TW331441U - Semiconductor means - Google Patents
Semiconductor meansInfo
- Publication number
- TW331441U TW331441U TW085219858U TW85219858U TW331441U TW 331441 U TW331441 U TW 331441U TW 085219858 U TW085219858 U TW 085219858U TW 85219858 U TW85219858 U TW 85219858U TW 331441 U TW331441 U TW 331441U
- Authority
- TW
- Taiwan
- Prior art keywords
- semiconductor means
- semiconductor
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/50—Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49517—Additional leads
- H01L23/49524—Additional leads the additional leads being a tape carrier or flat leads
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49575—Assemblies of semiconductor devices on lead frames
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/86—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using tape automated bonding [TAB]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16245—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01027—Cobalt [Co]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/1026—Compound semiconductors
- H01L2924/1032—III-V
- H01L2924/10329—Gallium arsenide [GaAs]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49121—Beam lead frame or beam lead device
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Wire Bonding (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1802791 | 1991-02-08 | ||
JP4021857A JP2582013B2 (ja) | 1991-02-08 | 1992-01-11 | 樹脂封止型半導体装置及びその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW331441U true TW331441U (en) | 1998-05-01 |
Family
ID=26354636
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW081100892A TW329533B (en) | 1991-02-08 | 1992-02-10 | The manufacturing method for semiconductor device |
TW085219858U TW331441U (en) | 1991-02-08 | 1992-02-10 | Semiconductor means |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW081100892A TW329533B (en) | 1991-02-08 | 1992-02-10 | The manufacturing method for semiconductor device |
Country Status (6)
Country | Link |
---|---|
US (2) | US5245215A (zh) |
EP (1) | EP0498446B1 (zh) |
JP (1) | JP2582013B2 (zh) |
DE (1) | DE69216867T2 (zh) |
MY (1) | MY108168A (zh) |
TW (2) | TW329533B (zh) |
Families Citing this family (80)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04273451A (ja) * | 1991-02-28 | 1992-09-29 | Nippon Steel Corp | 半導体装置 |
DE69222084T2 (de) * | 1991-05-17 | 1998-01-22 | Fujitsu Ltd | Oberflächenmontierbare Halbleiterpackung |
US5831332A (en) * | 1991-05-17 | 1998-11-03 | Fujitsu Limited | Semiconductor package for surface mounting |
JP2801810B2 (ja) * | 1992-04-14 | 1998-09-21 | 株式会社東芝 | 樹脂封止型半導体装置 |
JPH05299456A (ja) * | 1992-04-20 | 1993-11-12 | Toshiba Corp | 樹脂封止型半導体装置 |
MY109101A (en) * | 1992-05-25 | 1996-12-31 | Hitachi Ltd | Thin type semiconductor device, module structure using the device and method of mounting the device on board |
JPH06151685A (ja) * | 1992-11-04 | 1994-05-31 | Mitsubishi Electric Corp | Mcp半導体装置 |
JP2714335B2 (ja) * | 1992-12-16 | 1998-02-16 | 株式会社東芝 | 半導体装置 |
US5497032A (en) * | 1993-03-17 | 1996-03-05 | Fujitsu Limited | Semiconductor device and lead frame therefore |
KR100292036B1 (ko) * | 1993-08-27 | 2001-09-17 | 윤종용 | 반도체패키지의제조방법및그에 따른반도체패키지 |
JP2701712B2 (ja) * | 1993-11-11 | 1998-01-21 | 日本電気株式会社 | 半導体装置 |
JP2866572B2 (ja) * | 1994-02-07 | 1999-03-08 | 三菱電機株式会社 | 半導体製造方法 |
JPH0888312A (ja) * | 1994-09-14 | 1996-04-02 | Nec Corp | 樹脂封止型半導体装置 |
KR100248035B1 (ko) * | 1994-09-29 | 2000-03-15 | 니시무로 타이죠 | 반도체 패키지 |
JPH08111491A (ja) * | 1994-10-12 | 1996-04-30 | Toshiba Corp | 半導体装置 |
US5545850A (en) * | 1995-01-13 | 1996-08-13 | Olin Corporation | Guard ring for integrated circuit package |
DE19507132A1 (de) * | 1995-03-01 | 1996-09-05 | Siemens Ag | Anordnung von elektronischen Bauelementen auf einem Trägerstreifen |
SE516160C2 (sv) | 1995-04-28 | 2001-11-26 | Ericsson Telefon Ab L M | Kapslad optoelektronisk komponent |
FR2734984B1 (fr) * | 1995-05-29 | 1997-08-22 | Sgs Thomson Microelectronics | Utilisation d'un micromodule comme boitier de montage en surface et procede correspondant |
FR2734983B1 (fr) * | 1995-05-29 | 1997-07-04 | Sgs Thomson Microelectronics | Utilisation d'un micromodule comme boitier de montage en surface et procede correspondant |
JP2894254B2 (ja) * | 1995-09-20 | 1999-05-24 | ソニー株式会社 | 半導体パッケージの製造方法 |
US6066890A (en) * | 1995-11-13 | 2000-05-23 | Siliconix Incorporated | Separate circuit devices in an intra-package configuration and assembly techniques |
US5760465A (en) * | 1996-02-01 | 1998-06-02 | International Business Machines Corporation | Electronic package with strain relief means |
JP2798040B2 (ja) * | 1996-02-21 | 1998-09-17 | 日本電気株式会社 | 半導体装置の製造方法 |
US6271584B1 (en) | 1996-02-28 | 2001-08-07 | Siemens Aktiengesellschaft | Arrangement of electronic components on a bearer strip |
JPH09260550A (ja) * | 1996-03-22 | 1997-10-03 | Mitsubishi Electric Corp | 半導体装置 |
US5956601A (en) * | 1996-04-25 | 1999-09-21 | Kabushiki Kaisha Toshiba | Method of mounting a plurality of semiconductor devices in corresponding supporters |
JP2812303B2 (ja) * | 1996-07-04 | 1998-10-22 | 日本電気株式会社 | Tabテープ半導体装置 |
US5905750A (en) * | 1996-10-15 | 1999-05-18 | Motorola, Inc. | Semiconductor laser package and method of fabrication |
US5881084A (en) * | 1997-03-10 | 1999-03-09 | Motorola, Inc. | Semiconductor laser for package with power monitoring system |
US5953355A (en) * | 1997-04-02 | 1999-09-14 | Motorola, Inc. | Semiconductor laser package with power monitoring system |
US6355881B1 (en) | 1997-05-05 | 2002-03-12 | Brant P. Braeges | Means for sealing an electronic or optical component within an enclosure housing |
JP3487173B2 (ja) * | 1997-05-26 | 2004-01-13 | セイコーエプソン株式会社 | Tab用テープキャリア、集積回路装置及び電子機器 |
US5918112A (en) * | 1997-07-24 | 1999-06-29 | Motorola, Inc. | Semiconductor component and method of fabrication |
US6300687B1 (en) | 1998-06-26 | 2001-10-09 | International Business Machines Corporation | Micro-flex technology in semiconductor packages |
US6777785B1 (en) * | 1999-08-25 | 2004-08-17 | Winbond Electronics Corp. | Lead frame containing a master and a slave IC chips and a testing circuit embedded within the master IC chip |
US6146984A (en) * | 1999-10-08 | 2000-11-14 | Agilent Technologies Inc. | Method and structure for uniform height solder bumps on a semiconductor wafer |
FR2805083A1 (fr) * | 2000-02-10 | 2001-08-17 | Bull Sa | Procede de montage et de fabrication de circuits integres sur un support et support en resultant |
JP3650001B2 (ja) * | 2000-07-05 | 2005-05-18 | 三洋電機株式会社 | 半導体装置およびその製造方法 |
US6552416B1 (en) * | 2000-09-08 | 2003-04-22 | Amkor Technology, Inc. | Multiple die lead frame package with enhanced die-to-die interconnect routing using internal lead trace wiring |
US20040069289A1 (en) * | 2001-01-24 | 2004-04-15 | Takashi Ito | Ignition device of internal combustion engine |
JP3839267B2 (ja) * | 2001-03-08 | 2006-11-01 | 株式会社ルネサステクノロジ | 半導体装置及びそれを用いた通信端末装置 |
US6791166B1 (en) | 2001-04-09 | 2004-09-14 | Amkor Technology, Inc. | Stackable lead frame package using exposed internal lead traces |
DE10125697B4 (de) * | 2001-05-25 | 2019-01-03 | Infineon Technologies Ag | Leistungshalbleitermodul und Verfahren zum Herstellen eines Leistungshalbleitermoduls |
KR100426330B1 (ko) * | 2001-07-16 | 2004-04-08 | 삼성전자주식회사 | 지지 테이프를 이용한 초박형 반도체 패키지 소자 |
KR100444172B1 (ko) * | 2001-12-28 | 2004-08-11 | 동부전자 주식회사 | 멀티 칩 반도체 패키지 |
JP2004103703A (ja) * | 2002-09-06 | 2004-04-02 | Ricoh Co Ltd | 半導体装置及び当該半導体装置を用いた異なるレベルの信号の処理システム |
JP2005300485A (ja) * | 2004-04-16 | 2005-10-27 | Renesas Technology Corp | 半導体装置 |
JP4357344B2 (ja) * | 2004-04-16 | 2009-11-04 | 株式会社ルネサステクノロジ | 半導体装置 |
JP4666592B2 (ja) | 2005-03-18 | 2011-04-06 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
US20070130759A1 (en) * | 2005-06-15 | 2007-06-14 | Gem Services, Inc. | Semiconductor device package leadframe formed from multiple metal layers |
DE102005038755B4 (de) * | 2005-08-17 | 2016-03-10 | Robert Bosch Gmbh | Mikromechanisches Bauelement |
CN101068005B (zh) * | 2006-05-02 | 2010-12-29 | 捷敏服务公司 | 由多个金属层制成的半导体装置封装引线框架 |
US7808088B2 (en) * | 2006-06-07 | 2010-10-05 | Texas Instruments Incorporated | Semiconductor device with improved high current performance |
DE102007003182B4 (de) * | 2007-01-22 | 2019-11-28 | Snaptrack Inc. | Elektrisches Bauelement |
JP2009099905A (ja) * | 2007-10-19 | 2009-05-07 | Rohm Co Ltd | 半導体装置 |
JP2009224529A (ja) * | 2008-03-17 | 2009-10-01 | Fuji Electric Device Technology Co Ltd | 半導体装置およびその製造方法 |
JP5233337B2 (ja) * | 2008-03-17 | 2013-07-10 | 富士電機株式会社 | 半導体装置及び半導体装置の製造方法 |
JP5233340B2 (ja) * | 2008-03-17 | 2013-07-10 | 富士電機株式会社 | 半導体装置及び半導体装置の製造方法 |
JP5233341B2 (ja) * | 2008-03-17 | 2013-07-10 | 富士電機株式会社 | 半導体装置及び半導体装置の製造方法 |
JP5233336B2 (ja) * | 2008-03-17 | 2013-07-10 | 富士電機株式会社 | 半導体装置及び半導体装置の製造方法 |
JP5233339B2 (ja) * | 2008-03-17 | 2013-07-10 | 富士電機株式会社 | 半導体装置及び半導体装置の製造方法 |
JP5233338B2 (ja) * | 2008-03-17 | 2013-07-10 | 富士電機株式会社 | 半導体装置及び半導体装置の製造方法 |
US8253241B2 (en) | 2008-05-20 | 2012-08-28 | Infineon Technologies Ag | Electronic module |
US7847375B2 (en) * | 2008-08-05 | 2010-12-07 | Infineon Technologies Ag | Electronic device and method of manufacturing same |
US20100252918A1 (en) * | 2009-04-06 | 2010-10-07 | Jiang Hunt H | Multi-die package with improved heat dissipation |
US8227904B2 (en) | 2009-06-24 | 2012-07-24 | Intel Corporation | Multi-chip package and method of providing die-to-die interconnects in same |
US8314487B2 (en) * | 2009-12-18 | 2012-11-20 | Infineon Technologies Ag | Flange for semiconductor die |
TWI455253B (zh) * | 2010-06-30 | 2014-10-01 | Alpha & Omega Semiconductor | 一種通過印刷粘接材料封裝的半導體裝置及其製造方法 |
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-
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- 1992-01-11 JP JP4021857A patent/JP2582013B2/ja not_active Expired - Fee Related
- 1992-02-03 MY MYPI92000179A patent/MY108168A/en unknown
- 1992-02-03 US US07/829,388 patent/US5245215A/en not_active Expired - Lifetime
- 1992-02-07 EP EP92102066A patent/EP0498446B1/en not_active Expired - Lifetime
- 1992-02-07 DE DE69216867T patent/DE69216867T2/de not_active Expired - Fee Related
- 1992-02-10 TW TW081100892A patent/TW329533B/zh not_active IP Right Cessation
- 1992-02-10 TW TW085219858U patent/TW331441U/zh unknown
-
1993
- 1993-05-17 US US08/062,013 patent/US5352632A/en not_active Expired - Lifetime
Also Published As
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---|---|
TW329533B (en) | 1998-04-11 |
EP0498446A2 (en) | 1992-08-12 |
US5352632A (en) | 1994-10-04 |
JPH0661406A (ja) | 1994-03-04 |
EP0498446A3 (en) | 1993-10-20 |
JP2582013B2 (ja) | 1997-02-19 |
DE69216867D1 (de) | 1997-03-06 |
US5245215A (en) | 1993-09-14 |
EP0498446B1 (en) | 1997-01-22 |
MY108168A (en) | 1996-08-30 |
DE69216867T2 (de) | 1997-06-05 |
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