06-14 2023-08-29 苏州贝克微电子股份有限公司 一种宽输入电压范围的电压检测电路

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Also Published As

Publication number Publication date
KR100421523B1 (ko) 2004-07-12
EP0787993A1 (en) 1997-08-06
US6822493B2 (en) 2004-11-23
US6538482B2 (en) 2003-03-25
US6246624B1 (en) 2001-06-12
CN1163664A (zh) 1997-10-29
US20010036119A1 (en) 2001-11-01
KR970707445A (ko) 1997-12-01
CN1092335C (zh) 2002-10-09
US20030122597A1 (en) 2003-07-03
US6882193B2 (en) 2005-04-19
EP0787993A4 (en) 1999-09-15
US20040169533A1 (en) 2004-09-02
US5864247A (en) 1999-01-26
WO1997007408A1 (fr) 1997-02-27

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees